EP1875216A2 - Method and device for eliminating parasite reflections during inspection of translucent or transparent hollow objects - Google Patents

Method and device for eliminating parasite reflections during inspection of translucent or transparent hollow objects

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Publication number
EP1875216A2
EP1875216A2 EP06726316A EP06726316A EP1875216A2 EP 1875216 A2 EP1875216 A2 EP 1875216A2 EP 06726316 A EP06726316 A EP 06726316A EP 06726316 A EP06726316 A EP 06726316A EP 1875216 A2 EP1875216 A2 EP 1875216A2
Authority
EP
European Patent Office
Prior art keywords
infrared radiation
sensor
objects
infrared
polarizer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP06726316A
Other languages
German (de)
French (fr)
Inventor
Guillaume Bathelet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tiama SA
Original Assignee
Tiama SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tiama SA filed Critical Tiama SA
Publication of EP1875216A2 publication Critical patent/EP1875216A2/en
Withdrawn legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B07—SEPARATING SOLIDS FROM SOLIDS; SORTING
    • B07C—POSTAL SORTING; SORTING INDIVIDUAL ARTICLES, OR BULK MATERIAL FIT TO BE SORTED PIECE-MEAL, e.g. BY PICKING
    • B07C5/00—Sorting according to a characteristic or feature of the articles or material being sorted, e.g. by control effected by devices which detect or measure such characteristic or feature; Sorting by manually actuated devices, e.g. switches
    • B07C5/04—Sorting according to size
    • B07C5/12—Sorting according to size characterised by the application to particular articles, not otherwise provided for
    • B07C5/122—Sorting according to size characterised by the application to particular articles, not otherwise provided for for bottles, ampoules, jars and other glassware
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N2021/9063—Hot-end container inspection

Definitions

  • the present invention relates to the technical field of inspection of articles or hollow objects, translucent or transparent having a high temperature.
  • the object of the invention is more specifically aimed at the high speed inspection of objects such as bottles or glass bottles leaving a manufacturing or forming machine.
  • objects such as bottles or glass bottles leaving a manufacturing or forming machine.
  • it is known to use the infrared radiation emitted by the objects at the output of the forming machine in order to carry out a control or an inspection in order to detect any defects on the surface or inside objects.
  • the quality control of such objects is necessary to eliminate those with defects that may affect their aesthetic or more serious character, to constitute a real danger for the subsequent user.
  • the forming machine consists of different cavities each equipped with a mold in which the object takes its final form at high temperature.
  • the objects are conveyed so as to constitute a queue on a transport conveyor causing the objects to scroll successively in various processing stations such as spraying and annealing.
  • patent GB 9 408 446 describes an apparatus consisting of two infrared sensors arranged on either side of the conveyor conveying the objects at the output of the forming machine. These sensors each generate a signal in response to the radiation of heat emitted by the objects. If such a signal does not correspond to a predetermined pattern, the objects are considered to be defective. It should be noted that this detection principle consists in memorizing for each cavity the image of an object considered good so as to serve as a reference model.
  • the document DE 199 02 316 proposes to analyze the thermal profile of the objects recovered by the infrared sensor in order to statistically determine for each cavity, an expected thermal profile which is compared with the thermal profile measured in order to detect the state. of failure or not of objects.
  • the applicant has shown that the measurement of the infrared radiation for each object is tainted by an error due to other sources of infrared radiation reflected on the inspected surface.
  • these sources of infrared radiation considered parasitic may be objects placed upstream or downstream of the inspected object, objects before forming or objects located on another production line.
  • the object of the invention is therefore to overcome the drawbacks stated above by providing an optical method for limiting or even eliminating the influence of neighboring infrared radiation sources to the object inspected when measuring the infrared radiation emitted by said object.
  • Another object of the invention is to provide an optical method for removing the parasitic infrared radiation which is reflected on the inspected object so as to improve the quality of inspection to determine whether the inspected object is defective or not.
  • the object of the invention relates to a method for inspecting, using at least one sensor sensitive to infrared radiation, transparent hollow objects or translucent high temperature out of different forming cavities.
  • the infrared radiation taken into account by the sensitive sensor is suppressed, the infrared radiation reflected by said object and coming from infrared sources close to said object.
  • the method aims to suppress polarized infrared radiation in a preferred direction.
  • the polarized infrared radiation is eliminated in a vertical preferred direction.
  • the polarized infrared radiation is suppressed in an infrared spectral band encompassing the infrared spectral band of the measurement sensor.
  • Another object of the invention is to provide a device for inspecting at high temperature transparent or translucent hollow objects emerging from different forming cavities, adapted to limit or even eliminate the influence of neighboring infrared radiation sources to the inspected object.
