FR2576422B1 - Adapteur de controle, notamment pour circuit electronique ou electrique et en particulier des circuits imprimes ou analogues - Google Patents
Adapteur de controle, notamment pour circuit electronique ou electrique et en particulier des circuits imprimes ou analoguesInfo
- Publication number
- FR2576422B1 FR2576422B1 FR8600891A FR8600891A FR2576422B1 FR 2576422 B1 FR2576422 B1 FR 2576422B1 FR 8600891 A FR8600891 A FR 8600891A FR 8600891 A FR8600891 A FR 8600891A FR 2576422 B1 FR2576422 B1 FR 2576422B1
- Authority
- FR
- France
- Prior art keywords
- combined plate
- front combined
- contact pins
- holes
- diameter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Steroid Compounds (AREA)
- Polymers With Sulfur, Phosphorus Or Metals In The Main Chain (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE3501874 | 1985-01-22 |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2576422A1 FR2576422A1 (fr) | 1986-07-25 |
FR2576422B1 true FR2576422B1 (fr) | 1987-09-18 |
Family
ID=6260363
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR8600891A Expired FR2576422B1 (fr) | 1985-01-22 | 1986-01-22 | Adapteur de controle, notamment pour circuit electronique ou electrique et en particulier des circuits imprimes ou analogues |
Country Status (4)
Country | Link |
---|---|
EP (1) | EP0189179B1 (fr) |
AT (2) | AT395485B (fr) |
DE (1) | DE3671974D1 (fr) |
FR (1) | FR2576422B1 (fr) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4884024A (en) * | 1985-11-19 | 1989-11-28 | Teradyne, Inc. | Test pin assembly for circuit board tester |
DE3832410C2 (de) * | 1987-10-09 | 1994-07-28 | Feinmetall Gmbh | Kontaktvorrichtung |
SE458005B (sv) * | 1987-11-16 | 1989-02-13 | Reinhold Strandberg | Foerfarande foer provning av kretskort samt apparat foer utfoerande av provningen |
SE457315B (sv) * | 1987-11-16 | 1988-12-12 | Reinhold Strandberg | Apparat foer provning av kretskort |
DE4226069C2 (de) * | 1992-08-06 | 1994-08-04 | Test Plus Electronic Gmbh | Adaptereinrichtung für eine Prüfeinrichtung für Schaltungsplatinen |
FR2777999B1 (fr) * | 1998-04-28 | 2000-06-09 | St Microelectronics Sa | Dispositif de connexion electrique d'un composant electronique par points retractables |
US6570399B2 (en) | 2000-05-18 | 2003-05-27 | Qa Technology Company, Inc. | Test probe and separable mating connector assembly |
US6876530B2 (en) | 2001-01-12 | 2005-04-05 | Qa Technology Company, Inc. | Test probe and connector |
WO2014143880A1 (fr) | 2013-03-15 | 2014-09-18 | Siluria Technologies, Inc. | Catalyseurs pour une catalyse pétrochimique |
CN115460850A (zh) * | 2022-09-30 | 2022-12-09 | 陈金泉 | 一种堆叠式多层电路板 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4183609A (en) * | 1978-03-16 | 1980-01-15 | Luna L Jack | Insulator board for spring probe fixtures |
DE2933862A1 (de) * | 1979-08-21 | 1981-03-12 | Paul Mang | Vorrichtung zur elektronischen pruefung von leiterplatten. |
DE3115787A1 (de) * | 1981-03-06 | 1982-11-04 | Feinmetall Gmbh, 7033 Herrenberg | Kontaktvorrichtung |
DE3240415A1 (de) * | 1982-11-02 | 1984-05-03 | Siemens AG, 1000 Berlin und 8000 München | Nadelfelder fuer pruefautomaten |
-
1986
- 1986-01-09 AT AT0003186A patent/AT395485B/de not_active IP Right Cessation
- 1986-01-22 FR FR8600891A patent/FR2576422B1/fr not_active Expired
- 1986-01-22 EP EP86100780A patent/EP0189179B1/fr not_active Expired - Lifetime
- 1986-01-22 DE DE8686100780T patent/DE3671974D1/de not_active Expired - Lifetime
- 1986-01-22 AT AT86100780T patent/ATE53672T1/de not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP0189179B1 (fr) | 1990-06-13 |
FR2576422A1 (fr) | 1986-07-25 |
DE3671974D1 (de) | 1990-07-19 |
EP0189179A1 (fr) | 1986-07-30 |
ATA3186A (de) | 1992-05-15 |
ATE53672T1 (de) | 1990-06-15 |
AT395485B (de) | 1993-01-25 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |