FR2981783B1 - Systeme de detection d'une attaque par laser d'une puce de circuit integre - Google Patents
Systeme de detection d'une attaque par laser d'une puce de circuit integreInfo
- Publication number
- FR2981783B1 FR2981783B1 FR1159445A FR1159445A FR2981783B1 FR 2981783 B1 FR2981783 B1 FR 2981783B1 FR 1159445 A FR1159445 A FR 1159445A FR 1159445 A FR1159445 A FR 1159445A FR 2981783 B1 FR2981783 B1 FR 2981783B1
- Authority
- FR
- France
- Prior art keywords
- detecting
- integrated circuit
- circuit chip
- laser attack
- attack
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/08—Measuring resistance by measuring both voltage and current
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/57—Protection from inspection, reverse engineering or tampering
- H01L23/576—Protection from inspection, reverse engineering or tampering using active circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2856—Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/302—Contactless testing
- G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
- G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31719—Security aspects, e.g. preventing unauthorised access during test
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09C—CIPHERING OR DECIPHERING APPARATUS FOR CRYPTOGRAPHIC OR OTHER PURPOSES INVOLVING THE NEED FOR SECRECY
- G09C1/00—Apparatus or methods whereby a given sequence of signs, e.g. an intelligible text, is transformed into an unintelligible sequence of signs by transposing the signs or groups of signs or by replacing them by others according to a predetermined system
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L9/00—Cryptographic mechanisms or cryptographic arrangements for secret or secure communications; Network security protocols
- H04L9/002—Countermeasures against attacks on cryptographic mechanisms
- H04L9/004—Countermeasures against attacks on cryptographic mechanisms for fault attacks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L2209/00—Additional information or applications relating to cryptographic mechanisms or cryptographic arrangements for secret or secure communication H04L9/00
- H04L2209/12—Details relating to cryptographic hardware or logic circuitry
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Computer Security & Cryptography (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Environmental & Geological Engineering (AREA)
- Theoretical Computer Science (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Health & Medical Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Electromagnetism (AREA)
- Toxicology (AREA)
- Semiconductor Integrated Circuits (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1159445A FR2981783B1 (fr) | 2011-10-19 | 2011-10-19 | Systeme de detection d'une attaque par laser d'une puce de circuit integre |
US13/654,991 US9052345B2 (en) | 2011-10-19 | 2012-10-18 | System for detecting a laser attack on an integrated circuit chip |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1159445A FR2981783B1 (fr) | 2011-10-19 | 2011-10-19 | Systeme de detection d'une attaque par laser d'une puce de circuit integre |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2981783A1 FR2981783A1 (fr) | 2013-04-26 |
FR2981783B1 true FR2981783B1 (fr) | 2014-05-09 |
Family
ID=45558149
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1159445A Expired - Fee Related FR2981783B1 (fr) | 2011-10-19 | 2011-10-19 | Systeme de detection d'une attaque par laser d'une puce de circuit integre |
Country Status (2)
Country | Link |
---|---|
US (1) | US9052345B2 (fr) |
FR (1) | FR2981783B1 (fr) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102013112552B4 (de) * | 2013-11-14 | 2017-05-24 | Infineon Technologies Ag | Schaltungsanordnung und Verfahren zum Sichern einer Schaltungsanordnung gegen wiederholte Lichtangriffe |
