GB1559247A - Photovoltaic cell array - Google Patents
Photovoltaic cell array Download PDFInfo
- Publication number
- GB1559247A GB1559247A GB50259/77A GB5025977A GB1559247A GB 1559247 A GB1559247 A GB 1559247A GB 50259/77 A GB50259/77 A GB 50259/77A GB 5025977 A GB5025977 A GB 5025977A GB 1559247 A GB1559247 A GB 1559247A
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- 229910052751 metal Inorganic materials 0.000 claims description 57
- 239000002184 metal Substances 0.000 claims description 57
- 239000010408 film Substances 0.000 claims description 55
- 239000000919 ceramic Substances 0.000 claims description 53
- 239000000758 substrate Substances 0.000 claims description 51
- 239000000463 material Substances 0.000 claims description 33
- 239000004065 semiconductor Substances 0.000 claims description 29
- AQMRBJNRFUQADD-UHFFFAOYSA-N copper(I) sulfide Chemical compound [S-2].[Cu+].[Cu+] AQMRBJNRFUQADD-UHFFFAOYSA-N 0.000 claims description 24
- 229910052980 cadmium sulfide Inorganic materials 0.000 claims description 23
- WUPHOULIZUERAE-UHFFFAOYSA-N 3-(oxolan-2-yl)propanoic acid Chemical compound OC(=O)CCC1CCCO1 WUPHOULIZUERAE-UHFFFAOYSA-N 0.000 claims description 22
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 21
- 239000010949 copper Substances 0.000 claims description 20
- 229910052802 copper Inorganic materials 0.000 claims description 18
- 238000000034 method Methods 0.000 claims description 18
- 238000012216 screening Methods 0.000 claims description 16
- 229910044991 metal oxide Inorganic materials 0.000 claims description 15
- 150000004706 metal oxides Chemical class 0.000 claims description 15
- 239000011248 coating agent Substances 0.000 claims description 14
- 238000000576 coating method Methods 0.000 claims description 14
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 14
- 239000010409 thin film Substances 0.000 claims description 14
- 239000003795 chemical substances by application Substances 0.000 claims description 13
- 239000011521 glass Substances 0.000 claims description 13
- 238000004519 manufacturing process Methods 0.000 claims description 12
- 229910010293 ceramic material Inorganic materials 0.000 claims description 9
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 8
- BERDEBHAJNAUOM-UHFFFAOYSA-N copper(I) oxide Inorganic materials [Cu]O[Cu] BERDEBHAJNAUOM-UHFFFAOYSA-N 0.000 claims description 8
- 229940112669 cuprous oxide Drugs 0.000 claims description 8
- KRFJLUBVMFXRPN-UHFFFAOYSA-N cuprous oxide Chemical compound [O-2].[Cu+].[Cu+] KRFJLUBVMFXRPN-UHFFFAOYSA-N 0.000 claims description 8
- 229910052725 zinc Inorganic materials 0.000 claims description 8
- 239000011701 zinc Substances 0.000 claims description 8
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 7
- 229910052737 gold Inorganic materials 0.000 claims description 7
- 239000010931 gold Substances 0.000 claims description 7
- 229910052697 platinum Inorganic materials 0.000 claims description 7
- 229910052709 silver Inorganic materials 0.000 claims description 7
- 239000004332 silver Substances 0.000 claims description 7
- 230000004888 barrier function Effects 0.000 claims description 6
- 239000004020 conductor Substances 0.000 claims description 5
- 229910000431 copper oxide Inorganic materials 0.000 claims description 5
- 230000008021 deposition Effects 0.000 claims description 5
- 150000002739 metals Chemical class 0.000 claims description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 5
- 229920004439 Aclar® Polymers 0.000 claims description 2
- 229920002799 BoPET Polymers 0.000 claims description 2
- 229910001111 Fine metal Inorganic materials 0.000 claims description 2
- 239000005041 Mylar™ Substances 0.000 claims description 2
- 241000206607 Porphyra umbilicalis Species 0.000 claims description 2
- 239000012298 atmosphere Substances 0.000 claims description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 2
- 229920006333 epoxy cement Polymers 0.000 claims description 2
- 239000011368 organic material Substances 0.000 claims description 2
- 239000001301 oxygen Substances 0.000 claims description 2
- 229910052760 oxygen Inorganic materials 0.000 claims description 2
- 239000005023 polychlorotrifluoroethylene (PCTFE) polymer Substances 0.000 claims description 2
- 230000001681 protective effect Effects 0.000 claims description 2
- 239000002923 metal particle Substances 0.000 claims 5
- FRLJSGOEGLARCA-UHFFFAOYSA-N cadmium sulfide Chemical compound [S-2].[Cd+2] FRLJSGOEGLARCA-UHFFFAOYSA-N 0.000 claims 1
- 239000007788 liquid Substances 0.000 claims 1
- 210000004027 cell Anatomy 0.000 description 68
- 229940116367 cadmium sulfide Drugs 0.000 description 18
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- 239000004033 plastic Substances 0.000 description 8
- 229920003023 plastic Polymers 0.000 description 8
- 239000001856 Ethyl cellulose Substances 0.000 description 7
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 7
- WMWLMWRWZQELOS-UHFFFAOYSA-N bismuth(III) oxide Inorganic materials O=[Bi]O[Bi]=O WMWLMWRWZQELOS-UHFFFAOYSA-N 0.000 description 7
- 229920001249 ethyl cellulose Polymers 0.000 description 7
- 235000019325 ethyl cellulose Nutrition 0.000 description 7
- 230000008569 process Effects 0.000 description 7
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 description 6
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 6
- 241000779819 Syncarpia glomulifera Species 0.000 description 6
- ADCOVFLJGNWWNZ-UHFFFAOYSA-N antimony trioxide Chemical compound O=[Sb]O[Sb]=O ADCOVFLJGNWWNZ-UHFFFAOYSA-N 0.000 description 6
- 239000001739 pinus spp. Substances 0.000 description 6
- 238000005245 sintering Methods 0.000 description 6
- 239000000243 solution Substances 0.000 description 6
- 229940036248 turpentine Drugs 0.000 description 6
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 5
- 238000003491 array Methods 0.000 description 5
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 239000005751 Copper oxide Substances 0.000 description 3
- 239000000020 Nitrocellulose Substances 0.000 description 3
- 229910000464 lead oxide Inorganic materials 0.000 description 3
- 229910052759 nickel Inorganic materials 0.000 description 3
- 229920001220 nitrocellulos Polymers 0.000 description 3
