GB518951A - Improvements in or relating to electron microscopes - Google Patents
Improvements in or relating to electron microscopesInfo
- Publication number
- GB518951A GB518951A GB26505/38A GB2650538A GB518951A GB 518951 A GB518951 A GB 518951A GB 26505/38 A GB26505/38 A GB 26505/38A GB 2650538 A GB2650538 A GB 2650538A GB 518951 A GB518951 A GB 518951A
- Authority
- GB
- United Kingdom
- Prior art keywords
- photographic layer
- layer
- electron
- photographic
- drum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000010894 electron beam technology Methods 0.000 abstract 3
- 230000001360 synchronised effect Effects 0.000 abstract 2
- 238000012986 modification Methods 0.000 abstract 1
- 230000004048 modification Effects 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/22—Optical, image processing or photographic arrangements associated with the tube
- H01J37/224—Luminescent screens or photographic plates for imaging; Apparatus specially adapted therefor, e. g. cameras, TV-cameras, photographic equipment or exposure control; Optical subsystems specially adapted therefor, e. g. microscopes for observing image on luminescent screen
-
- D—TEXTILES; PAPER
- D04—BRAIDING; LACE-MAKING; KNITTING; TRIMMINGS; NON-WOVEN FABRICS
- D04B—KNITTING
- D04B15/00—Details of, or auxiliary devices incorporated in, weft knitting machines, restricted to machines of this kind
- D04B15/66—Devices for determining or controlling patterns ; Programme-control arrangements
- D04B15/68—Devices for determining or controlling patterns ; Programme-control arrangements characterised by the knitting instruments used
- D04B15/78—Electrical devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/28—Scanning microscopes
- H01J2237/2802—Transmission microscopes
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Textile Engineering (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
518,951. Electron microscopes ; local viewing by scanning. ARDENNE, M. VON, and SIEMENS & HALSKE AKT.-GES. Sept. 10, 1938, No. 26505. Convention date, Sept. 11, 1937. [Classes 39 (i) and 40 (iii)] [Also in Group XX] A fine electron beam, having a diameter preferably less than 10<-3> mm., scans the surface of an object and the electron energy modulated by the structure of the object is recorded with the aid of a photographic layer, the layer and the recording electron spot being relatively movable so as to form on the layer a magnified image of the structure of the object. In one form, the object 2, Fig. 1, is supported on a Lenard window 5, a collodion film 10<-3> to 10-4 in thickness stretched across an aperture in the supporting wall 3. The resulting modulated electron beam passes in air through diaphragm 6 to a rotating photographic drum 7. The photographic layer may also be within the vacuum space. The deflection of the scanning beam is synchronized with the movement of the drum by the circuit shown in Fig. 2. The motor 12 rotates drum 7 by a shaft carrying contact ring 13, which discharges condenser 14 at each revolution, and bevel gear 17 driving potentiometer 18. Condenser 14 charges up through resistance 16 and energizes " line " deflecting plates 15, while potentiometer 18 energizes " frame " deflecting plates 19. Additional focusing and accelerating means may be interposed between the object and the photographic layer. Preliminary adjustment is facilitated by replacing the photographic layer by a fluorescent screen 8, on which the image of a fine wire used as a test object is observed by microscope 10 through mirror 9. Narrow strips of film may also be used for recording. In a modification, the photographic layer may be stationary and the scanning beam after passing through the object is additionally deflected by means synchronized with the initial deflection. A luminous screen may be interposed between the electron beam and the photographic layer. The object 2 may be positioned on the outside of the Lenard window 5. The photographic layer is preferably made insensitive to light to facilitate manipulation.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE518951X | 1937-09-11 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| GB518951A true GB518951A (en) | 1940-03-12 |
Family
ID=6550298
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB26505/38A Expired GB518951A (en) | 1937-09-11 | 1938-09-10 | Improvements in or relating to electron microscopes |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US2241432A (en) |
| BE (1) | BE430092A (en) |
| FR (1) | FR843213A (en) |
| GB (1) | GB518951A (en) |
| NL (1) | NL53866C (en) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2527562A (en) * | 1945-08-02 | 1950-10-31 | Raymond E Mccormick | Apparatus for recording oscilloscopic signal traces |
| US2680669A (en) * | 1947-11-26 | 1954-06-08 | Jr Ward Shepard | Cathode ray multisignal measuring and recording apparatus |
| US2729748A (en) * | 1950-08-17 | 1956-01-03 | High Voltage Engineering Corp | Apparatus for sterilizing foods, drugs and other substances by scanning action of high-energy electrons |
| US2680815A (en) * | 1950-12-28 | 1954-06-08 | High Voltage Engineering Corp | Method of and apparatus for treating substances with high energy electrons |
| US2839602A (en) * | 1951-10-09 | 1958-06-17 | Julius Cato Vredenburg Inglesb | Method of and apparatus for recording pictures |
| US2901627A (en) * | 1953-02-19 | 1959-08-25 | Leitz Ernst Gmbh | Method of and apparatus for the electronic magnification of objects |
| US2932549A (en) * | 1953-11-20 | 1960-04-12 | Technicon Instr | Method and apparatus for recording vectorcardiographs |
| US2894160A (en) * | 1954-09-09 | 1959-07-07 | Sheldon Edward Emanuel | Electron microscopes |
| US3025125A (en) * | 1957-08-06 | 1962-03-13 | Texaco Inc | Method and apparatus for photographing oscilloscopic sweep magnified signals |
| US3346736A (en) * | 1964-09-22 | 1967-10-10 | Applied Res Lab Inc | Electron probe apparatus having an objective lens with an aperture for restricting fluid flow |
| DE2223367C3 (en) * | 1972-05-12 | 1978-11-30 | Max-Planck-Gesellschaft Zur Foerderung Der Wissenschaften E.V., 3400 Goettingen | Micro-beam probe for the quantitative detection of charged secondary particles |
| AU534811B2 (en) * | 1979-07-03 | 1984-02-16 | Unisearch Limited | Atmospheric scanning electron microscope |
| US7618906B2 (en) * | 2005-11-17 | 2009-11-17 | Oxford Instruments Analytical Oy | Window membrane for detector and analyser devices, and a method for manufacturing a window membrane |
| US7474730B2 (en) * | 2006-10-17 | 2009-01-06 | Oxford Instruments Analytical Oy | Compensation for fluctuations over time in the radiation characteristics of the X-ray source in an XRF analyser |
-
0
- NL NL53866D patent/NL53866C/xx active
- BE BE430092D patent/BE430092A/xx unknown
-
1938
- 1938-09-07 US US228776A patent/US2241432A/en not_active Expired - Lifetime
- 1938-09-09 FR FR843213D patent/FR843213A/en not_active Expired
- 1938-09-10 GB GB26505/38A patent/GB518951A/en not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| US2241432A (en) | 1941-05-13 |
| NL53866C (en) | |
| FR843213A (en) | 1939-06-28 |
| BE430092A (en) |
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