  • the device comprises:
  • the optical system of each sensitive sensor is provided with a polarizer whose polarization vector is substantially orthogonal to the polarization vector of the rays reflected by the inspected object.
  • the polarizer has a polarization vector that is orthogonal to the polarization vector of the rays reflected by the inspected object.
  • the polarizer has a horizontal polarization vector.
  • the polarizer performs its polarization function in an infrared spectral band encompassing at least the infrared spectral band of the measurement sensor.
  • Figure 1 is a schematic view illustrating an embodiment of an inspection installation according to the invention.
  • Figure 2 illustrates the formation of spurious reflections on the surface of an object being inspected, created by neighboring objects.
  • FIG. 3 illustrates the operating principle of the subject of the invention.
  • the object of the invention relates to a device 1 for inspecting hot transparent or translucent hollow objects 2 such as for example bottles or glass bottles.
  • the device 1 is placed so as to make it possible to inspect the objects 2 leaving a manufacturing or forming machine 3 and thus having a high temperature.
  • the forming machine 3 conventionally comprises a series of cavities 4 each providing the forming of an object 2.
  • the objects 2 which have just been formed by the machine 3 are conveyed on an output conveyor 5 of FIG. 2 objects form a queue on the conveyor 5.
  • the objects 2 are thus conveyed successively in different processing stations.
  • the device 1 comprises a P inspection or control station at high speed, objects 2 having a high temperature.
  • the inspection station P is placed closer to the forming machine so that the conveyor 5 ensures the successive movement of the objects 2 at high temperature in front of the inspection station P.
  • the inspection station P has at least one and in the example shown, two sensors 6 sensitive to infrared radiation emitted by the objects 2 scrolling past each sensor.
  • the infrared radiation emitted by the hot objects 2 extends from near infrared to far infrared.
  • the sensors 6 are thus placed at the output of the forming machine 3 so as to be sensitive to all or part of the infrared radiation (near infrared to far infrared) emitted by the objects 2.
  • the two sensors 6 are arranged on either side of the conveyor 5 to allow inspection of both sides of the objects 2.
  • each sensor 6 is constituted by an infrared camera. It should be noted that each sensor is directed so as to observe an object 2 downstream with respect to the direction of travel D of the objects.
  • the two sensors 6 thus extend symmetrically on either side of the conveyor 5.
  • the sensors 6 are connected to a unit 10 for controlling and processing the output signals delivered by the sensors 6.
  • each sensor 6 generates an output signal, for example video, in response to the Infrared radiation emitted by an object 2.
  • the unit 10 is adapted to control the operation of the sensors 6 to the passage of an object 2 in their field of vision, so that each sensor 6 takes an image of each of the objects 2 scrolling at high speed.
  • the images taken by the sensor (s) 6 are analyzed by the unit 10 during an inspection step, in particular to look for possible defects of the objects 2 or to analyze the operation of the forming process.
  • the unit 10 is thus adapted to determine whether the inspected objects are defective or not. More specifically, the unit 10 makes it possible to determine whether the object inspected has defects on the surface and / or in the material constituting the object inspected.
  • the optical system of each sensitive sensor 6 is provided with an optical polarizer so as to limit or even eliminate the infrared radiation reflected by the object inspected and issued from sources adjacent to said inspected object and considered as parasitic sources of infrared radiation.
  • sources of heat adjacent to the inspected object generate spurious reflections R on the surface of the inspected object 2.
  • the downstream objects 2i and upstream 2 2 to said inspected object 2, placed on the conveyor 5 are at a temperature close to the inspected object and emit infrared radiation which is reflected on the surface of the inspected object 2, which disturbs the measurement of the infrared radiation made by each sensor 6.
  • the measurement of the radiation received by each sensor 6 is a function of the direct radiation unpolarized object inspected 2 and radiation reflected on the surface of said object 2 and from neighboring objects.
  • other sources of heat may be reflected on the surface of the inspected object 2 such as objects before they are formed or high temperature objects made on a neighboring line.
  • the neighboring or parasitic infrared source 2 2 emits towards the object to be inspected 2, an infrared radiation whose polarization vector V P has multiple unprivileged directions.
  • the parasitic reflections R due to this source of parasitic heat 2 2 and reflected on the surface of the object to be inspected 2 are predominantly polarized in a preferred direction.
  • the infrared radiation from the parasitic reflections R has a polarization vector V v of vertical direction.
  • the object of the invention is therefore to place in the optical system of each measuring sensor 6, a polarizer oriented in the substantially orthogonal direction and preferably in the direction orthogonal to this preferred direction of the polarization vector of the infrared radiation reflected by the surface of the object inspected 2.
  • a polarizer makes it possible to eliminate infrared radiation taken into account by each measuring sensor, the infrared radiation reflected by the surface of the object inspected 2 and from neighboring sources 2 lf 2 2 in the embodiment considered.
