ES2177615T3 - Sistema de contacto de interconexion electrica. - Google Patents
Sistema de contacto de interconexion electrica.Info
- Publication number
- ES2177615T3 ES2177615T3 ES95309283T ES95309283T ES2177615T3 ES 2177615 T3 ES2177615 T3 ES 2177615T3 ES 95309283 T ES95309283 T ES 95309283T ES 95309283 T ES95309283 T ES 95309283T ES 2177615 T3 ES2177615 T3 ES 2177615T3
- Authority
- ES
- Spain
- Prior art keywords
- contact
- elastomeric element
- accommodation
- cable
- received
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000004308 accommodation Effects 0.000 abstract 5
- 238000005259 measurement Methods 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2435—Contacts for co-operating by abutting resilient; resiliently-mounted with opposite contact points, e.g. C beam
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
- H01R12/70—Coupling devices
- H01R12/71—Coupling devices for rigid printing circuits or like structures
- H01R12/712—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit
- H01R12/714—Coupling devices for rigid printing circuits or like structures co-operating with the surface of the printed circuit or with a coupling device exclusively provided on the surface of the printed circuit with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/02—Arrangements of circuit components or wiring on supporting structure
- H05K7/10—Plug-in assemblages of components, e.g. IC sockets
- H05K7/1015—Plug-in assemblages of components, e.g. IC sockets having exterior leads
- H05K7/103—Plug-in assemblages of components, e.g. IC sockets having exterior leads co-operating by sliding, e.g. DIP carriers
- H05K7/1046—J-shaped leads
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/02—Arrangements of circuit components or wiring on supporting structure
- H05K7/10—Plug-in assemblages of components, e.g. IC sockets
- H05K7/1053—Plug-in assemblages of components, e.g. IC sockets having interior leads
- H05K7/1061—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting
- H05K7/1069—Plug-in assemblages of components, e.g. IC sockets having interior leads co-operating by abutting with spring contact pieces
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
- Connecting Device With Holders (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Cable Accessories (AREA)
- Multi-Conductor Connections (AREA)
- Connections By Means Of Piercing Elements, Nuts, Or Screws (AREA)
- Conductive Materials (AREA)
Abstract
UN CONECTOR PARA INTERCONECTAR ELECTRICAMENTE UN CABLE DE UN DISPOSITIVO A UN TERMINAL SEPARADO A UNA DISTANCIA DEL CABLE. EL APARATO INCLUYE UN ALOJAMIENTO (20) QUE TIENE UNA RANURA (24) PARA RECIBIR UNO DE CADA DE UNO O MAS CONTACTOS (22). LA RANURA DE RECEPCION DE CONTACTO SE EXTIENDE SUSTANCIALMENTE PARALELA A UN EJE QUE SE EXTIENDE ENTRE UN CABLE CORRESPONDIENTE Y UN TERMINAL SEPARADO. EL ALOJAMIENTO TIENE UN PRIMER CONDUCTO (56) FORMADO EN EL MISMO JUNTO AL CABLE Y UN SEGUNDO CONDUCTO (58) FORMADO EN EL MISMO JUNTO AL TERMINAL SEPARADO. UN PRIMER ELEMENTO ELASTOMERICO (76) ES RECIBIDO EN EL PRIMER CONDUCTO FORMADO EN EL ALOJAMIENTO, Y UN SEGUNDO ELEMENTO ELASTOMERICO (50) ES RECIBIDO EN EL SEGUNDO CONDUCTO FORMADO EN EL ALOJAMIENTO. EL PRIMER Y SEGUNDO ELEMENTOS ELASTOMERICOS TIENEN UNA