GB2349742B - Method and apparatus for processing a wafer to remove an unnecessary substance therefrom - Google Patents
Method and apparatus for processing a wafer to remove an unnecessary substance therefromInfo
- Publication number
- GB2349742B GB2349742B GB0007920A GB0007920A GB2349742B GB 2349742 B GB2349742 B GB 2349742B GB 0007920 A GB0007920 A GB 0007920A GB 0007920 A GB0007920 A GB 0007920A GB 2349742 B GB2349742 B GB 2349742B
- Authority
- GB
- United Kingdom
- Prior art keywords
- wafer
- remove
- processing
- unnecessary substance
- substance therefrom
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67075—Apparatus for fluid treatment for etching for wet etching
- H01L21/67086—Apparatus for fluid treatment for etching for wet etching with the semiconductor substrates being dipped in baths or vessels
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67057—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67075—Apparatus for fluid treatment for etching for wet etching
- H01L21/6708—Apparatus for fluid treatment for etching for wet etching using mainly spraying means, e.g. nozzles
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Cleaning In General (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Weting (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11095187A JP2000294527A (en) | 1999-04-01 | 1999-04-01 | Method for processing wafer and its processor |
Publications (3)
Publication Number | Publication Date |
---|---|
GB0007920D0 GB0007920D0 (en) | 2000-05-17 |
GB2349742A GB2349742A (en) | 2000-11-08 |
GB2349742B true GB2349742B (en) | 2001-05-30 |
Family
ID=14130761
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0007920A Expired - Fee Related GB2349742B (en) | 1999-04-01 | 2000-03-31 | Method and apparatus for processing a wafer to remove an unnecessary substance therefrom |
Country Status (2)
Country | Link |
---|---|
JP (1) | JP2000294527A (en) |
GB (1) | GB2349742B (en) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003297947A (en) * | 2002-04-01 | 2003-10-17 | Hitachi Ltd | Semiconductor integrated circuit device and its manufacturing method |
JP2006139271A (en) * | 2005-10-24 | 2006-06-01 | Hoya Corp | Apparatus and method for removing unwanted film, and method for manufacturing photomask blank |
WO2008048259A2 (en) | 2006-10-16 | 2008-04-24 | Materials And Technologies Corporation | Wet processing using a fluid meniscus, apparatus and method |
US8221552B2 (en) | 2007-03-30 | 2012-07-17 | Lam Research Corporation | Cleaning of bonded silicon electrodes |
JP2011100978A (en) * | 2009-10-07 | 2011-05-19 | Sumco Corp | Method and device for cleaning semiconductor substrate |
JP6306540B2 (en) * | 2015-06-19 | 2018-04-04 | 東京エレクトロン株式会社 | Substrate processing apparatus and substrate processing method |
CN105080892B (en) * | 2015-07-30 | 2017-04-05 | 上海华力微电子有限公司 | A kind of cleaning device and cleaning method of wafer holder |
CN106783683B (en) * | 2016-12-19 | 2019-08-09 | 安徽天裕汽车零部件制造有限公司 | A kind of wafer-scanning cleaning swinging arm device |
JP7138539B2 (en) * | 2018-10-18 | 2022-09-16 | 東京エレクトロン株式会社 | SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD |
CN110743865B (en) * | 2019-10-29 | 2020-12-11 | 韶关市洁盟超声科技有限公司 | Utilize automatic air-dried device of lid behind high-efficient washing wrist-watch of ultrasonic wave |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4544446A (en) * | 1984-07-24 | 1985-10-01 | J. T. Baker Chemical Co. | VLSI chemical reactor |
-
1999
- 1999-04-01 JP JP11095187A patent/JP2000294527A/en active Pending
-
2000
- 2000-03-31 GB GB0007920A patent/GB2349742B/en not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4544446A (en) * | 1984-07-24 | 1985-10-01 | J. T. Baker Chemical Co. | VLSI chemical reactor |
Also Published As
Publication number | Publication date |
---|---|
JP2000294527A (en) | 2000-10-20 |
GB2349742A (en) | 2000-11-08 |
GB0007920D0 (en) | 2000-05-17 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
732E | Amendments to the register in respect of changes of name or changes affecting rights (sect. 32/1977) | ||
PCNP | Patent ceased through non-payment of renewal fee |
Effective date: 20050331 |