- YEXPOXQUZXUXJW-UHFFFAOYSA-N oxolead Chemical compound [Pb]=O YEXPOXQUZXUXJW-UHFFFAOYSA-N 0.000 description 3
- 229910052763 palladium Inorganic materials 0.000 description 3
- 239000002985 plastic film Substances 0.000 description 3
- 239000004848 polyfunctional curative Substances 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
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- 239000000080 wetting agent Substances 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- 229910001209 Low-carbon steel Inorganic materials 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 238000006731 degradation reaction Methods 0.000 description 2
- 238000004070 electrodeposition Methods 0.000 description 2
- 229920002457 flexible plastic Polymers 0.000 description 2
- 239000005337 ground glass Substances 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 229920006255 plastic film Polymers 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 150000003839 salts Chemical class 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 238000007740 vapor deposition Methods 0.000 description 2
- 239000000037 vitreous enamel Substances 0.000 description 2
- PCTMTFRHKVHKIS-BMFZQQSSSA-N (1s,3r,4e,6e,8e,10e,12e,14e,16e,18s,19r,20r,21s,25r,27r,30r,31r,33s,35r,37s,38r)-3-[(2r,3s,4s,5s,6r)-4-amino-3,5-dihydroxy-6-methyloxan-2-yl]oxy-19,25,27,30,31,33,35,37-octahydroxy-18,20,21-trimethyl-23-oxo-22,39-dioxabicyclo[33.3.1]nonatriaconta-4,6,8,10 Chemical compound C1C=C2C[C@@H](OS(O)(=O)=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2.O[C@H]1[C@@H](N)[C@H](O)[C@@H](C)O[C@H]1O[C@H]1/C=C/C=C/C=C/C=C/C=C/C=C/C=C/[C@H](C)[C@@H](O)[C@@H](C)[C@H](C)OC(=O)C[C@H](O)C[C@H](O)CC[C@@H](O)[C@H](O)C[C@H](O)C[C@](O)(C[C@H](O)[C@H]2C(O)=O)O[C@H]2C1 PCTMTFRHKVHKIS-BMFZQQSSSA-N 0.000 description 1
- CPELXLSAUQHCOX-UHFFFAOYSA-M Bromide Chemical compound [Br-] CPELXLSAUQHCOX-UHFFFAOYSA-M 0.000 description 1
- 229910021589 Copper(I) bromide Inorganic materials 0.000 description 1
- 229910021591 Copper(I) chloride Inorganic materials 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical class [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 229910021626 Tin(II) chloride Inorganic materials 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 1
- 210000003850 cellular structure Anatomy 0.000 description 1
- 229920002678 cellulose Polymers 0.000 description 1
- 239000001913 cellulose Substances 0.000 description 1
- 238000005524 ceramic coating Methods 0.000 description 1
- OXBLHERUFWYNTN-UHFFFAOYSA-M copper(I) chloride Chemical compound [Cu]Cl OXBLHERUFWYNTN-UHFFFAOYSA-M 0.000 description 1
- 229940045803 cuprous chloride Drugs 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000009713 electroplating Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000009472 formulation Methods 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 229910001092 metal group alloy Inorganic materials 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 238000010943 off-gassing Methods 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000012266 salt solution Substances 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 235000012239 silicon dioxide Nutrition 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 229910052714 tellurium Inorganic materials 0.000 description 1
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 description 1
- 239000002562 thickening agent Substances 0.000 description 1
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 1
- 229910001887 tin oxide Inorganic materials 0.000 description 1
- HPGGPRDJHPYFRM-UHFFFAOYSA-J tin(iv) chloride Chemical compound Cl[Sn](Cl)(Cl)Cl HPGGPRDJHPYFRM-UHFFFAOYSA-J 0.000 description 1
- 238000005019 vapor deposition process Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
- H01L31/0264—Inorganic materials
- H01L31/0328—Inorganic materials including, apart from doping materials or other impurities, semiconductor materials provided for in two or more of groups H01L31/0272 - H01L31/032
- H01L31/0336—Inorganic materials including, apart from doping materials or other impurities, semiconductor materials provided for in two or more of groups H01L31/0272 - H01L31/032 in different semiconductor regions, e.g. Cu2X/CdX hetero- junctions, X being an element of Group VI of the Periodic Table
- H01L31/03365—Inorganic materials including, apart from doping materials or other impurities, semiconductor materials provided for in two or more of groups H01L31/0272 - H01L31/032 in different semiconductor regions, e.g. Cu2X/CdX hetero- junctions, X being an element of Group VI of the Periodic Table comprising only Cu2X / CdX heterojunctions, X being an element of Group VI of the Periodic Table
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
- H01L31/036—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes
- H01L31/0392—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by their crystalline structure or particular orientation of the crystalline planes including thin films deposited on metallic or insulating substrates ; characterised by specific substrate materials or substrate features or by the presence of intermediate layers, e.g. barrier layers, on the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/042—PV modules or arrays of single PV cells
- H01L31/0445—PV modules or arrays of single PV cells including thin film solar cells, e.g. single thin film a-Si, CIS or CdTe solar cells
- H01L31/046—PV modules composed of a plurality of thin film solar cells deposited on the same substrate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Sustainable Development (AREA)
- Life Sciences & Earth Sciences (AREA)
- Sustainable Energy (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Photovoltaic Devices (AREA)
Description
(54) PHOTOVOLTAIC CELL ARRAY
(71) We, SES, INCORPORATED, a corporation organized and existing under the laws of the State of Delaware, United States of America, of One Tralee Industrial Park,
Newark, State of Delaware 19711, United
States of America assignee: LEE Rov ULLERY, JR.), do hereby declare the invention, for which we pray that a patent may be granted to us, and the method by which it is to be performed, to be particularly described in and by the following statement: This invention relates generally to solar cell arrays and a method of making them.