  • the polarizer has a horizontal polarization vector, that is to say orthogonal to the polarization vector V v of the parasitic infrared radiation.
  • it may be provided to make the polarizer by means of a linear polarized filter or by means of other optical elements such as for example a circular or elliptical polarizer.
  • the polarizer assumes its polarization function in an infrared spectral band encompassing at least the infrared spectral band of the measurement sensor.
  • the infrared radiation taken into account corresponds to the direct unpolarized radiation of the inspected object making it possible to accurately determine whether the inspected object is defective or not.
  • the object of the invention makes it possible to improve the detection of defects appearing on the surface and / or in the constituent material of the object inspected.

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Radiation Pyrometers (AREA)

Abstract

The invention concerns a method for inspecting, by means of at least one infrared sensitive sensor, transparent or translucent hollow objects (2) at high temperature exiting from various forming cavities (4). The invention is characterized in that the method for inspecting an object consists in eliminating the infrared radiation integrated for the sensitive sensor, the infrared radiation reflected by said object and derived from infrared sources in the vicinity of said object.

Description

PROCEDE ET DISPOSITIF POUR SUPPRIMER LES REFLETS PARASITES LORS DE L'INSPECTION A CHAUD D'OBJETS CREUX TRANSLUCIDES OUMETHOD AND DEVICE FOR REMOVING PARASITE REFLECTIONS DURING HOT INSPECTION OF TRANSLUCENT OR HOLLOW OBJECTS
TRANSPARENTSTRANSPARENT
La présente invention concerne le domaine technique de l'inspection d'articles ou d'objets creux, translucides ou transparents présentant une haute température.The present invention relates to the technical field of inspection of articles or hollow objects, translucent or transparent having a high temperature.
L'objet de l'invention vise plus précisément l'inspection à haute cadence d'objets tels que des bouteilles ou des flacons en verre sortant d'une machine de fabrication ou de formage. Dans le domaine préféré de la fabrication d'objets en verre, il est connu d'utiliser le rayonnement infrarouge émis par les objets en sortie de la machine de formage afin de réaliser un contrôle ou une inspection en vue de déceler d'éventuels défauts sur la surface ou à l'intérieur des objets. Le contrôle de la qualité de tels objets est nécessaire afin d'éliminer ceux qui présentent des défauts susceptibles d'affecter leur caractère esthétique ou plus grave, de constituer un réel danger pour l'utilisateur ultérieur.The object of the invention is more specifically aimed at the high speed inspection of objects such as bottles or glass bottles leaving a manufacturing or forming machine. In the preferred field of the manufacture of glass objects, it is known to use the infrared radiation emitted by the objects at the output of the forming machine in order to carry out a control or an inspection in order to detect any defects on the surface or inside objects. The quality control of such objects is necessary to eliminate those with defects that may affect their aesthetic or more serious character, to constitute a real danger for the subsequent user.
D'une manière classique, la machine de formage est constituée de différentes cavités équipées chacune d'un moule dans lequel l'objet prend sa forme finale à haute température. En sortie de la machine de formage, les objets sont acheminés de manière à constituer une file sur un convoyeur de transport amenant les objets à défiler successivement dans divers postes de traitement tels que de pulvérisation et de recuit.In a conventional manner, the forming machine consists of different cavities each equipped with a mold in which the object takes its final form at high temperature. At the output of the forming machine, the objects are conveyed so as to constitute a queue on a transport conveyor causing the objects to scroll successively in various processing stations such as spraying and annealing.
Il apparaît intéressant d'identifier un défaut de formage le plus tôt possible à la sortie de la machine de formage avant les divers postes de traitement de manière à pouvoir le corriger le plutôt possible au niveau de la machine de formage. Dans l'état de la technique, diverses solutions ont été proposées pour inspecter des objets à haute température sortant d'une machine de formage.It appears interesting to identify a forming defect as soon as possible at the output of the forming machine before the various processing stations so as to be able to correct it as much as possible at the level of the forming machine. In the state of the art, various solutions have been proposed to inspect high temperature objects leaving a forming machine.
Par exemple, le brevet GB 9 408 446 décrit un appareil constitué de deux capteurs infrarouges disposés de part et d'autre du convoyeur acheminant les objets en sortie de la machine de formage. Ces capteurs génèrent chacun un signal en réponse aux radiations de chaleur émise par les objets. Si un tel signal ne correspond pas à un modèle prédéterminé, les objets sont considérés comme défectueux. Il est à noter que ce principe de détection consiste à mémoriser pour chaque cavité, l'image d'un objet considéré comme bon de manière à servir de modèle de référence.For example, patent GB 9 408 446 describes an apparatus consisting of two infrared sensors arranged on either side of the conveyor conveying the objects at the output of the forming machine. These sensors each generate a signal in response to the radiation of heat emitted by the objects. If such a signal does not correspond to a predetermined pattern, the objects are considered to be defective. It should be noted that this detection principle consists in memorizing for each cavity the image of an object considered good so as to serve as a reference model.
