EP3631419A1 - Kalibrierung von optischen vorrichtungen zur analyse der verglasungsqualität und diesbezügliche verfahren - Google Patents

Kalibrierung von optischen vorrichtungen zur analyse der verglasungsqualität und diesbezügliche verfahren

Info

Publication number
EP3631419A1
EP3631419A1 EP18730028.0A EP18730028A EP3631419A1 EP 3631419 A1 EP3631419 A1 EP 3631419A1 EP 18730028 A EP18730028 A EP 18730028A EP 3631419 A1 EP3631419 A1 EP 3631419A1
Authority
EP
European Patent Office
Prior art keywords
optical
glazing
calibration
quenching
line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP18730028.0A
Other languages
English (en)
French (fr)
Inventor
Romain Decourcelle
Olivier DUMOULIN
Théo RYBARCZYK
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Saint Gobain Glass France SAS
Original Assignee
Saint Gobain Glass France SAS
Compagnie de Saint Gobain SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Saint Gobain Glass France SAS, Compagnie de Saint Gobain SA filed Critical Saint Gobain Glass France SAS
Publication of EP3631419A1 publication Critical patent/EP3631419A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/89Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B27/00Tempering or quenching glass products
    • C03B27/04Tempering or quenching glass products using gas
    • C03B27/0417Controlling or regulating for flat or bent glass sheets
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B35/00Transporting of glass products during their manufacture, e.g. hot glass lenses, prisms
    • C03B35/14Transporting hot glass sheets or ribbons, e.g. by heat-resistant conveyor belts or bands
    • C03B35/16Transporting hot glass sheets or ribbons, e.g. by heat-resistant conveyor belts or bands by roller conveyors
    • C03B35/163Drive means, clutches, gearing or drive speed control means
    • C03B35/164Drive means, clutches, gearing or drive speed control means electric or electronicsystems therefor, e.g. for automatic control
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/24Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
    • G01L1/241Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet by photoelastic stress analysis
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes
    • G01L5/16Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force
    • G01L5/161Apparatus for, or methods of, measuring force, work, mechanical power, or torque, specially adapted for specific purposes for measuring several components of force using variations in ohmic resistance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
    • G01M11/336Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face by measuring polarization mode dispersion [PMD]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties
    • G01N21/23Bi-refringence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274Calibration, base line adjustment, drift correction
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B2225/00Transporting hot glass sheets during their manufacture
    • C03B2225/02Means for positioning, aligning or orientating the sheets during their travel, e.g. stops
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B23/00Re-forming shaped glass
    • C03B23/02Re-forming glass sheets
    • C03B23/023Re-forming glass sheets by bending
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B25/00Annealing glass products
    • C03B25/04Annealing glass products in a continuous way
    • C03B25/06Annealing glass products in a continuous way with horizontal displacement of the glass products
    • C03B25/08Annealing glass products in a continuous way with horizontal displacement of the glass products of glass sheets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/16Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/168Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by means of polarisation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21Polarisation-affecting properties
    • G01N2021/216Polarisation-affecting properties using circular polarised light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens

Definitions

  • the present invention relates to the field of the quality analysis of glazing, in particular quench marks or heating heterogeneities of a tempered or semi-hardened glazing (in other words hardened).
  • the toughened toughened glass is optically anisotropic. It develops birefringence properties. These properties are used to analyze the quench marks in patent WO 201 1/157815.
  • the glazing is passed into an assembly for measuring the presence of birefringence resulting from quenching.
  • the base of this assembly is constituted by a measurement device by photoelasticimetry or polariscope which comprises:
  • An object of the invention is to provide an analysis of the quality of a tempered glass and even semi tempered independent of the material used.
  • the invention firstly relates to an optical device comprising a first polariscope preferably vertically comprising in this order, in optical alignment with an optical axis (preferably vertical axis Z or horizontal axis):
  • a first light source visible, preferably polychromatic, with a given spectrum, in particular white, delivering a light beam - of which the light is emitted preferentially in the direction given by the optical axis -, in particular a plurality inorganic light emitting diodes (LEDs) or even one or more of organic electroluminescent diode (s) (OLED), first light source including orthogonal to the optical axis,
  • first analyzer which is a circular (or quasi-circular) polarizer in a second direction of rotation of the polarization opposite to the first direction of rotation - respectively or right or left -, in particular orthogonal to the optical axis
  • first analyzer comprising a second quarter-wave plate in particular with a second fast axis and a second slow axis (at an angle A2 equal to A1 in absolute value) followed by a second linear polarizer in particular with a second axis of polarization Y1 perpendicular to the optical axis and at the first polarization axis X1 (thus first and second crossed polarizers), in particular the second slow axis is aligned with the first fast axis and the second fast axis is aligned with the first slow axis.
  • optical device further comprises downstream of the first analyzer and following said optical alignment:
  • a first digital sensor in particular orthogonal to the optical axis
  • a first objective in particular orthogonal to the optical axis and defining a focal plane, facing the first digital sensor and between the first analyzer and the first digital sensor, in particular fixed at or against the first digital sensor.
  • the optical device comprises between the first polarizer and the first analyzer, and following said optical alignment, a calibrated first optical delay generator, in particular orthogonal to the optical axis, in particular a compensator Babinet, in a range AB with the value A (integer preferably) in a range from Onm to 100nm, preferably A being equal to Onm, and with the difference BA of at least 100nm or even at least 200nm and even from plus 2000nm, or even at most 800nm or at most 500nm or at most 300nm and preferably the first optical delay generator being in said focal plane.
  • a calibrated first optical delay generator in particular orthogonal to the optical axis
  • a compensator Babinet in a range AB with the value A (integer preferably) in a range from Onm to 100nm, preferably A being equal to Onm, and with the difference BA of at least 100nm or even at least 200nm and even from plus 2000nm, or even at most 800nm or at most 500n
  • the first digital sensor comprises a set of first sensitive photodetectors in the spectrum of the first light source having a given spectral response.
  • One or (preferably) first so-called calibration photodetectors are opposite (of the calibration surface, in particular of the opening) of the first generator of optical delays.