More particularly, the invention relates to an integrated array of thin-film,-photovoltaic cells connected in series and/or parallel and a method of making it.
Since each commonly known. individual solar cell generates only a small amount of power, usually much less power than is required for most applications, the desired voltage and current are realized by interconnecting a plurality of solar cell array, and generates electrical energy from solar radiation for a variety of uses.
Solar cell arrays can be made manually by bonding the individual cells to a suitable support in the desired configuration and connecting, e.g. by soldering, the electrical leads of the individual cells in the necessary manner to give the desired voltage and current. Manual construction of arrays suffers from a number of disadvantages, including cumbersome and difficult construction methods, expense, faulty connections, and the like. An integrated array and method of making it as described in U.S.
Patent No. 3,483,038, issued December 9,
1969 to Hui et al. The patented array comprises a substrate of flexible plastic insulating material such as polyimide plastic to which a plurality of serially connected individual cells are integrally united. The individual cells comprise a bottom electrode of a three-layered metal film covered by a film of an n-type semiconductor such as cadmium sulfide and a film of p-type semiconductor such as cuprous sulfide to form a barrier layer, and a top electrode of a thin film of metal such as tellurium.
The use of flexible plastic films of the prior art as substrates has certain disadvantages. Many of the plastics are air and water permeable to a certain degree which makes it impossible to completely hermetically seal the final cell array and can result in degradation of the cell components over a period of time as air and water diffuse into the cell. It is frequently difficult to bond the metal electrode to the plastic. The plastic substrate is too flexible for many uses and cell manufacturing techniques, so rigidity must be built in by later encapsulation, or the flexible substrate must be supported with a rigid structure. Bonding the plastic film to a rigid structure can produce degradation of the film by mechanical deforming of the film from bonding pressures, or from heat used in thermal bonding or from solvents used in adhesives. Many plastics have absorption peaks in the infrared, resulting in high temperatures in use when these plastics are usde in photovoltaic cell construction. Flexing of the substrate over a period of time of use tends to break down the films in the cells, reducing their output and shortening their life. The infierent flexibility of plastic substrate material increases processing complexity, since in order to obtain high resolution of array cells, the plastic film can not be subjected to stresses during the manufacturing process which would cause stretching and buckling. Use of a plastic substrate limits the temperature to which the cell can be subjected during fabrication.
Abrahamsohn in U.S. 3.376, 163 issued
April 2, 1968, illustrates the use of commercially available conductive glass as a cell substrate. These are glasses that have a thin layer of conductive tin oxide on the surface. These glasses are typically produced by spraying a solution of tin chloride on hot glass, above 800"F. See U.S. Patent
Specification No. 2.648,753, for a description of the process. This process has several disadvantages. Because the tin salt solution is sprayed onto a hot glass surface, the conductive layer is continuous on the surface of the glass and it is not possible to obtain the complicated grid pattern needed to obtain a parallel or series array of cells on a simple substrate.
According to the present invention there is provided an integrated array of connected, thin film, photo-voltaic cells comprising:
a substrate of electrically insulative ceramic material;
and a plurality of thin film photovoltaic cells integrally united to a major surface of said substrate in a spaced-apart relationship, each of said cells comprising:
an electrically conductive ceramic bottom electrode; united to said major surface of said substrate;
a film of first semiconductor material of one type conductivity covering and overlapping all but a portion adjacent an edge of said bottom electrode;
a film of second semiconductor material of opposite type conductivity and forming a p-n junction with the first semiconductor material and;
a top electrode, in contact with said second semiconductor material and which allows radiant energy to pass into the second semiconductor material, selected ones of said top and bottom electrodes of the cells being connected to selected top and bottom electrodes of respective adjacent cells to connect said cells in a series or parallel arrangement.
The present invention also provides a method of making an integrated array of connected, thin-film, photovoltaic cells comprising:
providing a substrate of electrically insulative ceramic material;
coating a major surface of said substrate with a plurality of electrically conductive ceramic bottom electrodes, a separate one of said bottom electrodes being for each of said cells;
coating each of said bottom electrodes, except for a portion adjacent an edge thereof with a film of first semiconductor material of one type conductivity;
coating each of said films of one type conductivity with a relatively thin film of second semiconductor material of an opposite type conductivity, and forming a p-n junction therewith;
attaching a radiant energy transmitting top electrode on each of said second semiconductor films, and connecting selected top and bottom electrodes of the cells with selected top and bottom electrodes of respective adjacent cells to provide series or parallel arrangement of the cells; wherein; in order to form the substrate and bottom electrodes a paste of electrically conducive ceramic is coated on a substrate of electrically insulative ceramic, and the c'oated substrate is heat treated to 'dory and remove screening materials from said paste and to bond said electrically conductive ceramic to said substrate.
The insulative ceramic substrate and conductive ceramic electrode provide a number
of advantages over the prior art. Good bonds between the substrate and bottom electrode and good adhesion of the cadmium sulfide film to the bottom electrode are obtained. The ceramic substrate provides sufficient rigidity to reduce flexurally induced damage to finished arrays. Higher temperatures can be used in the manufacture of the arrays. The ceramic substrate and conductive ceramic electrode have excellent vacuum processing characteristics, allowing high temperatures of operation with minimal outgassing. The rigidity of the substrate of this invention allows a high degree of resolution of array cells to be obtained during manufacture. Good hermetic seals can be obtained to exclude air and water.
The present invention will now be further described with reference to the accompanying drawings in which : - Figure 1 is a plan view of one embodiment of an integrated array with cells in a side by side relationship and connected serially.
