FI20031753A0 - Parannettu mittausjärjestely röntgenfluoresenssianlyysiä varten - Google Patents

Parannettu mittausjärjestely röntgenfluoresenssianlyysiä varten

Info

Publication number
FI20031753A0
FI20031753A0 FI20031753A FI20031753A FI20031753A0 FI 20031753 A0 FI20031753 A0 FI 20031753A0 FI 20031753 A FI20031753 A FI 20031753A FI 20031753 A FI20031753 A FI 20031753A FI 20031753 A0 FI20031753 A0 FI 20031753A0
Authority
FI
Finland
Prior art keywords
improved
ray fluorescence
measurement arrangement
fluorescence assay
assay measurement
Prior art date
Application number
FI20031753A
Other languages
English (en)
Swedish (sv)
Other versions
FI20031753A (fi
Inventor
Heikki Sipilae
Riitta Kaijansaari
Original Assignee
Metorex Internat Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Metorex Internat Oy filed Critical Metorex Internat Oy
Priority to FI20031753A priority Critical patent/FI20031753A/fi
Publication of FI20031753A0 publication Critical patent/FI20031753A0/fi
Priority to US10/987,145 priority patent/US7065174B2/en
Publication of FI20031753A publication Critical patent/FI20031753A/fi

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
FI20031753A 2003-12-01 2003-12-01 Parannettu mittausjärjestely röntgenfluoresenssianalyysiä varten FI20031753A (fi)

Priority Applications (2)

Application Number Priority Date Filing Date Title
FI20031753A FI20031753A (fi) 2003-12-01 2003-12-01 Parannettu mittausjärjestely röntgenfluoresenssianalyysiä varten
US10/987,145 US7065174B2 (en) 2003-12-01 2004-11-12 Measurement arrangement for X-ray fluoresence analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FI20031753A FI20031753A (fi) 2003-12-01 2003-12-01 Parannettu mittausjärjestely röntgenfluoresenssianalyysiä varten

Publications (2)

Publication Number Publication Date
FI20031753A0 true FI20031753A0 (fi) 2003-12-01
FI20031753A FI20031753A (fi) 2005-06-02

Family

ID=29763454

Family Applications (1)

Application Number Title Priority Date Filing Date
FI20031753A FI20031753A (fi) 2003-12-01 2003-12-01 Parannettu mittausjärjestely röntgenfluoresenssianalyysiä varten

Country Status (2)

Country Link
US (1) US7065174B2 (fi)
FI (1) FI20031753A (fi)

