FR2294539A1 - Gas ioniser - with microchannel disc for emission of secondary electrons giving ion discharge - Google Patents
Gas ioniser - with microchannel disc for emission of secondary electrons giving ion dischargeInfo
- Publication number
- FR2294539A1 FR2294539A1 FR7441249A FR7441249A FR2294539A1 FR 2294539 A1 FR2294539 A1 FR 2294539A1 FR 7441249 A FR7441249 A FR 7441249A FR 7441249 A FR7441249 A FR 7441249A FR 2294539 A1 FR2294539 A1 FR 2294539A1
- Authority
- FR
- France
- Prior art keywords
- disc
- gas
- electrodes
- electrons
- ionising
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J43/00—Secondary-emission tubes; Electron-multiplier tubes
- H01J43/04—Electron multipliers
- H01J43/06—Electrode arrangements
- H01J43/18—Electrode arrangements using essentially more than one dynode
- H01J43/24—Dynodes having potential gradient along their surfaces
- H01J43/246—Microchannel plates [MCP]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J27/00—Ion beam tubes
- H01J27/02—Ion sources; Ion guns
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Combustion & Propulsion (AREA)
- Electron Sources, Ion Sources (AREA)
Abstract
In an ionising device having a source of electrons in the interior of a sealed evacuated enclosure subsequently filled with a gas atmosphere, with means for circulating the electrons and ionising the gas as well as means for extracting the ions of the plasma so created. (a) the electron source consists of a disc with micro-channels having an internal secondary electron emission on the faces of which a pulsed potential difference of ca 1000V is applied (b) an auxiliary electron source may optionally be arranged in front of the face at the lower potential (called the disc inlet in opposition to the other face which is called the outlet), (c) the means for accelerating the electrons, ionising the gas and extracting the plasma ions comprise a system of electrodes situated on both sides of or within the plasma (d) a pulsed potential difference is applied between these different electrodes simultaneously with or slightly later than that applied to the faces of the disc, the potential difference of the electrodes furthest apart differing by a value of the order of several kilo volts. the potential of on eof these electrodes being in the vicinity of that on the output or input face of the disc. Permits auto-maintenance of electron emission and re-injection into the disc of the energy removed in the electron beam.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7441249A FR2294539A1 (en) | 1974-12-13 | 1974-12-13 | Gas ioniser - with microchannel disc for emission of secondary electrons giving ion discharge |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR7441249A FR2294539A1 (en) | 1974-12-13 | 1974-12-13 | Gas ioniser - with microchannel disc for emission of secondary electrons giving ion discharge |
Publications (2)
Publication Number | Publication Date |
---|---|
FR2294539A1 true FR2294539A1 (en) | 1976-07-09 |
FR2294539B1 FR2294539B1 (en) | 1978-12-22 |
Family
ID=9146172
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FR7441249A Granted FR2294539A1 (en) | 1974-12-13 | 1974-12-13 | Gas ioniser - with microchannel disc for emission of secondary electrons giving ion discharge |
Country Status (1)
Country | Link |
---|---|
FR (1) | FR2294539A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2792773A1 (en) * | 1999-04-22 | 2000-10-27 | Cit Alcatel | Mass spectrometer ionisation gas samples analysis having electron beam generator/focussing and circular microchannel sections producing increased secondary electron beam and ionisation zone directing. |
-
1974
- 1974-12-13 FR FR7441249A patent/FR2294539A1/en active Granted
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2792773A1 (en) * | 1999-04-22 | 2000-10-27 | Cit Alcatel | Mass spectrometer ionisation gas samples analysis having electron beam generator/focussing and circular microchannel sections producing increased secondary electron beam and ionisation zone directing. |
EP1052672A1 (en) * | 1999-04-22 | 2000-11-15 | Alcatel | Time-of-flight mass spectrometer ion source for gas sample analysis |
US6545269B1 (en) | 1999-04-22 | 2003-04-08 | Alcatel | Ion source for time-of-flight mass spectrometers for analyzing gas samples |
Also Published As
Publication number | Publication date |
---|---|
FR2294539B1 (en) | 1978-12-22 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
ST | Notification of lapse |