EP0772171A1 - Détecteur passif d'intrusion et utilisation du détecteur - Google Patents

Détecteur passif d'intrusion et utilisation du détecteur Download PDF

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Publication number
EP0772171A1
EP0772171A1 EP96116924A EP96116924A EP0772171A1 EP 0772171 A1 EP0772171 A1 EP 0772171A1 EP 96116924 A EP96116924 A EP 96116924A EP 96116924 A EP96116924 A EP 96116924A EP 0772171 A1 EP0772171 A1 EP 0772171A1
Authority
EP
European Patent Office
Prior art keywords
detector
light source
entrance window
radiation
passive infrared
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
EP96116924A
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German (de)
English (en)
Other versions
EP0772171B1 (fr
Inventor
Dieter Wieser
Kurt Albert Dr. Müller
Martin Dr. Allemann
Michael Thomas Dr. Gale
Thomas Hessler
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens Building Technologies AG
Original Assignee
Cerberus AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cerberus AG filed Critical Cerberus AG
Priority to EP19960116924 priority Critical patent/EP0772171B1/fr
Publication of EP0772171A1 publication Critical patent/EP0772171A1/fr
Application granted granted Critical
Publication of EP0772171B1 publication Critical patent/EP0772171B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G08—SIGNALLING
    • G08B—SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
    • G08B29/00—Checking or monitoring of signalling or alarm systems; Prevention or correction of operating errors, e.g. preventing unauthorised operation
    • G08B29/02—Monitoring continuously signalling or alarm systems
    • G08B29/04—Monitoring of the detection circuits
    • G08B29/046—Monitoring of the detection circuits prevention of tampering with detection circuits

