GB8614683D0 - Manufacturing crystalline thin films - Google Patents
Manufacturing crystalline thin filmsInfo
- Publication number
- GB8614683D0 GB8614683D0 GB868614683A GB8614683A GB8614683D0 GB 8614683 D0 GB8614683 D0 GB 8614683D0 GB 868614683 A GB868614683 A GB 868614683A GB 8614683 A GB8614683 A GB 8614683A GB 8614683 D0 GB8614683 D0 GB 8614683D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- thin films
- crystalline thin
- manufacturing crystalline
- manufacturing
- films
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B13/00—Single-crystal growth by zone-melting; Refining by zone-melting
- C30B13/28—Controlling or regulating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B13/00—Single-crystal growth by zone-melting; Refining by zone-melting
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B13/00—Single-crystal growth by zone-melting; Refining by zone-melting
- C30B13/16—Heating of the molten zone
- C30B13/22—Heating of the molten zone by irradiation or electric discharge
- C30B13/24—Heating of the molten zone by irradiation or electric discharge using electromagnetic waves
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/60—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape characterised by shape
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60130764A JPS61289617A (en) | 1985-06-18 | 1985-06-18 | Manufacturing device for single-crystal thin film |
Publications (3)
Publication Number | Publication Date |
---|---|
GB8614683D0 true GB8614683D0 (en) | 1986-07-23 |
GB2177256A GB2177256A (en) | 1987-01-14 |
GB2177256B GB2177256B (en) | 1988-12-21 |
Family
ID=15042097
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB08614683A Expired GB2177256B (en) | 1985-06-18 | 1986-06-17 | Methods of and apparatus for manufacturing crystalline thin films |
Country Status (5)
Country | Link |
---|---|
JP (1) | JPS61289617A (en) |
KR (1) | KR870000744A (en) |
DE (1) | DE3620300A1 (en) |
FR (1) | FR2583572B1 (en) |
GB (1) | GB2177256B (en) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB2211210A (en) * | 1987-10-16 | 1989-06-28 | Philips Electronic Associated | A method of modifying a surface of a body using electromagnetic radiation |
US5074952A (en) * | 1987-11-13 | 1991-12-24 | Kopin Corporation | Zone-melt recrystallization method and apparatus |
WO1989004387A1 (en) * | 1987-11-13 | 1989-05-18 | Kopin Corporation | Improved zone melt recrystallization method and apparatus |
JPH01246829A (en) * | 1988-03-28 | 1989-10-02 | Tokyo Electron Ltd | Beam annealing device |
DE3818504A1 (en) * | 1988-05-31 | 1991-01-03 | Fraunhofer Ges Forschung | METHOD AND DEVICE FOR THE CRYSTALIZATION OF THIN SEMICONDUCTOR LAYERS ON A SUBSTRATE MATERIAL |
US5173446A (en) * | 1988-06-28 | 1992-12-22 | Ricoh Company, Ltd. | Semiconductor substrate manufacturing by recrystallization using a cooling medium |
DE3921038C2 (en) * | 1988-06-28 | 1998-12-10 | Ricoh Kk | Method for producing a semiconductor substrate or solid structure |
US5459346A (en) * | 1988-06-28 | 1995-10-17 | Ricoh Co., Ltd. | Semiconductor substrate with electrical contact in groove |
US5310446A (en) * | 1990-01-10 | 1994-05-10 | Ricoh Company, Ltd. | Method for producing semiconductor film |
US5338388A (en) * | 1992-05-04 | 1994-08-16 | Mitsubishi Denki Kabushiki Kaisha | Method of forming single-crystal semiconductor films |
US8183498B2 (en) | 2006-05-01 | 2012-05-22 | Tcz, Llc | Systems and method for optimization of laser beam spatial intensity profile |
US8927898B2 (en) | 2006-05-01 | 2015-01-06 | Tcz, Llc | Systems and method for optimization of laser beam spatial intensity profile |
CN101680107B (en) * | 2007-04-24 | 2013-04-10 | Limo专利管理有限及两合公司 | Method for restructuring semiconductor layers |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4155779A (en) * | 1978-08-21 | 1979-05-22 | Bell Telephone Laboratories, Incorporated | Control techniques for annealing semiconductors |
US4380864A (en) * | 1981-07-27 | 1983-04-26 | The United States Of America As Represented By The Secretary Of The Air Force | Method for providing in-situ non-destructive monitoring of semiconductors during laser annealing process |
-
1985
- 1985-06-18 JP JP60130764A patent/JPS61289617A/en active Pending
-
1986
- 1986-06-12 KR KR1019860004670A patent/KR870000744A/en not_active Application Discontinuation
- 1986-06-17 GB GB08614683A patent/GB2177256B/en not_active Expired
- 1986-06-17 FR FR868608724A patent/FR2583572B1/en not_active Expired - Lifetime
- 1986-06-18 DE DE19863620300 patent/DE3620300A1/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
KR870000744A (en) | 1987-02-20 |
FR2583572A1 (en) | 1986-12-19 |
FR2583572B1 (en) | 1990-05-11 |
GB2177256B (en) | 1988-12-21 |
DE3620300A1 (en) | 1986-12-18 |
JPS61289617A (en) | 1986-12-19 |
GB2177256A (en) | 1987-01-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 19950617 |