EP1528150B1 - Système a base d'ordinateur pour contrôle du profile transversal d'une paramètrede qualité d'une bande - Google Patents

Système a base d'ordinateur pour contrôle du profile transversal d'une paramètrede qualité d'une bande Download PDF

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Publication number
EP1528150B1
EP1528150B1 EP04104801A EP04104801A EP1528150B1 EP 1528150 B1 EP1528150 B1 EP 1528150B1 EP 04104801 A EP04104801 A EP 04104801A EP 04104801 A EP04104801 A EP 04104801A EP 1528150 B1 EP1528150 B1 EP 1528150B1
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EP
European Patent Office
Prior art keywords
profile
determined
peak
standard deviations
corrected
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Not-in-force
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EP04104801A
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German (de)
English (en)
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EP1528150A1 (fr
Inventor
Georg Dr. Kleiser
Joachim Dr. Grabscheid
Thomas Augscheller
Klaus Hermann
Florian Dr. Wegmann
Roland Mayer
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Voith Patent GmbH
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Voith Patent GmbH
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    • D—TEXTILES; PAPER
    • D21—PAPER-MAKING; PRODUCTION OF CELLULOSE
    • D21G—CALENDERS; ACCESSORIES FOR PAPER-MAKING MACHINES
    • D21G9/00—Other accessories for paper-making machines
    • D21G9/0009—Paper-making control systems