  • Each first calibration photodetector receives successively for each of said optical delays in said range AB the light energy coming from the light beam coming out of the first analyzer, the first digital sensor then generating digital calibration images for said optical delays in said range AB , each digital calibration image being formed of one or more pixels with one or more reference channels Ck representative of the spectral response of the first or the first photodetectors of calibration.
  • the optical device finally comprises a first digital calibration image processing unit forming a calibration base containing, for each optical delay in the range AB, digital values Ik for each of the reference channels Ck, digital values Ik being representative. light energies collected by the first photodetector or calibrators.
  • each calibration image can be reduced in size.
  • a reasonable number of calibration images are collected, so the processing time is fast.
  • a luminous strip (linear, rectangular, etc.) is formed which will serve (at least the central portion) in its entirety thereafter during the quality analysis of the glazing.
  • all diodes -leds or oled (s) - are installed, a fraction (for example the majority) of the diodes is not used (they can be switched off or on indifferently) but will be used later for quality analysis of the glazing.
  • all the photodetectors used subsequently during the glass quality analysis are preferably installed, a fraction (for example the majority) of the photodetectors are not used but will be used during the quality analysis of the glass. glazing.
  • any photodetector that is illuminated by the out-of-delay light beam is not used. It could be added at the time of the quality analysis but for simplicity we prefer to install them all for the calibration.
  • the optical axis therefore passes through the center of the first objective, and in particular through the center of the calibration surface (of the opening). Preferably, it passes through the center (the center line) of the first source.
  • the first calibrated optical delay generator comprises an optical system made of birefringent material, chosen from:
  • a calibrated optical system or compensator preferably a Babinet Soleil compensator (or equivalent), comprising first and second wedge blades of birefringent material, the second blade being movable in translation relative to the first static blade; .
  • This calibration with such a birefringent optical system according to the invention is furthermore preferable to a calibration which would require one or more reference glasses whose stress field must be known and whose retarding power is inferred by the use of photoelastic laws. .
  • the optical device with such a birefringent optical system according to the invention is easily portable if necessary.
  • the first optical delay generator for example the birefringent optical system, in particular the compensator, is placed on and / or fixed (to be stable) to a fixed mounting support (immobile, static at the time of the delay-by-delay calibration).
  • a fixed mounting support immobile, static at the time of the delay-by-delay calibration.
  • a flat plate for example fixed to a frame or a lateral upright, preferably horizontal if optical alignment to the vertical.
  • the first optical delay generator according to the invention can be defined by a calibration surface, centered on the optical axis, facing a hole of the possible mounting bracket such as a flat plate.
  • plastic plates preferably acrylic, in particular 2 mm thick, are used in turn with a static optical delay. It is preferred that the light beam passes through the plate outside the edge area.
  • the static optical retardation plane blade change can be automated, for example with a turntable or mobile translation system.
  • the optical device with a compensator (Babinet Sun) calibrated according to the invention also makes it possible to obtain all the optical delays, in a range of ways, without modifying (adding, exchanging optical elements) the optical device.
  • the first optical delay generator is a compensator including Babinet Sun, comprising opposite and spaced between them:
  • a first triangular, fixed wedge blade made of a first birefringent material (uniaxial, defined by a first optical axis), such as quartz or other crystals such as magnesium fluoride,
  • a second wedge-shaped triangular blade movable in translation relative to the first blade in a second birefringent material (uniaxial, defined by a second optical axis), such as quartz or other crystals such as magnesium fluoride, preferably identical to the first birefringent material.
  • a second birefringent material uniaxial, defined by a second optical axis
  • quartz or other crystals such as magnesium fluoride
  • the translation of the movable wedge blade can be generated by motor or manually by screw (or other mechanical means) including micrometer. Even manually, it is possible to increment the optical delays in the range AB (in ascending order from A to B or decreasing from B to A) with a given step (marks on the screw etc).
  • first and second optical axes are orthogonal.
  • d1 and d2 respectively the local thickness of the first corner blade and the second along the optical axis of the optical device, no and no the ordinary and extraordinary indices of the birefringent material, ⁇ the optical delay or difference in walk between two electromagnetic vibrations orthogonal to each other and parallel respectively to the optical axes of the two blades of the compensator corresponds to: (no-ne) (d1 -d2).
  • the compensator according to the invention can be defined by an opening, centered on the optical axis.
  • the opening is entirely illuminated by the first light source, the opening being in said focal plane, of width 01 of at most 30 mm (diameter if circular opening or equivalent diameter).
  • the opening is in the light passing area, a passage area surrounded by closure means, such as a cover or an opaque housing with the opening.
  • closure means such as a cover or an opaque housing with the opening.
  • One or more first photodetectors of calibration are opposite the opening.
  • the optical delay change is automated (computer controlled), including:
  • planar optical static delay blade change is automated, for example with a turntable or mobile system in translation or
  • the first optical delay generator being a compensator, such as the motorized Babinet Soleil compensator, capable of automatically incrementing the optical delays in the range AB (in increasing order from A to B or decreasing from B to A).
  • the engine (computer controlled) is for example on a (first) mounting bracket such as a flat plate.
  • the incrementation step P0 is preferably at most 1 nm and even at most 0.5 nm and at least 2 nm, particularly in the range of delays between 15 and 25 nm and even 0 and 25 nm.
  • a larger step that is to say of 1 nm in the range of delays of more than 200 nm to 800 nm.
  • the first optical delay generator such as the compensator including Babinet Sun
  • the first optical delay generator can be connected to a control interface (a computer) in communication with the first processing unit.
  • the pixels are the digital images carrying values representative of the light energy received by the light-sensitive component (s) (the set of first photodetectors) of the first sensor (camera) forming receivers of the light beam having passed through the polariscope.
  • Each first photodetector may comprise a photosensitive (elementary) surface per color (thus per reference channel for the pixel), in particular three photosensitive (elementary) surfaces for a pixel with the channels R, G, B.
  • Each first photodetector may alternatively comprise a photosensitive surface for all colors (so every reference channels for the pixel), in particular a photosensitive (elementary) surface for a pixel with the R, G B channels.