De même, le document DE 199 02 316 propose d'analyser le profil thermique des objets récupérés par le capteur infrarouge en vue de déterminer statistiquement pour chaque cavité, un profil thermique escompté qui est comparé au profil thermique mesuré en vue de détecter l'état de défaillance ou non des objets.Similarly, the document DE 199 02 316 proposes to analyze the thermal profile of the objects recovered by the infrared sensor in order to statistically determine for each cavity, an expected thermal profile which is compared with the thermal profile measured in order to detect the state. of failure or not of objects.
Indépendamment des inconvénients que présentent les techniques décrites ci-dessus, la déposante a mis en évidence que la mesure du rayonnement infrarouge pour chaque objet est entachée d'une erreur due à d'autres sources de rayonnement infrarouge qui se réfléchissent sur la surface inspectée. Par exemple, ces sources de rayonnement infrarouge considérées comme parasites, peuvent être des objets, placés en amont ou en aval de l'objet inspecté, des objets avant leur formage ou des objets situés sur une autre ligne de fabrication.Regardless of the disadvantages presented by the techniques described above, the applicant has shown that the measurement of the infrared radiation for each object is tainted by an error due to other sources of infrared radiation reflected on the inspected surface. For example, these sources of infrared radiation considered parasitic, may be objects placed upstream or downstream of the inspected object, objects before forming or objects located on another production line.
L'objet de l'invention vise donc à remédier aux inconvénients énoncés ci-dessus en proposant un procédé optique permettant de limiter voire de supprimer l'influence des sources de rayonnement infrarouge voisines à l'objet inspecté lors de la mesure du rayonnement infrarouge émis par ledit objet.The object of the invention is therefore to overcome the drawbacks stated above by providing an optical method for limiting or even eliminating the influence of neighboring infrared radiation sources to the object inspected when measuring the infrared radiation emitted by said object.
Un autre objet de l'invention est de proposer un procédé optique permettant de supprimer le rayonnement infrarouge parasite qui se réfléchit sur l'objet inspecté de manière à améliorer la qualité d'inspection visant à déterminer si l'objet inspecté est défectueux ou non.Another object of the invention is to provide an optical method for removing the parasitic infrared radiation which is reflected on the inspected object so as to improve the quality of inspection to determine whether the inspected object is defective or not.
Pour atteindre un tel objectif, l'objet de l'invention concerne un procédé pour inspecter, à l'aide d'au moins un capteur sensible au rayonnement infrarouge, des objets creux transparents ou translucides à haute température sortant de différentes cavités de formage. Selon l'invention, pour détecter un objet défectueux ou non, on supprime du rayonnement infrarouge pris en compte par le capteur sensible, le rayonnement infrarouge réfléchi par ledit objet et issu de sources infrarouges voisines audit objet.To achieve such an object, the object of the invention relates to a method for inspecting, using at least one sensor sensitive to infrared radiation, transparent hollow objects or translucent high temperature out of different forming cavities. According to the invention, to detect an object that is defective or not, the infrared radiation taken into account by the sensitive sensor is suppressed, the infrared radiation reflected by said object and coming from infrared sources close to said object.
Selon une forme de réalisation, le procédé vise à supprimer le rayonnement infrarouge polarisé selon une direction privilégiée.According to one embodiment, the method aims to suppress polarized infrared radiation in a preferred direction.
Avantageusement, on supprime le rayonnement infrarouge polarisé selon une direction privilégiée verticale.Advantageously, the polarized infrared radiation is eliminated in a vertical preferred direction.
Selon une forme préférée de réalisation, on supprime le rayonnement infrarouge polarisé dans une bande spectrale infrarouge englobant la bande spectrale infrarouge du capteur de mesure.According to a preferred embodiment, the polarized infrared radiation is suppressed in an infrared spectral band encompassing the infrared spectral band of the measurement sensor.
Un autre objet de l'invention est de proposer un dispositif pour inspecter à haute température des objets creux transparents ou translucides sortant de différentes cavités de formage, adaptée pour limiter voire supprimer l'influence des sources de rayonnement infrarouge voisines à l'objet inspecté.Another object of the invention is to provide a device for inspecting at high temperature transparent or translucent hollow objects emerging from different forming cavities, adapted to limit or even eliminate the influence of neighboring infrared radiation sources to the inspected object.