Definitions

  • the invention relates to a system for computer-aided monitoring of a transverse profile of a quality parameter of a material web, in particular paper or board web, in their manufacture and / or finishing.
  • the transverse profile can be, for example, the moisture transverse profile, the thickness transverse profile, the ash transverse profile, the basis weight (FG), transverse profile, etc.
  • the invention has for its object to provide an improved system of the type mentioned above, with a more detailed assessment of the quality of each cross-section is possible and in particular also allows conclusions about the nature of the respective disorders and / or possible correction options.
  • a system for computer-aided monitoring of a transverse profile of a quality parameter of a material web, in particular paper or board web, in their manufacture and / or finishing with a measuring device for measuring the cross profile, at least one computer-based operation and linking unit for determining the Standard deviations of at least two disturbance profiles representative of different disturbances in the form of different peak groups in the measured transverse profile, wherein the different peak groups differ in that their peaks have widths lying in different areas, and with means for storing, displaying and / or further processing the determined standard deviations.
  • means for storing, displaying and / or further processing the measured transverse profile are provided.
  • any other peak width groups can be selected.
  • the maximum number of peak groups can basically be greater or less than 4.
  • At least one correction element can be activated as a function of the respective standard deviations.
  • a first correction profile is first calculated as a disturbance profile on the basis of the measured transverse profile by forming the moving average over at least substantially the maximum peak width of a first peak group.
  • the standard deviation of this first correction profile is then preferably determined. In particular, this standard deviation can serve as a measure of the deviations that are greater than the maximum peak width of the first peak group.
  • a first corrected profile can then be determined by subtracting the first correction profile from the measured transverse profile.
  • the standard deviation of this first corrected profile can then be determined.
  • This standard deviation can then be used in particular as a measure of the deviations that are equal to or smaller than the maximum peak width of the first peak group.
  • At least one further correction profile and at least one further corrected profile can then be determined and the standard deviations determined therefrom, wherein a respective further corrected profile is determined by subtracting the further correction profile from the respective preceding corrected profile.
  • the maximum peak width of the first peak group may in particular be greater than the maximum peak width of the subsequently considered peak groups.
  • the moving average may be formed, for example, first with a predetermined pitch of about 1 m and then with predetermined pitches of, for example, 200 mm and 60 mm. In principle, however, any other grid can be used.
  • the values of the standard deviation determined temporally successively for a respective peak group are stored. Out of the for a In particular, a long-term trend of the standard deviation can then be determined for each peak group obtained.
  • machine data can be stored. From the stored machine data and standard deviations can then be concluded for example by means of at least one self-learning algorithm or statistical evaluations on advantageous or critical machine settings.
  • FIG. 1 shows a schematic representation of the course of a measured or preceding corrected transverse profile Y old in the range of a subsequent calculation of the moving average Raster predetermined grid R.
  • the formation of a respective moving average described in more detail below serves the elimination of a part of disturbances occurring in the transverse profile peaks.
  • the respective moving average values are generated in a system for computer-aided monitoring of the cross-section of a material web, in particular a paper or board web.
  • the monitoring can be carried out in particular during the production and / or finishing of the relevant material web.
  • the computer-aided monitoring system comprises a measuring device or measuring frame for measuring the transverse profile, at least one computer-based operating and linking unit for determining the standard deviations of at least two interference profiles representative of different disturbances in the form of different peak groups in the measured transverse profile.
  • the different peak groups differ in that their peaks have widths lying in different ranges.
  • the computer-aided monitoring system can have means for storing, displaying and / or further processing the determined standard deviations.
  • means for storing, displaying and / or further processing the measured transverse profile can also be provided.
  • their peaks have a width in the following ranges: a) greater than about 1 m, b) about 1 m to about 200 mm, c) about 200 mm to about 60 mm and d) less than about 60 mm (cf. FIG. 3 ).
  • other peak width ranges are conceivable.
  • a distinction can generally be made between more than four or less than four peak groups.
  • first of all a first correction profile can be determined on the basis of the measured transverse profile by forming the moving average over at least substantially the maximum peak width of a first peak group.
  • FIG. 1 shows in a purely schematic representation the course of a measured or preceding corrected transverse profile Y alt in the range of a predetermined for a subsequent calculation of the moving average raster R, which here is for example 1000 mm (see also FIG. 3 ).
  • the moving average is now obtained by averaging over the raster R at a moving value X while maintaining the grid R.
  • the formation of the respective moving average results in a correction profile Y corr (cf. Figures 1 and 2 ).
  • FIG. 4 shows a schematic representation of a purely exemplary course of a transverse profile, from which it follows that in the edge region of the average range may be smaller than the grid R. This applies both to the edge region on the driver's side (FS) and for the edge region on the drive side ( TS).
  • FS driver's side
  • TS edge region on the drive side
  • a corrected profile Y new is obtained , with which a further interference profile is now present.
  • FIG. 2 shows in a purely schematic representation of the overhead curve obtained by the formation of the moving average correction profile Y corr and the corrected profile Y obtained by subtracting the old correction profile from the measured Y corr or the preceding corrected cross section Y again. This process eliminates the wider peaks from the original cross profile.
  • This process can be repeated until the last peak width group is reached.
  • the grids 1 m, 200 mm and 60 mm can be used one after the other to form the respective moving average.
  • the correction profiles Y korr obtained can each be deducted from the measured transverse profile or preceding corrected profile Y old in order to obtain the respectively new corrected profile Y new .
  • Each of the standard deviations or two 2 ⁇ values of the correction profiles Y are recalculated corr and corrected profiles Y. These operations can be repeated until the last peak width group is reached.
  • the existing transverse profile disturbances can thus be arranged according to the width of the peaks in at least two and for example a maximum of four groups, resulting in the present embodiment the following grouping: interference with peak widths greater than 1 m, 1 m to 200 mm, 200 mm to 60 mm and smaller 60 mm.
  • the standard deviations for the individual groups can be displayed to the operators and / or processed in the assigned process control system. The operator thus receives important information about the type of interference. In addition, information is available with which corrective measures the disturbances can at least be reduced. Disturbances greater than 1 m, for example, can be repaired with a steam blow box, while in the case of faults below 60 mm, correction elements can generally no longer be used.
  • a correction profile can first be calculated from the existing or measured transverse profile by forming the moving average over the maximum peak width of the first peak width group.
  • the standard deviation of this correction profile can serve as a measure of the disturbances with a width greater than the said maximum peak width.
  • the correction profile is then subtracted from the original profile. This process eliminates the wider peaks from the original cross profile. This process can be repeated until the last peak width group is reached.
  • the calculated standard deviations can be displayed together with the measured transverse profile and / or at least one corrected profile.
  • the values can be stored so that a long term trend of the standard deviation is retrievable for each peak width range. It is also advantageous if, in addition to the standard deviations, machine data is stored, so that advantageous or critical machine settings can be detected, for example with the aid of self-learning algorithms or statistical evaluations, and thus the driving style of the machine can be optimized.

