EP0932936A1 - Improved successive approximation a/d converter - Google Patents

Improved successive approximation a/d converter

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Publication number
EP0932936A1
EP0932936A1 EP98935670A EP98935670A EP0932936A1 EP 0932936 A1 EP0932936 A1 EP 0932936A1 EP 98935670 A EP98935670 A EP 98935670A EP 98935670 A EP98935670 A EP 98935670A EP 0932936 A1 EP0932936 A1 EP 0932936A1
Authority
EP
European Patent Office
Prior art keywords
value
analog input
digital
input signal
time interval
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
EP98935670A
Other languages
German (de)
French (fr)
Inventor
Russell E. Cooper
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Microchip Technology Inc
Original Assignee
Microchip Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microchip Technology Inc filed Critical Microchip Technology Inc
Publication of EP0932936A1 publication Critical patent/EP0932936A1/en
Withdrawn legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0617Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence
    • H03M1/0675Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy
    • H03M1/0678Continuously compensating for, or preventing, undesired influence of physical parameters characterised by the use of methods or means not specific to a particular type of detrimental influence using redundancy using additional components or elements, e.g. dummy components
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/08Continuously compensating for, or preventing, undesired influence of physical parameters of noise
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/34Analogue value compared with reference values
    • H03M1/38Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter

Definitions

  • the present invention relates generally to analog-to-digital (A/D)
  • A/D conversion constitutes any of many available methods
  • representations of the quantities of interest may be processed by a computer, or
  • the A/D converter 10 consists of three basic components, namely,
  • DAC digital-to-analog converter
  • SAR successive approximation register
  • the comparator 16 compares the output of the DAC 12, which is
  • comparator 16 operate in a closed loop system to determine the digital (binary)
  • an analog voltage of +7.2 volts lies within a range of interest between 0
  • the SAR system divides the valid range (0 to 16 volts) in half, and
  • the comparator output indicates to the SAR that the current binary value
  • analog input voltage can be found is between 4 volts and 8 volts.
  • That digital value is provided as the output of the successive approximation A/D
  • V ⁇ N is wavering because of system noise, jitter, or the like.
  • the comparator may fluctuate between a high and a low output, which is
  • a more specific objective of the invention is to provide an improved
  • the analog input voltage is
  • the SAR is implemented with additional latches and shift register stages to accommodate the
  • the majority detect approach can be limited to only those
  • V m at just slightly more than one-half of V DD (e.g., 2
  • range is selected with an upper limit to encompass the digital value of the analog input
  • the upper limit of the reference range is compared to the magnitude of the
  • the reference range is successively
  • analog input signal over the selected time interval is acquired by rapidly sampling the
  • analog input signal an odd number of times over the predetermined time interval
  • the odd number is at least three.
  • A/D conversion of a variable analog input signal includes
  • n+1 is the number of significant bits in the conversion
  • the comparator to provide the odd number of binary values as the respective values of
  • the SAR includes
  • the successive approximation A/D converter of the invention may also be used as a first and second input signal.
  • the SAR being adapted to adjust the reference range based on a succession of the binary inputs to more closely encompass the
  • the samples are supplied to provide an odd number of binary inputs of at least
  • Logic means coupled to the SAR detects or determines the majority binary
  • the SAR has an effective
  • Another aim of the invention is to improve the repeatability
  • FIG. 1 is a block diagram of a prior art successive approximation A/D
  • FIG. 2 is a signal diagram of analog input signals to a comparator of the
  • FIG. 3 is a sampling and A/D conversion diagram illustrating the
  • FIG. 4 is a block diagram of a preferred embodiment of the SAR portion
  • analog input signal V ]N of FIG. 2 is sampled at a high rate
  • FIG. 3 they produce outputs of 1, 0, 1, 1, and 0, respectively. The majority of these
  • plurality of individual register stages includes individual latches and shift register to
  • the high sampling rate takes into account changes in a rapidly varying analog input
  • sampling may be performed in advance of application to
  • FIG. 4 three bits constituting the result of compared values of three samples that
  • logic circuit 27 which determines binary value of the majority, or a consensus value
  • the contents of the first three stages of SAR 25 are detected by logic 27 as a majority binary value of 1, which
  • the SAR had been taken as the DAC bit value, as in a conventional arrangement, it
  • Each bit determined in that manner may be captured in a latch (not shown).
  • multiple stage shift register and majority detect logic may be and preferably is used by
  • the present invention is a 12-bit system with very high resolution, 10 volts by 4096
  • a battery charge level monitor oftentimes
  • fuel gauge referred to as a "fuel gauge,” must be sufficiently accurate at these levels to assure that