Pour atteindre un tel objectif, le dispositif comporte :To achieve such an objective, the device comprises:
- au moins un capteur sensible au rayonnement infrarouge émis par les objets défilant devant le capteur,at least one sensor sensitive to the infrared radiation emitted by the objects passing in front of the sensor,
- et une unité de contrôle et de traitement des signaux de sortie délivrés par le capteur et adaptée pour déterminer si un objet est défectueux ou non. Selon l'invention, le système optique de chaque capteur sensible est muni d'un polariseur dont le vecteur de polarisation est sensiblement orthogonal au vecteur de polarisation des rayons réfléchis par l'objet inspecté. De préférence, le polariseur possède un vecteur de polarisation qui est orthogonal au vecteur de polarisation des rayons réfléchis par l'objet inspecté.and a unit for controlling and processing the output signals delivered by the sensor and adapted to determine whether an object is defective or not. According to the invention, the optical system of each sensitive sensor is provided with a polarizer whose polarization vector is substantially orthogonal to the polarization vector of the rays reflected by the inspected object. Preferably, the polarizer has a polarization vector that is orthogonal to the polarization vector of the rays reflected by the inspected object.
Selon une forme de réalisation, le polariseur possède un vecteur de polarisation horizontal. Avantageusement, le polariseur assure sa fonction de polarisation dans une bande spectrale infrarouge englobant au moins la bande spectrale infrarouge du capteur de mesure.According to one embodiment, the polarizer has a horizontal polarization vector. Advantageously, the polarizer performs its polarization function in an infrared spectral band encompassing at least the infrared spectral band of the measurement sensor.
Diverses autres caractéristiques ressortent de la description faite ci-dessous en référence aux dessins annexés qui montrent, à titre d'exemples non limitatifs, des formes de réalisation de l'objet de l'invention.Various other characteristics appear from the description given below with reference to the accompanying drawings which show, by way of non-limiting examples, embodiments of the subject of the invention.
La Figure 1 est une vue schématique illustrant un exemple de réalisation d'une installation d'inspection conforme à l'invention.Figure 1 is a schematic view illustrating an embodiment of an inspection installation according to the invention.
La Figure 2 illustre la formation de reflets parasites sur la surface d'un objet en cours d'inspection, créés par les objets voisins.Figure 2 illustrates the formation of spurious reflections on the surface of an object being inspected, created by neighboring objects.
La Figure 3 illustre le principe de fonctionnement de l'objet de l'invention.Figure 3 illustrates the operating principle of the subject of the invention.
Tel que cela ressort plus précisément de la Figure 1, l'objet de l'invention concerne un dispositif 1 permettant d'inspecter à chaud des objets creux transparents ou translucides 2 tels que par exemple des bouteilles ou des flacons en verre. Le dispositif 1 est placé de manière à permettre d'inspecter les objets 2 sortant d'une machine de fabrication ou de formage 3 et présentant ainsi une haute température.As is more specifically apparent from Figure 1, the object of the invention relates to a device 1 for inspecting hot transparent or translucent hollow objects 2 such as for example bottles or glass bottles. The device 1 is placed so as to make it possible to inspect the objects 2 leaving a manufacturing or forming machine 3 and thus having a high temperature.
La machine de formage 3 comporte de manière classique une série de cavités 4 assurant chacune le formage d'un objet 2. De manière connue, les objets 2 qui viennent d'être formés par la machine 3 sont acheminés sur un convoyeur de sortie 5 de manière que les objets 2 constituent une file sur le convoyeur 5. Les objets 2 sont ainsi acheminés successivement dans différents postes de traitement. Conformément à l'invention, le dispositif 1 comporte un poste d'inspection ou de contrôle P à haute cadence, des objets 2 présentant une haute température. A cet effet, le poste d'inspection P est placé au plus près de la machine de formage de sorte que le convoyeur 5 assure le défilement successif des objets 2 à haute température devant le poste d'inspection P. Le poste d'inspection P comporte au moins un et dans l'exemple illustré, deux capteurs 6 sensibles au rayonnement infrarouge émis par les objets 2 défilant devant chaque capteur. De manière classique, il doit être noté que le rayonnement infrarouge émis par les objets chauds 2 s'étend du proche infrarouge à l'infrarouge lointain. Les capteurs 6 sont placés ainsi en sortie de la machine de formage 3 de manière à être sensibles à tout ou partie du rayonnement infrarouge (proche infrarouge à l'infrarouge lointain) émis par les objets 2. Dans l'exemple illustré, les deux capteurs 6 sont disposés de part et d'autre du convoyeur 5 pour permettre d'inspecter les deux côtés des objets 2. Par exemple, chaque capteur 6 est constitué par une caméra infrarouge. II est à noter que chaque capteur est dirigé de manière à observer un objet 2 en aval par rapport au sens de défilement D des objets. Les deux capteurs 6 s'étendent donc de manière symétrique de part et d'autre du convoyeur 5.The forming machine 3 conventionally comprises a series of cavities 4 each providing the forming of an object 2. In known manner, the objects 2 which have just been formed by the machine 3 are conveyed on an output conveyor 5 of FIG. 2 objects form a queue on the conveyor 5. The objects 2 are thus conveyed successively in different processing stations. According to the invention, the device 1 comprises a P inspection or control station at high speed, objects 2 having a high temperature. For this purpose, the inspection station P is placed closer to the forming machine so that the conveyor 5 ensures the successive movement of the objects 2 at high temperature in front of the inspection station P. The inspection station P has at least one and in the example shown, two sensors 6 sensitive to infrared radiation emitted by the objects 2 scrolling past each sensor. Conventionally, it should be noted that the infrared radiation emitted by the hot objects 2 extends from near infrared to far infrared. The sensors 6 are thus placed at the output of the forming machine 3 so as to be sensitive to all or part of the infrared radiation (near infrared to far infrared) emitted by the objects 2. In the example shown, the two sensors 6 are arranged on either side of the conveyor 5 to allow inspection of both sides of the objects 2. For example, each sensor 6 is constituted by an infrared camera. It should be noted that each sensor is directed so as to observe an object 2 downstream with respect to the direction of travel D of the objects. The two sensors 6 thus extend symmetrically on either side of the conveyor 5.
