FI981810A0 - Menetelmä alkuainepitoisuuksien määrittämiseksi - Google Patents
Menetelmä alkuainepitoisuuksien määrittämiseksiInfo
- Publication number
- FI981810A0 FI981810A0 FI981810A FI981810A FI981810A0 FI 981810 A0 FI981810 A0 FI 981810A0 FI 981810 A FI981810 A FI 981810A FI 981810 A FI981810 A FI 981810A FI 981810 A0 FI981810 A0 FI 981810A0
- Authority
- FI
- Finland
- Prior art keywords
- determination
- elemental concentrations
- elemental
- concentrations
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI981810A FI110820B (fi) | 1998-08-24 | 1998-08-24 | Menetelmä alkuainepitoisuuksien määrittämiseksi |
AU43525/99A AU758756B2 (en) | 1998-08-24 | 1999-08-11 | Method for determining element contents |
US09/374,070 US6285734B1 (en) | 1998-08-24 | 1999-08-12 | Method for determining element contents using wave dispersive and energy dispersive x-ray fluorescence analysis |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI981810 | 1998-08-24 | ||
FI981810A FI110820B (fi) | 1998-08-24 | 1998-08-24 | Menetelmä alkuainepitoisuuksien määrittämiseksi |
Publications (3)
Publication Number | Publication Date |
---|---|
FI981810A0 true FI981810A0 (fi) | 1998-08-24 |
FI981810A FI981810A (fi) | 2000-04-14 |
FI110820B FI110820B (fi) | 2003-03-31 |
Family
ID=8552349
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI981810A FI110820B (fi) | 1998-08-24 | 1998-08-24 | Menetelmä alkuainepitoisuuksien määrittämiseksi |
Country Status (3)
Country | Link |
---|---|
US (1) | US6285734B1 (fi) |
AU (1) | AU758756B2 (fi) |
FI (1) | FI110820B (fi) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1144986A2 (de) * | 1999-01-23 | 2001-10-17 | MERCK PATENT GmbH | Energiedispersive röntgenfluoreszenzanalyse von chemischen substanzen |
JP2003534528A (ja) | 1999-11-19 | 2003-11-18 | バッテル・メモリアル・インスティチュート | 機械用流体分析装置 |
US6668039B2 (en) | 2002-01-07 | 2003-12-23 | Battelle Memorial Institute | Compact X-ray fluorescence spectrometer and method for fluid analysis |
US6859517B2 (en) * | 2003-04-22 | 2005-02-22 | Battelle Memorial Institute | Dual x-ray fluorescence spectrometer and method for fluid analysis |
JP3928656B2 (ja) * | 2003-07-11 | 2007-06-13 | 学校法人早稲田大学 | エネルギー分散型エックス線回折・分光装置 |
US7298817B2 (en) * | 2003-12-01 | 2007-11-20 | X-Ray Optical Systems, Inc. | Portable and on-line arsenic analyzer for drinking water |
US7184515B2 (en) * | 2004-09-24 | 2007-02-27 | Battelle Memorial Institute | Component specific machine wear determination with x-ray fluorescence spectrometry |
US9739730B2 (en) * | 2015-03-03 | 2017-08-22 | Panalytical B.V. | Quantitative X-ray analysis—multi optical path instrument |
CN107957431A (zh) * | 2017-12-27 | 2018-04-24 | 吴俊逸 | 一种快速半定量检测烟花爆竹用烟火药盲样中汞含量的方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4263510A (en) * | 1979-07-30 | 1981-04-21 | General Electric Company | Combined x-ray diffraction and fluorescence spectroscopy apparatus with environmentally controllable chamber |
JPH0238850A (ja) * | 1988-07-28 | 1990-02-08 | Jeol Ltd | X線分光器を用いた定性分析方法 |
JPH06174663A (ja) * | 1992-12-01 | 1994-06-24 | Toshiba Corp | 汚染元素分析方法 |
JP2848751B2 (ja) * | 1992-12-04 | 1999-01-20 | 株式会社東芝 | 元素分析方法 |
-
1998
- 1998-08-24 FI FI981810A patent/FI110820B/fi not_active IP Right Cessation
-
1999
- 1999-08-11 AU AU43525/99A patent/AU758756B2/en not_active Expired
- 1999-08-12 US US09/374,070 patent/US6285734B1/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
AU4352599A (en) | 2000-03-16 |
US6285734B1 (en) | 2001-09-04 |
FI110820B (fi) | 2003-03-31 |
FI981810A (fi) | 2000-04-14 |
AU758756B2 (en) | 2003-03-27 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MA | Patent expired |