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

Apparatus and method are disclosed for successive approximation analog-to-digital conversion of a variable analog input voltage to digital form by periodic sampling thereof, using a comparator to compare the relative values of the analog input voltage amplitude in a predetermined time interval and the upper limit of a reference voltage range which is successively adjusted until it closely approximates the digital value of the sampled analog input voltage in that time interval. The successive adjustment is performed by a successive approximation register which has an odd number of multiple stages, at least three, for each digital significant bit representing the upper limit of the reference voltage range to be used in the comparison. The accuracy and reliability of this upper limit is refined by using as the value of each significant bit the majority of its value in the multiple stages. After a number of comparisons that fixes the majority value of each significant bit, the resulting succession of the significant bits becomes the digital conversion of the analog input voltage in the respective time interval.

Description

IMPROVED SUCCESSIVE APPROXIMATION A/D CONVERTER
Background of the Invention
The present invention relates generally to analog-to-digital (A/D)
conversion techniques, and more particularly to improvements in successive
approximation register A/D conversion.
Generically, A/D conversion constitutes any of many available methods
for converting measured analog quantities to digital form so that the digital
representations of the quantities of interest may be processed by a computer, or
displayed, or stored. So-called "successive approximation" is among the most popular
of the many different techniques. Unlike other methods, the conversion time for
successive approximation A/D conversion, i.e., the time interval in which the analog
quantity is converted to digital form, is fixed. That is, conversion time is the same
regardless of the value of the analog quantity being converted.
Referring to the block diagram of a prior art successive approximation
converter in FIG. 1, the A/D converter 10 consists of three basic components, namely,
a digital-to-analog converter (DAC) 12, a successive approximation register (SAR) 15,
and a comparator 16. The comparator 16 compares the output of the DAC 12, which is
supplied as one of the inputs of the comparator, to an analog quantity of interest,
typically an analog input signal voltage V1N, which is supplied to the other comparator
input. In operation of the prior art converter of FIG. 1, SAR 15, DAC 12, and
comparator 16 operate in a closed loop system to determine the digital (binary)
equivalent of an applied analog signal VIN. The system determines the value of each
bit, from the most significant bit (MSB) to the least significant bit (LSB), in succession
by dividing the previous range in which the analog input signal can be found, in half.
For example, an analog voltage of +7.2 volts lies within a range of interest between 0
volts and 16 volts. The SAR system divides the valid range (0 to 16 volts) in half, and
provides an output of 8 volts (a binary value of 1000) from the 4-bit DAC to the
comparator. The comparator output indicates to the SAR that the current binary value
is too high (i.e., 8 volts being greater than 7.2 volts). The MSB value is now known to
be a logic 0, and the new valid range in which the analog input voltage can be found is
between 0 volts and 8 volts. Next, the SAR divides the new valid range in half, and
provides an output of 4 volts (a binary value of 0100) from the 4-bit DAC to the
comparator. This time the comparator output indicates to the SAR that the current
binary value is too low (i.e., 4 volts being less than 7.2 volts). The second most
significant bit value is now known to be a logic 1 , and the new valid range in which the
analog input voltage can be found is between 4 volts and 8 volts. The sequence
continues for the next two bits, and the binary output of the SAR is found to be 0111.
That digital value is provided as the output of the successive approximation A/D
converter, and the SAR registers are cleared to 0's in preparation for the next sample
conversion cycle. In practice, problems are encountered with a conventional successive
approximation A/D converter in that the comparator at times may have considerable
difficulty in determining whether the voltage applied from the DAC is greater than or
less than the analog input voltage Ww, such as when V,N is close to the DAC value, or
when noise is present. An example is illustrated in the signal diagram of FIG. 2, where
voltage VΓN is wavering because of system noise, jitter, or the like. In these
circumstances, the comparator may fluctuate between a high and a low output, which is
likely to produce errors in the digital conversion value of the conventional SAR
converter.
Accordingly, it is a principal aim of the present invention to provide an
improved technique of successive approximation analog-to-digital conversion.
A more specific objective of the invention is to provide an improved
successive approximation A/D converter for substantially better reproduction of