MEDIDA DE COMPRESIBILIDAD Y EXTENSIBILIDAD DE TENSION. UN CONTACTO (22) ES RECIBIDO EN CADA RANURA. CADA CONTACTO PROVISTO CON UN SALIENTE (42) QUE SE EXTIENDE HACIA AFUERA DE LA SUPERFICIE DEL ALOJAMIENTO A ENGANCHAR POR EL CABLE AL QUE SE CORRESPONDE. CADA CONTACTO TIENE TAMBIEN UNA PROTUBERANCIA (40) QUE SE EXTIENDE FUERA DE LA SUPERFICIE PARA ENGANCHAR EL TERMINAL SEPARADO CORRESPONDIENTE. CADA CONTACTO TIENE ADEMAS PRIMERAS Y SEGUNDAS PORCIONES DE GANCHO, LA PRIMERA PORCION DE GANCHO ESTANDO DISPUESTA PROXIMA AL SALIENTE DE CONTACTO Y RODEANDO EL PRIMER ELEMENTO ELASTOMERICO PARA MANTENER EL CONTACTO CON EL PRIMER ELEMENTO ELASTOMERICO, Y LA SEGUNDA PORCION DE GANCHO ESTANDO DISPUESTA PROXIMA A LA PROTUBERANCIA DE CONTACTO Y RODEANDO EL SEGUNDO ELEMENTO ELASTOMERICO PARA MANTENER EL CONTACTO CON EL SEGUNDO ELEMENTO ELASTOMERICO.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/362,206 US5634801A (en) | 1991-01-09 | 1994-12-22 | Electrical interconnect contact system |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2177615T3 true ES2177615T3 (es) | 2002-12-16 |
Family
ID=23425121
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES95309283T Expired - Lifetime ES2177615T3 (es) | 1994-12-22 | 1995-12-20 | Sistema de contacto de interconexion electrica. |
Country Status (8)
Country | Link |
---|---|
US (1) | US5634801A (es) |
EP (1) | EP0718917B1 (es) |
JP (1) | JP2788622B2 (es) |
AT (1) | ATE218760T1 (es) |
DE (1) | DE69526912T2 (es) |
DK (1) | DK0718917T3 (es) |
ES (1) | ES2177615T3 (es) |
PT (1) | PT718917E (es) |
Families Citing this family (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5634801A (en) | 1991-01-09 | 1997-06-03 | Johnstech International Corporation | Electrical interconnect contact system |
US5947749A (en) * | 1996-07-02 | 1999-09-07 | Johnstech International Corporation | Electrical interconnect contact system |
MY128129A (en) * | 1997-09-16 | 2007-01-31 | Tan Yin Leong | Electrical contactor for testing integrated circuit devices |
US6448803B1 (en) * | 1998-10-10 | 2002-09-10 | Un-Young Chung | Test socket |
US6350153B1 (en) | 2000-06-16 | 2002-02-26 | Leeno Ind Inc | Electrical connector for connecting an integrated circuit to a printed circuit board |
JP3578708B2 (ja) * | 2000-08-28 | 2004-10-20 | Necセミコンダクターズ九州株式会社 | Icソケット |
US6302727B1 (en) | 2000-09-08 | 2001-10-16 | Telefonaktiebolaget, L.M. Ericsson | Multi-axis connectors and electronic devices incorporating same |
US6558181B2 (en) | 2000-12-29 | 2003-05-06 | Intel Corporation | System and method for package socket with embedded power and ground planes |
US6854981B2 (en) * | 2002-06-03 | 2005-02-15 | Johnstech International Corporation | Small pin connecters |
US7059866B2 (en) * | 2003-04-23 | 2006-06-13 | Johnstech International Corporation | integrated circuit contact to test apparatus |
US20060019508A1 (en) * | 2004-04-27 | 2006-01-26 | Ronmee Industrial Corporation | Terminal formation for socket employed on CPU |
JP4905872B2 (ja) * | 2005-02-18 | 2012-03-28 | 日本発條株式会社 | 導電性接触子ユニット |
US7445465B2 (en) * | 2005-07-08 | 2008-11-04 | Johnstech International Corporation | Test socket |
US7639026B2 (en) * | 2006-02-24 | 2009-12-29 | Johnstech International Corporation | Electronic device test set and contact used therein |