  • the first processing unit establishes for each pixel used during calibration the value Ik for each reference channel Ck, and this for each optical delay.
  • the first processing unit establishes for each pixel the value Ik for each reference channel Ck, and this for each optical delay.
  • the light surface at the first optical delay generator may be greater than the size of the calibration surface (of the aperture) so that the light power passing through the calibration surface (the aperture) is homogeneous, in particular light intensity, in cd, varying by not more than 5%.
  • the light power at the first optical delay generator in particular the birinfringent optical system (static delay plate for example), be homogeneous.
  • a single first calibration photodetector (and therefore a reference pixel) preferably centered on the optical axis may be sufficient to correctly generate the delay calibration base versus reference channels.
  • a divergent light beam angle of the rays when one moves away from the optical axis
  • a single first photodetector is opposite the opening and even in the center of the opening.
  • the opening of the compensator is circular, of diameter 01 where the opening of the compensator is of equivalent diameter 01, the center of the opening is inscribed in a central disk of diameter 01/2, the first calibration photodetectors said representative are entirely opposite said central disk.
  • the first optical delay generator may have an input surface illuminated (homogeneously) by the light beam defining a calibration surface. This generates a (homogeneous) delay on the entire surface.
  • the calibration surface can be (very) less than the glass analysis surface.
  • the calibration surface is (a disk) with a diameter of at most 30mm in a range of 5mm to 25mm or a surface (rectangle, etc.) of equivalent diameter of at most 30mm and even 5mm to 25mm.
  • the analysis surface of the glass is at least 10 times or at least 100 greater than the calibration surface.
  • the calibration surface may be all or part of the surface of the opening (surface of a central disk of the opening for example) and be (very) less than the surface of analysis of the glass .
  • the glass analysis surface is at least 10 times or at least 100 greater than the surface of the opening or even the central disc of the opening.
  • the elementary photosensitive surfaces of the first calibration photodetectors are of width Wp and preferably of square shape. So Wp is ⁇ 01 and even at 01/2.
  • a fraction of a row of representative first calibration photodetectors or a fraction of calibrated calibration photodetectors can be provided.
  • the set of first photodetectors may be in line or in matrix.
  • the beam of the first light source is received on the first linear digital sensor, which extends linearly in a direction parallel to that of the initial light beam.
  • the first photodetectors are aligned in this direction.
  • the intensity Ik for each reference channel in each pixel is given in numerical values (digital unit Du in English). For 8-bit coding, the intensity varies from 0 to 255 (256 numeric values ie 2 8 ).
  • RGB channels which are readily available are therefore preferably chosen as reference channels.
  • RGB triplet (a, b, c) where a, b and c are the Ik values per RGB channel.
  • the first processing unit is arranged upstream of the first digital sensor connected by links with or without wires to the first sensor, particularly remote from the conveyor and preferably connected to the first light source.
  • the first processing unit may comprise a computer connected by wired or wireless links to the first sensor (remote from the conveyor) and preferably to the first light source.
  • the first processing unit controls the first sensor and even the first light source. It is possible to use a computer connected by wired or wireless links to the first sensor (remote from the conveyor) and preferably to the first light source.
  • the first processing unit (a computer) interacts with the first digital sensor (pilot and retrieves the data) and even drives the first light source.
  • the first digital sensor can be connected to an ethernet port of a computer (with a network card etc.), especially with "GigE" protocol.
  • a computer can handle the first source of light, in particular control the ignition (for less fatigue of the equipment).
  • the first processing unit receives the data from the first digital sensor and controls the acquisition (expo time %), retrieves the data and stores it as pixels.
  • the first processing unit controls the automated passage of an optical delay to another optical delay for example the movement of the motor of the automated (Babinet) compensator or a wheel (or other) with the delay blades fixed, the analysis of the data of the digital sensor, the recording of the calibration result file, the display of a human-machine interface.
  • the optical device comprises, between the first optical delay generator and the first linear sensor, upstream of the first analyzer, an optical delay plate calibrated with a delay A'O chosen in the area where the value value Ik depends.
  • optical delay is substantially linear for at least one of the reference channels Ck, in particular 70 or 75 to 175 nm or 185 nm or from 350 or 375 nm to 425 nm.
  • Simultaneous calibration can be performed in two areas scanned by the light beam (or even more areas) of the first light source by multiplying the elements.
  • a second optical delay generator preferably identical to the first
  • a set of second photodetectors preferably identical and with their objectives.
  • the two calibration surfaces (the two openings, for example compensators) of the two optical delay generators are placed on the optical axis, in particular on the central line of the linear source. For example they are equidistant from the center and / or spaced at least 50cm.
  • the processing unit can simultaneously process both calibrations. It is also possible to perform a successive calibration in two zones scanned by the light beam (or even more zones) of the first light source if the first optical delay generator moves.
  • the optical device is vertical, with the vertical optical axis Z.
  • the optical axis is vertical Z and the first polariscope, the first digital sensor and the first optical delay generator are on a (industrial) heating and quenching line, possibly heating line, bending hardening, downstream the quenching system (quench box), especially in a cooling zone, without scrolling glazing in the calibration zone and better off (static).
  • the line comprises a horizontal glazing conveyor along a (horizontal) Y conveyor axis, the vertical optical axis Z is perpendicular to the Y axis, and optionally the line is hardened bending, the first polariscope, the first digital sensor and the first optical delay generator are downstream of the bending system.
  • the first mounting bracket of the first generator can be placed on the conveyor of the glazing stationary or independent of the conveyor -or at least the moving part of the horizontal conveyor, generally rotating rollers alone or with a system of a carpet or more adjacent conveyor belts.
  • the invention also relates to the use of the optical device as described above in a heating line and quenching possibly heating line, bending quench, downstream of the quenching system.
  • the invention also aims a heating line and quenching possible heating line, bending quenching comprising:
  • a conveyor preferably horizontal, of glazing along a Y axis of conveying, and possibly the line is of hardened bending
  • the optical device as described previously without scrolling of glazing in the calibration zone (with the calibration surface of the first optical delay generator which is the surface of entrance illuminated by the light beam) and better off,
  • the conveyor comprises in particular two rollers spaced by an inter-roll space for example of at least the size of the calibration surface of the delay generator.
