FI20105626A0 - Erittäin ohut berylliumikkuna ja menetelmä sen valmistamiseksi - Google Patents

Erittäin ohut berylliumikkuna ja menetelmä sen valmistamiseksi

Info

Publication number
FI20105626A0
FI20105626A0 FI20105626A FI20105626A FI20105626A0 FI 20105626 A0 FI20105626 A0 FI 20105626A0 FI 20105626 A FI20105626 A FI 20105626A FI 20105626 A FI20105626 A FI 20105626A FI 20105626 A0 FI20105626 A0 FI 20105626A0
Authority
FI
Finland
Prior art keywords
ultra
manufacture
beryllium window
thin beryllium
thin
Prior art date
Application number
FI20105626A
Other languages
English (en)
Swedish (sv)
Inventor
Heikki Sipilae
Original Assignee
Hs Foils Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hs Foils Oy filed Critical Hs Foils Oy
Priority to FI20105626A priority Critical patent/FI20105626A0/fi
Publication of FI20105626A0 publication Critical patent/FI20105626A0/fi
Priority to PCT/FI2010/050781 priority patent/WO2011151505A1/en
Priority to US13/700,791 priority patent/US9607723B2/en
Priority to EP10852461.2A priority patent/EP2577705B1/en
Priority to US13/700,835 priority patent/US9697922B2/en
Priority to PCT/FI2011/050100 priority patent/WO2011151506A1/en
Priority to EP11789306.5A priority patent/EP2589062B1/en

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J5/00—Details relating to vessels or to leading-in conductors common to two or more basic types of discharge tubes or lamps
    • H01J5/02—Vessels; Containers; Shields associated therewith; Vacuum locks
    • H01J5/18—Windows permeable to X-rays, gamma-rays, or particles
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/0248—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies
    • H01L31/0256—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by their semiconductor bodies characterised by the material
    • H01L31/0264—Inorganic materials
    • H01L31/028—Inorganic materials including, apart from doping material or other impurities, only elements of Group IV of the Periodic System
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/18—Windows, e.g. for X-ray transmission
    • H01J2235/183—Multi-layer structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H01J35/18—Windows
    • H01J35/186—Windows used as targets or X-ray converters
FI20105626A 2010-06-03 2010-06-03 Erittäin ohut berylliumikkuna ja menetelmä sen valmistamiseksi FI20105626A0 (fi)

Priority Applications (7)

Application Number Priority Date Filing Date Title
FI20105626A FI20105626A0 (fi) 2010-06-03 2010-06-03 Erittäin ohut berylliumikkuna ja menetelmä sen valmistamiseksi
PCT/FI2010/050781 WO2011151505A1 (en) 2010-06-03 2010-10-08 Ultra thin radiation window and method for its manufacturing
US13/700,791 US9607723B2 (en) 2010-06-03 2010-10-08 Ultra thin radiation window and method for its manufacturing
EP10852461.2A EP2577705B1 (en) 2010-06-03 2010-10-08 Ultra thin radiation window and method for its manufacturing
US13/700,835 US9697922B2 (en) 2010-06-03 2011-02-04 Radiation window with good strength properties, and method for its manufacturing
PCT/FI2011/050100 WO2011151506A1 (en) 2010-06-03 2011-02-04 Radiation window with good strength properties, and method for its manufacturing
EP11789306.5A EP2589062B1 (en) 2010-06-03 2011-02-04 Radiation window with good strength properties, and method for its manufacturing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20105626A FI20105626A0 (fi) 2010-06-03 2010-06-03 Erittäin ohut berylliumikkuna ja menetelmä sen valmistamiseksi

Publications (1)

Publication Number Publication Date
FI20105626A0 true FI20105626A0 (fi) 2010-06-03

Family

ID=42308084

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20105626A FI20105626A0 (fi) 2010-06-03 2010-06-03 Erittäin ohut berylliumikkuna ja menetelmä sen valmistamiseksi

Country Status (4)