US20080293308A1 (en) * | 2007-05-24 | 2008-11-27 | Tribotek, Inc. | Pivoting wafer connector |
JP2009043591A (ja) * | 2007-08-09 | 2009-02-26 | Yamaichi Electronics Co Ltd | Icソケット |
US7794235B2 (en) | 2008-01-31 | 2010-09-14 | Methode Electronics, Inc. | Continuous wireform connector |
US7547215B1 (en) | 2008-01-31 | 2009-06-16 | Methode Electronics, Inc. | Round connector with spring helix |
US7806699B2 (en) * | 2008-01-31 | 2010-10-05 | Methode Electornics, Inc. | Wound coil compression connector |
US7806737B2 (en) * | 2008-02-04 | 2010-10-05 | Methode Electronics, Inc. | Stamped beam connector |
JP5029969B2 (ja) * | 2008-11-12 | 2012-09-19 | 山一電機株式会社 | 電気接続装置 |
DE102010019955A1 (de) | 2010-02-03 | 2011-08-04 | Eutegra Ag, 60325 | Elektrische Kontaktiereinrichtung |
US9274141B1 (en) | 2013-01-22 | 2016-03-01 | Johnstech International Corporation | Low resistance low wear test pin for test contactor |
USD727269S1 (en) | 2014-01-29 | 2015-04-21 | Johnstech International Corporation | Articulating contact pin |
US9354251B2 (en) * | 2014-02-25 | 2016-05-31 | Titan Semiconductor Tool, LLC | Integrated circuit (IC) test socket using Kelvin bridge |
US9343830B1 (en) * | 2015-06-08 | 2016-05-17 | Xcerra Corporation | Integrated circuit chip tester with embedded micro link |
DE102015115657B3 (de) * | 2015-09-17 | 2017-02-09 | Harting Ag & Co. Kg | elektrisches Kontaktelement |
Family Cites Families (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3551750A (en) * | 1969-04-21 | 1970-12-29 | Hugh H Eby Co | Circuit board connector |
DE2119567C2 (de) * | 1970-05-05 | 1983-07-14 | International Computers Ltd., London | Elektrische Verbindungsvorrichtung und Verfahren zu ihrer Herstellung |
GB1539470A (en) * | 1975-11-13 | 1979-01-31 | Tektronix Inc | Electrical connector |
JPS5555985U (es) * | 1978-10-12 | 1980-04-16 | ||
JPS568081U (es) * | 1979-06-29 | 1981-01-23 | ||
JPS56116282A (en) * | 1980-02-19 | 1981-09-11 | Sharp Kk | Electronic part with plural terminals |
FR2477324A1 (fr) * | 1980-02-28 | 1981-09-04 | Dassault Electronique | Dispositif de contact electrique pour appareil de traitement de cartes electroniques |
FR2495846A1 (fr) * | 1980-12-05 | 1982-06-11 | Cii Honeywell Bull | Dispositif de connexion electrique a haute densite de contacts |
US4506938A (en) * | 1982-07-06 | 1985-03-26 | At&T Bell Laboratories | Integrated circuit chip carrier mounting arrangement |
US4598246A (en) * | 1982-09-08 | 1986-07-01 | Pylon Company, Inc. | Printed circuit board tester having a flex and wiping action free vacuum actuated edge connector |
US4511197A (en) * | 1983-08-01 | 1985-04-16 | Amp Incorporated | High density contact assembly |
US4686467A (en) * | 1984-03-21 | 1987-08-11 | Dit-Mco International Corp. | Circuit board testing system |
US4866374A (en) * | 1984-10-12 | 1989-09-12 | Daymarc Corporation | Contactor assembly for testing integrated circuits |
US4633175A (en) * | 1984-11-23 | 1986-12-30 | Avx Corporation | Testing method and apparatus for electronic components |
US4593961A (en) * | 1984-12-20 | 1986-06-10 | Amp Incorporated | Electrical compression connector |
US4634199A (en) * | 1985-01-22 | 1987-01-06 | Itt Corporation | Connector assembly for making multiple connections in a thin space |