conversions even when the difference between inputs to be compared is not readily
discernible by the comparator.
Summary of the Invention
According to the invention, a method and a circuit are employed to
attain improved repeatability and stability of the A/D conversion. In particular, each
time a sampling and conversion of the analog input voltage is to be performed, rather
than looking at a single sample of VΓN at eacn interval, the analog input voltage is
sampled several times per interval for comparison with the DAC output. The SAR is implemented with additional latches and shift register stages to accommodate the
number of samples selected per DAC input bit, as well as with a majority vote logic
circuit. The majority of the binary values among the samples, 0 or 1, for-a particular bit
wins the vote as the value of the input to the DAC for that bit location. For that reason
the number of samples taken for any given bit must be an odd number (to arrive at a
majority), and is at a minimum three to take into account the desire for repeatability and
stability without unduly reducing the speed of conversion of the successive
approximation approach.
If desired, the majority detect approach can be limited to only those
times when the comparator output appears to be fluctuating. This may occur only once
or twice during conversion of the analog signal to a 12-bit digital value. Nevertheless,
the desire remains to make the conversion process more repeatable. For example, if a
conversion were performed with Vm at just slightly more than one-half of VDD (e.g., 2
microvolts (μV) higher than exactly one-half) — the improved SAR converter of the
invention will still arrive at the same conversion value much more often than would be
the case with prior art SAR A/D converters. The conversion repeatability increases
asymptotically with the number of inputs to the majority vote logic circuit.
In a preferred method of performing successive approximation A/D
conversion of a variable analog input signal according to the invention, a reference
range is selected with an upper limit to encompass the digital value of the analog input
signal, the upper limit of the reference range is compared to the magnitude of the
analog input signal in a predetermined time interval to obtain the most significant bit (MSB) of the digital value for the conversion, the reference range is successively
divided in half for comparison to that magnitude to obtain each successive significant
bit from MSB to least significant bit (LSB) of the digital value for the conversion, with
the number of divisions of the reference range being dependent on the number of bits
from MSB to LSB of the digital value for the conversion, and the magnitude of the
analog input signal over the selected time interval is acquired by rapidly sampling the
analog input signal an odd number of times over the predetermined time interval and
taking the consensus of the samples as its magnitude. The odd number is at least three.
The digital value from MSB to LSB is then the conversion value of the magnitude of
the analog input signal over the predetermined time interval.
Stated somewhat differently, the method of successive approximation
A/D conversion of a variable analog input signal according to the invention includes
rapidly sampling the amplitude of the analog input signal an odd number of times, at
least three, during a predetermined time interval, comparing the value of each sample to
a first predetermined reference value estimated to be the maximum value of a range in
which the amplitude of the analog input signal lies in the predetermined time interval to
obtain a binary value representing whether the sample value is above or below the first
reference value, and using the majority of corresponding binary values of the odd
number of samples as the binary value of the MSB for the digital conversion. The
reference value is then halved and compared against the value of each sample, and the
majority binary value obtained from the comparisons is used as the next most
significant bit. The process of halving the reference value, comparing and taking the majority binary value as the value for each succeeding bit is continued until the LSB is
obtained for the digital conversion.
A successive approximation A/D converter according to the invention
includes an SAR for generating a digital output in the form of a succession of binary
values ranging from MSB of 2n to LSB of 2° in response to a succession of inputs
thereto, where n+1 is the number of significant bits in the conversion, a comparator for
supplying an input to the SAR based on a comparison of the instantaneous magnitude
of the analog input signal to the magnitude of a reference signal, means for converting a
succession of binary values to analog values as the reference signal to the comparator,
and means for performing a majority vote of an odd number of binary values associated
with each of the succession of binary values to provide a modified succession of binary
values to the converting means. Means are provided for rapidly sampling the
magnitude of the analog input signal during a predetermined time interval as an input to