Figure 2 is a cross-sectional view of cell
12 taken along line 2-2 of Fig. 1 showing the layers of the individual cell.
Referring to Figures 1 and 2 of the drawings, there is shown an integrated array of a plurality of serially connected, thin-film photovoltaic cells 11, 12 and 13, integrally formed on and united to a substrate 10 of insulating ceramic material. Although the integrated array described and illustrated herein as only three cells for the sake of clarity of explanation, the integrated array may have as many cells as are convenient and practical for any particular application.
A row of cells in a side by side configuration
and connected in series is shown; however, a plurality of rows of cells can be provided wherein some or all of the rows are connected in parallel with each other, as desired,
to nrovide a predetermined power output.
The substrate is an insulative ceramic and is capable of withstanding high temperatures.
The ceramic substrate has sufficient rigidity to structurallv support a number of individual cells. While ceramic materials can be
used, a particularly suitable substrate is sheet metal coated, preferably on one side, with a thin laver of ceramic. The metal im
parts structural strength to an array and
can be made sufficiently thin to impart
some degree of flexibility if desired. More
over, the use of metal facilitates overall
fabrication of solar ^ collec'tors - especiall-y where heat exchange means are provided to
remove. 'thermal energy. Ceramic coated metal is readily avàilablé as it' is used with in the appliance industry for refrigerators, stoves, and the like and in the construction industry as panels for commercial buildings such as service stations. A suitable material is, for example, "Mirawal," a registered trademark of Kaiser Aluminum Company for cold rolled low-carbon steel sheets having a continuous coating of vitreous enamel on at least one side of the sheet. Desirable thickness of the sheet metal ranges from about 0.005 to about 0.030 inches, although thicknesses from about 0.012 to about 0.025 inches are also suitable. The thickness of the ceramic coat should be sufficient to insulate the sheet metal from the bottom electrode and desirably ranges from about .0015 to about 0.012 inches, although thicknesses from about 0.0025 to about 0.0065 are also suitable. The ceramic coating should be free from pinholes or other defects which would tend to result in short circuits to the sheet metal.
The individual cells are integrally formed on and united to the substrate. Any desired configuration can be used other than that given in Figure 1 for illustrative purposes.
Each cell comprises a number of thin layers which, for the sake of clarity, are shown in an exaggerated manner in the drawing. The construction of a typical cell, e.g. cell 12, will be described in detail.
Substrate 10 comprising mild steel 16 coated with a thin film of insulating vitreous enamel 17 is coated with a thin layer of conductive ceramic material 18. This conductive ceramic layer 18 provides the bottom electrode of the cell assembly and is represented by the area ABCDEF in Figure 1 for cell 11. The conductive ceramic layer is applied as a paste to substrate 10 .by suitable means such as silk screening, hand or machine dipping or by spraying through a suitably apertured mask. After application to substrate 10, ceramic conductive layer 18 is suitably cured. Such curing process typically involves first drying at temneratures of from about 75"C to about 1500C for times ranging from about 0.05 to about 1 hour, preferably from about 0.1 to about 1 hour.
Higher temperatures will require short drying times and vice-versa. Temperatures outside the above limits are useful but too low a temperature will require long drying time which will be uneconomical, whereas too high a drying temperature can result in poor adherence of and/or voids in the conductive ceramic layer due to rapid evaporation of solvent from the paste. Drying is followed by burn-out in air of organic materials such as organic screening materials such as resins, plasticisers: hardeners, wetting agents, thickeners and the like used in the paste formulations, Burn-out is typically carried out in air for 'from about 0.05 to about 1 hour ilnd at temperatures ranging from about 100"C to about 500"C, preferably from about 1500C to about 500"C and more preferably from about 250"C to about 400"C. After burn-out, the conductive ceramic paste is fired in a neutral atmosphere such as nitrogen, argon, helium, and the like for about 0.05 to about 1 hour at peak temperatures ranging from about 500"C to about 1200"C, preferably from about 500 C to about 1100 C, more preferably from about 500 C to about 1000"C and yet more preferably from about 500"C to about 950"C. This firing results in the sintering of the paste into a solid layer, and the adherence of the layer to the ceramic surface 17 of the substrate. Upon sintering the edges of the bottom electrode will be found to be rounded rather than sharp, which facilitates vapor deposition of a cadmium sulfide film 20 over the edges of the bottom electrode to the substrate 10, thus protecting the bottom edectrode from deposition of copper during a barriering process. A copper layer would establish electrical contact between the bottom electrode and the barrier layer. Also, if sharp corners were present instead of rounded corners, the possibility of thin spots or pin holes in the cadmium sulfide film exists.
Suitable conductive ceramic pastes comprise: from about 30 to about 85 percent by weight and preferably from about 40 to about 75 percent by weight of a metal having a high electrical conductivity, such as, for example, nickel, silver, gold, palladium, platinum and copper with copper being preferred; from about 1 to about 40, preferably from about 1 to about 20 percent by weight of a metal oxide capable of forming, upon firing, a metal oxide -- silica complex, thus allowing the conductive metal to wet the complex of the fired paste, copper oxide being preferred and of the copper oxides, cuprous and cupric, cuprous oxide being preferred; from about 3 to about 30 percent by weight, preferably from about 3 to about 20 percent by weight of a ground ( < 400 mesh) glass frit (powder), optionally from about 1 to about 20 percent by weight of a fluxing agent such as bismuth trioxide, antimony trioxide, lead oxide and the like, bismuth trioxide being preferred; from about 1 to about 10 percent by weight of a suitable screening agent such as ethyl cellulose, nitrocellulose and the like: and from about 1 to about 50, preferably from about 5 to about 45 percent by weight of a suitable solvent such as turpentine, pine oil. naptha, and the like. The screening agent is typically used in solution with a suitable solvent such as turpentine, pine oil. naDtha. and the like.
