FI953370A0 - Menetelmä NDIR-mittalaitteen lyhyen Fabry-Perot inMenetelmä NDIR-mittalaitteen lyhyen Fabry-Perot interferometrin ohjaamiseksi terferometrin ohjaamiseksi - Google Patents
Menetelmä NDIR-mittalaitteen lyhyen Fabry-Perot inMenetelmä NDIR-mittalaitteen lyhyen Fabry-Perot interferometrin ohjaamiseksi terferometrin ohjaamiseksiInfo
- Publication number
- FI953370A0 FI953370A0 FI953370A FI953370A FI953370A0 FI 953370 A0 FI953370 A0 FI 953370A0 FI 953370 A FI953370 A FI 953370A FI 953370 A FI953370 A FI 953370A FI 953370 A0 FI953370 A0 FI 953370A0
- Authority
- FI
- Finland
- Prior art keywords
- ndir
- perot
- short fabry
- terferometer
- inmethod
- Prior art date
Links
- 238000001745 non-dispersive infrared spectroscopy Methods 0.000 title 2
- 238000000034 method Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Instruments For Measurement Of Length By Optical Means (AREA)
- Mechanical Light Control Or Optical Switches (AREA)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI953370A FI103216B (fi) | 1995-07-07 | 1995-07-07 | Menetelmä NDIR-mittalaitteen lyhyen Fabry-Perot interferometrin ohjaam iseksi |
DE69628974T DE69628974T2 (de) | 1995-07-07 | 1996-06-28 | Methode zur Kontrolle eines Fabry-Perot-Interferometers mit einem kurzen Etalon zur Verwendung in einer NDIR Messvorrichtung |
EP96660035A EP0753733B1 (en) | 1995-07-07 | 1996-06-28 | Method of controlling a short-etalon Fabry-Perot interferometer used in an NDIR measurement apparatus |
US08/675,858 US5835216A (en) | 1995-07-07 | 1996-07-05 | Method of controlling a short-etalon fabry-perot interferometer used in an NDIR mearsurement apparatus |
JP17647396A JP3778996B2 (ja) | 1995-07-07 | 1996-07-05 | Ndir測定装置に使用されるショートエタロン・ファブリー・ペロー干渉計を制御する方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI953370A FI103216B (fi) | 1995-07-07 | 1995-07-07 | Menetelmä NDIR-mittalaitteen lyhyen Fabry-Perot interferometrin ohjaam iseksi |
FI953370 | 1995-07-07 |
Publications (4)
Publication Number | Publication Date |
---|---|
FI953370A0 true FI953370A0 (fi) | 1995-07-07 |
FI953370A FI953370A (fi) | 1997-01-08 |
FI103216B1 FI103216B1 (fi) | 1999-05-14 |
FI103216B FI103216B (fi) | 1999-05-14 |
Family
ID=8543759
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI953370A FI103216B (fi) | 1995-07-07 | 1995-07-07 | Menetelmä NDIR-mittalaitteen lyhyen Fabry-Perot interferometrin ohjaam iseksi |
Country Status (5)
Country | Link |
---|---|
US (1) | US5835216A (fi) |
EP (1) | EP0753733B1 (fi) |
JP (1) | JP3778996B2 (fi) |
DE (1) | DE69628974T2 (fi) |
FI (1) | FI103216B (fi) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5920391A (en) * | 1995-10-27 | 1999-07-06 | Schlumberger Industries, S.A. | Tunable Fabry-Perot filter for determining gas concentration |
US6590710B2 (en) * | 2000-02-18 | 2003-07-08 | Yokogawa Electric Corporation | Fabry-Perot filter, wavelength-selective infrared detector and infrared gas analyzer using the filter and detector |
US6608711B2 (en) * | 2000-03-03 | 2003-08-19 | Axsun Technologies, Inc. | Silicon on insulator optical membrane structure for fabry-perot MOEMS filter |
US6836366B1 (en) | 2000-03-03 | 2004-12-28 | Axsun Technologies, Inc. | Integrated tunable fabry-perot filter and method of making same |
US6373632B1 (en) | 2000-03-03 | 2002-04-16 | Axsun Technologies, Inc. | Tunable Fabry-Perot filter |
US6341039B1 (en) | 2000-03-03 | 2002-01-22 | Axsun Technologies, Inc. | Flexible membrane for tunable fabry-perot filter |
US6724785B1 (en) * | 2000-04-14 | 2004-04-20 | Agilent Technologies, Inc. | Tunable fabry-perot filters and lasers with reduced frequency noise |
US20030018271A1 (en) * | 2001-07-02 | 2003-01-23 | Kimble Allan Wayne | Simplified and lightweight system for enhanced visualization of subcutaneous hemoglobin-containing structures |
