EP1842095A4 - Microscope optique de scannage adaptatif - Google Patents
Microscope optique de scannage adaptatifInfo
- Publication number
- EP1842095A4 EP1842095A4 EP05855789A EP05855789A EP1842095A4 EP 1842095 A4 EP1842095 A4 EP 1842095A4 EP 05855789 A EP05855789 A EP 05855789A EP 05855789 A EP05855789 A EP 05855789A EP 1842095 A4 EP1842095 A4 EP 1842095A4
- Authority
- EP
- European Patent Office
- Prior art keywords
- optical microscope
- scanning optical
- adaptive scanning
- adaptive
- microscope
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
- G02B21/367—Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/06—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the phase of light
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Microscoopes, Condenser (AREA)
- Lenses (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US64757205P | 2005-01-27 | 2005-01-27 | |
PCT/US2005/047287 WO2006081031A2 (fr) | 2005-01-27 | 2005-12-29 | Microscope optique de scannage adaptatif |
Publications (2)
Publication Number | Publication Date |
---|---|
EP1842095A2 EP1842095A2 (fr) | 2007-10-10 |
EP1842095A4 true EP1842095A4 (fr) | 2010-08-04 |
Family
ID=36740940
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP05855789A Withdrawn EP1842095A4 (fr) | 2005-01-27 | 2005-12-29 | Microscope optique de scannage adaptatif |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP1842095A4 (fr) |
JP (1) | JP2008529082A (fr) |
CN (1) | CN100585449C (fr) |
IL (1) | IL183131A0 (fr) |
WO (1) | WO2006081031A2 (fr) |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7556378B1 (en) | 2003-04-10 | 2009-07-07 | Tsontcho Ianchulev | Intraoperative estimation of intraocular lens power |
AU2005234778B2 (en) | 2004-04-20 | 2011-04-21 | Alcon Inc. | Integrated surgical microscope and wavefront sensor |
DE102006010767B4 (de) | 2006-03-08 | 2008-04-17 | Carl Zeiss Surgical Gmbh | Mikroskopiesystem |
US8333474B2 (en) | 2007-10-19 | 2012-12-18 | Wavetec Vision Systems, Inc. | Optical instrument alignment system |
US7594729B2 (en) | 2007-10-31 | 2009-09-29 | Wf Systems, Llc | Wavefront sensor |
US8550624B2 (en) | 2008-11-06 | 2013-10-08 | Wavetec Vision Systems, Inc. | Optical angular measurement system for ophthalmic applications and method for positioning of a toric intraocular lens with increased accuracy |
US8876290B2 (en) | 2009-07-06 | 2014-11-04 | Wavetec Vision Systems, Inc. | Objective quality metric for ocular wavefront measurements |
CN102497833B (zh) | 2009-07-14 | 2014-12-03 | 波技术视觉***公司 | 眼科手术测量*** |
ES2524618T3 (es) | 2009-07-14 | 2014-12-10 | Wavetec Vision Systems, Inc. | Determinación de la posición efectiva de la lente de una lente intraocular utilizando potencia refractiva afática |
CN102686972B (zh) | 2009-09-18 | 2015-04-08 | 卡尔蔡司Smt有限责任公司 | 测量光学表面形状的方法以及干涉测量装置 |
JP2011095685A (ja) * | 2009-11-02 | 2011-05-12 | Sony Corp | 顕微鏡システム及び顕微鏡システムの制御方法 |
JP5744450B2 (ja) * | 2009-11-17 | 2015-07-08 | キヤノン株式会社 | 撮像装置及びその制御方法 |
DE102012101778A1 (de) * | 2012-03-02 | 2013-09-05 | Leica Microsystems Cms Gmbh | Scanmikroskopisches Verfahren und Scanmikroskop |
JP5814855B2 (ja) * | 2012-04-27 | 2015-11-17 | 株式会社日立ハイテクノロジーズ | 荷電粒子線調整支援装置および方法 |
US9072462B2 (en) | 2012-09-27 | 2015-07-07 | Wavetec Vision Systems, Inc. | Geometric optical power measurement device |
TWI490542B (zh) * | 2013-05-07 | 2015-07-01 | Univ Nat Taiwan | A scanning lens and an interference measuring device using the scanning lens |
DE102014005880A1 (de) | 2014-04-17 | 2015-11-05 | Carl Zeiss Ag | Lichtrastermikroskop mit vereinfachter Optik, insbesondere mit veränderlicher Pupillenlage |
DE102014112199A1 (de) | 2014-08-26 | 2016-03-03 | Carl Zeiss Microscopy Gmbh | Mikroskopisches Abbildungssystem |
DE102014113908A1 (de) * | 2014-09-25 | 2016-03-31 | Carl Zeiss Ag | Laserscansystem |
DE102014017001A1 (de) * | 2014-11-12 | 2016-05-12 | Carl Zeiss Ag | Mikroskop mit geringem Verzeichnungsfehler |
CN104460007B (zh) * | 2014-12-30 | 2017-02-01 | 哈尔滨工业大学 | 一种激光三倍频的空间强度整形方法 |
EP3350578B1 (fr) | 2015-09-02 | 2022-03-09 | Inscopix, Inc. | Systèmes et procédés d'imagerie couleur |
