GB1302193A - - Google Patents
Info
- Publication number
- GB1302193A GB1302193A GB2000569A GB1302193DA GB1302193A GB 1302193 A GB1302193 A GB 1302193A GB 2000569 A GB2000569 A GB 2000569A GB 1302193D A GB1302193D A GB 1302193DA GB 1302193 A GB1302193 A GB 1302193A
- Authority
- GB
- United Kingdom
- Prior art keywords
- ions
- slit
- time
- deflection plates
- spectrum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/061—Ion deflecting means, e.g. ion gates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
1302193 Mass spectrometers SHELL INTERNATIONALE RESEARCH MAATSCHAPPIJ NV 16 April 1970 [18 April 1969] 20005/69 Heading H1D In a mass spectrometer of the time-of flight type, a beam of ions is passed through a pair of electrostatic deflection plates 21, Fig. 2, the field between which is periodically stepped between two discrete values. Ions as shown at a 0 which have passed through the plates before the step waveform is applied follow the path a 1 , a 2 to one side of a slit 4 in an output diaphragm, whereas ions as shown at e 0 which enter the field as the waveform is applied are deflected to the other side of the slit along the path e 1 , e 2 ; only ions which lie within the region c 0 , b 0 , d 0 , c<SP>1</SP> 0 at the time of the step pass through the slit to an output electron multiplier (not shown). The solid lines in Fig. 2 illustrate the shape of the beam at various instants, and the ions in the selected region separate according to their mass/charge ratio in the drift space, which may or may not include an electric field, so that the masses may be displayed as a function of time on an oscilloscope synchronised with the step wave. The end of the step wave could cause a second spectrum, and this may be displayed and may be prevented from interfering with the first spectrum by using a long enough pulse; alternatively the second spectrum may be suppressed by providing a second pair of deflection plates inclined e.g. at 90 degrees to the first and supplied with the same waveform, or by triggering the oscilloscope only on the leading edge of the pulse. For adequate resolution the rise time of the pulse should be less than half the transit time of the heaviest ions through the deflection plates. The width of the slit 4 influences the sensitivity and resolution and may be adjustable or may vary along its length so that a desired width may be selected by adjustment of the direct voltage across the second pair of deflection plates.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB2000569 | 1969-04-18 |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1302193A true GB1302193A (en) | 1973-01-04 |
Family
ID=10138774
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB2000569A Expired GB1302193A (en) | 1969-04-18 | 1969-04-18 |
Country Status (4)
Country | Link |
---|---|
US (1) | US3634683A (en) |
DE (1) | DE2018297A1 (en) |
FR (1) | FR2043434A5 (en) |
GB (1) | GB1302193A (en) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3920566A1 (en) * | 1989-06-23 | 1991-01-10 | Bruker Franzen Analytik Gmbh | MS-MS FLIGHT TIME MASS SPECTROMETER |
US5117107A (en) * | 1987-12-24 | 1992-05-26 | Unisearch Limited | Mass spectrometer |
US5120958A (en) * | 1990-05-11 | 1992-06-09 | Kratos Analytical Limited | Ion storage device |
US5180914A (en) * | 1990-05-11 | 1993-01-19 | Kratos Analytical Limited | Mass spectrometry systems |
EP1305452A1 (en) * | 2000-07-14 | 2003-05-02 | Epion Corporation | Gcib size diagnostics and workpiece processing |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2540505A1 (en) * | 1975-09-11 | 1977-03-24 | Leybold Heraeus Gmbh & Co Kg | FLIGHT TIME MASS SPECTROMETERS FOR IONS WITH DIFFERENT ENERGIES |
EP0304525A1 (en) * | 1987-08-28 | 1989-03-01 | FISONS plc | Pulsed microfocused ion beams |
DE4305363A1 (en) * | 1993-02-23 | 1994-08-25 | Hans Bernhard Dr Linden | Mass spectrometer for time-dependent mass separation |
DE4322102C2 (en) * | 1993-07-02 | 1995-08-17 | Bergmann Thorald | Time-of-flight mass spectrometer with gas phase ion source |
DE4322101C2 (en) * | 1993-07-02 | 1995-06-14 | Bergmann Thorald | Ion source for time-of-flight mass spectrometers |
US5614711A (en) * | 1995-05-04 | 1997-03-25 | Indiana University Foundation | Time-of-flight mass spectrometer |
US5712480A (en) * | 1995-11-16 | 1998-01-27 | Leco Corporation | Time-of-flight data acquisition system |
US5753909A (en) * | 1995-11-17 | 1998-05-19 | Bruker Analytical Systems, Inc. | High resolution postselector for time-of-flight mass spectrometery |
EP1315844A4 (en) * | 2000-07-14 | 2007-04-04 | Epion Corp | Gcib size diagnostics and workpiece processing |
US7186972B2 (en) * | 2003-10-23 | 2007-03-06 | Beckman Coulter, Inc. | Time of flight mass analyzer having improved mass resolution and method of operating same |
US7501621B2 (en) * | 2006-07-12 | 2009-03-10 | Leco Corporation | Data acquisition system for a spectrometer using an adaptive threshold |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2612607A (en) * | 1947-04-05 | 1952-09-30 | William E Stephens | Mass spectrometer |
GB780999A (en) * | 1953-12-12 | 1957-08-14 | Tno | Improvements in or relating to mass spectrometers |
US3307033A (en) * | 1963-07-19 | 1967-02-28 | William H Johnston Lab Inc | Coincidence mass spectrometer with electrostatic means to separate positive and negative ions and detectors and method of use |
-
1969
- 1969-04-18 GB GB2000569A patent/GB1302193A/en not_active Expired
-
1970
- 1970-04-13 US US27803A patent/US3634683A/en not_active Expired - Lifetime
- 1970-04-16 DE DE19702018297 patent/DE2018297A1/en active Pending
- 1970-04-16 FR FR7013752A patent/FR2043434A5/fr not_active Expired
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5117107A (en) * | 1987-12-24 | 1992-05-26 | Unisearch Limited | Mass spectrometer |
GB2233149B (en) * | 1987-12-24 | 1992-07-15 | Unisearch Ltd | Mass spectrometer |
DE3920566A1 (en) * | 1989-06-23 | 1991-01-10 | Bruker Franzen Analytik Gmbh | MS-MS FLIGHT TIME MASS SPECTROMETER |
US5032722A (en) * | 1989-06-23 | 1991-07-16 | Bruker Franzen Analytik Gmbh | MS-MS time-of-flight mass spectrometer |
US5120958A (en) * | 1990-05-11 | 1992-06-09 | Kratos Analytical Limited | Ion storage device |
US5180914A (en) * | 1990-05-11 | 1993-01-19 | Kratos Analytical Limited | Mass spectrometry systems |
EP1305452A1 (en) * | 2000-07-14 | 2003-05-02 | Epion Corporation | Gcib size diagnostics and workpiece processing |
EP1305452A4 (en) * | 2000-07-14 | 2007-12-26 | Tel Epion Inc | Gcib size diagnostics and workpiece processing |
Also Published As
Publication number | Publication date |
---|---|
FR2043434A5 (en) | 1971-02-12 |
US3634683A (en) | 1972-01-11 |
DE2018297A1 (en) | 1970-11-12 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PS | Patent sealed [section 19, patents act 1949] | ||
PLNP | Patent lapsed through nonpayment of renewal fees |