Country Link
US (2) US9607723B2 (fi)
EP (2) EP2577705B1 (fi)
FI (1) FI20105626A0 (fi)
WO (2) WO2011151505A1 (fi)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9305735B2 (en) 2007-09-28 2016-04-05 Brigham Young University Reinforced polymer x-ray window
US9076628B2 (en) * 2011-05-16 2015-07-07 Brigham Young University Variable radius taper x-ray window support structure
US9174412B2 (en) 2011-05-16 2015-11-03 Brigham Young University High strength carbon fiber composite wafers for microfabrication
US9564252B2 (en) * 2012-02-15 2017-02-07 Hs Foils Oy Method and arrangement for manufacturing a radiation window
WO2013159049A1 (en) * 2012-04-20 2013-10-24 Bruker Axs Handheld, Inc. Apparatus for protecting a radiation window
EP2888754B1 (en) 2012-08-22 2018-03-21 HS Foils OY Reinforced foil for an x-ray radiation window, and method for manufacturing the same
US20140301531A1 (en) * 2013-04-08 2014-10-09 James L. Failla, JR. Protective shield for x-ray fluorescence (xrf) system
KR102088300B1 (ko) 2013-06-14 2020-04-14 한국전자통신연구원 클라우드 컴퓨터 환경에서의 사용자 빅데이터 정보 제공 장치 및 방법
WO2016100874A1 (en) * 2014-12-19 2016-06-23 Energy Sciences Inc. Electron beam window tile having non-uniform cross-sections
US20180019089A1 (en) * 2015-01-22 2018-01-18 Luxel Corporation Improved materials and structures for large area x-ray dectector windows
FI20155881A (fi) 2015-11-26 2017-05-27 Hs Foils Oy Menetelmä säteilyikkunan valmistamiseksi ja säteilyikkuna
EP3261115A1 (en) * 2016-06-23 2017-12-27 Nxp B.V. Chip scale semiconductor package and method of manufacturing the same
FI127409B (fi) * 2017-01-18 2018-05-15 Oxford Instruments Tech Oy Säteilyikkuna
US20180061608A1 (en) * 2017-09-28 2018-03-01 Oxford Instruments X-ray Technology Inc. Window member for an x-ray device
JP7152115B2 (ja) 2018-05-08 2022-10-12 アメテク フィンランド オーイー 多層放射線窓の製造方法及び多層放射線窓
US10991540B2 (en) * 2018-07-06 2021-04-27 Moxtek, Inc. Liquid crystal polymer for mounting x-ray window
CN111374689A (zh) * 2018-12-27 2020-07-07 通用电气公司 Ct扫描装置及其扫描架
TW202226296A (zh) * 2020-08-27 2022-07-01 美商布魯克奈米公司 用於ｘ射線偵測器使用的氮化矽ｘ射線窗和製造的方法