The concentration of the screening agent in the solvent tvnicallv ranges from about 10 to about 50 percent by weight. A paste comnosition that when dried and fired hns been found to produce a copper-containing con ductor with good electrical characteristics, excellent soldering and electroplating characteristics and good adhesion to the substrate is as follows: 66% wt. copper powder sleved to < 400 mesh (37 microns), (Fernlock D-100, U.S. Bronze, Flemington, N.J.), 9% wt. cuprous oxide, 5% wt. bismuth trioxide, 5% wt. glass frit (Pemco S-2120-P manufactured by SCM Corp. of Baltimore,
Maryland), 12% wt. of MM5 ethyl cellulose based screening vehicle (1.2% ethyl cellulose based screening vehicle (1.2% ethyl cellulose; 0.6% Poly-Pale (registered Trade
Mark) resin hardener, Hercules; 0.12% CO430 non-ionic wetting agent, GAF; 10.08% pine oil) and 3% wt pine oil (solvent). The fired conductive ceramic layer typically has a thickness ranging from about 0.3 mils to about 2.0 mils, preferably from about 0.7 mils to about 1.2 mils. After sintering of this type of paste, the electrically conductive metal-containing bottom electrode will contain from about 70 to about 85 percent by -weight of a metal in the zero valent state, from about 10 to about 20 percent by weight of ceramic and from about 5 to about 10 percent by weight of the metal oxide which is believed to form a complex with said ceramic.
Ceramic pastes having lower metal contents than the above described pastes can also be used. With lower metal content, the sintered conductive ceramic layer is advantageously electroplated with a metal having a high electrical conductivity such as, for example, silver, gold, platinum or copper, with copper being the preferred metals. The electrodeposition processes used are those which are well known in the art and are suitably adapted by those skilled in the art to the particular metal being deposited. Suitable conductive ceramic pastes encompassing the lower metal contents comprise from about 5 to about 40 and preferably from about 10 to about 30 percent by weight of a metal having a high electrical conductivity; such as, for example, nickel, silver, gold, palladium, platinum and copper with copper being preferred; from about 15 to about 75, preferablv from about 20 to about 40 percent by weight of a metal oxide capable of forming. upon firing, a metal oxidesilica complex. thus allowing the conductive metal to wet the complex of the fired paste, copper oxide being preferred; and of the copper oxides. cuprous and cupric, cuprous being preferred; from about 2 to about 60, preferably from about 3 to about 50 percent by weight of a ground glass frit ( < 400 mesh): optionallv from about 1 to about -Z0 percent by weight of a fluxing agent such as bismuth trioxide. antimony trioxide. lead oxide and the like, busmuth trioxide being preferred; fmm about 0.05 to about 10 Dercent by weight of a suitable screening agent such as ethyle cellulose, nitrocellulose and the like; and from about 1 to about 50, preferably from about 5 to about 45 percent by weight of a suitable solvent such as turpentine, pine oil, naptha, and the like.
The screening agent is typically used in solution with a suitable solvent such as turpentine, pine oil, naptha, and the like.
The concentration of the screening agent in the solvent typically ranges from about 2 to about 40 percent by weight. A paste composition that when dried and fired has been found to produce a low metal-containing conductive ceramic film that is readily electroplatable and has good adhesion to the substrate is as follows: 15% wt. copper
flake powder with the individual flakes having, on the average, a length of about 5-15 microns and a width of about 1-5 microns (MD 955 copper Flake-Alcan
Metals), 28% wt. cuprous oxide, 12.4% wt.
bismuth trioxide, 12.4% glass frit (S-2120-P
Glass, 400 mesh (37 microns) PEMCO), 28.2% MM22 ethylcellulose based screening vehicle (2.82% ethyl cellulose; 1.41% Poly
Pale (registered Trade Mark) resin hard
ener, Hercules; 0.28% CO-430 non-ionic wetting agent, GAF; 23.69% pine oil), 4% wt. pine oil. After sintering of this type of
paste, the electrically conductive, metal
containing bottom electrode will contain from about 5 to about 70 percent by weight of a metal in the zero valent state, from about 5 to about 50 percent by weight of
ceramic and from about 5 to about 60 percent by weight of the metal oxide.
In general, the conductive ceramic paste
will comprise from about 5 to about 85 percent by weight and preferably from about 10 to about 75 percent by weight of the metal having a high electrical conductivity, such as, for example, nickel, silver, gold, palladium, platinum and copper with copper being preferred; from about 1 to about 75,
preferably from about 1 to about 60 percent by weight of a metal oxide capable of forming, upon firing, a metal oxide -- silica cor - plex, thus allowing the conductive metal to wet the complex of the fired paste, copper oxide being preferred, and of the copper oxides, cuprous and cupric,.cuprous oxide being preferred; from about 2 to about 60, preferably from about 3 to about 50 percent by weight of a ground glass frit ( < 400 mesh); optionallv from about 1 to about 20 percent by weight of a fluxing agent such as bismuth trioxide, antimony trioxide. lead oxide and the like, bismuth trioxide being preferred; from about 0.05 to about 10 percent by weight of a suitable screening agent such as ethyl cellulose, nitrocellulose and the like; and from about 1 to about 50, -preferahly nitrocelluldse and the like; and from about 1 to about 50, preferably from about 5 to about 45 percent by weight of a
suitable solvent such as turpentine, pine oil,
naptha, and the like. The screening agent
is typically used in solution with a suitable
solvent such as turpentine, pine oil, naptha,
and the like. The concentration of the
screening agent in the solvent typically
ranges from about 2 to about 40 percent by
weight. After sintering, the electrically con
ductive, metal-containing bottom electrode
will contain from about 15 to about 85
percent by weight of zero valent metal,
from about 5 to about 50 percent by weight of ceramic and from about 5 to about 60
percent by weight of the metal oxide which
is believed to form a complex with said
ceramic.
Other methods of producing metal-con
taining conductive ceramic films are known
in the art and are considered within the
scope of this invention.
