FR3054034B1 - Procede et dispositif de caracterisation d'une source optique - Google Patents

Procede et dispositif de caracterisation d'une source optique Download PDF

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Publication number
FR3054034B1
FR3054034B1 FR1656663A FR1656663A FR3054034B1 FR 3054034 B1 FR3054034 B1 FR 3054034B1 FR 1656663 A FR1656663 A FR 1656663A FR 1656663 A FR1656663 A FR 1656663A FR 3054034 B1 FR3054034 B1 FR 3054034B1
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FR
France
Prior art keywords
datum
source
radiation
characterizing
optical source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1656663A
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English (en)
Other versions
FR3054034A1 (fr
Inventor
Johann Georges Des Aulnois
Benjamin Szymanski
Bertrand HARDY-BARANSKI
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Blue Industry and Science SAS
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Blue Industry and Science SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Blue Industry and Science SAS filed Critical Blue Industry and Science SAS
Priority to FR1656663A priority Critical patent/FR3054034B1/fr
Priority to CN201780055643.8A priority patent/CN109690266B/zh
Priority to US16/316,409 priority patent/US10768051B2/en
Priority to JP2019523171A priority patent/JP7114582B2/ja
Priority to EP17740684.0A priority patent/EP3485248B1/fr
Priority to PCT/EP2017/067017 priority patent/WO2018011063A1/fr
Publication of FR3054034A1 publication Critical patent/FR3054034A1/fr
Application granted granted Critical
Publication of FR3054034B1 publication Critical patent/FR3054034B1/fr
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J9/0246—Measuring optical wavelength
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J2009/0257—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods multiple, e.g. Fabry Perot interferometer

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Character Input (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

La présente invention concerne un procédé de caractérisation d'une source optique (1) comprenant une cavité fixe (2) ayant un intervalle spectral libre, ledit procédé comprenant : - une génération d'un premier rayonnement (3), - une réception d'au moins une partie de ce premier rayonnement par au moins un capteur (4), - une mesure d'un signal par chaque capteur et pour chaque état exploré de la source, - à partir des signaux mesurés et pour chaque état exploré de la source, un calcul d'une première donnée représentative de la longueur d'onde du premier rayonnement, le calcul comprenant, pour chaque état exploré de la source, une sélection d'une valeur sélectionnée de la première donnée parmi plusieurs valeurs possibles, ladite sélection comprenant une élimination des valeurs de la première donnée ne correspondant pas à une constante modulo l'intervalle spectral libre de la cavité fixe exprimé selon les unités de la première donnée.
FR1656663A 2016-07-12 2016-07-12 Procede et dispositif de caracterisation d'une source optique Active FR3054034B1 (fr)

Priority Applications (6)

Application Number Priority Date Filing Date Title
FR1656663A FR3054034B1 (fr) 2016-07-12 2016-07-12 Procede et dispositif de caracterisation d'une source optique
CN201780055643.8A CN109690266B (zh) 2016-07-12 2017-07-06 用于表征光源的方法和设备
US16/316,409 US10768051B2 (en) 2016-07-12 2017-07-06 Process and device including a fixed cavity with a free spectral range for characterizing an optical source
JP2019523171A JP7114582B2 (ja) 2016-07-12 2017-07-06 光源を特徴付ける工程および装置
EP17740684.0A EP3485248B1 (fr) 2016-07-12 2017-07-06 Procédé et dispositif de caractérisation d'une source optique
PCT/EP2017/067017 WO2018011063A1 (fr) 2016-07-12 2017-07-06 Procédé et dispositif de caractérisation d'une source optique

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FR1656663 2016-07-12
FR1656663A FR3054034B1 (fr) 2016-07-12 2016-07-12 Procede et dispositif de caracterisation d'une source optique

Publications (2)

Publication Number Publication Date
FR3054034A1 FR3054034A1 (fr) 2018-01-19
FR3054034B1 true FR3054034B1 (fr) 2020-06-12

Family

ID=57860930

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1656663A Active FR3054034B1 (fr) 2016-07-12 2016-07-12 Procede et dispositif de caracterisation d'une source optique

Country Status (6)

Country Link
US (1) US10768051B2 (fr)
EP (1) EP3485248B1 (fr)
JP (1) JP7114582B2 (fr)
CN (1) CN109690266B (fr)
FR (1) FR3054034B1 (fr)
WO (1) WO2018011063A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10845251B2 (en) * 2018-06-28 2020-11-24 Zygo Corporation Wavemeter using pairs of interferometric optical cavities

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4864578A (en) * 1983-04-12 1989-09-05 Coherent, Inc. Scannable laser with integral wavemeter
JPS6422087A (en) * 1987-07-17 1989-01-25 Komatsu Mfg Co Ltd Control equipment for laser wavelength
US6088142A (en) * 1997-03-13 2000-07-11 Oplink Communications, Inc. System and method for precision wavelength monitoring
WO2001011738A1 (fr) * 1999-08-10 2001-02-15 Coretek, Inc. Dispositif de reference a longueur d'onde optique et a double etalon
JP4197816B2 (ja) * 1999-12-07 2008-12-17 株式会社小松製作所 波長検出装置
US20030035120A1 (en) * 2001-08-14 2003-02-20 Myatt Christopher J. Multiple-interferometer device for wavelength measuring and locking
JP2003315160A (ja) * 2002-04-23 2003-11-06 Sun Tec Kk 偏波無依存型波長モニタ
GB2399875B (en) * 2003-03-24 2006-02-22 Tsunami Photonics Ltd Optical wavelength meter
DE602004007432T2 (de) * 2003-05-23 2008-03-13 Rohm and Haas Electronic Materials, L.L.C., Marlborough Halbleiterlaser mit externem Resonator enthaltend ein Etalon und Verfahren zur Herstellung desselben
GB0405553D0 (en) * 2004-03-12 2004-04-21 Xyz Imaging Inc A laser
JP4893026B2 (ja) * 2005-03-03 2012-03-07 日本電気株式会社 波長可変共振器及びこれを用いた波長可変光源並びに多重共振器の波長可変方法
CN101490518A (zh) * 2006-07-07 2009-07-22 Tir科技公司 用于表征光源的设备和方法
US7982944B2 (en) * 2007-05-04 2011-07-19 Max-Planck-Gesellschaft Zur Forderung Der Wissenschaften E.V. Method and apparatus for optical frequency comb generation using a monolithic micro-resonator
KR20110036945A (ko) * 2008-07-25 2011-04-12 상뜨르 나쇼날 드 라 러쉐르쉬 샹띠피끄 (쎄엔알에스) 주파수 빗 광원을 갖는 푸리에 변환 분광기
EP2817613A4 (fr) * 2012-02-21 2016-08-03 Massachusetts Inst Technology Dispositif spectromètre
CN103067092A (zh) * 2012-12-28 2013-04-24 华为技术有限公司 多波长光源装置
US11415700B2 (en) * 2016-02-26 2022-08-16 Michigan Aerospace Corporation Multi-element Fabry-Perot etalon interferometer for direct detection lidar

Also Published As

Publication number Publication date
EP3485248A1 (fr) 2019-05-22
CN109690266B (zh) 2021-12-07
FR3054034A1 (fr) 2018-01-19
WO2018011063A1 (fr) 2018-01-18
US20190293491A1 (en) 2019-09-26
EP3485248B1 (fr) 2023-01-18
JP2019526058A (ja) 2019-09-12
JP7114582B2 (ja) 2022-08-08
CN109690266A (zh) 2019-04-26
US10768051B2 (en) 2020-09-08

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