GB2369909B - Faulty cell repairing method for a semiconductor memory - Google Patents
Faulty cell repairing method for a semiconductor memoryInfo
- Publication number
- GB2369909B GB2369909B GB0205031A GB0205031A GB2369909B GB 2369909 B GB2369909 B GB 2369909B GB 0205031 A GB0205031 A GB 0205031A GB 0205031 A GB0205031 A GB 0205031A GB 2369909 B GB2369909 B GB 2369909B
- Authority
- GB
- United Kingdom
- Prior art keywords
- semiconductor memory
- repairing method
- faulty cell
- cell repairing
- faulty
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
- G11C29/846—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability by choosing redundant lines at an output stage
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
- G11C29/84—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
- G11C29/848—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability by adjacent switching
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019970065906A KR100252053B1 (en) | 1997-12-04 | 1997-12-04 | Semiconductor memory device having column direction data in-out line and fail cell reparing circuit and method thereof |
GB9811155A GB2332292B (en) | 1997-12-04 | 1998-05-22 | A semiconductor memory device |
Publications (3)
Publication Number | Publication Date |
---|---|
GB0205031D0 GB0205031D0 (en) | 2002-04-17 |
GB2369909A GB2369909A (en) | 2002-06-12 |
GB2369909B true GB2369909B (en) | 2002-08-28 |
Family
ID=26313733
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0205031A Expired - Fee Related GB2369909B (en) | 1997-12-04 | 1998-05-22 | Faulty cell repairing method for a semiconductor memory |
GB0205033A Expired - Fee Related GB2369910B (en) | 1997-12-04 | 1998-05-22 | Faulty cell repairing method for a semiconductor memory device |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0205033A Expired - Fee Related GB2369910B (en) | 1997-12-04 | 1998-05-22 | Faulty cell repairing method for a semiconductor memory device |
Country Status (1)
Country | Link |
---|---|
GB (2) | GB2369909B (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0447995A2 (en) * | 1990-03-19 | 1991-09-25 | Advantest Corporation | Analyzing device for saving semiconductor memory failures |
US5621691A (en) * | 1994-08-25 | 1997-04-15 | Samsung Electronics Co., Ltd. | Column redundancy circuit and method of semiconductor memory device |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2777276B2 (en) * | 1990-09-20 | 1998-07-16 | 株式会社東芝 | Test device for memory IC with redundant circuit |
-
1998
- 1998-05-22 GB GB0205031A patent/GB2369909B/en not_active Expired - Fee Related
- 1998-05-22 GB GB0205033A patent/GB2369910B/en not_active Expired - Fee Related
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0447995A2 (en) * | 1990-03-19 | 1991-09-25 | Advantest Corporation | Analyzing device for saving semiconductor memory failures |
US5621691A (en) * | 1994-08-25 | 1997-04-15 | Samsung Electronics Co., Ltd. | Column redundancy circuit and method of semiconductor memory device |
Also Published As
Publication number | Publication date |
---|---|
GB0205033D0 (en) | 2002-04-17 |
GB2369910A (en) | 2002-06-12 |
GB0205031D0 (en) | 2002-04-17 |
GB2369910B (en) | 2002-08-28 |
GB2369909A (en) | 2002-06-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20090522 |