FR2980846B1 - Procede de determination sans contact de l'epaisseur d'un echantillon, systeme correspondant - Google Patents
Procede de determination sans contact de l'epaisseur d'un echantillon, systeme correspondantInfo
- Publication number
- FR2980846B1 FR2980846B1 FR1158905A FR1158905A FR2980846B1 FR 2980846 B1 FR2980846 B1 FR 2980846B1 FR 1158905 A FR1158905 A FR 1158905A FR 1158905 A FR1158905 A FR 1158905A FR 2980846 B1 FR2980846 B1 FR 2980846B1
- Authority
- FR
- France
- Prior art keywords
- sample
- thickness
- corresponding system
- contact determination
- determination
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0658—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of emissivity or reradiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
- G01B21/085—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness using thermal means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1158905A FR2980846B1 (fr) | 2011-10-03 | 2011-10-03 | Procede de determination sans contact de l'epaisseur d'un echantillon, systeme correspondant |
PCT/EP2012/069539 WO2013050417A1 (fr) | 2011-10-03 | 2012-10-03 | Procédé de détermination sans contact de l'épaisseur d'un échantillon, système correspondant |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1158905A FR2980846B1 (fr) | 2011-10-03 | 2011-10-03 | Procede de determination sans contact de l'epaisseur d'un echantillon, systeme correspondant |
FR1158905 | 2011-10-03 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2980846A1 FR2980846A1 (fr) | 2013-04-05 |
FR2980846B1 true FR2980846B1 (fr) | 2014-05-30 |
Family
ID=46970300
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR1158905A Active FR2980846B1 (fr) | 2011-10-03 | 2011-10-03 | Procede de determination sans contact de l'epaisseur d'un echantillon, systeme correspondant |
Country Status (2)
Country | Link |
---|---|
FR (1) | FR2980846B1 (fr) |
WO (1) | WO2013050417A1 (fr) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2980845B1 (fr) * | 2011-10-03 | 2013-10-04 | Commissariat Energie Atomique | Procede de determination sans contact du rayon d'un faisceau, systeme correspondant |
FR3007523B1 (fr) * | 2013-06-21 | 2016-06-17 | Commissariat Energie Atomique | Procede de determination de la diffusivite thermique et systeme pour la mise en oeuvre |
FR3007831B1 (fr) * | 2013-07-01 | 2015-06-19 | Enovasense | Procede de mesure de l'epaisseur d'une couche d'un materiau, procede de galvanisation et dispositif de mesure associes |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4679946A (en) * | 1984-05-21 | 1987-07-14 | Therma-Wave, Inc. | Evaluating both thickness and compositional variables in a thin film sample |
FR2589566A1 (fr) | 1985-11-06 | 1987-05-07 | Cegedur | Procede de mesure au defile et sans contact de l'epaisseur et de la temperature de feuilles metalliques minces au moyen de courants de foucault |
DE60041661D1 (de) * | 1999-12-02 | 2009-04-09 | Thermal Wave Imaging Inc | Verfahren und system zur bezugsfreien thermographischen erkennung von suboberflächendefekten unter verwendung komprimierter bilddaten |
DE10355440A1 (de) | 2003-11-27 | 2005-06-23 | Contitech Holding Gmbh | Verfahren und Vorrichtung zur Messung der Wanddicke von Kunststoffteilen |
AR070418A1 (es) * | 2009-02-12 | 2010-04-07 | Consejo Nac Invest Cient Tec | Metodo y aparato para determinar la dilatacion de un material mediante un dispositivo sensor de error de foco |
-
2011
- 2011-10-03 FR FR1158905A patent/FR2980846B1/fr active Active
-
2012
- 2012-10-03 WO PCT/EP2012/069539 patent/WO2013050417A1/fr active Application Filing
Also Published As
Publication number | Publication date |
---|---|
FR2980846A1 (fr) | 2013-04-05 |
WO2013050417A1 (fr) | 2013-04-11 |
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