GB201710982D0 - Metal nanowires - Google Patents

Metal nanowires

Info

Publication number
GB201710982D0
GB201710982D0 GBGB1710982.8A GB201710982A GB201710982D0 GB 201710982 D0 GB201710982 D0 GB 201710982D0 GB 201710982 A GB201710982 A GB 201710982A GB 201710982 D0 GB201710982 D0 GB 201710982D0
Authority
GB
United Kingdom
Prior art keywords
metal nanowires
nanowires
metal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB1710982.8A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Katholieke Universiteit Leuven
Original Assignee
Katholieke Universiteit Leuven
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Katholieke Universiteit Leuven filed Critical Katholieke Universiteit Leuven
Priority to GBGB1710982.8A priority Critical patent/GB201710982D0/en
Publication of GB201710982D0 publication Critical patent/GB201710982D0/en
Priority to PCT/EP2018/068282 priority patent/WO2019008108A1/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/10—Shape or taper
    • G01Q70/12—Nanotube tips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/18—SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
    • G01Q60/22—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • G01Q60/42—Functionalisation
GBGB1710982.8A 2017-07-07 2017-07-07 Metal nanowires Ceased GB201710982D0 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
GBGB1710982.8A GB201710982D0 (en) 2017-07-07 2017-07-07 Metal nanowires
PCT/EP2018/068282 WO2019008108A1 (en) 2017-07-07 2018-07-05 Atomic force microscopy probes with an assembly of metal nanowires and dielectrophoretic method for attaching and detaching said metal nanowires to and from said probes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB1710982.8A GB201710982D0 (en) 2017-07-07 2017-07-07 Metal nanowires

Publications (1)

Publication Number Publication Date
GB201710982D0 true GB201710982D0 (en) 2017-08-23

Family

ID=59676765

Family Applications (1)

Application Number Title Priority Date Filing Date
GBGB1710982.8A Ceased GB201710982D0 (en) 2017-07-07 2017-07-07 Metal nanowires

Country Status (2)

Country Link
GB (1) GB201710982D0 (en)
WO (1) WO2019008108A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113219211B (en) * 2021-04-28 2022-02-22 西安交通大学 Preparation method of nano probe

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3557589B2 (en) * 2002-03-27 2004-08-25 株式会社ユニソク Method of manufacturing probe for scanning probe microscope, probe manufactured by the method, and manufacturing apparatus
AU2003294586A1 (en) * 2002-12-09 2004-06-30 The University Of North Carolina At Chapel Hill Methods for assembly and sorting of nanostructure-containing materials and related articles
WO2011068999A2 (en) * 2009-12-02 2011-06-09 Carbon Design Innovations, Inc. Carbon nanotube based composite surface enhanced raman scattering (sers) probe

Also Published As

Publication number Publication date
WO2019008108A1 (en) 2019-01-10

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)