FI20031753A0 - Parannettu mittausjärjestely röntgenfluoresenssianlyysiä varten - Google Patents
Parannettu mittausjärjestely röntgenfluoresenssianlyysiä vartenInfo
- Publication number
- FI20031753A0 FI20031753A0 FI20031753A FI20031753A FI20031753A0 FI 20031753 A0 FI20031753 A0 FI 20031753A0 FI 20031753 A FI20031753 A FI 20031753A FI 20031753 A FI20031753 A FI 20031753A FI 20031753 A0 FI20031753 A0 FI 20031753A0
- Authority
- FI
- Finland
- Prior art keywords
- improved
- ray fluorescence
- measurement arrangement
- fluorescence assay
- assay measurement
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20031753A FI20031753A (fi) | 2003-12-01 | 2003-12-01 | Parannettu mittausjärjestely röntgenfluoresenssianalyysiä varten |
US10/987,145 US7065174B2 (en) | 2003-12-01 | 2004-11-12 | Measurement arrangement for X-ray fluoresence analysis |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FI20031753A FI20031753A (fi) | 2003-12-01 | 2003-12-01 | Parannettu mittausjärjestely röntgenfluoresenssianalyysiä varten |
Publications (2)
Publication Number | Publication Date |
---|---|
FI20031753A0 true FI20031753A0 (fi) | 2003-12-01 |
FI20031753A FI20031753A (fi) | 2005-06-02 |
Family
ID=29763454
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
FI20031753A FI20031753A (fi) | 2003-12-01 | 2003-12-01 | Parannettu mittausjärjestely röntgenfluoresenssianalyysiä varten |
Country Status (2)
Country | Link |
---|---|
US (1) | US7065174B2 (fi) |
FI (1) | FI20031753A (fi) |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101063106B1 (ko) * | 2004-11-08 | 2011-09-07 | 에스아이아이 나노 테크놀로지 가부시키가이샤 | 형광 x선 분석 장치 |
US8064570B2 (en) * | 2006-12-20 | 2011-11-22 | Innov-X-Systems, Inc. | Hand-held XRF analyzer |
US20090257548A1 (en) * | 2008-04-14 | 2009-10-15 | Ashutosh Joshi | Computed tomography system |
DE08155628T1 (de) * | 2008-05-05 | 2010-04-29 | Oxford Instruments Analytical Oy | Röntgenfluoreszenzanalysator mit gasgefüllter Kammer |
CN102460135A (zh) * | 2009-06-03 | 2012-05-16 | 特莫尼托恩分析仪器股份有限公司 | 检测器位于聚焦元件内部的x射线***和方法 |
JP5517506B2 (ja) * | 2009-06-30 | 2014-06-11 | 株式会社堀場製作所 | 蛍光x線分析装置 |
EP2270479A3 (en) * | 2009-06-30 | 2012-02-22 | HORIBA, Ltd. | Fluorescent X-ray analyzer and fluorescent X-ray analysis method |
JP6096418B2 (ja) * | 2012-04-12 | 2017-03-15 | 株式会社堀場製作所 | X線検出装置 |
JP6096419B2 (ja) * | 2012-04-12 | 2017-03-15 | 株式会社堀場製作所 | X線検出装置 |
EP2839498B1 (en) * | 2012-04-20 | 2017-12-06 | Bruker AXS Handheld, Inc. | Apparatus for protecting a radiation window |
WO2013184213A2 (en) * | 2012-05-14 | 2013-12-12 | The General Hospital Corporation | A distributed, field emission-based x-ray source for phase contrast imaging |
EP2768289B1 (de) * | 2013-02-18 | 2018-04-04 | Airbus Defence and Space GmbH | Personentransportable Röntgenvorrichtung |
JP6081260B2 (ja) * | 2013-03-28 | 2017-02-15 | 株式会社日立ハイテクサイエンス | 蛍光x線分析装置 |
US20140301531A1 (en) * | 2013-04-08 | 2014-10-09 | James L. Failla, JR. | Protective shield for x-ray fluorescence (xrf) system |
US20140301530A1 (en) * | 2013-04-08 | 2014-10-09 | James L. Failla, JR. | Protective shield for x-ray fluorescence (xrf) system |
WO2014192173A1 (ja) * | 2013-05-27 | 2014-12-04 | 株式会社島津製作所 | 蛍光x線分析装置 |
ITRM20130705A1 (it) * | 2013-12-20 | 2015-06-21 | Ilaria Carocci | Metodo e apparato per l'analisi di materiali mediante fluorescenza per raggi x a fascio aperto |
