FR2647551B1 - Sonde electro-optique pour la mesure de signaux ou de champs electriques et son application - Google Patents

Sonde electro-optique pour la mesure de signaux ou de champs electriques et son application

Info

Publication number
FR2647551B1
FR2647551B1 FR898915444A FR8915444A FR2647551B1 FR 2647551 B1 FR2647551 B1 FR 2647551B1 FR 898915444 A FR898915444 A FR 898915444A FR 8915444 A FR8915444 A FR 8915444A FR 2647551 B1 FR2647551 B1 FR 2647551B1
Authority
FR
France
Prior art keywords
electro
fields
application
electrical signals
optical probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR898915444A
Other languages
English (en)
Other versions
FR2647551A1 (fr
Inventor
Steven Williamson
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Rochester
Original Assignee
University of Rochester
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Rochester filed Critical University of Rochester
Publication of FR2647551A1 publication Critical patent/FR2647551A1/fr
Application granted granted Critical
Publication of FR2647551B1 publication Critical patent/FR2647551B1/fr
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/07—Non contact-making probes
    • G01R1/071—Non contact-making probes containing electro-optic elements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
FR898915444A 1989-05-23 1989-11-23 Sonde electro-optique pour la mesure de signaux ou de champs electriques et son application Expired - Fee Related FR2647551B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/355,514 US4928058A (en) 1989-05-23 1989-05-23 Electro-optic signal measurement

Publications (2)

Publication Number Publication Date
FR2647551A1 FR2647551A1 (fr) 1990-11-30
FR2647551B1 true FR2647551B1 (fr) 1992-08-14

Family

ID=23397712

Family Applications (1)

Application Number Title Priority Date Filing Date
FR898915444A Expired - Fee Related FR2647551B1 (fr) 1989-05-23 1989-11-23 Sonde electro-optique pour la mesure de signaux ou de champs electriques et son application

Country Status (5)

Country Link
US (1) US4928058A (fr)
JP (1) JPH0318780A (fr)
DE (1) DE4001737A1 (fr)
FR (1) FR2647551B1 (fr)
GB (2) GB2231956B (fr)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5354695A (en) * 1992-04-08 1994-10-11 Leedy Glenn J Membrane dielectric isolation IC fabrication
US5041783A (en) * 1989-02-13 1991-08-20 Olympus Optical Co., Ltd. Probe unit for an atomic probe microscope
US5434698A (en) * 1989-11-13 1995-07-18 Dai Nippon Printing Co., Ltd. Potential sensor employing electrooptic crystal and potential measuring method
US5208531A (en) * 1990-08-13 1993-05-04 Texas Instruments Incorporated Apparatus and method for testing integrated circuits
US6714625B1 (en) * 1992-04-08 2004-03-30 Elm Technology Corporation Lithography device for semiconductor circuit pattern generation
US5592101A (en) * 1992-07-24 1997-01-07 Hamamatsu Photonics K.K. Electro-optic apparatus for measuring an electric field of a sample
US5406194A (en) * 1992-09-21 1995-04-11 At&T Corp. Alx Ga1-x as probe for use in electro-optic sampling
US5952818A (en) * 1996-05-31 1999-09-14 Rensselaer Polytechnic Institute Electro-optical sensing apparatus and method for characterizing free-space electromagnetic radiation
EP0902896A4 (fr) * 1996-05-31 1999-12-08 Rensselaer Polytech Inst Dispositif electro-optique et magneto-optique et procede pour deceler le rayonnement electromagnetique dans l'espace libre
US6414473B1 (en) 1996-05-31 2002-07-02 Rensselaer Polytechnic Institute Electro-optic/magneto-optic measurement of electromagnetic radiation using chirped optical pulse
US5915167A (en) * 1997-04-04 1999-06-22 Elm Technology Corporation Three dimensional structure memory
US6551857B2 (en) * 1997-04-04 2003-04-22 Elm Technology Corporation Three dimensional structure integrated circuits
JP2000162243A (ja) * 1998-11-30 2000-06-16 Ando Electric Co Ltd 電気光学サンプリングプローバ
US6288531B1 (en) * 1999-02-03 2001-09-11 Ando Electric Co., Ltd. Probe for electro-optic sampling oscilloscope
US6400165B1 (en) * 2000-02-02 2002-06-04 Lucent Technologies Inc. Ultra-fast probe
US6587258B1 (en) * 2000-03-24 2003-07-01 Southwest Sciences Incorporated Electro-optic electric field probe
US6677769B2 (en) 2000-06-09 2004-01-13 The Regents Of The University Of Michigan Scanning electromagnetic-field imager with optical-fiber-based electro-optic field-mapping system
US6906506B1 (en) 2001-06-08 2005-06-14 The Regents Of The University Of Michigan Method and apparatus for simultaneous measurement of electric field and temperature using an electrooptic semiconductor probe
US7402897B2 (en) * 2002-08-08 2008-07-22 Elm Technology Corporation Vertical system integration
WO2005017732A1 (fr) 2003-08-18 2005-02-24 Gunze Limited Panneau tactile transparent et dispositif electronique
JP2007072494A (ja) * 2003-12-25 2007-03-22 Nissha Printing Co Ltd タッチパネル
WO2009028653A1 (fr) 2007-08-30 2009-03-05 Kyocera Corporation Panneau tactile et dispositif d'affichage de panneau tactile