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4960486A (en) * 1988-06-06 1990-10-02 Brigham Young University Method of manufacturing radiation detector window structure
JPH02208601A (ja) * 1989-02-08 1990-08-20 Seiko Instr Inc 光学用窓材及びその製造方法
JPH0353200A (ja) 1989-07-20 1991-03-07 Fujitsu Ltd Ｘ線露光装置の製造方法
FR2651122B1 (fr) 1989-08-29 1994-10-28 Oreal Compositions destinees a etre utilisees pour freiner la chute des cheveux et pour induire et stimuler leur croissance, contenant des derives de l'amino-2 pyrimidine oxyde-3 et nouveaux composes derives de l'amino-2 pyrimidine oxyde-3.
JP3026284B2 (ja) * 1990-09-18 2000-03-27 住友電気工業株式会社 Ｘ線窓材とその製造方法
JP3127511B2 (ja) * 1991-09-19 2001-01-29 株式会社日立製作所 露光装置および半導体装置の製造方法
FI93680C (fi) 1992-05-07 1995-05-10 Outokumpu Instr Oy Ohutkalvon tukirakenne ja menetelmä sen valmistamiseksi
JPH06289145A (ja) 1993-03-24 1994-10-18 Sumitomo Electric Ind Ltd Ｘ線窓材及びその製造方法
JPH07333399A (ja) * 1994-06-14 1995-12-22 Nikon Corp Ｘ線透過窓部材
US5905571A (en) * 1995-08-30 1999-05-18 Sandia Corporation Optical apparatus for forming correlation spectrometers and optical processors
US6002202A (en) * 1996-07-19 1999-12-14 The Regents Of The University Of California Rigid thin windows for vacuum applications
EP0885454A1 (en) * 1996-12-06 1998-12-23 Koninklijke Philips Electronics N.V. X-ray tube having an internal window shield
DE10050811A1 (de) * 2000-10-13 2002-04-18 Philips Corp Intellectual Pty Elektronenstrahltransparentes Fenster
DE10120335C2 (de) 2001-04-26 2003-08-07 Bruker Daltonik Gmbh Ionenmobilitätsspektrometer mit nicht-radioaktiver Ionenquelle
US20060191215A1 (en) * 2002-03-22 2006-08-31 Stark David H Insulated glazing units and methods
US7153186B2 (en) * 2002-09-13 2006-12-26 Towa Intercon Technology, Inc. Jet singulation
JP4401691B2 (ja) * 2003-06-13 2010-01-20 株式会社オクテック 電子ビーム照射管の電子ビーム透過窓の製造方法
JP2005003564A (ja) * 2003-06-13 2005-01-06 Ushio Inc 電子ビーム管および電子ビーム取り出し用窓
US6803570B1 (en) * 2003-07-11 2004-10-12 Charles E. Bryson, III Electron transmissive window usable with high pressure electron spectrometry
EP1749550A1 (en) * 2005-08-04 2007-02-07 Institut Curie Method and apparatus for applying radiotherapy
US7618906B2 (en) * 2005-11-17 2009-11-17 Oxford Instruments Analytical Oy Window membrane for detector and analyser devices, and a method for manufacturing a window membrane
JP4950542B2 (ja) * 2006-04-07 2012-06-13 岩手東芝エレクトロニクス株式会社 固体撮像装置およびその製造方法
JP2008016628A (ja) * 2006-07-05 2008-01-24 Sharp Corp 半導体装置及びその製造方法
JP5023653B2 (ja) * 2006-10-19 2012-09-12 富士通セミコンダクター株式会社 露光用マスク、電子装置の製造方法、及び露光用マスクの検査方法
US8110321B2 (en) * 2007-05-16 2012-02-07 International Business Machines Corporation Method of manufacture of damascene reticle
US7709820B2 (en) * 2007-06-01 2010-05-04 Moxtek, Inc. Radiation window with coated silicon support structure
US7737424B2 (en) 2007-06-01 2010-06-15 Moxtek, Inc. X-ray window with grid structure
US7660393B2 (en) 2007-06-19 2010-02-09 Oxford Instruments Analytical Oy Gas tight radiation window, and a method for its manufacturing
US8498381B2 (en) * 2010-10-07 2013-07-30 Moxtek, Inc. Polymer layer on X-ray window
US7772033B2 (en) * 2007-09-28 2010-08-10 Qimonda Ag Semiconductor device with different conductive features embedded in a mold enclosing a semiconductor die and method for making same
JP5897474B2 (ja) * 2010-02-08 2016-03-30 テトラ ラバル ホールデイングス エ フイナンス ソシエテ アノニム 金属箔の皺を減らすための組立体及び方法
US9174412B2 (en) * 2011-05-16 2015-11-03 Brigham Young University High strength carbon fiber composite wafers for microfabrication

Also Published As

Publication number Publication date
EP2589062B1 (en) 2021-09-01
US20130077761A1 (en) 2013-03-28
EP2589062A4 (en) 2014-09-24
EP2577705A4 (en) 2014-10-08
US9607723B2 (en) 2017-03-28
EP2577705A1 (en) 2013-04-10
EP2589062A1 (en) 2013-05-08
US9697922B2 (en) 2017-07-04
EP2577705B1 (en) 2021-08-11
WO2011151505A1 (en) 2011-12-08
WO2011151506A1 (en) 2011-12-08
US20130089184A1 (en) 2013-04-11

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Legal Events

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