D'une manière classique, les capteurs 6 sont reliés à une unité 10 de contrôle et de traitement des signaux de sortie délivrés par les capteurs 6. En effet, chaque capteur 6 génère chacun un signal de sortie, par exemple vidéo, en réponse au rayonnement infrarouge émis par un objet 2. Bien entendu, l'unité 10 est adaptée pour piloter le fonctionnement des capteurs 6 au passage d'un objet 2 dans leur champ de vision, de manière que chaque capteur 6 prenne une image de chacun des objets 2 défilant à haute cadence. Les images prises par le ou les capteur(s) 6 sont analysées par l'unité 10 lors d'une étape d'inspection, pour notamment rechercher d'éventuels défauts des objets 2 ou analyser le fonctionnement du procédé de formage. L'unité 10 est ainsi adaptée pour déterminer si les objets inspectés sont défectueux ou non. De façon plus précise, l'unité 10 permet de déterminer si l'objet inspecté présente des défauts à la surface et/ou dans le matériau constitutif de l'objet inspecté.In a conventional manner, the sensors 6 are connected to a unit 10 for controlling and processing the output signals delivered by the sensors 6. In fact, each sensor 6 generates an output signal, for example video, in response to the Infrared radiation emitted by an object 2. Of course, the unit 10 is adapted to control the operation of the sensors 6 to the passage of an object 2 in their field of vision, so that each sensor 6 takes an image of each of the objects 2 scrolling at high speed. The images taken by the sensor (s) 6 are analyzed by the unit 10 during an inspection step, in particular to look for possible defects of the objects 2 or to analyze the operation of the forming process. The unit 10 is thus adapted to determine whether the inspected objects are defective or not. More specifically, the unit 10 makes it possible to determine whether the object inspected has defects on the surface and / or in the material constituting the object inspected.
Conformément à l'invention, le système optique de chaque capteur sensible 6 est muni d'un polariseur optique de manière à limiter voire à supprimer le rayonnement infrarouge réfléchi par l'objet inspecté et issu de sources voisines audit objet inspecté et considérées comme des sources parasites de rayonnement infrarouge.According to the invention, the optical system of each sensitive sensor 6 is provided with an optical polarizer so as to limit or even eliminate the infrared radiation reflected by the object inspected and issued from sources adjacent to said inspected object and considered as parasitic sources of infrared radiation.
En effet, il doit être considéré que des sources de chaleur voisines à l'objet inspecté, en l'occurrence 2 dans l'exemple illustré à la Fig. 2, génèrent des reflets parasites R sur la surface de l'objet inspecté 2. Par exemple, les objets aval 2i et amont 22 audit objet inspecté 2, placés sur le convoyeur 5, sont à une température proche de l'objet inspecté et émettent un rayonnement infrarouge qui se réfléchit sur la surface de l'objet inspecté 2, ce qui perturbe la mesure du rayonnement infrarouge effectué par chaque capteur 6. Il s'ensuit que la mesure du rayonnement reçu par chaque capteur 6 est fonction du rayonnement direct non polarisé de l'objet inspecté 2 et du rayonnement réfléchi sur la surface dudit objet 2 et issue des objets voisins. Bien entendu, d'autres sources de chaleur peuvent se réfléchir sur la surface de l'objet inspecté 2 telles que les objets avant leur formage ou des objets à haute température fabriqués sur une ligne voisine.Indeed, it must be considered that sources of heat adjacent to the inspected object, in this case 2 in the example illustrated in FIG. 2, generate spurious reflections R on the surface of the inspected object 2. For example, the downstream objects 2i and upstream 2 2 to said inspected object 2, placed on the conveyor 5, are at a temperature close to the inspected object and emit infrared radiation which is reflected on the surface of the inspected object 2, which disturbs the measurement of the infrared radiation made by each sensor 6. It follows that the measurement of the radiation received by each sensor 6 is a function of the direct radiation unpolarized object inspected 2 and radiation reflected on the surface of said object 2 and from neighboring objects. Of course, other sources of heat may be reflected on the surface of the inspected object 2 such as objects before they are formed or high temperature objects made on a neighboring line.