JP5782154B2 (ja) * | 2014-04-10 | 2015-09-24 | 株式会社堀場製作所 | 蛍光x線分析装置 |
JP6320898B2 (ja) * | 2014-10-27 | 2018-05-09 | 株式会社日立ハイテクサイエンス | X線発生源及び蛍光x線分析装置 |
DE102015221323B3 (de) | 2015-10-30 | 2016-08-04 | Airbus Defence and Space GmbH | Verfahren zum Nachweis von Oberflächenverunreinigungen mittels Röntgenfluoreszenzanalyse |
GB2551980A (en) * | 2016-06-30 | 2018-01-10 | Commw Scient Ind Res Org | Method and system for low level metal analysis of mineral samples |
CA3100580A1 (en) * | 2018-05-18 | 2019-11-21 | Enersoft Inc. | Geological analysis system and methods using x-ray flurescence and spectroscopy |
WO2021046334A1 (en) * | 2019-09-06 | 2021-03-11 | Alltrista Plastics Llc | Rapid measurement systems and methods for plastic articles |
JP7302504B2 (ja) * | 2020-02-27 | 2023-07-04 | 株式会社島津製作所 | 蛍光x線分析装置 |
US20230296541A1 (en) * | 2020-06-30 | 2023-09-21 | Shimadzu Corporation | X-ray fluorescence analyzer |
CN111781630B (zh) * | 2020-07-11 | 2022-06-21 | 山东罗丹尼分析仪器有限公司 | 一种硅光电二极管阵列贝塔粒子计数探测器 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3610984A (en) * | 1967-12-28 | 1971-10-05 | Tokyo Shibaura Electric Co | Rotating-anode x-ray tube with multiple focal areas |
US4017757A (en) * | 1976-01-02 | 1977-04-12 | The Machlett Laboratories, Incorporated | Multi-target X-ray tube |
US4959848A (en) * | 1987-12-16 | 1990-09-25 | Axic Inc. | Apparatus for the measurement of the thickness and concentration of elements in thin films by means of X-ray analysis |
JPH05240808A (ja) | 1992-02-29 | 1993-09-21 | Horiba Ltd | 蛍光x線定量方法 |
US5627871A (en) | 1993-06-10 | 1997-05-06 | Nanodynamics, Inc. | X-ray tube and microelectronics alignment process |
US5982847A (en) * | 1996-10-28 | 1999-11-09 | Utah State University | Compact X-ray fluorescence spectrometer for real-time wear metal analysis of lubrucating oils |
JP2000504422A (ja) * | 1996-11-05 | 2000-04-11 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 2つのコリメータマスクを有するx線分析装置 |
JP3166638B2 (ja) * | 1996-11-29 | 2001-05-14 | 株式会社島津製作所 | 蛍光x線分析装置 |
JP3511826B2 (ja) * | 1997-01-23 | 2004-03-29 | 株式会社島津製作所 | 蛍光x線分析装置 |
US6075839A (en) | 1997-09-02 | 2000-06-13 | Varian Medical Systems, Inc. | Air cooled end-window metal-ceramic X-ray tube for lower power XRF applications |
DE19820321B4 (de) * | 1998-05-07 | 2004-09-16 | Bruker Axs Gmbh | Kompaktes Röntgenspektrometer |
JP3921872B2 (ja) | 1999-05-20 | 2007-05-30 | 株式会社島津製作所 | 蛍光x線分析用データ処理装置 |
DE19932275B4 (de) | 1999-07-06 | 2005-08-04 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Vorrichtung zur Röntgenfluoreszenzanalyse |
AU2002363962A1 (en) | 2001-12-04 | 2003-06-17 | X-Ray Optical Systems, Inc. | X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof |
US6668039B2 (en) * | 2002-01-07 | 2003-12-23 | Battelle Memorial Institute | Compact X-ray fluorescence spectrometer and method for fluid analysis |
-
2003
- 2003-12-01 FI FI20031753A patent/FI20031753A/fi not_active Application Discontinuation
-
2004
- 2004-11-12 US US10/987,145 patent/US7065174B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US20050129174A1 (en) | 2005-06-16 |
FI20031753A (fi) | 2005-06-02 |
US7065174B2 (en) | 2006-06-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FD | Application lapsed |