CN105242397B (zh) * | 2015-09-30 | 2017-10-27 | 深圳大学 | 一种相干自适应光学像差校正*** |
CN108474736B (zh) | 2015-11-05 | 2022-01-25 | 英思克斯公司 | 用于光遗传学成像的***和方法 |
CN105910799B (zh) * | 2016-06-06 | 2017-06-06 | 北京理工大学 | 无限兼有限共轭寻焦光电像分析器及其方法 |
CN106092518B (zh) * | 2016-06-06 | 2017-09-05 | 北京理工大学 | 无限兼有限共轭差动探测寻焦光电像分析器及其方法 |
CN106199751B (zh) * | 2016-07-08 | 2019-03-01 | 中国科学院电子学研究所 | 太赫兹电控波束扫描光学链路 |
CN106680984B (zh) * | 2016-12-16 | 2019-06-11 | 大连光耀辉科技有限公司 | 一种激光双通道同时输出设备和显微镜 |
CN106773024A (zh) * | 2017-03-30 | 2017-05-31 | 中国检验认证集团检验有限公司 | 一种基于变形镜的变放大倍率光学成像技术 |
CN107063092B (zh) * | 2017-06-05 | 2019-02-05 | 北京理工大学 | 一种大视场快速扫描的双光源同轴标定***及调整方法 |
CN112782844B (zh) * | 2021-01-12 | 2023-03-31 | 中国科学院光电技术研究所 | 一种自适应光学***稳定闭环控制方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10038622A1 (de) * | 2000-08-03 | 2002-02-21 | Leica Microsystems | Scan-Mikroskop,optische Anordnung und Verfahren zur Bildaufnahme in der Scan-Mikroskopie |
US20020044332A1 (en) * | 2000-10-04 | 2002-04-18 | Johann Engelhardt | Optical arrangement, and method for the deflection of light beams |
WO2004025331A2 (fr) * | 2002-09-16 | 2004-03-25 | Rensselaer Polytechnic Institute | Microscope a champ de vision etendu |
US20040184163A1 (en) * | 2003-02-13 | 2004-09-23 | Olympus Corporation | Optical apparatus |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW538256B (en) * | 2000-01-14 | 2003-06-21 | Zeiss Stiftung | Microlithographic reduction projection catadioptric objective |
JP2004514943A (ja) * | 2000-11-28 | 2004-05-20 | カール・ツアイス・エスエムテイ・アーゲー | 157nmリソグラフィ用の反射屈折投影系 |
JP2003057553A (ja) * | 2001-08-09 | 2003-02-26 | Olympus Optical Co Ltd | 共焦点走査型顕微鏡 |
AU2003245458A1 (en) * | 2002-06-12 | 2003-12-31 | Advanced Research And Technology Institute, Inc. | Method and apparatus for improving both lateral and axial resolution in ophthalmoscopy |
JP2004198492A (ja) * | 2002-12-16 | 2004-07-15 | Olympus Corp | 蛍光顕微鏡 |
US7339148B2 (en) * | 2002-12-16 | 2008-03-04 | Olympus America Inc. | Confocal microscope |
US7057806B2 (en) * | 2003-05-09 | 2006-06-06 | 3M Innovative Properties Company | Scanning laser microscope with wavefront sensor |
-
2005
- 2005-12-29 CN CN200580045412A patent/CN100585449C/zh active Active
- 2005-12-29 EP EP05855789A patent/EP1842095A4/fr not_active Withdrawn
- 2005-12-29 WO PCT/US2005/047287 patent/WO2006081031A2/fr active Application Filing
- 2005-12-29 JP JP2007553106A patent/JP2008529082A/ja active Pending
-
2007
- 2007-05-10 IL IL183131A patent/IL183131A0/en unknown
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10038622A1 (de) * | 2000-08-03 | 2002-02-21 | Leica Microsystems | Scan-Mikroskop,optische Anordnung und Verfahren zur Bildaufnahme in der Scan-Mikroskopie |
US20020044332A1 (en) * | 2000-10-04 | 2002-04-18 | Johann Engelhardt | Optical arrangement, and method for the deflection of light beams |
WO2004025331A2 (fr) * | 2002-09-16 | 2004-03-25 | Rensselaer Polytechnic Institute | Microscope a champ de vision etendu |
US20040184163A1 (en) * | 2003-02-13 | 2004-09-23 | Olympus Corporation | Optical apparatus |
Also Published As
Publication number | Publication date |
---|---|
JP2008529082A (ja) | 2008-07-31 |
CN101116023A (zh) | 2008-01-30 |
CN100585449C (zh) | 2010-01-27 |
EP1842095A2 (fr) | 2007-10-10 |
WO2006081031A2 (fr) | 2006-08-03 |
WO2006081031A3 (fr) | 2007-03-01 |
IL183131A0 (en) | 2007-09-20 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
17P | Request for examination filed |
Effective date: 20070515 |
|
AK | Designated contracting states |
Kind code of ref document: A2 Designated state(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR |
|
RIN1 | Information on inventor provided before grant (corrected) |
Inventor name: BELLOUARD, YVES Inventor name: POTSAID, BENJAMIN, MICHAEL Inventor name: WEN, JOHN, T. |
|
DAX | Request for extension of the european patent (deleted) | ||
A4 | Supplementary search report drawn up and despatched |
Effective date: 20100702 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: THE APPLICATION IS DEEMED TO BE WITHDRAWN |
|
18D | Application deemed to be withdrawn |
Effective date: 20110201 |