Tel que cela ressort de l'exemple illustré à la Fig. 3, la source infrarouge 22 voisine ou parasite émet en direction de l'objet à inspecter 2, un rayonnement infrarouge dont le vecteur de polarisation VP présente des directions multiples non privilégiées. Les reflets parasites R dus à cette source de chaleur parasite 22 et qui se réfléchissent sur la surface de l'objet à inspecter 2 sont majoritairement polarisés selon une direction privilégiée.As is apparent from the example illustrated in FIG. 3, the neighboring or parasitic infrared source 2 2 emits towards the object to be inspected 2, an infrared radiation whose polarization vector V P has multiple unprivileged directions. The parasitic reflections R due to this source of parasitic heat 2 2 and reflected on the surface of the object to be inspected 2 are predominantly polarized in a preferred direction.
Dans l'exemple illustré, le rayonnement infrarouge provenant des reflets parasites R présente un vecteur de polarisation Vv de direction verticale.In the example illustrated, the infrared radiation from the parasitic reflections R has a polarization vector V v of vertical direction.
L'objet de l'invention vise donc à placer dans le système optique de chaque capteur de mesure 6, un polariseur orienté dans le sens sensiblement orthogonal et de préférence dans le sens orthogonal à cette direction privilégiée du vecteur de polarisation du rayonnement infrarouge réfléchi par la surface de l'objet inspecté 2. Un tel polariseur permet de supprimer du rayonnement infrarouge pris en compte par chaque capteur de mesure, le rayonnement infrarouge réfléchi par la surface de l'objet inspecté 2 et issu des sources voisines 2lf 22 dans l'exemple de réalisation considéré.The object of the invention is therefore to place in the optical system of each measuring sensor 6, a polarizer oriented in the substantially orthogonal direction and preferably in the direction orthogonal to this preferred direction of the polarization vector of the infrared radiation reflected by the surface of the object inspected 2. Such a polarizer makes it possible to eliminate infrared radiation taken into account by each measuring sensor, the infrared radiation reflected by the surface of the object inspected 2 and from neighboring sources 2 lf 2 2 in the embodiment considered.
Dans l'exemple illustré, le polariseur possède un vecteur de polarisation horizontal, c'est-à-dire orthogonal au vecteur de polarisation Vv du rayonnement infrarouge parasite. Selon une forme préférée de réalisation, il peut être prévu de réaliser le polariseur par l'intermédiaire d'un filtre polarisé linéaire ou par l'intermédiaire d'autres éléments optiques tels que par exemple, un polariseur circulaire ou elliptique. Le polariseur assume sa fonction de polarisation dans une bande spectrale infrarouge englobant au moins la bande spectrale infrarouge du capteur de mesure.In the example illustrated, the polarizer has a horizontal polarization vector, that is to say orthogonal to the polarization vector V v of the parasitic infrared radiation. According to a preferred embodiment, it may be provided to make the polarizer by means of a linear polarized filter or by means of other optical elements such as for example a circular or elliptical polarizer. The polarizer assumes its polarization function in an infrared spectral band encompassing at least the infrared spectral band of the measurement sensor.
Il ressort de l'objet de l'invention, que le rayonnement infrarouge pris en compte correspond au rayonnement direct non polarisé de l'objet inspecté permettant de déterminer avec précision si l'objet inspecté est défectueux ou non. En d'autres termes, l'objet de l'invention permet d'améliorer la détection des défauts apparaissant à la surface et/ou dans le matériau constitutif de l'objet inspecté.It emerges from the subject of the invention that the infrared radiation taken into account corresponds to the direct unpolarized radiation of the inspected object making it possible to accurately determine whether the inspected object is defective or not. In other words, the object of the invention makes it possible to improve the detection of defects appearing on the surface and / or in the constituent material of the object inspected.
L'invention n'est pas limitée aux exemples décrits et représentés car diverses modifications peuvent y être apportées sans sortir de son cadre. The invention is not limited to the examples described and shown because various modifications can be made without departing from its scope.