US4664458A (en) * | 1985-09-19 | 1987-05-12 | C W Industries | Printed circuit board connector |
US4793814A (en) * | 1986-07-21 | 1988-12-27 | Rogers Corporation | Electrical circuit board interconnect |
WO1987004568A1 (en) * | 1986-01-15 | 1987-07-30 | Rogers Corporation | Electrical circuit board interconnect |
US4943768A (en) * | 1986-12-12 | 1990-07-24 | Mitsubishi Denki Kabushiki Kaisha | Testing device for electrical circuit boards |
US4835464A (en) * | 1987-04-23 | 1989-05-30 | Micro Component Technology, Inc. | Decoupling apparatus for use with integrated circuit tester |
US4800335A (en) * | 1987-05-28 | 1989-01-24 | Zenith Electronics Corporation | Test fixture for circuit components on circuit boards |
US4870353A (en) * | 1987-12-30 | 1989-09-26 | Hewlett-Packard | Pre-loaded compression spring assembly |
US4950980A (en) * | 1988-07-29 | 1990-08-21 | Pfaff Wayne | Test socket for electronic device packages |
US4929892A (en) * | 1989-02-09 | 1990-05-29 | Hughes Aircraft Company | Process for electrically testing a component in transit to assembly and component test chuck |
US4998886A (en) * | 1989-07-07 | 1991-03-12 | Teledyne Kinetics | High density stacking connector |
US5049084A (en) * | 1989-12-05 | 1991-09-17 | Rogers Corporation | Electrical circuit board interconnect |
US5634801A (en) | 1991-01-09 | 1997-06-03 | Johnstech International Corporation | Electrical interconnect contact system |
US5207584A (en) * | 1991-01-09 | 1993-05-04 | Johnson David A | Electrical interconnect contact system |
US5069629A (en) * | 1991-01-09 | 1991-12-03 | Johnson David A | Electrical interconnect contact system |
US5388996A (en) * | 1991-01-09 | 1995-02-14 | Johnson; David A. | Electrical interconnect contact system |
US5139427A (en) * | 1991-09-23 | 1992-08-18 | Amp Incorporated | Planar array connector and flexible contact therefor |
US5137456A (en) * | 1991-11-04 | 1992-08-11 | International Business Machines Corporation | High density, separable connector and contact for use therein |
JP2807171B2 (ja) * | 1993-05-03 | 1998-10-08 | デビット エー.ジョンソン | 電気的相互接続コンタクト装置 |
US5336094A (en) * | 1993-06-30 | 1994-08-09 | Johnstech International Corporation | Apparatus for interconnecting electrical contacts |
-
1994
- 1994-12-22 US US08/362,206 patent/US5634801A/en not_active Expired - Lifetime
-
1995
- 1995-12-20 AT AT95309283T patent/ATE218760T1/de not_active IP Right Cessation
- 1995-12-20 DK DK95309283T patent/DK0718917T3/da active
- 1995-12-20 ES ES95309283T patent/ES2177615T3/es not_active Expired - Lifetime
- 1995-12-20 EP EP95309283A patent/EP0718917B1/en not_active Expired - Lifetime
- 1995-12-20 DE DE69526912T patent/DE69526912T2/de not_active Expired - Lifetime
- 1995-12-20 PT PT95309283T patent/PT718917E/pt unknown
- 1995-12-22 JP JP33500995A patent/JP2788622B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE69526912T2 (de) | 2003-03-20 |
EP0718917A2 (en) | 1996-06-26 |
JPH08236237A (ja) | 1996-09-13 |
EP0718917B1 (en) | 2002-06-05 |
PT718917E (pt) | 2002-11-29 |
JP2788622B2 (ja) | 1998-08-20 |
EP0718917A3 (en) | 1997-07-09 |
DK0718917T3 (da) | 2002-10-07 |
ATE218760T1 (de) | 2002-06-15 |
US5634801A (en) | 1997-06-03 |
DE69526912D1 (de) | 2002-07-11 |
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