the comparator to provide the odd number of binary values as the respective values of
each of an odd number of successive ones of the samples relative to the reference signal
for delivery to the SAR for use in performing the majority vote. The SAR includes
means for generating an upper limit of a reference range of magnitudes in digital format
as the reference signal for the comparison.
The successive approximation A/D converter of the invention may also
be viewed as including means for supplying samples of the magnitude of the analog
input signal relative to the maximum value of a reference range over a predetermined
time interval as binary inputs to the SAR, the SAR being adapted to adjust the reference range based on a succession of the binary inputs to more closely encompass the
sampled magnitude of the analog input signal over the time interval for use in refining
the digital output to better represent the analog input signal magnitude; and means for
further adjusting the reference range by discarding samples having a binary value that
differ from a norm established by a majority of the binary inputs during the time
interval. The samples are supplied to provide an odd number of binary inputs of at least
three in number to the SAR for each significant bit in a digital representation of the
reference range, including successive adjustments of the range, for determination of the
majority for each significant bit in the digital representation in the predetermined time
interval. Logic means coupled to the SAR detects or determines the majority binary
value for each significant bit in the digital representation. The SAR has an effective
digital content, after determination of the majority binary value for each significant bit
in the digital representation of the reference range in the predetermined time interval,
constituting the digital output representative of the variable analog input signal in that
time interval.
Another aim of the invention, then, is to improve the repeatability,
accuracy, and reliability of a successive approximation A/D conversion by multiple
high-rate sampling of the analog signal to be converted during periods of noise on or
waver of the signal. Brief Description of the Drawings
The above and still further aims, objects, aspects, features and attendant
advantages of the present invention will become apparent from a consideration of the
following detailed description of the best mode currently contemplated for practicing
the invention, encompassed by a preferred method and embodiment, taken in
conjunction with the accompanying drawings, in which:
FIG. 1 is a block diagram of a prior art successive approximation A/D
converter, which has been discussed above;
FIG. 2 is a signal diagram of analog input signals to a comparator of the
successive approximation A/D converter, to be converted to digital form over a time
interval including a sampling period, also discussed above;
FIG. 3 is a sampling and A/D conversion diagram illustrating the
outcome of an exemplary majority detect scheme according to the invention; and
FIG. 4 is a block diagram of a preferred embodiment of the SAR portion
and related logic of a successive approximation A/D converter according to the present
invention.
Detailed Description of the Preferred Methods and Embodiments
Referring now to FIG. 3, in the successive approximation A/D converter
of the present invention the analog input signal V]N of FIG. 2 is sampled at a high rate
multiple times over a predetermined very brief period of time closely corresponding to
the typical predetermined interval at which samples are taken in the standard successive approximation A/D converter. This multiple sampling is therefore performed while the
signal may be undergoing relatively rapid undulations or excursions which, in the
conventional successive approximation A D converter, would produce a single sample
that may not result in an accurate conversion output bit from the comparator. For
example, if five samples are taken, designated SI, S2, S3, S4, and S5 in the diagram of
FIG. 3, they produce outputs of 1, 0, 1, 1, and 0, respectively. The majority of these
samples is a 1 (3 out of the 5 samples being a binary value of 1), so a binary 1
constitutes the value derived from this portion of the conversion process.
In the conventional SAR 15 of A/D converter 10 (FIG. 1), each of a
plurality of individual register stages includes individual latches and shift register to
which the samples are supplied after each comparison. The same basic arrangement is
provided in an exemplary embodiment of an SAR A/D converter according to the
present invention, except that the sampling rate is markedly increased and rather than
using each individual sample as the basis for the conversion process, multiple samples
are examined to arrive at an appropriate value, based on a majority vote, or consensus.
The high sampling rate takes into account changes in a rapidly varying analog input
signal to accurately portray these undulations. A plurality of stages of odd number
form the basic unit of the successive approximation register so as to accept numerous
samples obtained within a predetermined interval, and then the binary value of the