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4446426A (en) * 1981-11-04 1984-05-01 Westinghouse Electric Corp. On-line RF arc monitor for large rotating generators
JPS58109859A (ja) * 1981-12-24 1983-06-30 Sumitomo Electric Ind Ltd 光による電圧・電界測定器
IT1161826B (it) * 1983-05-03 1987-03-18 Anic Spa Metodo per la terminazione di polimeri viventi e composti adatti allo scopo
US4618819A (en) * 1984-03-27 1986-10-21 The University Of Rochester Measurement of electrical signals with subpicosecond resolution
US4603293A (en) * 1984-03-27 1986-07-29 University Of Rochester Measurement of electrical signals with subpicosecond resolution
GB8507560D0 (en) * 1985-03-22 1985-05-01 Plessey Co Plc Optical connecting arrangements
GB8610129D0 (en) * 1986-04-25 1986-05-29 Secr Defence Electro-optical device
US4910458A (en) * 1987-03-24 1990-03-20 Princeton Applied Research Corp. Electro-optic sampling system with dedicated electro-optic crystal and removable sample carrier
JPH0695111B2 (ja) * 1987-06-05 1994-11-24 浜松ホトニクス株式会社 電圧検出装置
JP2537364B2 (ja) * 1987-06-10 1996-09-25 浜松ホトニクス株式会社 電圧検出装置
JPS63308572A (ja) * 1987-06-10 1988-12-15 Hamamatsu Photonics Kk 電圧検出装置
JPH0695114B2 (ja) * 1987-07-13 1994-11-24 浜松ホトニクス株式会社 電圧検出装置

Also Published As

Publication number Publication date
US4928058A (en) 1990-05-22
DE4001737A1 (de) 1990-11-29
GB8925603D0 (en) 1990-01-04
GB2231956A (en) 1990-11-28
GB9314803D0 (en) 1993-08-25
JPH0318780A (ja) 1991-01-28
FR2647551A1 (fr) 1990-11-30
GB2267566A (en) 1993-12-08
GB2267566B (en) 1994-03-02
GB2231956B (en) 1994-01-19

Similar Documents

Publication Publication Date Title
FR2647551B1 (fr) Sonde electro-optique pour la mesure de signaux ou de champs electriques et son application
DE3864467D1 (de) Geraet und verfahren zur messung von deformationen einer probe.
FR2531482B1 (fr) Instrument, et notamment sonde, de mesure et de controle de sondages
GB8823795D0 (en) Testing device & method of determining uncertainty of measurement of coordinate-measuring instruments
DE69015401D1 (de) Instrument zur gleichzeitigen optischen Messung von thermischen und elektrischen Grössen.
FR2614105B1 (fr) Appareil et sonde pour le test de cartes de circuit imprime
DE69731206D1 (de) Fuzzy-Logikverfahren zur indirekten Messung von überwachten physischen Signalen und entsprechende Messvorrichtung
DE69413670D1 (de) Messvorrichtung zur differentiellen messung von momenten
BR9200851A (pt) Teste de tracao laboratorial
DE3863708D1 (de) Geraet und verfahren zur messung von deformationen einer probe.
DE69010627D1 (de) Verfahren und Gerät zur Messung von Bodenschwankungen.
DE3880748D1 (de) Verfahren und vorrichtung zur messung oder bestimmung einer oder mehrerer eigenschaften oder der identitaet einer probe.
DE69622671D1 (de) Verfahren und Vorrichtung zum Prüfen von Funknavigationsgeräten mit Messgeräten und Generatoren für Normsignale
EP0152066A3 (en) Method and system for testing and/or measuring electrically conductive test objects
DE69224066D1 (de) Sonde zur Oberflächenmessung
DE69232532D1 (de) Verfahren und Vorrichtung zur Bilderzeugung mittels magnetischer Resonanz mit der Möglichkeit der Messung von kurzen T2-Signalkomponenten
DE69000071D1 (de) Vorrichtung zur dynamischen torsionspruefung einer probe.
IT1219490B (it) Dispositivo e procedimento per misurazioni altamente accurate su tessuti coesionati o feltri fibrosi
FR2615955B1 (fr) Sonde pour tester des composants electroniques
FR2639119B1 (fr) Appareil de mesure de differentes grandeurs electriques ou multimetre perfectionne
FR2569974B1 (fr) Dispositif de depistage et/ou de mesure des defauts visuels
FR2564598B1 (fr) Sonde de mesure de corrosion de canalisations
FR2591342B1 (fr) Sonde ultrasonique pour tester le materiau de pieces fendues ou creuses
FR2621132B1 (fr) Procede et dispositif de mesures de distances
EP0284771A3 (en) Device and method for an optical measurement or/and imaging of electrical potentials

Legal Events

Date Code Title Description
ST Notification of lapse