FR2408261A1 - Dispositif analyseur d'image du type a l'etat solide - Google Patents

Dispositif analyseur d'image du type a l'etat solide

Info

Publication number
FR2408261A1
FR2408261A1 FR7831380A FR7831380A FR2408261A1 FR 2408261 A1 FR2408261 A1 FR 2408261A1 FR 7831380 A FR7831380 A FR 7831380A FR 7831380 A FR7831380 A FR 7831380A FR 2408261 A1 FR2408261 A1 FR 2408261A1
Authority
FR
France
Prior art keywords
solid state
image analyzer
analyzer device
state image
elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
FR7831380A
Other languages
English (en)
Other versions
FR2408261B1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP1978047072U external-priority patent/JPS54151181U/ja
Priority claimed from JP1978066554U external-priority patent/JPS54169426U/ja
Priority claimed from JP1978085372U external-priority patent/JPS553553U/ja
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Publication of FR2408261A1 publication Critical patent/FR2408261A1/fr
Application granted granted Critical
Publication of FR2408261B1 publication Critical patent/FR2408261B1/fr
Expired legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/14643—Photodiode arrays; MOS imagers
    • H01L27/14654—Blooming suppression
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/62—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels
    • H04N25/621—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming
    • H04N25/622—Detection or reduction of noise due to excess charges produced by the exposure, e.g. smear, blooming, ghost image, crosstalk or leakage between pixels for the control of blooming by controlling anti-blooming drains

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)

Abstract

LE DISPOSITIF ANALYSEUR D'IMAGE DU TYPE A L'ETAT SOLIDE SELON LA PRESENTE INVENTION PERMET DE SUPPRIMER LE PHENOMENE DIT DE "FLOU D'IMAGE" ET, A CETTE FIN, IL COMPREND UN MOYEN POUR ELIMINER LES CHARGES ELECTRIQUES EN SURPLUS DANS DES ELEMENTS PHOTOELECTRIQUES 1 DE LA PARTIE 9 RECEPTRICE DE LUMIERE EN FAISANT VARIER LE POTENTIEL AUX BORNES DE COMMANDE DES ELEMENTS DE COMMUTATION VERTICAUX 91 A 9N PENDANT UNE PERIODE DE SUPPRESSION DE BALAYAGE.
FR7831380A 1977-11-07 1978-11-06 Dispositif analyseur d'image du type a l'etat solide Expired FR2408261B1 (fr)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP14831177 1977-11-07
JP1978047072U JPS54151181U (fr) 1978-04-12 1978-04-12
JP1978066554U JPS54169426U (fr) 1978-05-19 1978-05-19
JP1978085372U JPS553553U (fr) 1978-06-23 1978-06-23

Publications (2)

Publication Number Publication Date
FR2408261A1 true FR2408261A1 (fr) 1979-06-01
FR2408261B1 FR2408261B1 (fr) 1985-10-11

Family

ID=27461990

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7831380A Expired FR2408261B1 (fr) 1977-11-07 1978-11-06 Dispositif analyseur d'image du type a l'etat solide

Country Status (4)

Country Link
DE (1) DE2847992C2 (fr)
FR (1) FR2408261B1 (fr)
GB (1) GB2008889B (fr)
NL (1) NL7811038A (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0029351A2 (fr) * 1979-11-14 1981-05-27 Hitachi, Ltd. Dispositif de formation d'images à état solide
EP0104259A1 (fr) * 1982-03-31 1984-04-04 Sony Corporation Element de prise d'image a semi-conducteurs

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6017196B2 (ja) * 1978-01-23 1985-05-01 株式会社日立製作所 固体撮像素子
FR2433868A1 (fr) * 1978-08-17 1980-03-14 Hitachi Ltd Dispositif de formation d'image a semi-conducteur
JPS5738073A (en) * 1980-08-20 1982-03-02 Hitachi Ltd Solid-state image sensor
JPS5814682A (ja) * 1981-07-20 1983-01-27 Sony Corp 固体撮像装置
DE3138240A1 (de) * 1981-09-25 1983-04-07 Siemens AG, 1000 Berlin und 8000 München Zweidimensionaler halbleiter-bildsensor mit steuerung oder regelung der integrationszeit
DE3138294A1 (de) * 1981-09-25 1983-04-14 Siemens AG, 1000 Berlin und 8000 München Zweidimensionaler halbleiter-bildsensor mit steuerung oder regelung der integrationszeit
JPS5930376A (ja) * 1982-08-13 1984-02-17 Olympus Optical Co Ltd 固体撮像装置
DE3236073A1 (de) * 1982-09-29 1984-03-29 Siemens AG, 1000 Berlin und 8000 München Zweidimensionaler halbleiter-bildsensor mit einer anordnung zur reduzierung des ueberstrahlens
US4652918A (en) * 1985-03-04 1987-03-24 General Electric Company Compensating circuit
DE4415138A1 (de) * 1994-04-29 1995-11-02 Gold Star Electronics Vorspannschaltung gegen Überstrahlen

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3931465A (en) * 1975-01-13 1976-01-06 Rca Corporation Blooming control for charge coupled imager

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5310433B2 (fr) * 1975-03-10 1978-04-13

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3931465A (en) * 1975-01-13 1976-01-06 Rca Corporation Blooming control for charge coupled imager

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
EXBK/76 *

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0029351A2 (fr) * 1979-11-14 1981-05-27 Hitachi, Ltd. Dispositif de formation d'images à état solide
EP0029351A3 (en) * 1979-11-14 1982-03-24 Hitachi, Ltd. Solid-state imaging device
EP0104259A1 (fr) * 1982-03-31 1984-04-04 Sony Corporation Element de prise d'image a semi-conducteurs
EP0104259A4 (fr) * 1982-03-31 1986-11-06 Sony Corp Element de prise d'image a semi-conducteurs.

Also Published As

Publication number Publication date
GB2008889A (en) 1979-06-06
GB2008889B (en) 1982-08-04
FR2408261B1 (fr) 1985-10-11
DE2847992C2 (de) 1981-10-01
NL7811038A (nl) 1979-05-09
DE2847992A1 (de) 1979-05-10

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Legal Events

Date Code Title Description
ST Notification of lapse