  • the first light source is under the conveying zone, is between two rollers (wholly (or partly) and / or (partly) under two adjacent rollers of said rollers, possibly first light source on a spaced source support of the ground and fixed by amounts (metal etc.) on either side of the conveyor (on either side of the lateral ends of the rollers), and the first digital sensor preferably linear, is spaced is above the two rollers, from the conveying area.
  • the first optical delay generator may be attached to a mounting bracket on both rolls, with a bracket facing the calibration surface (of said compensator opening).
  • the rollers are for example steel.
  • the first light source is, on the ground side, under the two rollers, opposite said inter-roller space,
  • the first circular polarizer is under the two rollers, fixed on the first source
  • the first mounting bracket is above the two rollers, fixed to the ground, without vibration, or on the conveyor stationary (without vibration),
  • the first analyzer is in a filter holder and the first photodetector are above the two rollers.
  • the optical device also operates offline and for example in a horizontal optical alignment.
  • the first light source can form a linear luminous band in a given direction (for example perpendicular to the optical axis, and perpendicular to the conveying axis) and have a functional central emitting zone (strip) and one or more zones (bands) sideways masked along said direction for example by one or more lateral opaque strips (covers, adhesive tapes).
  • the first light source (on a source support) is spaced from the ground, fixed by a profile (metal etc.) for example on either side of the conveyor.
  • the first linear polarizer and the first quarter wave plate are for example glued together and reported on the first light source. They are for example at least functional in the central emitting zone, fixed by one or more lateral opaque strips (adhesive tapes).
  • the second quarter wave plate and the second linear polarizer are for example glued together and reported on the first goal.
  • the first linear polarizer and the first quarter wave plate may also be laminated or glued on a transparent support (for example a plastic such as PMMA for poly (methyl methacrylate)) and without internal mechanical stress.
  • the first light source can be in particular one or more rows of inorganic light emitting diodes and / or the first digital sensor (for example a camera) can be linear, that is to say with the first photodetectors in a line possibly with a second digital sensor (for example a digital camera), with the second photodetectors in one line, identical adjacent in the so-called analysis length (in the direction of the light source).
  • the first digital sensor for example a camera
  • the first digital sensor for example a camera
  • the first light source in particular forming a linear (rectangular) light strip, in particular inorganic light-emitting diodes or one or more organic light-emitting diodes, can be arranged for a field of view (ie solid angle at the first photodetector) of minus 1 m or even at least 2m.
  • the first light source may be with a rectangular or square (or any other) wavelength transmitting band, forming a rectangular or square light band (or any other shape) of width W0 (greater than or equal to Wp) in the plane the first generator (or horizontal conveyor).
  • the first sensor can be linear with the first photodetectors in a line of width (size) Wp less than the width Wi, the width Wp and less than the size of the calibration surface (of the aperture).
  • the line of first photodetectors (calibration) passes in the optical axis, the center line of the first light source, it is freed from the effects of edges in one direction.
  • the first light source is able to illuminate the entire analysis length (along the direction of the rollers) which is all or part of the length (for example at least 70% or 80% of the length) of the rollers (perpendicular to the axis of the conveyor) - in order subsequently to illuminate the glazing as homogeneously as possible over the entire analysis length (along the direction of the rollers).
  • the optical device comprises a second light source (same spectrum, better identical) adjacent to the first source, in order to subsequently illuminate the glazing as homogeneously as possible over the entire analysis length ( along the direction of the rollers).
  • the light beam of the at least one light source illuminates at least the actual length (useful) of conveying glazing, possibly excluding the areas of the edges of the rollers.
  • the first light source the working distances, the size of photodetectors, the pixels, the number of photodetectors (in particular calibration), the conveying speed, depending on the size, distribution, and / or the frequency of defects (one type or several types of defects), and also the surface area of the zone or zones to be inspected on the glazing (entire surface, central area, series of disjoint reference areas: central and / or in the border ).
  • the range AB is also chosen according to the type of defects.
  • the resolution (in mm / pixel) depends on the glazing to be inspected and the typical size of the anisotropic zones.
  • the resolution is at least 2 mm / pixel and better still at least 1 mm / pixel, for example for a linear digital sensor.
  • an analysis length of 1 m and at least 1000 photodetectors or 2000 photodetectors an analysis length of 2 m and at least 2000 photodetectors or 4000 photodetectors.
  • the first digital sensor can be a digital camera.
  • the optical device may in fact comprise a plurality of linear digital sensors (cameras) adjacent to the length of the horizontal conveyor rolls, each associated with a dedicated optical delay generator and a polariscope (common or non-common means).
  • the first light source forms a disk-shaped light surface on the first generator and / or the first digital sensor is matrix
  • the first photodetectors are therefore in matrix for example 1600x1200 photodetectors.
  • the calibration is successively carried out digital sensor by digital sensor, the first sensor is linear or matrix, on a robotic arm moving after the first calibration (always in static) according to the length horizontal conveyor, by moving the first optical delay generator from the first calibration area to the second calibration area.
  • the optical device comprises first collimation means (telecentric) downstream of the first light source and upstream of the first optical delay generator and preferably upstream of the first polarizer (or downstream without the collimating means modifies the polarization of the light,) and the first lens is telecentric.
  • the first digital sensor can be linear or matrix. During the analysis of the glazing, the first objective is then able alone to receive the light perpendicularly to the Y axis of the conveyor.
  • the orientation of the polariscope (s) relative to the ground is not limiting.
  • the polariscope (s) and the photodetector (s) are identically positioned during the calibration and during the quality analysis of the glazing thereafter.
  • a second polariscope is used, possibly sharing means (for example sharing the first light source and the first circular polarizer). If a second polariscope is chosen, the calibration surfaces (openings) are placed, for example, symmetrically at the center of the central line. The polariscopes are preferably aligned: the planes defined by the field of view and the optical axes are merged.
  • the optical device comprises a second polariscope identical and adjacent to the first polariscope, having in a so-called secondary optical alignment along a secondary optical axis parallel to said optical axis (Z) in this order:
  • a second mono or preferably polychromatic linear light source with a given spectrum, in particular orthogonal to the secondary optical axis, adjacent to the first light source along the length of the first source and followed by a second polarizer circular and a second quarter-wave plate
  • a second analyzer which is a circular polarizer in a second direction of rotation opposite to the first direction, in particular orthogonal to the secondary optical axis, the first analyzer comprising a second quarter-wave plate followed by a second linear polarizer
  • a second photodetector in particular orthogonal to the secondary optical axis, comprising a second digital sensor and a second objective defining a so-called secondary focal plane, opposite the second analyzer, between the second analyzer and the first or second polarizer, a second optical delay generator.
  • the first delay generator alone can suffice, by moving the first generator from the first calibration zone to the second calibration zone.
  • the beams of the first and second sources of linear lights intersect on a central portion of at most 100mm (in the plane of the glazing.
  • the focal plane intersects at a central portion of not more than half the width of the desired field of view.
  • the set of focal planes thus define the total field of view.
  • the subject of the invention is then an (optical) quality analysis device for a particularly tempered or semi hardened (hardened) glazing, optionally curved, glazing (clear, extraclear, tinted, etc.) optionally with a surface coating and / or surface texturing keeping the transparency (including a non-zero light transmission) and such that the changes in the polarization of the light at the crossing of the medium are due to the mechanical stresses of the same medium.
  • This quality analysis device comprises (reuse) said first polariscope, in particular calibrated preferably by the first calibrated optical delay generator (and even its mounting support), the first objective, the first digital sensor, preferably calibrated preferably. by the first calibrated optical delay generator (thus all the first photodetectors) and the calibration base of the optical device defined above (preferably without having to add first photodetectors to those already present outside the calibration zone).
  • the first optical delay generator is therefore removed and in operation the glazing is analyzed either static or preferably mobile, scrolling in translation for example on a conveyor as already described.
  • the glazing is between the first polarizer and the first analyzer, the optical axis is perpendicular to the tangent plane to the surface of the glazing in the illuminated surface portion, preferably perpendicular to the conveying axis of the glazing by a conveyor (rollers).
  • the quality analysis device comprises the first polariscope, in particular calibrated preferably by the first optical delay generator. calibrated and comprising in this order, according to an optical alignment along an optical axis (Z):
  • the first light source preferably polychromatic, with a given spectrum, in particular orthogonal to the optical axis, delivering a light beam, the first circular polarizer in a first direction of rotation of the polarization, in particular orthogonal to the axis optical, comprising a first linear polarizer followed by a first quarter-wave plate
  • the first analyzer which is a circular polarizer in a second direction of rotation of the polarization opposite to the first direction of rotation, in particular orthogonal to the optical axis, the first analyzer comprising a second quarter-wave plate followed by a second linear polarizer
  • the quality analysis device also includes:
  • the first digital sensor downstream of the first analyzer and following said optical alignment, the first digital sensor, in particular calibrated preferably by the first calibrated optical delay generator, in particular orthogonal to the optical axis, and a first objective orthogonal to the optical axis and defining a focal plane, first objective which is opposite the first digital sensor, between the first analyzer and the first digital sensor,
  • the glazing when the device is in operation, the glazing is between the first polarizer and the first analyzer
  • the first digital sensor comprises said set of first sensitive photodetectors in the spectrum of the first light source, having a given spectral response
  • each first photodetector of said set is able to receive light energy coming from the light beam coming out of the first analyzer, the first digital sensor then generating so-called digital quality analysis images, each digital quality analysis image being formed of one or more pixels with the reference channel or channels Ck representative of the spectral response of the first photodetectors.
  • the analysis device further comprises a unit for processing all the digital quality analysis images of the first sensor (and of the second optional sensor, etc.) facing said illuminated surface portion, forming a map of the optical delays in view of said surface portion illuminated by means of the calibration base already described (containing for each optical delay in the range AB of the digital values Ik for each of the reference channels Ck).
  • the calibration gives the correspondence Ik-optical delay (in nm), for each reference channel Ck of each pixel corresponding to an area element of the analyzed surface portion, it is read in the calibration table, the optical delay corresponding to each area element.
  • RGB channels (already used for calibration) are preferred as reference channels.
  • the measurement is objective and gives quantitative information on the measured glazing.
  • the processing unit controls for the analysis of the glazing: the whole of the acquisition, the analysis of the data of the sensor (s), the recording of the file results, the management of a database , the display of a man-machine interface ...
  • edge marks or around the holes can be excluded because the optical delays are systematically very high and generally hidden on the final glazing which will be mounted in a frame.
  • the orientation of the glazing on the conveyor is not limiting. More broadly the orientation of the glazing with respect to the direction (length) of the light strip is not limiting.
  • the surface portion illuminated by the beam at a time t may be a light band (preferably rectangular) which is not necessarily parallel to a glazing edge (which may be of any shape: rectangular, square, quadrilateral, triangular, round etc.).
  • the edges hidden by the spacers and the sealing means are of width of at most 3 at 20mm, it is not necessary to inspect these edges anisotropies are strong at the edge of the glazing. Considering that they are generally hidden by the frame after installation it does not always appear necessary to treat them as well as the clear view of the glazing. However, some windows are installed such that the visible glass surface is maximum.
  • the glazing is advantageously scanned by a beam of linear shape and with one or more sensors forming a line of pixels.
  • a movement of the glazing with respect to the (static) analysis device is then arranged.
  • the glazing is movable, advantageously arranged on a moving means animated with a uniform movement in translation.
  • a conveyor horizontal
  • It can be a cart (as long as the speed is controlled).
