FR3027402B1 - Circuit et procede pour le test sur puce d'une matrice de pixels - Google Patents

Circuit et procede pour le test sur puce d'une matrice de pixels

Info

Publication number
FR3027402B1
FR3027402B1 FR1460121A FR1460121A FR3027402B1 FR 3027402 B1 FR3027402 B1 FR 3027402B1 FR 1460121 A FR1460121 A FR 1460121A FR 1460121 A FR1460121 A FR 1460121A FR 3027402 B1 FR3027402 B1 FR 3027402B1
Authority
FR
France
Prior art keywords
circuit
pixel matrix
chip testing
testing
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1460121A
Other languages
English (en)
Other versions
FR3027402A1 (fr
Inventor
Richun Fei
Salvador Mir
Jocelyn Moreau
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics Grenoble 2 SAS
Original Assignee
Centre National de la Recherche Scientifique CNRS
STMicroelectronics Grenoble 2 SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Centre National de la Recherche Scientifique CNRS, STMicroelectronics Grenoble 2 SAS filed Critical Centre National de la Recherche Scientifique CNRS
Priority to FR1460121A priority Critical patent/FR3027402B1/fr
Priority to CN201520765285.8U priority patent/CN205160709U/zh
Priority to CN201510634790.3A priority patent/CN105530508B/zh
Priority to US14/887,390 priority patent/US10484676B2/en
Publication of FR3027402A1 publication Critical patent/FR3027402A1/fr
Application granted granted Critical
Publication of FR3027402B1 publication Critical patent/FR3027402B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
FR1460121A 2014-10-21 2014-10-21 Circuit et procede pour le test sur puce d'une matrice de pixels Active FR3027402B1 (fr)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FR1460121A FR3027402B1 (fr) 2014-10-21 2014-10-21 Circuit et procede pour le test sur puce d'une matrice de pixels
CN201520765285.8U CN205160709U (zh) 2014-10-21 2015-09-29 用于像素阵列的片上测试的电路和***
CN201510634790.3A CN105530508B (zh) 2014-10-21 2015-09-29 用于像素阵列的片上测试的电路和方法
US14/887,390 US10484676B2 (en) 2014-10-21 2015-10-20 Circuit and method for on-chip testing of a pixel array

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1460121A FR3027402B1 (fr) 2014-10-21 2014-10-21 Circuit et procede pour le test sur puce d'une matrice de pixels

Publications (2)

Publication Number Publication Date
FR3027402A1 FR3027402A1 (fr) 2016-04-22
FR3027402B1 true FR3027402B1 (fr) 2016-11-18

Family

ID=52824307

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1460121A Active FR3027402B1 (fr) 2014-10-21 2014-10-21 Circuit et procede pour le test sur puce d'une matrice de pixels

Country Status (3)

Country Link
US (1) US10484676B2 (fr)
CN (2) CN105530508B (fr)
FR (1) FR3027402B1 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3027402B1 (fr) * 2014-10-21 2016-11-18 Centre Nat Rech Scient Circuit et procede pour le test sur puce d'une matrice de pixels
CN109155829B (zh) 2016-05-31 2020-03-20 索尼半导体解决方案公司 成像装置及成像方法、相机模块、和电子设备
US10455171B2 (en) * 2018-02-13 2019-10-22 Semiconductor Components Industries, Llc Methods and apparatus for anti-eclipse circuit verification
CN112292849B (zh) * 2018-06-19 2023-11-14 索尼半导体解决方案公司 摄像元件和电子设备
TWI803695B (zh) * 2018-11-07 2023-06-01 日商索尼半導體解決方案公司 攝像裝置及電子機器
EP3907983B1 (fr) * 2020-05-07 2023-06-28 Teledyne Dalsa B.V. Circuit de détection de défauts pour capteur d'images
JP2022134549A (ja) * 2021-03-03 2022-09-15 キヤノン株式会社 半導体装置、機器

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0644806B2 (ja) * 1987-02-18 1994-06-08 三洋電機株式会社 オ−トフオ−カス回路
JP3849230B2 (ja) * 1997-06-06 2006-11-22 ソニー株式会社 信号処理装置
US6677613B1 (en) * 1999-03-03 2004-01-13 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method of fabricating the same
US6255803B1 (en) * 1999-08-10 2001-07-03 Matsushita Electric Industrial Co., Ltd. Method for detecting minor short in cells and method for detecting cell short in cells
GB0110634D0 (en) * 2001-05-01 2001-06-20 Gunton Bruce S Monitoring apparatus
US7085408B1 (en) * 2002-07-16 2006-08-01 Magna Chip Semiconductor Method and system for testing image sensor system-on-chip
GB0217708D0 (en) * 2002-07-31 2002-09-11 Koninkl Philips Electronics Nv Obtaining configuration data for a data processing apparatus
JP4281622B2 (ja) * 2004-05-31 2009-06-17 ソニー株式会社 表示装置及び検査方法
JP4631743B2 (ja) * 2006-02-27 2011-02-16 ソニー株式会社 半導体装置
JP4621231B2 (ja) * 2007-06-29 2011-01-26 富士通テン株式会社 電源保護装置及び電子制御装置
CN102063353A (zh) * 2009-11-18 2011-05-18 英业达股份有限公司 电路板的电压量测装置
JP2011129975A (ja) * 2009-12-15 2011-06-30 Sony Corp 撮像装置および欠陥検出方法
US8843343B2 (en) * 2011-10-31 2014-09-23 Aptina Imaging Corporation Failsafe image sensor with real time integrity checking of pixel analog paths and digital data paths
US8854475B2 (en) * 2013-02-08 2014-10-07 Omnivision Technologies, Inc. System and method for sensor failure detection
FR3027402B1 (fr) * 2014-10-21 2016-11-18 Centre Nat Rech Scient Circuit et procede pour le test sur puce d'une matrice de pixels

Also Published As

Publication number Publication date
CN205160709U (zh) 2016-04-13
CN105530508B (zh) 2019-04-19
US20160112700A1 (en) 2016-04-21
FR3027402A1 (fr) 2016-04-22
US10484676B2 (en) 2019-11-19
CN105530508A (zh) 2016-04-27

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