majority of these successive samples for that interval of the analog signal is used to
determine the digital output of the conversion process for that interval. The samples result in output bits from the comparator in a manner
similar to that illustrated in FIG. 3, except that in the preferred embodiment of the SAR
of the invention, the number of repetitive samples taken for determination of the SAR
content for a particular significant bit (to be applied as a given DAC input bit) is a
minimum of three. These bits are fed into the three successive stages of shift register
with related latches to hold the stored bits over the individual overall sampling period.
It should be understood that sampling may be performed in advance of application to
the comparator, or by the effect of clocking the comparator output into the SAR. In the
latter arrangement, the comparator output would be undergoing change during the
selected time interval if the analog input signal amplitude is varying by a sufficient
amount in that interval while the reference signal value to the comparator is held
constant. The differences in the comparator output are entered into the register stages
of the SAR for the significant bit of interest upon each clock signal.
For example, in the embodiment of a portion of a SAR 25 shown in
FIG. 4, three bits constituting the result of compared values of three samples that
substitute for the conventional single sample taken in a prior art SAR, have the values
1, 0, and 1. The contents of the register are detected in parallel by a majority detect
logic circuit 27 which determines binary value of the majority, or a consensus value,
and delivers that bit value to DAC 12 for the bit number to be used in a conversion to
analog value for the next comparison by the comparator (not shown in FIG. 4). An odd
number of stages for each significant bit of the SAR allows a majority binary value to
be determined for that bit. In the example of FIG. 4, the contents of the first three stages of SAR 25 are detected by logic 27 as a majority binary value of 1, which
provides the value of DAC bit 7. If only the content of the first sample (first stage) of
the SAR had been taken as the DAC bit value, as in a conventional arrangement, it
would by coincidence have been the same value as that arrived at by multiple samplings
in the arrangement of FIG. 4, but the conversion process in the former case would not
be as reliable as in the majority rule/digital filtering approach of the invention.
The same procedure is followed for each of the multiple stages whose
majority or consensus content establishes the value of the next DAC bit, and so forth.
Each bit determined in that manner may be captured in a latch (not shown). The
multiple stage shift register and majority detect logic may be and preferably is used by
the SAR and associated logic to develop each DAC bit. Alternatively, a suitable SAR
may consist of parallel shifts registers, one with multiple stages and another with single
stage, and having switchable inputs to allow some compare bits to be applied to the
multiple stage register with majority detect logic for determination of the next DAC bit
when analog signal characteristics warrant, and other compare bits to be applied to the
single stage as outputs directly to the applicable DAC bit input, and so forth.
A typical application for the successive approximation A/D converter of
the present invention is a 12-bit system with very high resolution, 10 volts by 4096
states, and down to one-quarter of a millivolt (250 microvolts). In such an application.
a situation in which a slight difference between V+ and V- (as with the signal depicted
in FIG. 2) is difficult to detect may be encountered frequently, so that the accuracy, resolution, and repeatability provided with the multi-stage SAR and majority rule of the
invention is a highly desirable feature.
In an application requiring monitoring of status of charge on a battery in
an electronic device, such as the battery in a portable personal computer, the voltage
deflection will indicate when the battery is fully charged. When the voltage on the
battery begins to decrease, by as slight an amount as one-quarter of a millivolt, the
appropriate state of charge has been attained. A battery charge level monitor, often
referred to as a "fuel gauge," must be sufficiently accurate at these levels to assure that
the battery is not being overcharged, and therefore, to shut down the charging circuit
once the level of a full charge has been attained. If the A/D conversion process were
not repeatable and highly accurate, the result could be an inefficient charge on the
battery and a deleterious effect on the system in which the battery is installed.
Although a best mode currently contemplated for practicing the
invention has been described herein, in conjunction with certain preferred methods and
embodiments, it will be recognized by those skilled in the art of the invention that
variations and modifications of the disclosed methods and embodiments may be made
without departing from the true spirit and scope of the invention. Accordingly, it is
intended that the invention shall be limited only by the appended claims and the rules
and principles of the applicable law.