  • the vertical optical axis is Z- or at an angle relative to the vertical
  • the first polariscope, the first digital sensor are on a (industrial) heating and quenching line, downstream of the quenching system (in the cooling zone), the line comprising a (horizontal) glazing conveyor along a conveying axis Y
  • the vertical optical axis Z is preferably perpendicular to the Y axis, and possibly the industrial line is heating, bending and quenching, the first polariscope, the first digital sensor are downstream of the bending system
  • the first light source preferably alone or with a second adjacent light source is able to illuminate all or part of the length of the conveyor perpendicular to the Y axis of the conveyor
  • the first digital sensor is (a camera) linear with the first photodetectors in line, in particular the first digital sensor alone or with a second linear digital sensor (and its objective) adjacent to form a line of photodetectors, in particular over the entire length of the Conveyor perpendicular to the Y axis of the conveyor
  • a presence detector of the glazing upstream of the first light source for example at most 1 m from the first light source, in order to trigger the first acquisition at a subsequent time t 0 , and possibly to indicate the end of the passage of said glazing (or of several windows of a batch (or batch)) to define the last acquisition at a time t d following or with a timer ('timer' in English) knowing the maximum length of a lot (or batch) (of the oven),
  • acquisition management means managing the triggering of the first acquisition, the acquisition duration T aq and the dead time t m between each acquisition (for storing data) and stopping acquisitions.
  • the invention relates to a heating and quenching line comprising a conveyor, preferably horizontal, glazing along a Y axis of conveying, and optionally the line is bending quenching and having downstream of the quenching system the device of quality analysis as described above, the optical axis is preferably vertical (Z), the first digital sensor is linear, the first photodetectors being in line and possibly the line, especially industrial, is heating, bending and quenching, the first polariscope, the first digital sensor are downstream of the bending system.
  • It may also include a presence detector glazing upstream of the first light source, in particular to trigger the first acquisition at a time t 0 and / or preferably an indicator of the instantaneous speed V of the two rollers flanking the first source from light.
  • V of the glazing ensures a stable resolution over the entire analysis of the surface.
  • the first light source produces a homogeneous beam on the analyzed surface portion.
  • a pixel corresponds to the integrated information of a surface element of the glass.
  • a square pixel of width W is defined along the analysis length, parallel to the two rollers.
  • each photodetector of the line is capable of receiving light having passed through the glazing unit, beam having illuminated a surface element of the glazing defined by a width L A Q in the conveying axis.
  • L-AQ is equal to the acquisition time T A Q by the instantaneous conveying speed V of the rollers bordering the first light source.
  • t m there is a dead time t m - to collect the data - in which the pixels are not "functional".
  • t m is at most 100ms.
  • the acquisition sequence is for example the following:
  • a Q exposure time set software consisting of an electronic pulse sent by the processing unit- the first sensor integrates the signal (ie all the light energy received during this time T A Q )
  • the encoder pulse N + 1 arrive after the sum of the acquisition time and the dead time.
  • the distance between the first light source and the glazing may be at least 10 cm, in particular 300 mm, just as the distance between the first light source and the opening may be at least 10 cm, in particular 300 mm.
  • the distance between the glazing and the lens can be at least 1 m in particular 2 m, just as the distance between the aperture and the lens can be at least 1 m in particular 2 m.
  • the glazing and the first generator can be successively at the same distance from the first light source (and the polarizer and the analyzer).
  • the presence detector is for example a sensor arranged at one end of the conveyor facing the edge of the glasses that are conveyed.
  • the rotary encoder is for example arranged at one end of a conveyor roll
  • the optical quality analysis device preferably comprises the second polariscope (the first and second optical delay generators on the mounting support (s) are replaced by the said glazing unit.
  • the glazing is preferably static, horizontal or vertical,
  • the first sensor is matrix (which comprises the first photodetectors in matrix).
  • the invention furthermore relates to a method of manufacturing a glazing unit successively comprising glazing formation, tempered heating, quenching or bending using the glass quality analysis device as already described preferably on the line of glass. heating and quenching, preferably quality analysis preceded by a calibration of the first digital sensor and the first polariscope forming part of the optical device already described by introducing an optical delay varying in a range AB preferably in an automated manner in the first polariscope from the first preferably calibrated optical delay generator calibrated preferably on the line at a standstill.
  • it may include an alert leading to the stoppage of manufacture and / or heating and / or the line, and / or feedback on the parameters of the heating device and / or quenching.
  • the invention relates to a method of calibrating the first digital sensor and the first polariscope by introducing an optical delay varying in a range AB preferably automatically in the first polariscope, calibration from the first calibrated optical delay generator preferably automated.
  • the beam of the light source (of each diode) is perpendicular to the plane of the main stresses of the glazing analyzed.
  • the measurement is always valid if one moves away from the optical axis, it is necessary preferably enough cameras to maintain good conditions of observation or to use a camera on robotic arm.
  • the glazing has a TL light transmission of at least 5%
  • Figure 1 is a schematic sectional view, in the X, Z plane of an optical device 1000 according to the invention forming part of a quenching industrial line with a horizontal conveyor.
  • FIG. 1a is a schematic view from above (in the horizontal plane X, Y) showing the conveyor with a mounting support and the two openings of two motorized Babinet Sun compensators used in the optical device 1000 of FIG. 1.
  • FIG. 1b is a schematic view from above (in the horizontal plane X, Y) of a motorized Babinet compensator on a mounting support used in the optical device 1000 of FIG. 1.
  • Figure 1c is a schematic perspective view of the two conveyor rollers and the light source, and the circular polarizer in the inter-roll space, used in the optical device 1000 of Figure 1.
  • FIG. 1 d is a schematic perspective view showing the first circular analyzer, the first objective, the first linear camera and a mounting profile, used in the optical device 1000 of FIG. 1.
  • FIG. 1e is a schematic sectional view, in the Y, Z plane, of the optical device 1000 of FIG. 1.
  • Figure 1f shows three graphs of the Ik values as a function of the optical delay for the three RGB channels (for a given representative pixel of a photodetector in the aperture or averaged over several pixels of photodetectors in the aperture).
  • FIG. 2 is a schematic sectional view, in the Y, Z plane, of an optical quality analysis device 2000 of a glazing unit according to the invention using the same apparatuses as in FIG. 1 except the Babinet compensator and its ordered.
  • FIG. 2 is a schematic view from above of the conveyor, of the glazing to be inspected, shown in FIG. 2.
  • Figure 2a is a schematic detail view of the conveyor.
  • Figure 2b explains and acquisition from the scanning surface.
  • Figures 2c and 2d are graphs showing the acquisition sequence and the dead time sequence for collection of acquisition data.
