GB1320346A - Specimen stages for electron microscopes - Google Patents

Specimen stages for electron microscopes

Info

Publication number
GB1320346A
GB1320346A GB2491670A GB1320346DA GB1320346A GB 1320346 A GB1320346 A GB 1320346A GB 2491670 A GB2491670 A GB 2491670A GB 1320346D A GB1320346D A GB 1320346DA GB 1320346 A GB1320346 A GB 1320346A
Authority
GB
United Kingdom
Prior art keywords
pulley
axis
gimbal
drive
attached
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2491670A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Associated Electrical Industries Ltd
Original Assignee
Associated Electrical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Associated Electrical Industries Ltd filed Critical Associated Electrical Industries Ltd
Publication of GB1320346A publication Critical patent/GB1320346A/en
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

1320346 Electron microscopes ASSOCIATED ELECTRICAL INDUSTRIES Ltd 19 May 1971 [22 May 1970] 24916/70 Heading H1D A specimen stage for an electron microscope has a specimen holder supported in gimbals 2, 4 which can be tilted about two perpendicular axes by means which comprise two flexible drive members 26 and 31 connected at one end respectively to gimbals 2 and 4 and at the other end to respective drive means 6 and 8. One end of member 26 (made of wire) is connected to the circumference of drive pulley 6 and the other end to a pulley connected to gimbal 2 such that rotation of pulley 6 produced by push rod 15 rotates gimbal 2 about axis 3. Similarly rotation of drive pulley 8 produces rotation of gimbal 4 about axis 5. Drive pulley 8 is slidably held on a support bracket 11 and biased by spring 12 to retain wire 31 taut. Wires 30 and 31 are each attached to pulley 8 and to the same point 34 on the rim of the pulley 35 on axis 5. When the outer gimbal 2 is rotated about axis 3 the wires 30, 31 are wound or unwound on the pulleys 33, 37 on axis 3 causing pulley 8 to slide relative to bracket 11. The push rods 15, 16 are slid longitudinally in grooves provided in a support 14 (Fig. 5, not shown) by means of respective drive shafts 24, 25 coupled through universal telescopic joints to worm gears 22, 23. A return spring 40 (not shown) is attached to rod 16 and bias spring 12 acts as return spring for rod 15. The push rods are held in position by means of a stirrup 41 (Fig. 3, not shown) attached to the top of support 14 by means of which the specimen cartridge can be mounted in the electron microscope.
GB2491670A 1970-05-22 1970-05-22 Specimen stages for electron microscopes Expired GB1320346A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB2491670 1970-05-22

Publications (1)

Publication Number Publication Date
GB1320346A true GB1320346A (en) 1973-06-13

Family

ID=10219287

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2491670A Expired GB1320346A (en) 1970-05-22 1970-05-22 Specimen stages for electron microscopes

Country Status (5)

Country Link
US (1) US3714423A (en)
DE (1) DE2125105A1 (en)
FR (1) FR2093572A5 (en)
GB (1) GB1320346A (en)
NL (1) NL7106972A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1981003580A1 (en) * 1980-06-09 1981-12-10 Burevestnik Sample chamber for electron-sounding instrument

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4170737A (en) * 1978-07-06 1979-10-09 Spetsialnoe Konstruktorskoe Bjuro Biologicheskogo Priborotroenia Akademii Nauk SSSR Top-entry transmission electron microscope
US6891170B1 (en) * 2002-06-17 2005-05-10 Zyvex Corporation Modular manipulation system for manipulating a sample under study with a microscope
US6967335B1 (en) 2002-06-17 2005-11-22 Zyvex Corporation Manipulation system for manipulating a sample under study with a microscope
CN1871684B (en) * 2003-09-23 2011-08-24 塞威仪器公司 Method, system and device for microscopic examination employing fib-prepared sample grasping element
TW200531420A (en) 2004-02-20 2005-09-16 Zyvex Corp Positioning device for microscopic motion
US7319336B2 (en) 2004-02-23 2008-01-15 Zyvex Instruments, Llc Charged particle beam device probe operation
US7326293B2 (en) * 2004-03-26 2008-02-05 Zyvex Labs, Llc Patterned atomic layer epitaxy
US7786442B2 (en) * 2004-06-18 2010-08-31 General Electric Company Method and apparatus for ion source positioning and adjustment
KR102083193B1 (en) * 2013-11-25 2020-03-02 삼성전자주식회사 Robot cleaner

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1226228B (en) * 1959-07-24 1966-10-06 Max Planck Gesellschaft Movable preparation table for a body beam apparatus, in particular an electron microscope or electron diffraction device
GB1188026A (en) * 1966-04-06 1970-04-15 Jeol Ltd X-Ray Diffraction Apparatus.
US3566111A (en) * 1967-06-19 1971-02-23 Siemens Ag Apparatus for varying the detector slit width in fully focusing x-ray spectrometers

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1981003580A1 (en) * 1980-06-09 1981-12-10 Burevestnik Sample chamber for electron-sounding instrument

Also Published As

Publication number Publication date
US3714423A (en) 1973-01-30
NL7106972A (en) 1971-11-24
FR2093572A5 (en) 1972-01-28
DE2125105A1 (en) 1971-12-02

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PLNP Patent lapsed through nonpayment of renewal fees