When the conductive metal in the conduc
tive ceramic layer is a metal of the type
which would form a rectifying barrier with
cadmium sulfide or would oxidize on the
surface to form a poor ohmic contact with
cadmium sulfide, then it is desirable to coat
the conductive ceramic with a transition
layer 19 of metal or metal alloy which
does not have the above drawbacks. Copper,
for example, would form a barrier with
cadmium sulfide. Aluminum would oxidize
and the layer of exposed aluminum oxide
would be an insulator and would give a
high resistance contact with cadmium sul
fide. Suitable metals for the metal transition
layer include gold, silver, platinum,
cadmium, zinc and alloys thereof. Zinc is
preferred. More than one layer of metal
may be deposited on the conductive ceramic
substrate.
The metal transition layer is applied to
the conductive ceramic layer in any suitable
manner. For example, it may be applied by
vapor deposition through a suitably aper
tured mask, by electrodeposition from a
solution of salts of the metal, or by contact
with a molten bath of metal. These pro
cesses are well known in the art and will be
suitably adapted by one skilled in the art
to the particular metal being deposited. The
metal transition layer will be applied in an
amount, for example, ranging from about
.0001 to about 0.01 gm/sq cm. preferably
from about 0.001 to about 0.002 gm/sq cm,
with zinc being a preferred metal.
The bottom electrode of the cell com
prises either the conductive ceramic layer,
or the conductive ceramic layer covered with
a metal transition layer when used. Upon
this bottom electrode a semiconductor ma
terial of n-type conductivity such as cadmium
sulfide film 20 is deposited. This can be done
in a known manner, such as through a suitably apertured mask from the vapor
state, in an amount of between about 0.05 gm/sq cm. and about 0.005 gm/sq cm. The cadmium sulfide film 20 covers and completely overlaps all but a small portion of the bottom electrode, this covered area being represented by ADEF shown in Figure 1 for cell 11. The uncovered portion is represented by the area ABCD and can be used subsequently either for electrical connecting means to an adjacent cell, such as the top electrode of an adiacent cell to make a series connection therewith as shown in
Figure 1, or for a negative output terminal such as 14. It is important that the cadmium sulfide film 20 in each of the cells 11-13 for example, overlaps the periphery of the bottom electrode 19, such as, the edges AF,
DE, and FE thereof, and extends to the s- rface of substrate 10 because the subsequent overlapping films and the top electrode in each cell must not contact the bottom electrode layers 19 or 18 thereof.
As discussed before, the use of a sintered ceramic bottom electrode facilitates this covering, since the sintering process produces rounded and filleted edge surfaces which are easily covered by cadmium sulfide during the vapor deposition process.
After deposition of the cadmium sulfide, a strip of insulating material 24, such as silicon dioxide or cured epoxy resin is deposited along the edge AD of the cadmium sulfide layer 20 as well as upon most of the substrate area extending beyond edge AD.
The purpose of the insulating film is to prevent a cuprous sulfide film 21 from coming in contact with the bottom electrode 19 which would short out the p-n junction between the cadmium sulfide and cuprous sulfide layers. This insulating layer 24 also allows the top electrode from one cell to be connected to the exposed part of the bottom electrode of an adiacent cell without shorting to its own bottom electrode.
The surface of the cadmium sulfide film 20 may be etched with hydrochloric acid for about W5 seconds, if desired, before the cuprous sulfide films are formed thereon, as described in Tanos, U.S. 3,480,473. The cuprous sulfide film 21 is formed in a suitable fashion such as, for example, deposition from the vapor state through a suitably apertured mask, over the cadmium sulfide film 20, or by contacting the cadmium sulfide film 20 with an aqueous solution of a cuprous salt as, for example, a cuprous chloride or bromide solution. as described in U.S. Patent
Specification 3,374,108. The cuprous sulfide film 21 will have a thickness between about 1000A and about 10,000A.
A top electrode is fixed to each cell. The top electrode can suitably be any material of high electrical conductivity. It must allow, or be shaped to allow, light to reach the cuprous sulfide layer. Such electrodes are known in the art. Preferably, and as shown in Figure 1, the top electrode comprises a
plurality of electrode strips 22 which ter
minate in tab 23 at one end, AD, and in a bar at end FE. The electrode strips are
placed in electrical contact with the cuprous
sulfide film 21 while tab 23 extends over
insulating strip 24 to electrically contact a
portion BCJI, of bottom electrode 19 of an
adjacent cell to electrically connect the two
cells in series. As shown, the top electrode
for cell 12 connects with the bottom elec
trode of cell 11, and the bottom electrode
of cell 11, and the bottom electrode of cell
12 is connected to the top electrode of cell
13. For end cell 11, the top electrode tab will
be the positive terminal 15 for the array.
The top electrode may be provided in
any known manner, such as by deposition
through a suitably apertured mask from the
vapor state over the cuprous sulfide film 21.
Alternatively, the top electrode may be
vapor deposited on a flexible insulating film
25 such as Mylar, (registered Trade Mark),
Aclar, TFE and then the film 25 pressed
onto the cell with top electrode strips 22
in contact with cuprous sulfide film 21
and held in place with light transmissive
epoxy cement 26. The top electrode can also be a grid, or mesh, of fine metal wire
which is attached to the cuprous sulfide film.
The top electrode may be any suitable elec
trical conductor having a high electrical con
ductivity, which forms a good ohmic con
tact with cuprous sulfide film 21, and which
will not form a barrier junction with the
cuprous sulfide film. Suitable electrical con
ductors are, for example, metals such as
gold. platinum and silver.
The finished cell assembly is typically heat treated, e.g., at 200"C for 10 minutes
and sealed with a protective light transmit
ting coating, a film or plate 27 of a material
such as glass or the like. The film should
be impervious to oxygen and water vapour
which would degrade the cell.
