FI20001568A - Pinnan muotojen määrittäminen - Google Patents

Pinnan muotojen määrittäminen Download PDF

Info

Publication number
FI20001568A
FI20001568A FI20001568A FI20001568A FI20001568A FI 20001568 A FI20001568 A FI 20001568A FI 20001568 A FI20001568 A FI 20001568A FI 20001568 A FI20001568 A FI 20001568A FI 20001568 A FI20001568 A FI 20001568A
Authority
FI
Finland
Prior art keywords
shapes
determination
Prior art date
Application number
FI20001568A
Other languages
English (en)
Swedish (sv)
Other versions
FI20001568A0 (fi
Inventor
Heimo Keraenen
Original Assignee
Thermo Radiometrie Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thermo Radiometrie Oy filed Critical Thermo Radiometrie Oy
Priority to FI20001568A priority Critical patent/FI20001568A/fi
Publication of FI20001568A0 publication Critical patent/FI20001568A0/fi
Priority to EP01660129A priority patent/EP1170572A3/en
Priority to US09/894,878 priority patent/US20020039187A1/en
Priority to JP2001198697A priority patent/JP2002071328A/ja
Publication of FI20001568A publication Critical patent/FI20001568A/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G01B11/2522—Projection by scanning of the object the position of the object changing and being recorded
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2531—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object using several gratings, projected with variable angle of incidence on the object, and one detection device
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B21—MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL; PUNCHING METAL
    • B21B—ROLLING OF METAL
    • B21B38/00—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product
    • B21B38/02—Methods or devices for measuring, detecting or monitoring specially adapted for metal-rolling mills, e.g. position detection, inspection of the product for measuring flatness or profile of strips

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
FI20001568A 2000-06-30 2000-06-30 Pinnan muotojen määrittäminen FI20001568A (fi)

Priority Applications (4)

Application Number Priority Date Filing Date Title
FI20001568A FI20001568A (fi) 2000-06-30 2000-06-30 Pinnan muotojen määrittäminen
EP01660129A EP1170572A3 (en) 2000-06-30 2001-06-28 Apparatus and method for determining surface shapes
US09/894,878 US20020039187A1 (en) 2000-06-30 2001-06-29 Determining surface shapes
JP2001198697A JP2002071328A (ja) 2000-06-30 2001-06-29 表面形状の決定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20001568A FI20001568A (fi) 2000-06-30 2000-06-30 Pinnan muotojen määrittäminen

Publications (2)

Publication Number Publication Date
FI20001568A0 FI20001568A0 (fi) 2000-06-30
FI20001568A true FI20001568A (fi) 2001-12-31

Family

ID=8558694

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20001568A FI20001568A (fi) 2000-06-30 2000-06-30 Pinnan muotojen määrittäminen

Country Status (4)

Country Link
US (1) US20020039187A1 (fi)
EP (1) EP1170572A3 (fi)
JP (1) JP2002071328A (fi)
FI (1) FI20001568A (fi)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8444821B2 (en) 2007-12-31 2013-05-21 Metso Automation Oy Measuring of web

