ES2107236T3 - Dispositivo y procedimiento de prueba para un circuito integrado soldado con una placa. - Google Patents
Dispositivo y procedimiento de prueba para un circuito integrado soldado con una placa.Info
- Publication number
- ES2107236T3 ES2107236T3 ES94919624T ES94919624T ES2107236T3 ES 2107236 T3 ES2107236 T3 ES 2107236T3 ES 94919624 T ES94919624 T ES 94919624T ES 94919624 T ES94919624 T ES 94919624T ES 2107236 T3 ES2107236 T3 ES 2107236T3
- Authority
- ES
- Spain
- Prior art keywords
- collector
- measured
- transistor
- current
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
Abstract
LA INVENCION SE REFIERE A UN DISPOSITIVO DE TEST Y A UN PROCEDIMIENTO PARA CHEQUEAR SI LOS PASADORES DE UN CIRCUITO INTEGRADO SOLDADO ESTAN CONECTADOS CORRECTAMENTE CON LAS VIAS DE CIRCUITO DE UNA PLETINA, MEDIANTE MEDICION DE TRANSISTORES PARASITARIOS EN LA CORRECCION DE LAS CORRIENTES DE COLECTOR MEDIDAS CON REFERENCIA A LOS TRANSISTORES ADICIONALES, QUE ESTAN DISPUESTOS EN PARALELO POR MEDIO DE UN DIODO EN CIRCUITOS INTEGRADOS CMOS, CON COLECTOR EN V{SUB, CC}.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4319710A DE4319710C1 (de) | 1993-06-15 | 1993-06-15 | Testverfahren für einen auf einer Platine eingelöteten IC und Testvorrichtung zum Durchführen des Testverfahrens |
Publications (1)
Publication Number | Publication Date |
---|---|
ES2107236T3 true ES2107236T3 (es) | 1997-11-16 |
Family
ID=6490332
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
ES94919624T Expired - Lifetime ES2107236T3 (es) | 1993-06-15 | 1994-06-11 | Dispositivo y procedimiento de prueba para un circuito integrado soldado con una placa. |
Country Status (13)
Country | Link |
---|---|
US (1) | US6188235B1 (es) |
EP (1) | EP0705439B1 (es) |
JP (1) | JPH08511345A (es) |
KR (1) | KR960703232A (es) |
CN (1) | CN1044644C (es) |
AT (1) | ATE157776T1 (es) |
AU (1) | AU686639B2 (es) |
CA (1) | CA2164415A1 (es) |
DE (2) | DE4319710C1 (es) |
DK (1) | DK0705439T3 (es) |
ES (1) | ES2107236T3 (es) |
TW (1) | TW249843B (es) |
WO (1) | WO1994029738A1 (es) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6720774B2 (en) * | 2002-07-29 | 2004-04-13 | Sun Microsystems, Inc. | Interchangeable fan control board with fault detection |
GB2394780B (en) * | 2002-10-29 | 2006-06-14 | Ifr Ltd | A method of and apparatus for testing for integrated circuit contact defects |
KR100565326B1 (ko) * | 2004-05-25 | 2006-03-30 | 엘지전자 주식회사 | 이동통신 단말기의 엘씨디 컨넥터 체크 장치 |
US7279907B2 (en) * | 2006-02-28 | 2007-10-09 | Freescale Semiconductor, Inc. | Method of testing for power and ground continuity of a semiconductor device |
DE102008020667A1 (de) * | 2008-04-24 | 2010-05-20 | Continental Automotive Gmbh | Verfahren zur Fehlerüberwachung an einem Beleuchtungsausgang eines Kraftfahrzeuges |
CN101571570B (zh) * | 2008-04-29 | 2013-05-22 | 京元电子股份有限公司 | 集成电路连续性测试方法及集成电路接触电阻的测量方法 |
CN101825681B (zh) * | 2010-04-29 | 2013-07-31 | 上海宏力半导体制造有限公司 | 一种双极型晶体管电流放大系数测量方法 |
RU173641U1 (ru) * | 2017-03-27 | 2017-09-04 | Закрытое акционерное общество "ГРУППА КРЕМНИЙ ЭЛ" | Тестовый планарный p-n-p транзистор |
CN107424549B (zh) * | 2017-09-28 | 2020-04-17 | 京东方科技集团股份有限公司 | 阈值电压漂移的检测方法和装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4779043A (en) * | 1987-08-26 | 1988-10-18 | Hewlett-Packard Company | Reversed IC test device and method |
US5254953A (en) * | 1990-12-20 | 1993-10-19 | Hewlett-Packard Company | Identification of pin-open faults by capacitive coupling through the integrated circuit package |
US5124660A (en) * | 1990-12-20 | 1992-06-23 | Hewlett-Packard Company | Identification of pin-open faults by capacitive coupling through the integrated circuit package |
DE4110551C1 (es) * | 1991-03-30 | 1992-07-23 | Ita Ingenieurbuero Fuer Testaufgaben Gmbh, 2000 Hamburg, De | |
JP3157683B2 (ja) * | 1994-08-30 | 2001-04-16 | 株式会社 沖マイクロデザイン | 半導体集積回路の静止時電流測定法、半導体集積回路 |
-
1993
- 1993-06-15 DE DE4319710A patent/DE4319710C1/de not_active Expired - Fee Related
-
1994
- 1994-06-11 AU AU70715/94A patent/AU686639B2/en not_active Ceased
- 1994-06-11 DE DE59403978T patent/DE59403978D1/de not_active Expired - Lifetime
- 1994-06-11 CA CA002164415A patent/CA2164415A1/en not_active Abandoned
- 1994-06-11 CN CN94192444A patent/CN1044644C/zh not_active Expired - Fee Related
- 1994-06-11 US US08/557,039 patent/US6188235B1/en not_active Expired - Lifetime
- 1994-06-11 EP EP94919624A patent/EP0705439B1/de not_active Expired - Lifetime
- 1994-06-11 JP JP7501337A patent/JPH08511345A/ja active Pending
- 1994-06-11 WO PCT/EP1994/001902 patent/WO1994029738A1/de active IP Right Grant
- 1994-06-11 AT AT94919624T patent/ATE157776T1/de active
- 1994-06-11 KR KR1019950705708A patent/KR960703232A/ko not_active Application Discontinuation
- 1994-06-11 ES ES94919624T patent/ES2107236T3/es not_active Expired - Lifetime
- 1994-06-11 DK DK94919624.0T patent/DK0705439T3/da active
- 1994-09-02 TW TW083108101A patent/TW249843B/zh active
Also Published As
Publication number | Publication date |
---|---|
CN1044644C (zh) | 1999-08-11 |
JPH08511345A (ja) | 1996-11-26 |
AU686639B2 (en) | 1998-02-12 |
KR960703232A (ko) | 1996-06-19 |
DK0705439T3 (da) | 1998-04-14 |
CA2164415A1 (en) | 1994-12-22 |
US6188235B1 (en) | 2001-02-13 |
EP0705439B1 (de) | 1997-09-03 |
EP0705439A1 (de) | 1996-04-10 |
DE59403978D1 (de) | 1997-10-09 |
CN1125482A (zh) | 1996-06-26 |
TW249843B (es) | 1995-06-21 |
ATE157776T1 (de) | 1997-09-15 |
WO1994029738A1 (de) | 1994-12-22 |
AU7071594A (en) | 1995-01-03 |
DE4319710C1 (de) | 1994-09-29 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
FG2A | Definitive protection |
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