Claims

Claims:
1. A method of performing successive approximation analog-to-
digital conversion of a variable analog input signal, which comprises selecting a
reference range for the digital value of said analog input signal, comparing the upper
limit of said reference range to the magnitude of said analog input signal in a
predetermined time interval to obtain the most significant bit (MSB) of the digital value
for said conversion, successively dividing said reference range in half for comparison to
said magnitude to obtain each successive significant bit from MSB to least significant
bit (LSB) of the digital value for said conversion, wherein the number of divisions of
said reference range depends on the number of bits from MSB to LSB of said digital
value for the conversion, and acquiring said magnitude of the analog input signal over
said predetermined time interval by rapidly sampling the analog input signal an odd
number of times over said predetermined time interval and taking the consensus of said
samples as said magnitude.
2. The method of claim 1, wherein the minimum number of said
odd number of times in which the analog input signal is sampled during said
predetermined time interval is three.
3. The method of claim 2, including outputting the digital value
from MSB to LSB as the conversion value of the magnitude of the analog input signal
over said predetermined interval.
4. A method of successive approximation analog-to-digital
conversion of a variable analog input signal, which comprises rapidly sampling the
amplitude of the analog input signal an odd number of times during a predetermined
time interval, comparing the value of each sample to a first predetermined reference
value estimated to be the maximum value of a range in which the amplitude of said
analog input signal lies in said predetermined time interval to obtain a binary value
representing whether said sample value is above or below the first reference value, and
using the majority of corresponding binary values of the odd number of samples as the
binary value of the most significant bit (MSB) for the digital conversion; halving the
reference value and comparing the value of each sample to the halved reference value
and using the majority binary value obtained from the comparisons as the next MSB;
and continuing the process of halving the reference value, comparing and taking the
majority binary value as the value for each succeeding bit until the least significant bit
is obtained for the digital conversion.
5. The method of claim 4, wherein said odd number of times of
rapid sampling of the analog input signal in said predetermined time interval is at least
three.
6. The method of claim 5, including repeating the process of
successively sampling, comparing each sample with successively halved reference
value, and taking the majority binary value for each set of samples relative to the
respective halved reference value for each predetermined time interval, to obtain
continuing conversions of the instantaneous amplitude of the analog input signal to
digital form from MSB to LSB.
7. A successive approximation analog-to-digital (A/D) converter for
converting a variable analog input signal to a digital format representative of the
magnitude thereof, comprising:
a successive approximation register (SAR) for generating a digital
output in the form of a succession of binary values ranging from a most significant bit
(MSB) of 2" to a least significant bit (LSB) of 2┬░ in response to a succession of inputs
thereto, where n+1 is the number of significant bits in the conversion,
a comparator for supplying an input to said SAR based on a comparison
of the instantaneous magnitude of said analog input signal to the magnitude of a
reference signal,
means for converting a succession of binary values to analog values as
said reference signal to said comparator, and means for performing a majority vote of an odd number of binary values
associated with each of said succession of binary values to provide a modified
succession of binary values to said converting means.
8. The A/D converter of claim 7, including:
means for rapidly sampling the magnitude of said analog input signal
during a predetermined time interval as an input to said comparator to provide said odd
number of binary values as the respective values of each of an odd number of
successive ones of said samples relative to said reference signal delivery to said SAR
for use in performing said majority vote.
9. The A/D converter of claim 7, wherein:
said SAR comprises means for generating an uppermost limit of a
reference range of magnitudes in digital format as said reference signal for comparison
with said analog input signal by said comparator.
10. A successive approximation analog-to-digital (A/D) converter for
generating a digital output representative of a variable analog input signal, comprising:
means for supplying samples of the magnitude of an analog input signal
relative to the maximum value of a reference range over a predetermined time interval
as binary inputs to a successive approximation register (SAR); said SAR being adapted to adjust the reference range based on a
succession of said binary inputs to more closely encompass the sampled magnitude of
the analog input signal over said time interval for use in refining said digital output to
better represent said analog input signal; and
means for further adjusting said reference range by discarding samples
having a binary value that differ from a norm established by a majority of the binary
inputs during said time interval.
11. The A/D converter of claim 10, wherein said samples are
supplied to provide an odd number of binary inputs of at least three in number to said
SAR for each significant bit in a digital representation of the reference range, including
successive adjustments of said range, for determination of said majority for each
significant bit in said digital representation in said predetermined time interval.
12. The A/D converter of claim 11, including logic means coupled to
said SAR for the determination of the majority binary value for each significant bit in
the digital representation of the reference range in said predetermined time interval.
13. The A/D converter of claim 12, wherein said SAR has an
effective digital content, after determination of the majority binary value for each
significant bit in the digital representation of the reference range in said predetermined time interval, constituting said digital output representative of the variable analog input
signal in that time interval.
EP98935670A 1997-07-18 1998-07-16 Improved successive approximation a/d converter Withdrawn EP0932936A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US896460 1978-04-14
US89646097A 1997-07-18 1997-07-18
PCT/US1998/014635 WO1999004496A1 (en) 1997-07-18 1998-07-16 Improved successive approximation a/d converter

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EP0932936A1 true EP0932936A1 (en) 1999-08-04

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WO (1) WO1999004496A1 (en)

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US7477177B2 (en) 2006-09-13 2009-01-13 Advantest Corporation A-D converter, A-D convert method, and A-D convert program
US7605738B2 (en) 2006-09-13 2009-10-20 Advantest Corporation A-D converter and A-D convert method
WO2008149259A2 (en) * 2007-06-06 2008-12-11 Nxp B.V. Circuit with a successive approximation analog to digital converter
US8896476B2 (en) 2013-01-25 2014-11-25 Technische Universiteit Eindhoven Data-driven noise reduction technique for analog to digital converters

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JP2876952B2 (en) * 1993-09-13 1999-03-31 日本電気株式会社 Successive approximation A / D converter
JPH08107354A (en) * 1994-10-04 1996-04-23 Kawasaki Steel Corp Pipeline type successive approximation a/d converter

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