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DE10205132A1 (de) * 2002-02-07 2003-08-28 Bfi Vdeh Inst Angewandte Forschung Gmbh Verfahren und Vorrichtung zum optischen Messen der Oberflächenform und zur optischen Oberflächeninspektion von bewegten Bändern in Walz- und Weiterbearbeitungsanlagen
US20070090310A1 (en) * 2005-10-24 2007-04-26 General Electric Company Methods and apparatus for inspecting an object
US7830528B2 (en) * 2005-12-14 2010-11-09 Koh Young Technology, Inc. 3D image measuring apparatus and method thereof
EP1830176A1 (en) * 2006-03-02 2007-09-05 FOSS Analytical AB Device and method for optical measurement of small particles such as grains from cereals and like crops
DE102006027121A1 (de) * 2006-06-12 2007-12-13 Robert Bosch Gmbh Bildaufnahmesystem und Verfahren für die Entfernungsbestimmung mit einem Bildaufnahmesystem
DE102006041462B3 (de) * 2006-09-04 2008-01-03 Chromasens Gmbh Verfahren und Vorrichtung zum optischen Abtasten einer Vorlage mit einer Zeilenkamera
US7474415B2 (en) * 2006-09-13 2009-01-06 Chung Shan Institute Of Science And Technology, Armaments Bureau, M.N.D. Measurement method of three-dimensional profiles and reconstruction system thereof using subpixel localization with color gratings and picture-in-picture switching on single display
DE102007034689B4 (de) * 2007-07-12 2009-06-10 Carl Zeiss Ag Verfahren und Vorrichtung zum optischen Inspizieren einer Oberfläche an einem Gegenstand
FI121151B (fi) * 2007-11-22 2010-07-30 Valtion Teknillinen Menetelmä ja laitteisto liikkuvan pinnan topografian ja optisten ominaisuuksien määrittämiseksi
AT507121B1 (de) * 2008-07-22 2012-04-15 Software Competence Center Hagenberg Gmbh Verfahren zur güteprüfung von oberflächen
DE102009017464B4 (de) 2009-04-03 2011-02-17 Carl Zeiss Oim Gmbh Vorrichtung zum optischen Inspizieren einer Oberfläche an einem Gegenstand
US8508591B2 (en) * 2010-02-05 2013-08-13 Applied Vision Corporation System and method for estimating the height of an object using tomosynthesis-like techniques
DE102010021317A1 (de) * 2010-05-22 2011-12-08 Bernhard Schäfer Handgerät zum Erfassen von Maßen
EP2615412B1 (en) 2010-09-07 2016-06-01 Dai Nippon Printing Co., Ltd. Scanner device and device for measuring three-dimensional shape of object
EP3104059B1 (en) 2010-09-07 2019-08-21 Dai Nippon Printing Co., Ltd. Illumination apparatus using coherent light source
EP3404452B1 (en) 2010-09-07 2020-10-28 Dai Nippon Printing Co., Ltd. Projection type image display apparatus and corresponding method
JP5430612B2 (ja) * 2011-05-31 2014-03-05 Ｃｋｄ株式会社 三次元計測装置
EP2783184A4 (en) * 2011-11-23 2015-07-15 Univ Columbia SYSTEMS, METHOD AND MEDIA FOR IMPLEMENTING SHAPE MEASUREMENTS
EP2647949A1 (fr) * 2012-04-04 2013-10-09 Siemens VAI Metals Technologies GmbH Méthode et dispositif de mesure de planéité d'un produit métallique
KR101331789B1 (ko) * 2012-06-11 2013-11-21 한국광기술원 다중 파장을 이용한 3차원 형상 측정 방법 및 장치
EP2753896B1 (de) * 2012-06-29 2020-09-30 INB Vision AG Verfahren zur bilderfassung einer vorzugsweise strukturierten oberfläche eines objekts und vorrichtung zur bilderfassung
WO2016194939A1 (ja) * 2015-06-05 2016-12-08 新日鐵住金株式会社 金属体の形状検査装置及び金属体の形状検査方法
EP3411695B1 (en) * 2016-02-01 2022-01-26 KLA-Tencor Corporation Method and system for optical three-dimensional topography measurement
JP6893797B2 (ja) * 2017-02-23 2021-06-23 京セラ株式会社 電磁波検出装置、プログラム、および電磁波検出システム
DE102017130909A1 (de) * 2017-12-21 2019-06-27 Weber Maschinenbau Gmbh Breidenbach Optische Messeinrichtung
CN109108096B (zh) * 2018-08-20 2020-03-10 山西太钢不锈钢股份有限公司 一种热轧平整机组激光板形监测方法及其***
CN112539712B (zh) * 2020-11-19 2022-07-05 广州视源电子科技股份有限公司 三维成像方法、装置及设备

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US4657394A (en) * 1984-09-14 1987-04-14 New York Institute Of Technology Apparatus and method for obtaining three dimensional surface contours
CA1266562A (en) * 1986-09-24 1990-03-13 Donald Stewart Distance measuring apparatus
US5085502A (en) * 1987-04-30 1992-02-04 Eastman Kodak Company Method and apparatus for digital morie profilometry calibrated for accurate conversion of phase information into distance measurements in a plurality of directions
JP2737390B2 (ja) * 1990-10-31 1998-04-08 松下電器産業株式会社 ディジタルプロセッシングカラーカメラ
US5175601A (en) * 1991-10-15 1992-12-29 Electro-Optical Information Systems High-speed 3-D surface measurement surface inspection and reverse-CAD system
JP2692603B2 (ja) * 1994-07-13 1997-12-17 村田機械株式会社 三次元計測方法
US6044170A (en) * 1996-03-21 2000-03-28 Real-Time Geometry Corporation System and method for rapid shape digitizing and adaptive mesh generation
JP3914638B2 (ja) * 1997-09-09 2007-05-16 シーケーディ株式会社 形状計測装置
US6438272B1 (en) * 1997-12-31 2002-08-20 The Research Foundation Of State University Of Ny Method and apparatus for three dimensional surface contouring using a digital video projection system
US6636310B1 (en) * 1998-05-12 2003-10-21 Metroptic Technologies, Ltd. Wavelength-dependent surface contour measurement system and method
AU3991799A (en) * 1998-05-14 1999-11-29 Metacreations Corporation Structured-light, triangulation-based three-dimensional digitizer
US6327374B1 (en) * 1999-02-18 2001-12-04 Thermo Radiometrie Oy Arrangement and method for inspection of surface quality
US6639685B1 (en) * 2000-02-25 2003-10-28 General Motors Corporation Image processing method using phase-shifted fringe patterns and curve fitting

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8444821B2 (en) 2007-12-31 2013-05-21 Metso Automation Oy Measuring of web

Also Published As

Publication number Publication date
JP2002071328A (ja) 2002-03-08
FI20001568A0 (fi) 2000-06-30
US20020039187A1 (en) 2002-04-04
EP1170572A3 (en) 2003-07-30
EP1170572A2 (en) 2002-01-09

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