FI981810A0 - Menetelmä alkuainepitoisuuksien määrittämiseksi - Google Patents

Menetelmä alkuainepitoisuuksien määrittämiseksi

Info

Publication number
FI981810A0
FI981810A0 FI981810A FI981810A FI981810A0 FI 981810 A0 FI981810 A0 FI 981810A0 FI 981810 A FI981810 A FI 981810A FI 981810 A FI981810 A FI 981810A FI 981810 A0 FI981810 A0 FI 981810A0
Authority
FI
Finland
Prior art keywords
determination
elemental concentrations
elemental
concentrations
Prior art date
Application number
FI981810A
Other languages
English (en)
Swedish (sv)
Other versions
FI110820B (fi
FI981810A (fi
Inventor
Myoeh. Ilm.
Original Assignee
Outokumpu Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Outokumpu Oy filed Critical Outokumpu Oy
Priority to FI981810A priority Critical patent/FI110820B/fi
Publication of FI981810A0 publication Critical patent/FI981810A0/fi
Priority to AU43525/99A priority patent/AU758756B2/en
Priority to US09/374,070 priority patent/US6285734B1/en
Publication of FI981810A publication Critical patent/FI981810A/fi
Application granted granted Critical
Publication of FI110820B publication Critical patent/FI110820B/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FI981810A 1998-08-24 1998-08-24 Menetelmä alkuainepitoisuuksien määrittämiseksi FI110820B (fi)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FI981810A FI110820B (fi) 1998-08-24 1998-08-24 Menetelmä alkuainepitoisuuksien määrittämiseksi
AU43525/99A AU758756B2 (en) 1998-08-24 1999-08-11 Method for determining element contents
US09/374,070 US6285734B1 (en) 1998-08-24 1999-08-12 Method for determining element contents using wave dispersive and energy dispersive x-ray fluorescence analysis

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI981810 1998-08-24
FI981810A FI110820B (fi) 1998-08-24 1998-08-24 Menetelmä alkuainepitoisuuksien määrittämiseksi

Publications (3)

Publication Number Publication Date
FI981810A0 true FI981810A0 (fi) 1998-08-24
FI981810A FI981810A (fi) 2000-04-14
FI110820B FI110820B (fi) 2003-03-31

Family

ID=8552349

Family Applications (1)

Application Number Title Priority Date Filing Date
FI981810A FI110820B (fi) 1998-08-24 1998-08-24 Menetelmä alkuainepitoisuuksien määrittämiseksi

Country Status (3)

Country Link
US (1) US6285734B1 (fi)
AU (1) AU758756B2 (fi)
FI (1) FI110820B (fi)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1144986A2 (de) * 1999-01-23 2001-10-17 MERCK PATENT GmbH Energiedispersive röntgenfluoreszenzanalyse von chemischen substanzen
JP2003534528A (ja) 1999-11-19 2003-11-18 バッテル・メモリアル・インスティチュート 機械用流体分析装置
US6668039B2 (en) 2002-01-07 2003-12-23 Battelle Memorial Institute Compact X-ray fluorescence spectrometer and method for fluid analysis
US6859517B2 (en) * 2003-04-22 2005-02-22 Battelle Memorial Institute Dual x-ray fluorescence spectrometer and method for fluid analysis
JP3928656B2 (ja) * 2003-07-11 2007-06-13 学校法人早稲田大学 エネルギー分散型エックス線回折・分光装置
US7298817B2 (en) * 2003-12-01 2007-11-20 X-Ray Optical Systems, Inc. Portable and on-line arsenic analyzer for drinking water
US7184515B2 (en) * 2004-09-24 2007-02-27 Battelle Memorial Institute Component specific machine wear determination with x-ray fluorescence spectrometry
US9739730B2 (en) * 2015-03-03 2017-08-22 Panalytical B.V. Quantitative X-ray analysis—multi optical path instrument
CN107957431A (zh) * 2017-12-27 2018-04-24 吴俊逸 一种快速半定量检测烟花爆竹用烟火药盲样中汞含量的方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4263510A (en) * 1979-07-30 1981-04-21 General Electric Company Combined x-ray diffraction and fluorescence spectroscopy apparatus with environmentally controllable chamber
JPH0238850A (ja) * 1988-07-28 1990-02-08 Jeol Ltd Ｘ線分光器を用いた定性分析方法
JPH06174663A (ja) * 1992-12-01 1994-06-24 Toshiba Corp 汚染元素分析方法
JP2848751B2 (ja) * 1992-12-04 1999-01-20 株式会社東芝 元素分析方法

Also Published As

Publication number Publication date
AU4352599A (en) 2000-03-16
US6285734B1 (en) 2001-09-04
FI110820B (fi) 2003-03-31
FI981810A (fi) 2000-04-14
AU758756B2 (en) 2003-03-27

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Legal Events

Date Code Title Description
MA Patent expired