FI114657B (fi) | 2003-03-24 | 2004-11-30 | Vaisala Oyj | Menetelmä Fabry-Perot-interfometrin peilien välimatkan jänniteriippuvuuden selvittämiseksi |
KR101229021B1 (ko) * | 2006-06-20 | 2013-02-01 | 엘지디스플레이 주식회사 | 확대된 영상을 표시하는 영상표시장치 및 이를 이용한 영상표시방법 |
JP4356724B2 (ja) * | 2006-09-20 | 2009-11-04 | 株式会社デンソー | 赤外線式ガス検知装置およびそのガス検知方法 |
DE102006045253B3 (de) * | 2006-09-26 | 2007-12-20 | Dräger Medical AG & Co. KG | Gaskonzentrationsmessvorrichtung |
JP4784495B2 (ja) * | 2006-11-28 | 2011-10-05 | 株式会社デンソー | 光学多層膜ミラーおよびそれを備えたファブリペロー干渉計 |
JP5367710B2 (ja) | 2007-09-05 | 2013-12-11 | ジーイー・アナリティカル・インストルメンツ・インコーポレイテッド | 高温および高圧下で酸化を利用する水性サンプル中の炭素測定 |
DE102009011421B3 (de) * | 2009-03-03 | 2010-04-15 | Drägerwerk AG & Co. KGaA | Gaskonzentrationsmessvorrichtung |
JP2010286291A (ja) * | 2009-06-10 | 2010-12-24 | Hioki Ee Corp | 赤外線分光器および赤外線分光測定装置 |
JP6120770B2 (ja) | 2011-06-28 | 2017-04-26 | オリンパス株式会社 | 分光画像取得装置 |
GB2497296B (en) * | 2011-12-05 | 2017-07-12 | Gassecure As | Gas sensors |
WO2015197914A1 (en) * | 2014-06-27 | 2015-12-30 | Spectral Engines Oy | Stabilized spectrometer and a method for stabilizing a spectrometer |
DE102017207186A1 (de) * | 2017-04-28 | 2018-10-31 | Robert Bosch Gmbh | Verfahren und Vorrichtung zum Kalibrieren eines Mikrospektrometermoduls |
CN108872124B (zh) * | 2017-05-12 | 2020-12-08 | 中国石油化工股份有限公司 | 一种在线一氧化碳分析仪和加热炉燃烧控制*** |
JP6720112B2 (ja) * | 2017-05-23 | 2020-07-08 | 浜松ホトニクス株式会社 | フィルタ制御式導出方法、光計測システム、ファブリペロー干渉フィルタの制御方法、及び、フィルタ制御プログラム |
US20190072534A1 (en) | 2017-08-07 | 2019-03-07 | O.I. Corporation | Stopped flow with pulsed injection technique for total organic carbon analyzer (toca) using high temperature combustion |
WO2019070957A1 (en) * | 2017-10-06 | 2019-04-11 | Bio-Rad Laboratories, Inc. | PROTEIN QUANTIFICATION DEVICE |
EP4078115A1 (en) * | 2019-12-19 | 2022-10-26 | Ams Sensors Singapore Pte. Ltd. | Detector wavelength calibration |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3832548A (en) * | 1972-10-18 | 1974-08-27 | Oceanetics Inc | Gas detector unit |
US3914055A (en) * | 1974-05-23 | 1975-10-21 | Lansing Research Corp | Instrument for high resolution spectral analysis with large optical throughput |
DE3812334A1 (de) * | 1988-04-14 | 1989-10-26 | Hartmann & Braun Ag | Interferometrische einrichtung |
US4998017A (en) * | 1989-05-01 | 1991-03-05 | Ryan Fredrick M | Method and arrangement for measuring the optical absorptions of gaseous mixtures |
DE3925692C1 (fi) * | 1989-08-03 | 1990-08-23 | Hartmann & Braun Ag, 6000 Frankfurt, De | |
US5357340A (en) * | 1989-10-12 | 1994-10-18 | Hartmann & Braun | Method for spectroscopy using two Fabry-Perot interference filters |
FI96450C (fi) * | 1993-01-13 | 1996-06-25 | Vaisala Oy | Yksikanavainen kaasun pitoisuuden mittausmenetelmä ja -laitteisto |
FI94804C (fi) * | 1994-02-17 | 1995-10-25 | Vaisala Oy | Sähköisesti säädettävä pintamikromekaaninen Fabry-Perot-interferometri käytettäväksi optisessa materiaalianalyysissä |
-
1995
- 1995-07-07 FI FI953370A patent/FI103216B/fi active
-
1996
- 1996-06-28 EP EP96660035A patent/EP0753733B1/en not_active Expired - Lifetime
- 1996-06-28 DE DE69628974T patent/DE69628974T2/de not_active Expired - Lifetime
- 1996-07-05 US US08/675,858 patent/US5835216A/en not_active Expired - Lifetime
- 1996-07-05 JP JP17647396A patent/JP3778996B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69628974D1 (de) | 2003-08-14 |
EP0753733B1 (en) | 2003-07-09 |
FI953370A (fi) | 1997-01-08 |
US5835216A (en) | 1998-11-10 |
EP0753733A1 (en) | 1997-01-15 |
FI103216B1 (fi) | 1999-05-14 |
JP3778996B2 (ja) | 2006-05-24 |
DE69628974T2 (de) | 2004-05-06 |
JPH0933345A (ja) | 1997-02-07 |
FI103216B (fi) | 1999-05-14 |
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Legal Events
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HC | Name/ company changed in application |
Owner name: VAISALA OYJ |