Claims

REVENDICATIONS
1 - Procédé pour inspecter, à l'aide d'au moins un capteur (6) sensible au rayonnement infrarouge, des objets creux (2) transparents ou translucides à haute température sortant de différentes cavités de formage (4), caractérisé en ce que pour détecter un objet défectueux ou non, on supprime du rayonnement infrarouge pris en compte par le capteur sensible, le rayonnement infrarouge réfléchi (R) par ledit objet et issu de sources infrarouges voisines audit objet.1 - Method for inspecting, using at least one sensor (6) sensitive to infrared radiation, hollow objects (2) transparent or translucent at high temperature exiting different forming cavities (4), characterized in that to detect an object which is defective or not, the infrared radiation taken into account by the sensitive sensor is suppressed, the infrared radiation reflected (R) by said object and coming from infrared sources close to said object.
2 - Procédé selon la revendication 1, caractérisé en ce que l'on supprime le rayonnement infrarouge polarisé selon une direction privilégiée.2 - Process according to claim 1, characterized in that one removes the polarized infrared radiation in a preferred direction.
3 - Procédé selon la revendication 2, caractérise en ce que l'on supprime le rayonnement infrarouge polarisé selon une direction privilégiée verticale.3 - Process according to claim 2, characterized in that one removes the polarized infrared radiation in a vertical preferred direction.
4 - Procédé selon la revendication 2 ou 3, caractérisé en ce que l'on supprime le rayonnement infrarouge polarisé dans une bande spectrale infrarouge englobant la bande spectrale infrarouge du capteur de mesure.4 - Process according to claim 2 or 3, characterized in that the polarized infrared radiation is suppressed in an infrared spectral band encompassing the infrared spectral band of the measuring sensor.
5 - Dispositif pour inspecter à chaud des objets creux (2) transparents ou translucides sortant de cavités de formage (4), le dispositif comportant :5 - Device for hot inspection of hollow objects (2) transparent or translucent leaving forming cavities (4), the device comprising:
- au moins un capteur (6) sensible au rayonnement infrarouge émis par les objets (2) défilant devant le capteur, - et une unité (10) de contrôle et de traitement des signaux de sortie délivrés par le capteur et adaptée pour déterminer si un objet est défectueux ou non, caractérisé en ce que le système optique de chaque capteur sensible (6) est muni d'un polariseur dont le vecteur de polarisation est sensiblement orthogonal au vecteur de polarisation des rayons réfléchis (R) par l'objet inspecté.at least one sensor (6) sensitive to the infrared radiation emitted by the objects (2) moving past the sensor, and a unit (10) for controlling and processing the output signals delivered by the sensor and adapted to determine whether a object is defective or not, characterized in that the optical system of each sensitive sensor (6) is provided with a polarizer whose polarization vector is substantially orthogonal to the polarization vector of the reflected rays (R) by the inspected object.
6 - Dispositif selon la revendication 5, caractérisé en ce que le polariseur possède un vecteur de polarisation qui est orthogonal au vecteur de polarisation des rayons réfléchis (R) par l'objet inspecté.6 - Device according to claim 5, characterized in that the polarizer has a polarization vector which is orthogonal to the polarization vector of the reflected rays (R) by the inspected object.
7 - Dispositif selon la revendication 5 ou 6, caractérisé en ce que le polariseur possède un vecteur de polarisation horizontal. 8 - Dispositif selon l'une des revendications 5 à 7, caractérisé en ce que le polariseur assure sa fonction de polarisation dans une bande spectrale infrarouge englobant au moins la bande spectrale infrarouge du capteur de mesure. 7 - Device according to claim 5 or 6, characterized in that the polarizer has a horizontal polarization vector. 8 - Device according to one of claims 5 to 7, characterized in that the polarizer performs its polarization function in an infrared spectral band encompassing at least the infrared spectral band of the measuring sensor.
EP06726316A 2005-04-06 2006-04-06 Method and device for eliminating parasite reflections during inspection of translucent or transparent hollow objects Withdrawn EP1875216A2 (en)

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FR0503432A FR2884317B1 (en) 2005-04-06 2005-04-06 METHOD AND DEVICE FOR SUPPRESSING PARASITE REFLECTIONS DURING HOT INSPECTION OF TRANSLUCENT OR TRANSPARENT HOLLOW OBJECTS
PCT/FR2006/050310 WO2006106271A2 (en) 2005-04-06 2006-04-06 Method and device for eliminating parasite reflections during inspection of translucent or transparent hollow objects

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RU2429466C2 (en) 2011-09-20
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ZA200709554B (en) 2009-04-29
BRPI0610517A2 (en) 2012-10-30
MX2007012348A (en) 2007-12-05
CN101156060A (en) 2008-04-02
RU2007136737A (en) 2009-05-20
FR2884317B1 (en) 2007-06-22
KR20070121821A (en) 2007-12-27
WO2006106271A2 (en) 2006-10-12
WO2006106271A3 (en) 2007-02-15

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