  • Figure 3a is a schematic sectional view in the X, Z plane of an optical device 1001 according to the invention forming part of a quenching industrial line in a second embodiment.
  • FIG. 3b is a schematic sectional view, in the X, Z plane, of a quality analysis device for a glazing unit 2001 according to the invention using the same apparatuses as in FIG. 3a except the Babinet compensator and its control .
  • FIG. 4a is a schematic sectional view, in the Y, Z plane, of an optical device 1002 according to the invention in a third embodiment.
  • FIG. 4b is a schematic side view in the Y, Z plane of an optical quality analysis device of a glazing unit 2002 according to the invention using the same apparatuses as in FIG. 4a except the Babinet compensator and its control .
  • Figure 1 is a schematic sectional view, in the X, Z plane of an optical device 1000 according to the invention forming part of a quenching industrial line with a horizontal conveyor.
  • the optical device 1000 comprises a first vertical polariscope comprising in this order (from bottom to top), according to an optical alignment with a vertical optical axis Z:
  • a first source of white light 1 in this case a bar of diodes called LEDs or LEDs, delivering a light beam here without collimation means, the light of which is emitted in the direction given by the optical axis, or alternatively one or more organic electroluminescent diode (s) (called OLED), a light bar orthogonal to the optical axis, producing with or without a diffuser a homogeneous light a first circular polarizer 2 (or quasi-circular) in a first direction of rotation - left or right -, in particular comprising a first linear polarizer and a first quarter-wave plate, against or glued on the light bar 1
  • OLED organic electroluminescent diode
  • a first analyzer 2 ' which is a circular (or quasi-circular) polarizer in a second direction of rotation of the polarization opposite to the first direction of rotation - respectively or right or left -, in particular first analyzer comprising a second quarter-wave plate followed by a second linear polarizer.
  • the optical device 1000 further comprises downstream of the first analyzer and following said optical alignment:
  • a first digital sensor 6 orthogonal to the optical axis, which is here a linear digital camera with a row of first photodetectors
  • a first objective orthogonal to the optical axis and defining a focal plane, facing the first digital sensor and between the first analyzer 2 and the first digital sensor, in particular fixed to or against the first digital sensor.
  • the optical device comprises between the first polarizer and the first analyzer, and according to said optical alignment, a first calibrated optical delay generator 3, orthogonal to the optical axis, here a compensator of Babinet (Sun), in a range AB between Onm and 800nm and the first optical delay generator is in said focal plane.
  • a first calibrated optical delay generator 3 orthogonal to the optical axis, here a compensator of Babinet (Sun), in a range AB between Onm and 800nm and the first optical delay generator is in said focal plane.
  • the first digital sensor 6 thus comprises a set of first in-line sensitive photodetectors in the spectrum of the first light source 1, having a given spectral response.
  • Second so-called calibration photodetectors are opposite (of the opening 31 of the first optical delay generator.
  • the optical device also comprises, between the first optical delay generator and the first linear sensor, upstream of the first analyzer, an optical delay plate calibrated with a delay A'O chosen in the zone where the value value Ik as a function of the optical delay is substantially linear for at least one of the reference channels, in particular 70 or 75 to 175 nm or 185 nm or from 350 or 375 nm to 425 nm.
  • the compensator Babinet Sun 3 comprises first and second wedge blades, birefringent material, the second blade being movable in translation relative to the first static blade, in particular the compensator being defined by an opening 31, centered on the optical axis , the opening is fully illuminated by the first light source 1, the opening being in said focal plane, one or more first photodetectors of calibration being opposite the opening.
  • the change in optical delay is automated especially computer controlled.
  • the Babinet Soleil compensator motorized and in particular controlled by a computer, is capable of automatically incrementing the optical delays in the range AB, in particular with a incrementation step PO of at most 0.5 nm and even at most 0, 3nm, especially between 15 and 25mm and even 0 and 25mm.
  • the opening 31 of the compensator is circular, of diameter 01 of at most 30 mm, the center of the opening is inscribed in a central disc of diameter 01/2, the first or the first photodetectors of calibration used are entirely opposite said disc central.
  • Each first calibration photodetector receives successively for each of said optical delays in said range AB of the light energy from the light beam coming out of the first analyzer 2 '.
  • the first digital sensor then generates digital calibration images for said optical delays in said range AB, each digital calibration image being formed of one or more pixels with one or more reference channels Ck representative of the spectral response of the one or more first photodetectors of calibration.
  • the reference channels Ck are three red, green, and blue channels called RGB channels.
  • the first polariscope, the first digital sensor and the first optical delay generator are mounted on a heating and quenching line, downstream of the quenching system, at a standstill, the line comprising a horizontal glazing conveyor along a Y axis. conveying, possibly the line is bending tempering.
  • FIG. 1a is a schematic view from above (in the horizontal plane X, Y) showing the conveyor with a mounting support and the two openings of two motorized Babinet Sun compensators used in the optical device 1000 of FIG.
  • FIG. 1 is a schematic perspective view of the two conveyor rollers and the light source, and of the circular polarizer in the inter-roll space, used in the optical device 1000 of FIG. 1.
  • the conveyor (see FIGS. 1a, 1c in particular) comprises two rollers 81, 82 spaced apart by an inter-roll space, the first light source 1 on a source support 10 spaced from the ground is under the conveying zone, is under the two rollers opposite the inter-roll space.
  • the first digital sensor is linear and spaced and above the two rollers.
  • the first digital sensor can be attached to a metal gate 70 in particular on either side of the conveyor.
  • the first optical delay generator is fixed on a mounting bracket 7 on the two rollers, mounting bracket with a hole 71 facing the opening 71.
  • the lateral surfaces of the light strip can be masked (by opaque strips for example), only the central surface against the (central) part of the first polarizer 21 illuminating the compensator 3.
  • the optical device 1000 finally comprises a first processing unit (a computer) of digital calibration images forming a calibration base containing for each optical delay in the range AB digital values Ik for each of the reference channels Ck, numerical values Ik being representative of the light energies collected by the first calibration photodetectors.