Tn operation, the cells, 11, 12, and 13
convert light into electrical energy when they
are exposed to light. In each cell, light energy
passes through the area not cov
Claims (19)
- **WARNING** start of CLMS field may overlap end of DESC **.in Figure 1, the top electrode comprises a plurality of electrode strips 22 which ter minate in tab 23 at one end, AD, and in a bar at end FE. The electrode strips are placed in electrical contact with the cuprous sulfide film 21 while tab 23 extends over insulating strip 24 to electrically contact a portion BCJI, of bottom electrode 19 of an adjacent cell to electrically connect the two cells in series. As shown, the top electrode for cell 12 connects with the bottom elec trode of cell 11, and the bottom electrode of cell 11, and the bottom electrode of cell12 is connected to the top electrode of cell 13. For end cell 11, the top electrode tab will be the positive terminal 15 for the array.The top electrode may be provided in any known manner, such as by deposition through a suitably apertured mask from the vapor state over the cuprous sulfide film 21.Alternatively, the top electrode may be vapor deposited on a flexible insulating film25 such as Mylar, (registered Trade Mark), Aclar, TFE and then the film 25 pressed onto the cell with top electrode strips 22 in contact with cuprous sulfide film 21 and held in place with light transmissive epoxy cement 26. The top electrode can also be a grid, or mesh, of fine metal wire which is attached to the cuprous sulfide film.The top electrode may be any suitable elec trical conductor having a high electrical con ductivity, which forms a good ohmic con tact with cuprous sulfide film 21, and which will not form a barrier junction with the cuprous sulfide film. Suitable electrical con ductors are, for example, metals such as gold. platinum and silver.The finished cell assembly is typically heat treated, e.g., at 200"C for 10 minutes and sealed with a protective light transmit ting coating, a film or plate 27 of a material such as glass or the like. The film should be impervious to oxygen and water vapour which would degrade the cell.Tn operation, the cells, 11, 12, and 13 convert light into electrical energy when they are exposed to light. In each cell, light energy passes through the area not covered by top electrode strips 22 to the cuprous sulfide film 21 where it is at least partially absorbed thereby producing a voltage between the bottom electrode and the top electrode.Since this voltage for a photovoltaic, cadmium sulfide cell is typically about 0.4 0.5 volts, the cells 11-13 are connected m series to provide a desired voltage. The current capacities at the desired voltage may be increased by connecting a plurality of the serially connected rows of cells in parallel.WHAT WF CLAIM IS:- 1. An integrated array of connected, thin film, photovoltaic cells comprising: a substrate of electrically insulative ceramic material; and a plurality of thin film photovoltaic cells integrally united to a major surface of said substrate in a spaced-apart relationship, each of said cells comprising: an electrically conductive ceramic bottom electrode; united to said major surface of said substrate; a film of first semiconductor material of one type conductivity covering and over lapping all but a portion adjacent an edge of said bottom electrode; a film of second semiconductor material of opposite type conductivity and forming a p-n junction with the first semiconductor material and; a top electrode, in contact with said second semiconductor material and which allows radiant energy to pass into the second semiconductor material, selected ones of said top and bottom electrodes of the cells being connected to selected top and bottom electrodes of respective adjacent cells to connect said cells in a series or parallel arrangement.
- 2. An array as claimed in claim 1 wherein said substrate comprises sheet metal coated at least on one side with a thin layer of insulating ceramic.
- 3. An array as claimed in claim 1 or 2 wherein the bottom electrode comprises from 15 to 85 percent by weight of a metal, from 5 to 50 percent by weight of ceramic material and from 5 to60 percent by weight of a metal oxide.
- 4. An array as claimed in claim 3 wherein the bottom electrode comprises from 70 to 85 percent by weight of the metal, from 10 to 20 percent by weight of the ceramic material and from 5 to 10 percent by weight of the metal oxide.
- 5. An array as claimed in claim 3 or 4 wherein the bottom electrode comprises from 15 to 70 percent by weight of the metal.
- 6. An array as claimed in claim 3, 4 or 5 wherein said conductive ceramic is coated with at least one metal layer, one of which makes an ohmic contact with the first semiconductor material.
- 7. An array as claimed in claim 6 wherein said bottom electrode comprises copper and cuprous oxide, said metal coating is zinc, said first semiconductor material is cadmium sulfide and said second semicnnductor material is cuprous sulfide.
- 8. An array as claimed in any nne of claims 1 to 6 wherein said bottom electrode comprises copper and cuprous oxide, having deposited thereon a layer of copper and having further deposited thereon a laver of zinc, said first semiconductor material is cadmium sulfide and said second semicrn- ductor material is cuprous sulfide
- 9. A method of making an integrated array of connected, thin-film photovoltaic cells comprising:providing a substrate of electrically insulative ceramic material; coating a major surface of said substrate with a plurality of electrically conductive ceramic bottom electrodes, a separate one of said bottom electrodes being for each of said cells; coating each of said bottom electrodes, except for a portion adjacent an edge there.of, with a film of first semiconductor material of one type conductivity; coating each of said films of one type conductivity with a relatively thin film of second semiconductor material of an opposite type conductivity, and forming a p-n junction therewith; attaching a radiant energy transmitting top electrode on each of said second semiconductor films, and connecting selected top and bottom electrodes of the cells with selected top and bottom electrodes of respective adjacent cells to provide series or parallel arrangement of the cells; wherein, in order to form the substrate and bottom electrodes a paste of electrically conductive ceramic is coated on a substrate of electrically insulative ceramic, and the coated substrate is heat treated to dry and remove screening materials from said paste and to bond said electrically conductive ceramic to said substrate.
- 10. A method as claimed in claim 9 wherein said substrate comprises sheet metal coating at least on one side with a thin layer of ceramic and said electrically conductive ceramic paste comprises from 5 to 85 percent by weight of finely divided metal particles, from 1 to 75 percent by weight of a metal oxide, from 2 to 60 percent by weight cf a glass frit compatible with and capable of bonding with said substrate, and the remainder being a liquid carrying vehicle.
