FR3004582B1 - Systeme et procede d'inspection optique de circuits electroniques - Google Patents

Systeme et procede d'inspection optique de circuits electroniques

Info

Publication number
FR3004582B1
FR3004582B1 FR1353275A FR1353275A FR3004582B1 FR 3004582 B1 FR3004582 B1 FR 3004582B1 FR 1353275 A FR1353275 A FR 1353275A FR 1353275 A FR1353275 A FR 1353275A FR 3004582 B1 FR3004582 B1 FR 3004582B1
Authority
FR
France
Prior art keywords
electronic circuits
optically inspecting
inspecting electronic
optically
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
FR1353275A
Other languages
English (en)
Other versions
FR3004582A1 (fr
Inventor
Remi Gerbelot
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
VIT SAS
Original Assignee
VIT SAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by VIT SAS filed Critical VIT SAS
Priority to FR1353275A priority Critical patent/FR3004582B1/fr
Priority to EP14720669.2A priority patent/EP2984913A1/fr
Priority to KR1020157030835A priority patent/KR20150140704A/ko
Priority to PCT/FR2014/050853 priority patent/WO2014167248A1/fr
Priority to US14/783,491 priority patent/US20160054237A1/en
Publication of FR3004582A1 publication Critical patent/FR3004582A1/fr
Application granted granted Critical
Publication of FR3004582B1 publication Critical patent/FR3004582B1/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08—Monitoring manufacture of assemblages
    • H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0815—Controlling of component placement on the substrate during or after manufacturing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • G01N2021/95638—Inspecting patterns on the surface of objects for PCB's

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Operations Research (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
FR1353275A 2013-04-11 2013-04-11 Systeme et procede d'inspection optique de circuits electroniques Active FR3004582B1 (fr)

Priority Applications (5)

Application Number Priority Date Filing Date Title
FR1353275A FR3004582B1 (fr) 2013-04-11 2013-04-11 Systeme et procede d'inspection optique de circuits electroniques
EP14720669.2A EP2984913A1 (fr) 2013-04-11 2014-04-09 Systeme et procede d'inspection optique de circuits electroniques
KR1020157030835A KR20150140704A (ko) 2013-04-11 2014-04-09 전자 회로의 광학 검사 시스템 및 방법
PCT/FR2014/050853 WO2014167248A1 (fr) 2013-04-11 2014-04-09 Systeme et procede d'inspection optique de circuits electroniques
US14/783,491 US20160054237A1 (en) 2013-04-11 2014-04-09 System and method for optical inspection of electronic circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR1353275A FR3004582B1 (fr) 2013-04-11 2013-04-11 Systeme et procede d'inspection optique de circuits electroniques

Publications (2)

Publication Number Publication Date
FR3004582A1 FR3004582A1 (fr) 2014-10-17
FR3004582B1 true FR3004582B1 (fr) 2015-04-10

Family

ID=48856819

Family Applications (1)

Application Number Title Priority Date Filing Date
FR1353275A Active FR3004582B1 (fr) 2013-04-11 2013-04-11 Systeme et procede d'inspection optique de circuits electroniques

Country Status (5)

Country Link
US (1) US20160054237A1 (fr)
EP (1) EP2984913A1 (fr)
KR (1) KR20150140704A (fr)
FR (1) FR3004582B1 (fr)
WO (1) WO2014167248A1 (fr)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR3041111B1 (fr) * 2015-09-15 2017-09-15 Vit Mire d'etalonnage ou de test
CN105509663B (zh) * 2016-02-17 2019-12-27 京东方光科技有限公司 一种背光源平整度检测***及检测方法
FR3059423B1 (fr) 2016-11-29 2020-05-29 Vit Systeme et procede de positionnement et d'inspection optique d'un objet
DE112020007435T5 (de) 2020-10-05 2023-05-17 Yamaha Hatsudoki Kabushiki Kaisha Leiterplattenarbeitsvorrichtung
DE202021100731U1 (de) * 2021-02-15 2022-05-17 QUISS Qualitäts-Inspektionssysteme und Service GmbH Vorrichtung und System zur kontrastreichen Erfassung eines Prüfzeichens auf Dosen mittels Wärmestrahlung
CN113075232A (zh) * 2021-03-31 2021-07-06 深圳中科飞测科技股份有限公司 一种检测设备及检测方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1353275A (fr) 1963-04-01 1964-02-21 Nuclear Power Plant Co Ltd Caisson étanche en béton
JP2001153640A (ja) * 1999-11-29 2001-06-08 Anritsu Corp プリント基板検査装置
JP3729156B2 (ja) * 2002-06-07 2005-12-21 株式会社日立製作所 パターン欠陥検出方法およびその装置
JP4224268B2 (ja) * 2002-08-29 2009-02-12 富士機械製造株式会社 電子回路部品装着機、ならびにそれの装着位置精度検査方法および装置
JP4516567B2 (ja) * 2004-04-30 2010-08-04 富士機械製造株式会社 プリント基板支持装置
JP4654022B2 (ja) * 2004-12-24 2011-03-16 株式会社サキコーポレーション 基板の外観検査装置
JP2007311711A (ja) * 2006-05-22 2007-11-29 Anritsu Corp 基板バックアップ装置、該装置を備えた印刷半田検査装置及び方法
EP2060907A1 (fr) * 2006-08-28 2009-05-20 I-Pulse Kabushiki Kaisha Dispositif et procédé d'inspection de l'apparence d'une planche
FR2963144B1 (fr) * 2010-07-26 2012-12-07 Vit Installation d'inspection optique de circuits electroniques

Also Published As

Publication number Publication date
EP2984913A1 (fr) 2016-02-17
US20160054237A1 (en) 2016-02-25
WO2014167248A1 (fr) 2014-10-16
FR3004582A1 (fr) 2014-10-17
KR20150140704A (ko) 2015-12-16

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