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KR101063106B1 (ko) * 2004-11-08 2011-09-07 에스아이아이 나노 테크놀로지 가부시키가이샤 형광 ｘ선 분석 장치
US8064570B2 (en) * 2006-12-20 2011-11-22 Innov-X-Systems, Inc. Hand-held XRF analyzer
US20090257548A1 (en) * 2008-04-14 2009-10-15 Ashutosh Joshi Computed tomography system
DE08155628T1 (de) * 2008-05-05 2010-04-29 Oxford Instruments Analytical Oy Röntgenfluoreszenzanalysator mit gasgefüllter Kammer
CN102460135A (zh) * 2009-06-03 2012-05-16 特莫尼托恩分析仪器股份有限公司 检测器位于聚焦元件内部的x射线***和方法
JP5517506B2 (ja) * 2009-06-30 2014-06-11 株式会社堀場製作所 蛍光ｘ線分析装置
EP2270479A3 (en) * 2009-06-30 2012-02-22 HORIBA, Ltd. Fluorescent X-ray analyzer and fluorescent X-ray analysis method
JP6096418B2 (ja) * 2012-04-12 2017-03-15 株式会社堀場製作所 Ｘ線検出装置
JP6096419B2 (ja) * 2012-04-12 2017-03-15 株式会社堀場製作所 Ｘ線検出装置
EP2839498B1 (en) * 2012-04-20 2017-12-06 Bruker AXS Handheld, Inc. Apparatus for protecting a radiation window
WO2013184213A2 (en) * 2012-05-14 2013-12-12 The General Hospital Corporation A distributed, field emission-based x-ray source for phase contrast imaging
EP2768289B1 (de) * 2013-02-18 2018-04-04 Airbus Defence and Space GmbH Personentransportable Röntgenvorrichtung
JP6081260B2 (ja) * 2013-03-28 2017-02-15 株式会社日立ハイテクサイエンス 蛍光ｘ線分析装置
US20140301531A1 (en) * 2013-04-08 2014-10-09 James L. Failla, JR. Protective shield for x-ray fluorescence (xrf) system
US20140301530A1 (en) * 2013-04-08 2014-10-09 James L. Failla, JR. Protective shield for x-ray fluorescence (xrf) system
WO2014192173A1 (ja) * 2013-05-27 2014-12-04 株式会社島津製作所 蛍光ｘ線分析装置
ITRM20130705A1 (it) * 2013-12-20 2015-06-21 Ilaria Carocci Metodo e apparato per l'analisi di materiali mediante fluorescenza per raggi x a fascio aperto
JP5782154B2 (ja) * 2014-04-10 2015-09-24 株式会社堀場製作所 蛍光ｘ線分析装置
JP6320898B2 (ja) * 2014-10-27 2018-05-09 株式会社日立ハイテクサイエンス Ｘ線発生源及び蛍光ｘ線分析装置
DE102015221323B3 (de) 2015-10-30 2016-08-04 Airbus Defence and Space GmbH Verfahren zum Nachweis von Oberflächenverunreinigungen mittels Röntgenfluoreszenzanalyse
GB2551980A (en) * 2016-06-30 2018-01-10 Commw Scient Ind Res Org Method and system for low level metal analysis of mineral samples
CA3100580A1 (en) * 2018-05-18 2019-11-21 Enersoft Inc. Geological analysis system and methods using x-ray flurescence and spectroscopy
WO2021046334A1 (en) * 2019-09-06 2021-03-11 Alltrista Plastics Llc Rapid measurement systems and methods for plastic articles
JP7302504B2 (ja) * 2020-02-27 2023-07-04 株式会社島津製作所 蛍光ｘ線分析装置
US20230296541A1 (en) * 2020-06-30 2023-09-21 Shimadzu Corporation X-ray fluorescence analyzer
CN111781630B (zh) * 2020-07-11 2022-06-21 山东罗丹尼分析仪器有限公司 一种硅光电二极管阵列贝塔粒子计数探测器

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US3610984A (en) * 1967-12-28 1971-10-05 Tokyo Shibaura Electric Co Rotating-anode x-ray tube with multiple focal areas
US4017757A (en) * 1976-01-02 1977-04-12 The Machlett Laboratories, Incorporated Multi-target X-ray tube
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US5627871A (en) 1993-06-10 1997-05-06 Nanodynamics, Inc. X-ray tube and microelectronics alignment process
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JP2000504422A (ja) * 1996-11-05 2000-04-11 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ ２つのコリメータマスクを有するｘ線分析装置
JP3166638B2 (ja) * 1996-11-29 2001-05-14 株式会社島津製作所 蛍光ｘ線分析装置
JP3511826B2 (ja) * 1997-01-23 2004-03-29 株式会社島津製作所 蛍光ｘ線分析装置
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DE19932275B4 (de) 1999-07-06 2005-08-04 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur Röntgenfluoreszenzanalyse
AU2002363962A1 (en) 2001-12-04 2003-06-17 X-Ray Optical Systems, Inc. X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof
US6668039B2 (en) * 2002-01-07 2003-12-23 Battelle Memorial Institute Compact X-ray fluorescence spectrometer and method for fluid analysis

Also Published As

Publication number Publication date
US20050129174A1 (en) 2005-06-16
FI20031753A (fi) 2005-06-02
US7065174B2 (en) 2006-06-20

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