GB1302193A - - Google Patents

Info

Publication number
GB1302193A
GB1302193A GB2000569A GB1302193DA GB1302193A GB 1302193 A GB1302193 A GB 1302193A GB 2000569 A GB2000569 A GB 2000569A GB 1302193D A GB1302193D A GB 1302193DA GB 1302193 A GB1302193 A GB 1302193A
Authority
GB
United Kingdom
Prior art keywords
ions
slit
time
deflection plates
spectrum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB2000569A
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of GB1302193A publication Critical patent/GB1302193A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/06Electron- or ion-optical arrangements
    • H01J49/061Ion deflecting means, e.g. ion gates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
GB2000569A 1969-04-18 1969-04-18 Expired GB1302193A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB2000569 1969-04-18

Publications (1)

Publication Number Publication Date
GB1302193A true GB1302193A (ja) 1973-01-04

Family

ID=10138774

Family Applications (1)

Application Number Title Priority Date Filing Date
GB2000569A Expired GB1302193A (ja) 1969-04-18 1969-04-18

Country Status (4)

Country Link
US (1) US3634683A (ja)
DE (1) DE2018297A1 (ja)
FR (1) FR2043434A5 (ja)
GB (1) GB1302193A (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3920566A1 (de) * 1989-06-23 1991-01-10 Bruker Franzen Analytik Gmbh Ms-ms-flugzeit-massenspektrometer
US5117107A (en) * 1987-12-24 1992-05-26 Unisearch Limited Mass spectrometer
US5120958A (en) * 1990-05-11 1992-06-09 Kratos Analytical Limited Ion storage device
US5180914A (en) * 1990-05-11 1993-01-19 Kratos Analytical Limited Mass spectrometry systems
EP1305452A1 (en) * 2000-07-14 2003-05-02 Epion Corporation Gcib size diagnostics and workpiece processing

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2540505A1 (de) * 1975-09-11 1977-03-24 Leybold Heraeus Gmbh & Co Kg Flugzeit-massenspektrometer fuer ionen mit unterschiedlichen energien
EP0304525A1 (en) * 1987-08-28 1989-03-01 FISONS plc Pulsed microfocused ion beams
DE4305363A1 (de) * 1993-02-23 1994-08-25 Hans Bernhard Dr Linden Massenspektrometer zur flugzeitabhängigen Massentrennung
DE4322102C2 (de) * 1993-07-02 1995-08-17 Bergmann Thorald Flugzeit-Massenspektrometer mit Gasphasen-Ionenquelle
DE4322101C2 (de) * 1993-07-02 1995-06-14 Bergmann Thorald Ionenquelle für Flugzeit-Massenspektrometer
US5614711A (en) * 1995-05-04 1997-03-25 Indiana University Foundation Time-of-flight mass spectrometer
US5712480A (en) * 1995-11-16 1998-01-27 Leco Corporation Time-of-flight data acquisition system
US5753909A (en) * 1995-11-17 1998-05-19 Bruker Analytical Systems, Inc. High resolution postselector for time-of-flight mass spectrometery
JP2004507037A (ja) * 2000-07-14 2004-03-04 エピオン コーポレイション Gcibのサイズ診断、及びワークピース加工
US7186972B2 (en) * 2003-10-23 2007-03-06 Beckman Coulter, Inc. Time of flight mass analyzer having improved mass resolution and method of operating same
US7501621B2 (en) * 2006-07-12 2009-03-10 Leco Corporation Data acquisition system for a spectrometer using an adaptive threshold

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2612607A (en) * 1947-04-05 1952-09-30 William E Stephens Mass spectrometer
GB780999A (en) * 1953-12-12 1957-08-14 Tno Improvements in or relating to mass spectrometers
US3307033A (en) * 1963-07-19 1967-02-28 William H Johnston Lab Inc Coincidence mass spectrometer with electrostatic means to separate positive and negative ions and detectors and method of use

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5117107A (en) * 1987-12-24 1992-05-26 Unisearch Limited Mass spectrometer
GB2233149B (en) * 1987-12-24 1992-07-15 Unisearch Ltd Mass spectrometer
DE3920566A1 (de) * 1989-06-23 1991-01-10 Bruker Franzen Analytik Gmbh Ms-ms-flugzeit-massenspektrometer
US5032722A (en) * 1989-06-23 1991-07-16 Bruker Franzen Analytik Gmbh MS-MS time-of-flight mass spectrometer
US5120958A (en) * 1990-05-11 1992-06-09 Kratos Analytical Limited Ion storage device
US5180914A (en) * 1990-05-11 1993-01-19 Kratos Analytical Limited Mass spectrometry systems
EP1305452A1 (en) * 2000-07-14 2003-05-02 Epion Corporation Gcib size diagnostics and workpiece processing
EP1305452A4 (en) * 2000-07-14 2007-12-26 Tel Epion Inc METHOD AND DEVICE FOR GAS CLUSTER ION BEAM SIZING AND WORKPIECE PROCESSING

Also Published As

Publication number Publication date
FR2043434A5 (ja) 1971-02-12
DE2018297A1 (de) 1970-11-12
US3634683A (en) 1972-01-11

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Legal Events

Date Code Title Description
PS Patent sealed [section 19, patents act 1949]
PLNP Patent lapsed through nonpayment of renewal fees