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  • Paper (AREA)
  • Preliminary Treatment Of Fibers (AREA)

Claims (16)

  1. Système de surveillance assistée par ordinateur d'un profil transversal d'un paramètre de qualité d'une bande de matière, notamment une bande de papier ou de carton, lors de sa fabrication et/ou son façonnage, comprenant un dispositif de mesure pour mesurer le profil transversal, au moins une unité informatique d'opération et de combinaison pour déterminer des écarts types, et des moyens d'enregistrement, d'affichage et/ou de traitement ultérieur des écarts types déterminés, caractérisé en ce que les écarts types déterminés sont ceux d'au moins deux profils de défaut représentatifs de deux défauts différents sous la forme de groupes de crêtes différents dans le profil transversal (Yalt) mesuré, les différents groupes de crêtes se différenciant en ce que leurs crêtes présentent des largeurs qui se situent dans des plages différentes.
  2. Système selon la revendication 1, caractérisé en ce que sont en plus prévus des moyens d'enregistrement, d'affichage et/ou de traitement ultérieur du profil transversal mesuré.
  3. Système selon la revendication 1 ou 2, caractérisé en ce que la différence est faite entre un nombre maximum déterminé de groupes de crêtes.
  4. Système selon la revendication 3, caractérisé en ce que la différence est faite entre les groupes de crêtes dont les crêtes possèdent une largeur dans les plages suivantes : a) supérieure à environ 1 m, b) environ 1 m à environ 200 mm, c) environ 200 mm à environ 60 mm et d) inférieure à environ 60 mm.
  5. Système selon l'une des revendications précédentes, caractérisé en ce qu'au moins un élément de correction peut être activé en fonction des écarts types respectifs.
  6. Système selon l'une des revendications précédentes, caractérisé en ce que le profil de défaut déterminé est initialement un premier profil de correction (Ykorr) à partir du profil transversal mesuré (Yalt) en calculant la valeur moyenne glissante sur au moins pour l'essentiel la largeur de crête maximale d'un premier groupe de crêtes.
  7. Système selon la revendication 6, caractérisé en ce que l'écart type du premier profil de correction (Ykorr) est déterminé.
  8. Système selon la revendication 6 ou 7, caractérisé en ce que le profil de défaut supplémentaire déterminé est un premier profil corrigé (Yneu) obtenu en soustrayant le premier profil de correction (Ykorr) du profil transversal mesuré (Yalt).
  9. Système selon la revendication 8, caractérisé en ce que l'écart type du premier profil corrigé (Yneu) est déterminé.
  10. Système selon l'une des revendications précédentes, caractérisé en ce qu'au moins un profil de correction (Ykorr) supplémentaire et au moins un profil corrigé (Yneu) supplémentaire sont déterminés de la même manière et les écarts types de ceux-ci sont déterminés, un profil corrigé (Yneu) supplémentaire correspondant étant déterminé en soustrayant le profil de correction (Ykorr) supplémentaire du profil corrigé précédent (Yalt).
  11. Système selon la revendication 10, caractérisé en ce que des profils de correction (Ykorr) supplémentaires et des profils corrigés (Yneu) supplémentaires sont déterminés jusqu'à ce que le dernier groupe de crêtes du nombre de groupes de crêtes pouvant être prédéfini ait été pris en compte.
  12. Système selon l'une des revendications précédentes, caractérisé en ce que les valeurs de l'écart type déterminées chronologiquement pour un groupe de crêtes correspondant sont mémorisées.
  13. Système selon la revendication 12, caractérisé en ce qu'une tendance à long terme de l'écart type peut être déterminée à partir des valeurs de l'écart type obtenues pour un groupe de crêtes correspondant.
  14. Système selon l'une des revendications précédentes, caractérisé en ce que des données de machine peuvent être mémorisées en plus des écarts types.
  15. Système selon la revendication 14, caractérisé en ce que des réglages avantageux ou critiques de la machine peuvent être déduits au moyen d'au moins un algorithme à auto-apprentissage à partir des données de machine et des écarts types mémorisés.
  16. Système selon l'une des revendications précédentes, caractérisé en ce que des réglages avantageux ou critiques de la machine peuvent être déduits au moyen de méthodes statistiques à partir des données de machine et des écarts types mémorisés.
EP04104801A 2003-10-30 2004-09-30 Système a base d'ordinateur pour contrôle du profile transversal d'une paramètrede qualité d'une bande Not-in-force EP1528150B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE10350743A DE10350743A1 (de) 2003-10-30 2003-10-30 System zur computergestützten Überwachung eines Querprofils eines Qualitätsparameters einer Materialbahn
DE10350743 2003-10-30