- 11. A method as claimed in claim 10 wherein said paste comprises from 30 to 85 percent by weight of the finely divided metal particles, from 1 to 40 percent by weight of the metal oxide and from 3 to 30 percent by weight of the glass frit.
- 12. A method as claimed in claim 10 or 11 wherein said paste comprises from about 5 to about 40 percent by weight of the metal particles.
- 13. A method as claimed in claim 10, 11 or 12 wherein the conducting ceramic is coated with at least one metal layer, one of which provides ohmic contact with the first semiconductor material, prior to coating the first semiconductor metal film.
- 14. A method as claimed in claim 13, wherein said metal particles are copper, said metal oxide comprises cuprous oxide, said metal coating is zinc, said first semiconductor material is cadmium sulfide, and said second semiconductor material is cuprous sulfide.
- 15. A method as claimed in claim 13 wherein said metal particles are copper, said metal oxide comprises cuprous oxide, said metal coating is a layer of copper and a layer of zinc with the zinc in ohmic contact with the first semiconductor material, said first semiconductor material is cadmium sulfide, and said second semiconductor material is cuprous sulfide.
- 16. A method as claimed in any one of claims 9 to 15 wherein the paste comprises a fluxing agent of from 1 to 20 percent by weight of a second metal oxide.
- 17. A method as claimed in any one of claims 9 to 16 wherein said paste is dried at a temperature of from 75"C to 1500C for 0.05 to 1 hour, heated at from 1000C to 500"C in air to burn out organic material, and fired at from 5000C to 11000C for from 0.05 to 1 hour in an inert atmosphere to fuse the conductive ceramic to the insulating ceramic substrate.
- 18. An integrated array of connected, thin film, photovoltaic cells substantially as hereinbefore described with reference to and as illustrated in the accompanying drawings.
- 19. A method of making an integrated array of connected, thin film, photovoltaic cells substantially as hereinbefore described with reference to and as illustrated in the accompanying drawings.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US74784976A | 1976-12-06 | 1976-12-06 | |
US05/827,927 US4127424A (en) | 1976-12-06 | 1977-08-26 | Photovoltaic cell array |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1559247A true GB1559247A (en) | 1980-01-16 |
Family
ID=27114832
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB50259/77A Expired GB1559247A (en) | 1976-12-06 | 1977-12-02 | Photovoltaic cell array |
Country Status (12)
Country | Link |
---|---|
JP (1) | JPS5370781A (en) |
BR (1) | BR7707957A (en) |
CA (1) | CA1085946A (en) |
DE (1) | DE2751393A1 (en) |
ES (2) | ES464679A1 (en) |
FR (1) | FR2373165A1 (en) |
GB (1) | GB1559247A (en) |
IL (1) | IL53276A (en) |
IN (1) | IN148687B (en) |
IT (1) | IT1091265B (en) |
MX (1) | MX144753A (en) |
NL (1) | NL7712838A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE202008008743U1 (en) * | 2008-07-02 | 2009-11-19 | Aleo Solar Ag | Photovoltaic solar module |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5821827B2 (en) * | 1979-02-09 | 1983-05-04 | 三洋電機株式会社 | photovoltaic device |
GB2117971A (en) * | 1982-04-05 | 1983-10-19 | Hitachi Ltd | Amorphous silicon photovoltaic device |
JPH0530369Y2 (en) * | 1984-10-09 | 1993-08-03 | ||
JPS62211060A (en) * | 1986-03-12 | 1987-09-17 | オリンパス光学工業株式会社 | High frequency treatment tool |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2820841A (en) * | 1956-05-10 | 1958-01-21 | Clevite Corp | Photovoltaic cells and methods of fabricating same |
FR1315539A (en) * | 1961-03-14 | 1963-01-18 | Western Electric Co | Set of solar cells for artificial satellites |
US3833425A (en) * | 1972-02-23 | 1974-09-03 | Us Navy | Solar cell array |
AU7005674A (en) * | 1974-03-01 | 1975-12-18 | Univ Delaware | Photovoltaic cell |
-
1977
- 1977-11-02 IL IL53276A patent/IL53276A/en unknown
- 1977-11-03 IN IN1585/CAL/77A patent/IN148687B/en unknown
- 1977-11-09 CA CA290,513A patent/CA1085946A/en not_active Expired
- 1977-11-17 DE DE19772751393 patent/DE2751393A1/en not_active Withdrawn
- 1977-11-22 NL NL7712838A patent/NL7712838A/en not_active Application Discontinuation
- 1977-11-25 MX MX171471A patent/MX144753A/en unknown
- 1977-11-30 BR BR7707957A patent/BR7707957A/en unknown
- 1977-12-02 GB GB50259/77A patent/GB1559247A/en not_active Expired
- 1977-12-02 IT IT69722/77A patent/IT1091265B/en active
- 1977-12-02 ES ES464679A patent/ES464679A1/en not_active Expired
- 1977-12-05 FR FR7736611A patent/FR2373165A1/en active Granted
- 1977-12-05 JP JP14649577A patent/JPS5370781A/en active Pending
-
1978
- 1978-03-17 ES ES467972A patent/ES467972A1/en not_active Expired
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE202008008743U1 (en) * | 2008-07-02 | 2009-11-19 | Aleo Solar Ag | Photovoltaic solar module |
Also Published As
Publication number | Publication date |
---|---|
JPS5370781A (en) | 1978-06-23 |
IT1091265B (en) | 1985-07-06 |
IL53276A (en) | 1980-06-30 |
MX144753A (en) | 1981-11-19 |
FR2373165A1 (en) | 1978-06-30 |
CA1085946A (en) | 1980-09-16 |
FR2373165B1 (en) | 1981-03-20 |
IL53276A0 (en) | 1978-01-31 |
ES464679A1 (en) | 1978-09-01 |
BR7707957A (en) | 1978-09-05 |
DE2751393A1 (en) | 1978-06-08 |
NL7712838A (en) | 1978-06-08 |
ES467972A1 (en) | 1978-11-01 |
IN148687B (en) | 1981-05-09 |
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