FR2829280B1 - Dispositif de memoire claquable et procede de claquage d'une telle memoire - Google Patents

Dispositif de memoire claquable et procede de claquage d'une telle memoire

Info

Publication number
FR2829280B1
FR2829280B1 FR0111485A FR0111485A FR2829280B1 FR 2829280 B1 FR2829280 B1 FR 2829280B1 FR 0111485 A FR0111485 A FR 0111485A FR 0111485 A FR0111485 A FR 0111485A FR 2829280 B1 FR2829280 B1 FR 2829280B1
Authority
FR
France
Prior art keywords
memory
claquable
slapping
memory device
claquable memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0111485A
Other languages
English (en)
Other versions
FR2829280A1 (fr
Inventor
Sigrid Thomas
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
STMicroelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA filed Critical STMicroelectronics SA
Priority to FR0111485A priority Critical patent/FR2829280B1/fr
Priority to US10/233,052 priority patent/US6775175B2/en
Publication of FR2829280A1 publication Critical patent/FR2829280A1/fr
Application granted granted Critical
Publication of FR2829280B1 publication Critical patent/FR2829280B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/18—Auxiliary circuits, e.g. for writing into memory
FR0111485A 2001-09-05 2001-09-05 Dispositif de memoire claquable et procede de claquage d'une telle memoire Expired - Fee Related FR2829280B1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FR0111485A FR2829280B1 (fr) 2001-09-05 2001-09-05 Dispositif de memoire claquable et procede de claquage d'une telle memoire
US10/233,052 US6775175B2 (en) 2001-09-05 2002-08-30 Blowable memory device and method of blowing such a memory

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0111485A FR2829280B1 (fr) 2001-09-05 2001-09-05 Dispositif de memoire claquable et procede de claquage d'une telle memoire

Publications (2)

Publication Number Publication Date
FR2829280A1 FR2829280A1 (fr) 2003-03-07
FR2829280B1 true FR2829280B1 (fr) 2004-09-24

Family

ID=8866988

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0111485A Expired - Fee Related FR2829280B1 (fr) 2001-09-05 2001-09-05 Dispositif de memoire claquable et procede de claquage d'une telle memoire

Country Status (2)

Country Link
US (1) US6775175B2 (fr)
FR (1) FR2829280B1 (fr)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7012827B2 (en) * 2004-05-07 2006-03-14 Taiwan Semiconductor Manufacturing Co., Ltd. Multiple electrical fuses shared with one program device
US7436020B2 (en) * 2004-06-30 2008-10-14 Micron Technology, Inc. Flash memory with metal-insulator-metal tunneling program and erase
US8514620B2 (en) * 2010-11-29 2013-08-20 Micron Technology, Inc. Memory devices having select gates with P type bodies, memory strings having separate source lines and methods
US8743591B2 (en) * 2011-04-26 2014-06-03 Semiconductor Energy Laboratory Co., Ltd. Semiconductor memory device and method for driving the same

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5832789B2 (ja) * 1980-07-18 1983-07-15 富士通株式会社 半導体メモリ
US5506518A (en) * 1994-09-20 1996-04-09 Xilinx, Inc. Antifuse-based programmable logic circuit
US5675547A (en) * 1995-06-01 1997-10-07 Sony Corporation One time programmable read only memory programmed by destruction of insulating layer
US5724282A (en) * 1996-09-06 1998-03-03 Micron Technology, Inc. System and method for an antifuse bank
US6150706A (en) * 1998-02-27 2000-11-21 Micron Technology, Inc. Capacitor/antifuse structure having a barrier-layer electrode and improved barrier layer
JP2000123592A (ja) * 1998-10-19 2000-04-28 Mitsubishi Electric Corp 半導体装置

Also Published As

Publication number Publication date
US6775175B2 (en) 2004-08-10
US20030053349A1 (en) 2003-03-20
FR2829280A1 (fr) 2003-03-07

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20080531