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EP1528150A1 EP1528150A1 (fr) 2005-05-04
EP1528150B1 true EP1528150B1 (fr) 2008-11-12

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EP04104801A Not-in-force EP1528150B1 (fr) 2003-10-30 2004-09-30 Système a base d'ordinateur pour contrôle du profile transversal d'une paramètrede qualité d'une bande

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US (1) US7149650B2 (fr)
EP (1) EP1528150B1 (fr)
AT (1) ATE414195T1 (fr)
DE (2) DE10350743A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9481777B2 (en) 2012-03-30 2016-11-01 The Procter & Gamble Company Method of dewatering in a continuous high internal phase emulsion foam forming process

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3612839A (en) * 1967-11-13 1971-10-12 Industrial Nucleonics Corp Variance partitioning
GB1448669A (en) * 1972-09-08 1976-09-08 Bakelite Xylonite Ltd Profile determining and/or controlling system
DE59407934D1 (de) * 1993-12-02 1999-04-15 Siemens Ag Vorrichtung zur untersuchung des querprofils einer kontinuierlich erzeugten materialbahn
US5563809A (en) * 1994-04-06 1996-10-08 Abb Industrial Systems, Inc. Measurement/control of sheet material using at least one sensor array
US5893055A (en) * 1997-05-30 1999-04-06 Abb Industrial Systems, Inc. Two-dimensional web property variation modeling and control
DE19733454A1 (de) * 1997-08-02 1999-02-04 Voith Sulzer Papiermasch Gmbh Verfahren und Vorrichtung zur Erkennung und Korretur einer Faserorientierungs-Querprofil-Veränderung
DE19736047A1 (de) * 1997-08-20 1999-02-25 Voith Sulzer Papiermasch Gmbh Vorrichtung und Verfahren zur Steuerung oder Regelung des Flächengewichts einer Papier- oder Kartonbahn
FI107908B (fi) * 1998-11-04 2001-10-31 Metso Paper Inc Menetelmä ja laitteisto rullan rakenteen hallitsemiseksi
US6339727B1 (en) * 1998-12-21 2002-01-15 Recot, Inc. Apparatus and method for controlling distribution of product in manufacturing process
US6564117B1 (en) * 2000-06-13 2003-05-13 Abb Automation Inc. Automated optimization of cross machine direction profile control performance for sheet making processes
US6728592B2 (en) * 2000-08-24 2004-04-27 Voith Paper Automation, Inc. Streak detection in papermaking
CA2460068A1 (fr) * 2001-09-14 2003-03-27 The Research Foundation Of State University Of New York Procede et systeme de caracterisation de defauts de trainee dans des structures de bande

Also Published As

Publication number Publication date
US20050114077A1 (en) 2005-05-26
DE10350743A1 (de) 2005-10-27
EP1528150A1 (fr) 2005-05-04
US7149650B2 (en) 2006-12-12
ATE414195T1 (de) 2008-11-15
DE502004008442D1 (de) 2008-12-24

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