  • a first processing unit a computer of digital calibration images forming a calibration base containing for each optical delay in the range AB digital values Ik for each of the reference channels Ck, numerical values Ik being representative of the light energies collected by the first calibration photodetectors.
  • the length of the rollers is for example 3 to 4m.
  • a second polariscope using the light bar 1, the polarizer 2, the mounting support 7 (with another hole 71) is used here a second calibrated static delay blade 4, a second analyzer 2 ', a second linear camera 6 and a second compensator 3 with its opening 31.
  • FIG. 1b is a schematic view from above (in the horizontal plane X, Y) of the motorized Babinet compensator on the mounting support 7 with its hole 71 wider than the opening 31.
  • the control of the motor 32 (also on the support) is connected by a wiring 33 to the compensator 3 and acts on a micrometer screw for example.
  • FIG. 1d is a schematic perspective view showing a static retardation plate 4 (in a filter holder for example), the first lens 5, the first linear camera 6 and a mounting profile 101, a plate 102 with a screw positioning 103 of the camera 6.
  • FIG. 1f shows three graphs 15, 16, 17 of the values Ik as a function of the optical delay ⁇ (nm) for the three RGB channels averaged over several pixels of the photodetectors in the aperture).
  • FIG. 2 is a schematic sectional view, in the Y, Z plane, of a quality analysis optical device 2000 of a glazing unit using the same apparatuses as in FIG. 1 except the Babinet compensator and its control.
  • the pane 100 scrolls along the Y axis and is scanned by the light bar 1.
  • FIG. 2 ' is a schematic view from above of the conveyor in the X, Y plane of the window to be inspected 100 shown in FIG. 2.
  • Figure 2a is a schematic detailed view of the conveyor 8 with its rollers 81, 82 (and the fastening gate 70).
  • a presence detector 84 of the glazing (not visible) is used to trigger the acquisition.
  • a rotary encoder 83 is used which will provide information on the instantaneous speed V.
  • Figure 2b explains and acquisition from the scanning surface.
  • the first light source produces a homogeneous beam on the analyzed surface portion.
  • a pixel corresponds to the integrated information of a surface element of the glass.
  • a 91 square pixel width W is defined along the analysis length, parallel to the two rollers.
  • each photodetector of the line is capable of receiving light having passed through the sliding window 100 following Y, beam having illuminated a surface element of the glazing defined by a width L in the conveying axis. . L is equal to the acquisition time T A Q by the instantaneous conveying speed V of the rollers bordering the first light source.
  • t m there is a dead time t m - to collect the data - in which the pixels are not "functional".
  • t m is at most 100ms.
  • the acquisition sequence (in loop) is for example the following:
  • T A Q set in software consisting of an electronic pulse sent by the unit of treatment- the first sensor 6 integrates the signal (that is, all the light energy received during the time T A Q)
  • the encoder pulse N + 1 arrives after the sum of the acquisition time and the dead time.
  • FIGS. 2c and 2d are graphs showing for the 2c the pulses 18 for initiating the acquisitions and for FIG. 2d the acquisition sequence with the dead times for the collection of the acquisition data.
  • Figure 3a is a schematic sectional view in the X, Z plane of an optical device 1001 according to the invention forming part of a quenching industrial line in a second embodiment. It differs from the first device 1000 especially in that the beam 13 is collimated (the LED bar 1 'is collimated) and the first objective 6' is telecentric. One can then use a single polariscope and a single compensator 3.
  • FIG. 3b is a schematic sectional view, in the X, Z plane, of a quality analysis device 2001 of a glazing unit 100 according to the invention using the same apparatuses as in FIG. 3a except the Babinet compensator and its ordered.
  • FIG. 4a is a schematic sectional view, in the Y, Z plane, of an optical device 1002 according to the invention in a third embodiment.
  • the optical axis Y is horizontal so the elements 1, 2, 4, 2 ', 5, 6 are on the supports 70, 70' vertical planes and the compensator 3 on the amounts by side examples 71, 72.
  • FIG. 4b is a schematic side view in the Y, Z plane of a 2002 quality analysis optical device of a glazing unit 1000 using the same apparatuses as in FIG. 4a except the Babinet compensator and its control.
  • the glazing is on uprights for example side 73.

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EP18730028.0A 2017-05-31 2018-05-31 Kalibrierung von optischen vorrichtungen zur analyse der verglasungsqualität und diesbezügliche verfahren Withdrawn EP3631419A1 (de)

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FR3077386B1 (fr) 2018-01-31 2020-02-21 Saint-Gobain Glass France Simulation de la fleur de trempe d'un assemblage vitre
US20200049619A1 (en) * 2018-08-08 2020-02-13 GM Global Technology Operations LLC Polarized light filter vision system to detect level of temper in glass
ES2955582T3 (es) * 2019-04-11 2023-12-04 Saint Gobain Método para determinar la sensibilidad de un panel de vidrio a la formación de marcas de enfriamiento rápido
FR3096462A1 (fr) 2019-05-24 2020-11-27 Saint-Gobain Glass France procédé d’évaluation de la qualité visuelle d’un vitrage constitué par une feuille de verre renforcée thermiquement ou comprenant au moins une telle feuille de verre
CN110501352A (zh) * 2019-09-27 2019-11-26 中国建筑科学研究院有限公司 一种钢化玻璃幕墙杂质和缺陷现场检测***及方法
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FI128985B (fi) * 2019-10-22 2021-04-30 Glaston Finland Oy Menetelmä ja laite lasilevyjen lämpökäsittelyprosessin ohjaamiseksi
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CN114353703A (zh) * 2022-01-07 2022-04-15 长春希达电子技术有限公司 侧向光方式led屏幕拼接平整度简易测量方法及装置
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CN116046819B (zh) * 2023-04-03 2023-06-06 四川中科高能科技发展有限责任公司 一种基于辐照可用物品从而实现可用物品色泽识别方法

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US20200088651A1 (en) 2020-03-19
KR20200012915A (ko) 2020-02-05
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WO2018220328A1 (fr) 2018-12-06
CN109564156A (zh) 2019-04-02
RU2019143417A (ru) 2021-07-01
FR3067111B1 (fr) 2019-08-30

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