FR3111006B1 - Dispositif intégré de fonction physique non-clonable - Google Patents

Dispositif intégré de fonction physique non-clonable Download PDF

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Publication number
FR3111006B1
FR3111006B1 FR2005653A FR2005653A FR3111006B1 FR 3111006 B1 FR3111006 B1 FR 3111006B1 FR 2005653 A FR2005653 A FR 2005653A FR 2005653 A FR2005653 A FR 2005653A FR 3111006 B1 FR3111006 B1 FR 3111006B1
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FR
France
Prior art keywords
comparison
capacitor
capacitance
physical function
rcd
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR2005653A
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English (en)
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FR3111006A1 (fr
Inventor
BENOîT FROMENT
Jean-Marc Voisin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Crolles 2 SAS
STMicroelectronics Rousset SAS
Original Assignee
STMicroelectronics Crolles 2 SAS
STMicroelectronics Rousset SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by STMicroelectronics Crolles 2 SAS, STMicroelectronics Rousset SAS filed Critical STMicroelectronics Crolles 2 SAS
Priority to FR2005653A priority Critical patent/FR3111006B1/fr
Priority to US17/329,609 priority patent/US20210377058A1/en
Publication of FR3111006A1 publication Critical patent/FR3111006A1/fr
Application granted granted Critical
Publication of FR3111006B1 publication Critical patent/FR3111006B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/57Protection from inspection, reverse engineering or tampering
    • H01L23/576Protection from inspection, reverse engineering or tampering using active circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/58Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/64Impedance arrangements
    • H01L23/642Capacitive arrangements
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K19/00Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/003Modifications for increasing the reliability for protection
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L9/00Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols
    • H04L9/32Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols including means for verifying the identity or authority of a user of the system or for message authentication, e.g. authorization, entity authentication, data integrity or data verification, non-repudiation, key authentication or verification of credentials
    • H04L9/3271Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols including means for verifying the identity or authority of a user of the system or for message authentication, e.g. authorization, entity authentication, data integrity or data verification, non-repudiation, key authentication or verification of credentials using challenge-response
    • H04L9/3278Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols including means for verifying the identity or authority of a user of the system or for message authentication, e.g. authorization, entity authentication, data integrity or data verification, non-repudiation, key authentication or verification of credentials using challenge-response using physically unclonable functions [PUF]
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04LTRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L2209/00Additional information or applications relating to cryptographic mechanisms or cryptographic arrangements for secret or secure communication H04L9/00
    • H04L2209/12Details relating to cryptographic hardware or logic circuitry

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Semiconductor Integrated Circuits (AREA)

Abstract

Selon un aspect, il est proposé un dispositif intégré de fonction physique non-clonable comprenant : - au moins un condensateur de référence (RCD),- une pluralité de condensateurs de comparaison (CCD), le dispositif intégré comprenant en outre :- un circuit de détermination de capacité (CDC) configuré pour pouvoir déterminer la capacité dudit au moins un condensateur de référence (RCD) et de chaque condensateur de comparaison (CCD), - des moyens de comparaison (CM) configurés pour comparer la capacité déterminée de chaque condensateur de comparaison (CCD) à la capacité dudit au moins un condensateur de référence (RCD), et- des moyens de génération (GM) configuré pour générer sur une sortie du dispositif un mot numérique à partir de chaque comparaison effectuée par les moyens de comparaison (CM). Reference: Figure 1
FR2005653A 2020-05-28 2020-05-28 Dispositif intégré de fonction physique non-clonable Active FR3111006B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR2005653A FR3111006B1 (fr) 2020-05-28 2020-05-28 Dispositif intégré de fonction physique non-clonable
US17/329,609 US20210377058A1 (en) 2020-05-28 2021-05-25 Integrated physical unclonable function device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR2005653 2020-05-28
FR2005653A FR3111006B1 (fr) 2020-05-28 2020-05-28 Dispositif intégré de fonction physique non-clonable

Publications (2)

Publication Number Publication Date
FR3111006A1 FR3111006A1 (fr) 2021-12-03
FR3111006B1 true FR3111006B1 (fr) 2023-05-26

Family

ID=72801576

Family Applications (1)

Application Number Title Priority Date Filing Date
FR2005653A Active FR3111006B1 (fr) 2020-05-28 2020-05-28 Dispositif intégré de fonction physique non-clonable

Country Status (2)

Country Link
US (1) US20210377058A1 (fr)
FR (1) FR3111006B1 (fr)

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2780162B1 (fr) * 1998-06-19 2000-09-08 St Microelectronics Sa Structure de test de circuit, circuit integre et procede de test
US8138768B2 (en) * 2007-01-30 2012-03-20 Nxp B.V. Sensing circuit for devices with protective coating
US20110068810A1 (en) * 2009-04-03 2011-03-24 Tpo Displays Corp. Sensing method and driving circuit of capacitive touch screen
US9331012B2 (en) * 2012-03-08 2016-05-03 International Business Machines Corporation Method for fabricating a physical unclonable interconnect function array
US9018972B1 (en) * 2012-06-04 2015-04-28 Sandia Corporation Area-efficient physically unclonable function circuit architecture
EP3156947B1 (fr) * 2015-10-12 2020-01-01 Nxp B.V. Dispositif électronique
EP3407535B1 (fr) * 2016-01-19 2023-08-09 ICTK Holdings Co., Ltd. Appareil de génération de clé d'identification et son procédé de gestion
CN109934021B (zh) * 2019-01-28 2023-08-08 湖北大学 防探针探测的开关电容puf电路的布局方法
US10560079B1 (en) * 2019-03-04 2020-02-11 Texas Instruments Incorporated Capacitor ratio identification
CN110263588B (zh) * 2019-07-23 2023-05-16 南方电网科学研究院有限责任公司 一种物理不可克隆函数电路,集成电路及制备方法
US11240047B2 (en) * 2019-12-16 2022-02-01 Analog Devices International Unlimited Company Capacitor based physical unclonable function

Also Published As

Publication number Publication date
US20210377058A1 (en) 2021-12-02
FR3111006A1 (fr) 2021-12-03

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