GB9617380D0 - Atomic force microscopy apparatus and a method thereof - Google Patents

Atomic force microscopy apparatus and a method thereof

Info

Publication number
GB9617380D0
GB9617380D0 GBGB9617380.2A GB9617380A GB9617380D0 GB 9617380 D0 GB9617380 D0 GB 9617380D0 GB 9617380 A GB9617380 A GB 9617380A GB 9617380 D0 GB9617380 D0 GB 9617380D0
Authority
GB
United Kingdom
Prior art keywords
tip
piezotransducer
cantilever
sample
atomic force
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
GBGB9617380.2A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Oxford University Innovation Ltd
Original Assignee
Oxford University Innovation Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Oxford University Innovation Ltd filed Critical Oxford University Innovation Ltd
Priority to GBGB9617380.2A priority Critical patent/GB9617380D0/en
Publication of GB9617380D0 publication Critical patent/GB9617380D0/en
Priority to PCT/GB1997/002232 priority patent/WO1998008046A1/en
Priority to AU40225/97A priority patent/AU4022597A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/32—AC mode

Abstract

The microscopy apparatus comprises a cantilever (10) having an atomically sharp tip (11) and a detector (15) which monitors the deflection of the tip (11) as a measure of the atomic force between the tip and a sample. A piezotransducer (12) is provided on the end of the cantilever (10) distant from the tip (11). The piezotransducer (12) generates high frequency vibrations which are applied to the cantilever. The vibrations transmitted to the tip (11) are modulated using means such as a second piezotransducer (20) in contact with the sample and the movement of the tip (11) is then sampled by the detector (15) at a much lower frequency. The microscopy apparatus and method described is able to maintain sensitivity to the properties of the sample whilst retaining sensitivity to the output of the apparatus. The apparatus and method is particularly suited of the study of time-dependent physico-chemical and physico-mechanical properties up to nanosecond and sub-nanosecond time resolution.
GBGB9617380.2A 1996-08-19 1996-08-19 Atomic force microscopy apparatus and a method thereof Pending GB9617380D0 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
GBGB9617380.2A GB9617380D0 (en) 1996-08-19 1996-08-19 Atomic force microscopy apparatus and a method thereof
PCT/GB1997/002232 WO1998008046A1 (en) 1996-08-19 1997-08-19 Atomic force microscopy apparatus and a method thereof
AU40225/97A AU4022597A (en) 1996-08-19 1997-08-19 Atomic force microscopy apparatus and a method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB9617380.2A GB9617380D0 (en) 1996-08-19 1996-08-19 Atomic force microscopy apparatus and a method thereof

Publications (1)

Publication Number Publication Date
GB9617380D0 true GB9617380D0 (en) 1996-10-02

Family

ID=10798667

Family Applications (1)

Application Number Title Priority Date Filing Date
GBGB9617380.2A Pending GB9617380D0 (en) 1996-08-19 1996-08-19 Atomic force microscopy apparatus and a method thereof

Country Status (3)

Country Link
AU (1) AU4022597A (en)
GB (1) GB9617380D0 (en)
WO (1) WO1998008046A1 (en)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8438927B2 (en) 2003-08-12 2013-05-14 Northwestern University Scanning near field thermoelastic acoustic holography (SNFTAH)
US7448269B2 (en) 2003-08-12 2008-11-11 Northwestern University Scanning near field ultrasound holography
WO2007044002A1 (en) * 2005-10-06 2007-04-19 Northwestern University Scanning near field ultrasound holography
US8322220B2 (en) * 2007-05-10 2012-12-04 Veeco Instruments Inc. Non-destructive wafer-scale sub-surface ultrasonic microscopy employing near field AFM detection
US8726410B2 (en) 2010-07-30 2014-05-13 The United States Of America As Represented By The Secretary Of The Air Force Atomic force microscopy system and method for nanoscale measurement
CN112798205B (en) * 2020-12-15 2023-04-07 东莞理工学院 Atomic force microscope micro-cantilever elasticity coefficient calibration device

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4992659A (en) * 1989-07-27 1991-02-12 International Business Machines Corporation Near-field lorentz force microscopy
JP2500373B2 (en) * 1993-11-09 1996-05-29 工業技術院長 Atomic force microscope and sample observation method in atomic force microscope
EP0754289B1 (en) * 1995-02-07 2001-09-26 International Business Machines Corporation Measurement of AFM cantilever deflection with high frequency radiation and dopant profiler

Also Published As

Publication number Publication date
AU4022597A (en) 1998-03-06
WO1998008046A1 (en) 1998-02-26

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