US9306573B2 (en) * | 2014-07-21 | 2016-04-05 | Microsemi SoC Corporation | Apparatus and method for detecting and preventing laser interrogation of an FPGA integrated circuit |
US9965652B2 (en) * | 2014-08-06 | 2018-05-08 | Maxim Integrated Products, Inc. | Detecting and thwarting backside attacks on secured systems |
KR102341264B1 (ko) | 2015-02-02 | 2021-12-20 | 삼성전자주식회사 | 래치를 이용한 레이저 검출기 및 이를 포함하는 반도체 장치 |
FR3036559B1 (fr) * | 2015-05-19 | 2018-06-22 | Idemia France | Microcircuit comprenant un circuit logique et un module de detection d'une attaque |
FR3042891B1 (fr) * | 2015-10-22 | 2018-03-23 | Stmicroelectronics (Rousset) Sas | Puce electronique securisee |
CN105575948A (zh) * | 2015-11-09 | 2016-05-11 | 北京中电华大电子设计有限责任公司 | 一种芯片保护方法和*** |
GB201607589D0 (en) * | 2016-04-29 | 2016-06-15 | Nagravision Sa | Integrated circuit device |
FR3057088A1 (fr) * | 2016-09-30 | 2018-04-06 | Stmicroelectronics (Rousset) Sas | Detecteur laser picosecondes |
FR3057087B1 (fr) * | 2016-09-30 | 2018-11-16 | Stmicroelectronics (Rousset) Sas | Puce electronique protegee |
FR3063597A1 (fr) | 2017-03-06 | 2018-09-07 | Stmicroelectronics (Rousset) Sas | Architecture de puce electronique |
FR3074605B1 (fr) | 2017-12-05 | 2020-01-17 | Stmicroelectronics (Rousset) Sas | Procede de detection d'un amincissement eventuel d'un substrat d'un circuit integre par sa face arriere, et dispositif associe |
JP7143734B2 (ja) * | 2018-11-15 | 2022-09-29 | 富士電機株式会社 | 半導体集積回路 |
DE102019116468B3 (de) | 2019-06-18 | 2020-10-29 | Infineon Technologies Ag | Integrierte Schaltung mit Detektionsschaltung und zugehörige Chipkarte |
CN113534706B (zh) * | 2021-07-12 | 2023-06-16 | 陈毅 | 一种变电站接地电阻智能检测及分析*** |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10101995A1 (de) * | 2001-01-18 | 2002-07-25 | Philips Corp Intellectual Pty | Schaltungsanordnung und Verfahren zum Schützen mindestens einer Chipanordnung vor Manipulation und/oder vor Mißbrauch |
DE10254325A1 (de) * | 2002-11-21 | 2004-06-03 | Philips Intellectual Property & Standards Gmbh | Elektronisches Speicherbauteil |
JP2006228910A (ja) * | 2005-02-16 | 2006-08-31 | Matsushita Electric Ind Co Ltd | 半導体装置 |
KR101477630B1 (ko) * | 2007-10-09 | 2014-12-30 | 삼성전자주식회사 | 빛 공격을 검출할 수 있는 메모리 장치 및 그 방법 |
KR20090043823A (ko) * | 2007-10-30 | 2009-05-07 | 삼성전자주식회사 | 외부 공격을 감지할 수 있는 메모리 시스템 |
US7847581B2 (en) * | 2008-04-03 | 2010-12-07 | Stmicroelectronics (Rousset) Sas | Device for protecting an integrated circuit against a laser attack |
FR2951016B1 (fr) * | 2009-10-05 | 2012-07-13 | St Microelectronics Rousset | Procede de protection d'une puce de circuit integre contre des attaques laser |
DE102011018450B4 (de) * | 2011-04-21 | 2017-08-31 | Infineon Technologies Ag | Halbleiterbauelement mit durchgeschalteten parasitären Thyristor bei einem Lichtangriff und Halbleiterbauelement mit Alarmschaltung für einen Lichtangriff |
FR2976722B1 (fr) * | 2011-06-17 | 2013-11-29 | St Microelectronics Rousset | Dispositif de protection d'une puce de circuit integre contre des attaques |
FR2986633B1 (fr) * | 2012-02-08 | 2014-09-05 | St Microelectronics Rousset | Dispositif de detection d'une attaque par laser dans une puce de circuit integre |
-
2011
- 2011-10-19 FR FR1159445A patent/FR2981783B1/fr not_active Expired - Fee Related
-
2012
- 2012-10-18 US US13/654,991 patent/US9052345B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
US20140111230A1 (en) | 2014-04-24 |
US9052345B2 (en) | 2015-06-09 |
FR2981783A1 (fr) | 2013-04-26 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PLFP | Fee payment |
Year of fee payment: 6 |
|
PLFP | Fee payment |
Year of fee payment: 7 |
|
PLFP | Fee payment |
Year of fee payment: 8 |
|
PLFP | Fee payment |
Year of fee payment: 9 |
|
PLFP | Fee payment |
Year of fee payment: 10 |
|
ST | Notification of lapse |
Effective date: 20220605 |