FR2381316B1 - - Google Patents

Info

Publication number
FR2381316B1
FR2381316B1 FR7707649A FR7707649A FR2381316B1 FR 2381316 B1 FR2381316 B1 FR 2381316B1 FR 7707649 A FR7707649 A FR 7707649A FR 7707649 A FR7707649 A FR 7707649A FR 2381316 B1 FR2381316 B1 FR 2381316B1
Authority
FR
France
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
FR7707649A
Other versions
FR2381316A1 (fr
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HUNTRON INSTRUMENTS Inc
Original Assignee
HUNTRON INSTRUMENTS Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by HUNTRON INSTRUMENTS Inc filed Critical HUNTRON INSTRUMENTS Inc
Publication of FR2381316A1 publication Critical patent/FR2381316A1/fr
Application granted granted Critical
Publication of FR2381316B1 publication Critical patent/FR2381316B1/fr
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2843—In-circuit-testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
FR7707649A 1977-02-16 1977-03-15 Dispositif d'essais pour semi-conducteurs Granted FR2381316A1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/769,110 US4074195A (en) 1977-02-16 1977-02-16 Semiconductor tester

Publications (2)

Publication Number Publication Date
FR2381316A1 FR2381316A1 (fr) 1978-09-15
FR2381316B1 true FR2381316B1 (fr) 1983-02-25

Family

ID=25084487

Family Applications (1)

Application Number Title Priority Date Filing Date
FR7707649A Granted FR2381316A1 (fr) 1977-02-16 1977-03-15 Dispositif d'essais pour semi-conducteurs

Country Status (9)

Country Link
US (1) US4074195A (fr)
JP (1) JPS53101984A (fr)
CA (1) CA1093705A (fr)
FR (1) FR2381316A1 (fr)
GB (1) GB1567231A (fr)
IL (1) IL51637A (fr)
IT (1) IT1082962B (fr)
MX (1) MX145865A (fr)
NL (1) NL7702877A (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4386317A (en) * 1980-09-12 1983-05-31 Huntron Instruments, Inc. Apparatus for testing, in-circuit, semiconductors shunted by a low resistance
FR2662259B1 (fr) * 1990-05-17 1992-09-18 Commissariat Energie Atomique Dispositif automatique pour la mesure de caracteristiques concernant des composants electroniques.
GB2278689B (en) * 1993-06-02 1997-03-19 Ford Motor Co Method and apparatus for testing integrated circuits
US5508607A (en) * 1994-08-11 1996-04-16 Fluke Corporation Electronic test instrument for component test
US5596280A (en) * 1995-06-15 1997-01-21 International Business Machines Corp. Apparatus and method for testing circuits by the response of a phase-locked loop
US9310408B2 (en) * 2012-04-30 2016-04-12 Keysight Technologies, Inc. Power device analyzer
WO2024029282A1 (fr) * 2022-08-04 2024-02-08 ローム株式会社 Appareil de test de semi-conducteurs

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4720457U (fr) * 1971-03-06 1972-11-08
DE2345469A1 (de) * 1973-09-08 1975-03-20 Rolf Kox Verfahren, geraet und schaltungsanordnung zur funktionsfaehigkeitspruefung eines in einer schaltung integrierten elektrischen bauelementes
US3973198A (en) * 1974-10-29 1976-08-03 Bill Hunt In-circuit semiconductor tester

Also Published As

Publication number Publication date
IT1082962B (it) 1985-05-21
MX145865A (es) 1982-04-12
GB1567231A (en) 1980-05-14
JPS53101984A (en) 1978-09-05
IL51637A0 (en) 1977-05-31
IL51637A (en) 1979-09-30
US4074195A (en) 1978-02-14
CA1093705A (fr) 1981-01-13
FR2381316A1 (fr) 1978-09-15
NL7702877A (nl) 1978-08-18

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Legal Events

Date Code Title Description
ST Notification of lapse