FR2700852B1 - Cellule d'ablation d'un échantillon au laser. - Google Patents
Cellule d'ablation d'un échantillon au laser.Info
- Publication number
- FR2700852B1 FR2700852B1 FR9300784A FR9300784A FR2700852B1 FR 2700852 B1 FR2700852 B1 FR 2700852B1 FR 9300784 A FR9300784 A FR 9300784A FR 9300784 A FR9300784 A FR 9300784A FR 2700852 B1 FR2700852 B1 FR 2700852B1
- Authority
- FR
- France
- Prior art keywords
- ablation cell
- laser sample
- laser
- sample
- ablation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/40—Concentrating samples
- G01N1/4022—Concentrating samples by thermal techniques; Phase changes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0459—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for solid samples
- H01J49/0463—Desorption by laser or particle beam, followed by ionisation as a separate step
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
- G01N2001/045—Laser ablation; Microwave vaporisation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/10—Devices for withdrawing samples in the liquid or fluent state
- G01N1/14—Suction devices, e.g. pumps; Ejector devices
- G01N2001/1445—Overpressure, pressurisation at sampling point
- G01N2001/1463—Injector; Air-lift
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
- G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Sampling And Sample Adjustment (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9300784A FR2700852B1 (fr) | 1993-01-27 | 1993-01-27 | Cellule d'ablation d'un échantillon au laser. |
PCT/FR1994/000093 WO1994017385A1 (fr) | 1993-01-27 | 1994-01-26 | Cellule d'ablation d'un echantillon au laser |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR9300784A FR2700852B1 (fr) | 1993-01-27 | 1993-01-27 | Cellule d'ablation d'un échantillon au laser. |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2700852A1 FR2700852A1 (fr) | 1994-07-29 |
FR2700852B1 true FR2700852B1 (fr) | 1995-03-03 |
Family
ID=9443390
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR9300784A Expired - Fee Related FR2700852B1 (fr) | 1993-01-27 | 1993-01-27 | Cellule d'ablation d'un échantillon au laser. |
Country Status (2)
Country | Link |
---|---|
FR (1) | FR2700852B1 (fr) |
WO (1) | WO1994017385A1 (fr) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2714464B1 (fr) * | 1993-12-23 | 1996-02-09 | Cogema | Procédé de contrôle de la contamination surfacique d'un solide et dispositif de mise en Óoeuvre. |
DE19529717A1 (de) * | 1995-08-11 | 1997-02-13 | Finnigan Mat Gmbh | Verfahren und Vorrichtung zur Präparation einer anorganischen oder organischen Probe für die Isotopenverhältnisanalyse |
US9524856B2 (en) | 2013-02-09 | 2016-12-20 | Electro Scientific Industries, Inc. | In-chamber fluid handling system and methods handling fluids using the same |
KR20150114963A (ko) * | 2013-02-14 | 2015-10-13 | 일렉트로 싸이언티픽 인더스트리이즈 인코포레이티드 | 조성 분석 시스템을 위한 레이저 어블레이션 셀 및 토치 시스템 |
US20140227776A1 (en) | 2013-02-14 | 2014-08-14 | Electro Scientific Industries, Inc. | Laser ablation cell and torch system for a compositional analysis system |
EP3240014A1 (fr) * | 2016-04-29 | 2017-11-01 | ETH Zurich | Cellule d'ablation laser |
CN117388351B (zh) * | 2023-11-03 | 2024-06-25 | 中国地质大学(武汉) | 一种激光剥蚀***中气溶胶提取装置及方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4150951A (en) * | 1977-09-19 | 1979-04-24 | The Aerospace Corporation | Measurement of concentrations of gaseous phase elements |
DD153921B1 (de) * | 1980-10-29 | 1987-01-07 | Werner Schroen | Vorrichtung zum transport von probendampf |
DE3422946A1 (de) * | 1984-06-20 | 1986-01-02 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zur feststoffanalyse in plasmen und plasmabrenner zur durchfuehrung des verfahrens |
JPH02227652A (ja) * | 1989-02-28 | 1990-09-10 | Yokogawa Electric Corp | 試料導入装置 |
JPH03167446A (ja) * | 1989-11-27 | 1991-07-19 | Seiko Instr Inc | レーザー気化装置の試料交換装置 |
-
1993
- 1993-01-27 FR FR9300784A patent/FR2700852B1/fr not_active Expired - Fee Related
-
1994
- 1994-01-26 WO PCT/FR1994/000093 patent/WO1994017385A1/fr active Application Filing
Also Published As
Publication number | Publication date |
---|---|
WO1994017385A1 (fr) | 1994-08-04 |
FR2700852A1 (fr) | 1994-07-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |