GB8331558D0 - Automatic test equipment - Google Patents
Automatic test equipmentInfo
- Publication number
- GB8331558D0 GB8331558D0 GB838331558A GB8331558A GB8331558D0 GB 8331558 D0 GB8331558 D0 GB 8331558D0 GB 838331558 A GB838331558 A GB 838331558A GB 8331558 A GB8331558 A GB 8331558A GB 8331558 D0 GB8331558 D0 GB 8331558D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- test equipment
- automatic test
- automatic
- equipment
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (16)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB838331558A GB8331558D0 (en) | 1983-11-25 | 1983-11-25 | Automatic test equipment |
CA000468495A CA1242486A (en) | 1983-11-25 | 1984-11-23 | Automatic test equipment |
EP84308138A EP0143623A3 (en) | 1983-11-25 | 1984-11-23 | Automatic test equipment |
GB08429657A GB2150696B (en) | 1983-11-25 | 1984-11-23 | Automatic test equipment |
DK557884A DK557884A (en) | 1983-11-25 | 1984-11-23 | AUTOMATIC TEST EQUIPMENT |
BR8406011A BR8406011A (en) | 1983-11-25 | 1984-11-26 | AUTOMATIC TEST EQUIPMENT; MODULE FOR USE WITH AN AUTOMATIC TEST EQUIPMENT; DATA INSERT METHOD REPRESENTATIVE OF SPECIFIC SIGNALS AND / OR SPECIFIC WAVE SHAPES IN A COMPUTERIZED INSTALLATION OF MONITORING AND / OR INSTALLING TESTING MEDICATION. |
ES537982A ES8607570A1 (en) | 1983-11-25 | 1984-11-26 | Automatic test equipment. |
JP59249429A JPS60149980A (en) | 1983-11-25 | 1984-11-26 | Automatic test apparatus for testing electronic circuit |
AU35886/84A AU586154B2 (en) | 1983-11-25 | 1984-11-26 | Automatic test equipment |
IE3021/84A IE56161B1 (en) | 1983-11-25 | 1984-11-26 | Automatic test equipment |
GB8722960A GB2195029B (en) | 1983-11-25 | 1987-09-30 | Automatic test equipment |
GB8722959A GB2195028B (en) | 1983-11-25 | 1987-09-30 | Automatic test equipment |
GB8722958A GB2195027B (en) | 1983-11-25 | 1987-09-30 | Automatic test equipment |
US07/140,895 US4807161A (en) | 1983-11-25 | 1987-12-29 | Automatic test equipment |
SG32391A SG32391G (en) | 1983-11-25 | 1991-05-02 | Automatic test equipment |
SG32291A SG32291G (en) | 1983-11-25 | 1991-05-02 | Automatic test equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB838331558A GB8331558D0 (en) | 1983-11-25 | 1983-11-25 | Automatic test equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
GB8331558D0 true GB8331558D0 (en) | 1984-01-04 |
Family
ID=10552368
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB838331558A Pending GB8331558D0 (en) | 1983-11-25 | 1983-11-25 | Automatic test equipment |
Country Status (2)
Country | Link |
---|---|
JP (1) | JPS60149980A (en) |
GB (1) | GB8331558D0 (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6312975A (en) * | 1986-07-03 | 1988-01-20 | Nec Corp | Pin electronics substrate for integrated circuit testing device |
US7672805B2 (en) * | 2003-11-26 | 2010-03-02 | Advantest Corporation | Synchronization of modules for analog and mixed signal testing in an open architecture test system |
KR102308990B1 (en) * | 2021-07-20 | 2021-10-06 | (주) 에이블리 | Apparatus and method for generating semiconductor test pattern |
CN114185327B (en) * | 2021-12-06 | 2024-05-24 | 广东利扬芯片测试股份有限公司 | High-speed low-power consumption microcontroller high-precision test system |
-
1983
- 1983-11-25 GB GB838331558A patent/GB8331558D0/en active Pending
-
1984
- 1984-11-26 JP JP59249429A patent/JPS60149980A/en active Pending
Also Published As
Publication number | Publication date |
---|---|
JPS60149980A (en) | 1985-08-07 |
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