AU2001228696A1 - Instrument and method for combined surface topography and spectroscopic analysis - Google Patents

Instrument and method for combined surface topography and spectroscopic analysis

Info

Publication number
AU2001228696A1
AU2001228696A1 AU2001228696A AU2869601A AU2001228696A1 AU 2001228696 A1 AU2001228696 A1 AU 2001228696A1 AU 2001228696 A AU2001228696 A AU 2001228696A AU 2869601 A AU2869601 A AU 2869601A AU 2001228696 A1 AU2001228696 A1 AU 2001228696A1
Authority
AU
Australia
Prior art keywords
tip
sample
spectroscopic analysis
analyzer
sample surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001228696A
Inventor
Brian John Eves
Frederic Festy
Peter Georg Laitenberger
Richard Edward Palmer
Krister Svensson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Birmingham
Original Assignee
University of Birmingham
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Birmingham filed Critical University of Birmingham
Publication of AU2001228696A1 publication Critical patent/AU2001228696A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/10—STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
    • G01Q60/16—Probes, their manufacture, or their related instrumentation, e.g. holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nanostructures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
    • G01Q30/02—Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope

Landscapes

  • General Health & Medical Sciences (AREA)
  • Radiology & Medical Imaging (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Electron Tubes For Measurement (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

A combined surface topography and spectroscopic analysis instrument comprises a scanning tunnelling microscope tip (12); and a sample carrier (58) which supports a sample (10) so that a surface thereto to be analyzed is presented towards the tip (12). The sample carrier (58) and the tip (12) are relative movable to enable the distance between the tip (12) and the surface to be varied in use and the sample surface to be scanned in two dimensions by the tip (12). An electronic analyzer is positioned to detect electrons from the tip (12) which have been back-scattered off the sample surface. A voltage controller (59) enables selective operation of the tip (12) in a first voltage range in scanning tunnelling mode, to enable spatial resolution imaging of the sample surface, and in a second, higher, voltage range in electron field emission mode whereby to permit the electron analyzer to analyze the back-scattered electrons. The electron analyzer is positioned so as to detect back-scattered electrons travelling at an angle of less than 20° with respect to the sample surface.
AU2001228696A 2000-02-03 2001-01-31 Instrument and method for combined surface topography and spectroscopic analysis Abandoned AU2001228696A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB0002367.1A GB0002367D0 (en) 2000-02-03 2000-02-03 Spectrometer
GB0002367 2000-02-03
PCT/GB2001/000377 WO2001057878A1 (en) 2000-02-03 2001-01-31 Instrument and method for combined surface topography and spectroscopic analysis

Publications (1)

Publication Number Publication Date
AU2001228696A1 true AU2001228696A1 (en) 2001-08-14

Family

ID=9884810

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001228696A Abandoned AU2001228696A1 (en) 2000-02-03 2001-01-31 Instrument and method for combined surface topography and spectroscopic analysis

Country Status (8)

Country Link
US (1) US6855926B2 (en)
EP (1) EP1252634B1 (en)
JP (1) JP2003522327A (en)
AT (1) ATE352089T1 (en)
AU (1) AU2001228696A1 (en)
DE (1) DE60126057T2 (en)
GB (1) GB0002367D0 (en)
WO (1) WO2001057878A1 (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0002367D0 (en) * 2000-02-03 2000-03-22 Limited Spectrometer
WO2006025705A1 (en) * 2004-09-01 2006-03-09 Cebt Co. Ltd. Portable electron microscope using micro-column
FR2886755B1 (en) * 2005-06-06 2009-06-05 Centre Nat Rech Scient NANOMETER TRANSLATOR / RECEIVER GUIDES
US7884326B2 (en) * 2007-01-22 2011-02-08 Fei Company Manipulator for rotating and translating a sample holder
EP2051280A1 (en) * 2007-10-18 2009-04-22 The Regents of the University of California Motorized manipulator for positioning a TEM specimen
US20090121133A1 (en) * 2007-11-14 2009-05-14 University Of Washington Identification of nucleic acids using inelastic/elastic electron tunneling spectroscopy
EP2091065A1 (en) 2008-02-18 2009-08-19 ETH Zürich Low-voltage field emission scanning electron microscope
US8283631B2 (en) * 2008-05-08 2012-10-09 Kla-Tencor Corporation In-situ differential spectroscopy
US7924983B2 (en) * 2008-06-30 2011-04-12 Varian Medical Systems, Inc. Thermionic emitter designed to control electron beam current profile in two dimensions
WO2010144267A1 (en) * 2009-06-12 2010-12-16 Carl Zeiss Nts, Llc Method and system for heating a tip apex of a charged particle source
US8384020B2 (en) * 2010-09-24 2013-02-26 Ut-Battelle, Llc Spatially resolved thermal desorption/ionization coupled with mass spectrometry
JP6646290B2 (en) * 2014-12-17 2020-02-14 国立研究開発法人産業技術総合研究所 Method of measuring elements in a sample and visualization of concentration distribution
CN105445498A (en) * 2015-09-30 2016-03-30 哈尔滨理工大学 Probe locus planning and tracking method for micro-nano operation under SEM

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3938001A (en) * 1974-02-26 1976-02-10 Nihon Denshi Kabushiki Kaisha Protection circuit for electron gun
EP0189498B1 (en) * 1985-01-29 1989-05-03 International Business Machines Corporation Field-emission scanning auger electron microscope
JPH02174047A (en) * 1988-12-27 1990-07-05 Nec Corp Scanning type electron microscope
JPH03295142A (en) * 1990-04-13 1991-12-26 Hitachi Ltd Scanning electron microscope
JPH063295A (en) * 1992-06-19 1994-01-11 Hitachi Ltd Surface analyzing device
JP3101539B2 (en) * 1994-06-24 2000-10-23 インターナショナル・ビジネス・マシーンズ・コーポレ−ション Electron beam nanometrology system
JPH10104179A (en) * 1996-09-30 1998-04-24 Fujitsu Ltd Electron spectroscopic method and apparatus therefor
JP3687243B2 (en) * 1997-01-08 2005-08-24 株式会社ニコン Pattern inspection device
JP3401158B2 (en) * 1997-03-10 2003-04-28 日本電子株式会社 Ultra-high vacuum surface observation device
JPH11135047A (en) * 1997-09-01 1999-05-21 Jeol Ltd Transmission electron microscope
GB0002367D0 (en) * 2000-02-03 2000-03-22 Limited Spectrometer

Also Published As

Publication number Publication date
JP2003522327A (en) 2003-07-22
US6855926B2 (en) 2005-02-15
DE60126057T2 (en) 2007-11-08
EP1252634A1 (en) 2002-10-30
DE60126057D1 (en) 2007-03-08
EP1252634B1 (en) 2007-01-17
US20030010911A1 (en) 2003-01-16
GB0002367D0 (en) 2000-03-22
WO2001057878A1 (en) 2001-08-09
ATE352089T1 (en) 2007-02-15

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