Definitions

  • the following invention relates to a passive infrared intrusion detector, in particular with a device for tamper protection, and its use.
  • Passive infrared intrusion detectors of this type are used to monitor rooms, for example in museums, bank buildings or industrial areas, by detecting the body radiation of unauthorized persons in the wavelength range from approx. 6 to 15 ⁇ m. They essentially consist of a housing with an entry window that is transparent in the infrared wavelength range, focusing optics, one or more infrared sensors and an electrical signal evaluation and alarm output circuit.
  • the entrance window usually consists of infrared-transparent polypropylene or polyethylene. If an unauthorized person enters the area monitored by the detector, their infrared body radiation reaches the inside of the intrusion detector through the entry window and is directed by the focusing optics onto the infrared sensors.
  • the infrared sensors emit a signal to the evaluation circuit, which amplifies the signal and compares it with a predetermined threshold. If the specified threshold is exceeded, an alarm signal is issued.
  • a more refined sabotage which is difficult to detect by security guards, is spraying the entrance window with a spray such as an adhesive or hair spray.
  • a spray such as an adhesive or hair spray.
  • These sprays are transparent to the eye, but are opaque to the radiation in the infrared range. They are readily available and can also be sprayed very quickly onto the entrance window.
  • the latter method of sabotage is the most commonly used today.
  • the latest detectors In order to automatically detect such unwanted sabotage by the intrusion detector itself, be it at the immediate time of the sabotage during disarming or only when the detector is in focus, the latest detectors have been equipped with a device for detecting full acts of sabotage, in particular for monitoring the entrance window.
  • a burglar detector of this type is described for example in EP 0 499 177.
  • the device for tamper protection mentioned has an active radiation source on one side of the entrance window, the radiation of which is transmitted through the entrance window and received by a detector on the other side of the window. The electrical signal emitted by the detector is then evaluated by a circuit.
  • the radiation is used to measure the optical transmission of the entrance window and to monitor the immediate space in front of the entrance window for the presence of objects.
  • the characteristics of this radiation are chosen so that they do not interfere with the normal function of the intrusion detector, the detection of infrared body radiation. If the intrusion detector is sabotaged by covering or spraying it with a spray, this causes an increase or a reduction in the radiation received by the detector.
  • the light source is typically formed by an LED that emits in the near infrared.
  • a spray that is used for sabotage is partially transparent in the near infrared, so that the signal change in the event of sabotage is only small and the fault message is not clear.
  • EP 0 189 536 describes a similar intrusion detector in which a resistor is used for the light source which simulates the thermal radiation from people.
  • this solution has the disadvantage that the energy consumption of a resistor for this purpose is relatively high.
  • the device is intended to avoid the disadvantages of the above-mentioned prior art in that the change in the signal for monitoring the entrance window is large and the sabotage message is therefore clear.
  • a passive infrared intrusion detector with a device for tamper protection which has an active light source in the near infrared and its associated detector as well as a diffraction-optical grating structure, which is integrated on the outside of the entrance window and light emitted by the light source focused on the associated detector.
  • the light source and the detector are arranged in such a way that one component lies outside the entry window and the other lies inside the entry window.
  • the light source and the detector are both within the entry window of the infrared intrusion detector.
  • the Sabotage security device monitors the entrance window for changes such as spraying with spray or other contaminants.
  • the light from the light source is directed onto the entrance window and monitors the state of the surface of the entrance window by a part of it being focused on the detector by the diffraction-optical grating structure on the entrance window in the first or a higher diffraction order.
  • the detector emits an electrical signal to an evaluation circuit which indicates the state of the entrance window in accordance with this electrical signal.
  • the entrance window is intact and the lattice structure focuses part of the light on the detector.
  • the lattice structure on the entrance window is coated with the adhesive.
  • the lattice structure is changed by filling it in and the surface of the entrance window becomes that of a diffuse spreader.
  • the focussing effect of the diffraction-optical grating structure is destroyed, and the light radiation received by the detector is greatly reduced. If the signal emitted by the detector to the evaluation circuit falls below a predetermined threshold, it signals a sabotage alarm.
  • the diffraction grating according to the invention on the entrance window gives the sabotage monitoring the advantage that the monitoring signal is enlarged due to the focusing effect of the grating and thus the signal change in the event of sabotage is also large.
  • the sabotage is determined more clearly.
  • the two elements are preferably integrated on the circuit board, which contains the evaluation and alarm circuit of the intrusion detector.
  • This allows simple and inexpensive installation, such as the use of elements as a surface mount device (SMD) or elements in which the light source and detector and associated electrical driver or amplifier circuits are integrated in one element
  • Fig. 1 shows an external view of the passive infrared intrusion detector in perspective with the diffraction optical element integrated in its entrance window.
  • 2a), 2b), 2c) and 2d) show examples of the profile of the diffraction-optical grating structure integrated in the entrance window.
  • Fig. 3 shows the passive infrared intrusion detector in the vertical and perpendicular to the entrance window cross section with a first arrangement of the device for sabotage security.
  • FIG. 4 shows the passive infrared intrusion detector in the same cross section as in FIG. 3 with a second arrangement of the device for tamper protection.
  • FIG. 5 shows the passive infrared intrusion detector in horizontal cross section, in which the light source is arranged outside and the detector is arranged inside the entry window.
  • the 1 shows a passive infrared intrusion detector 1, the housing 2 of which has an entry window 3 which faces the room to be monitored. While the housing 2 is opaque to any radiation, infrared radiation in the wavelength range of 6-15 ⁇ m passes through the entrance window 3 into the interior of the housing.
  • the entrance window 3 has a diffraction-optical grating structure 4 on its outside, which fills the entire area of the entrance window 3.
  • the grating structure 4 consisting of fine grooves that form a phase-modulating relief structure, focuses part of the light that falls on it from the light source onto a detector inside the housing 2.
  • the distance between the individual grooves is in the micrometer range; therefore only some of the grooves of the lattice structure are indicated in the figure.) It is made of the same material as that of the entrance window 3, mostly polyethylene or polypropylene, and is spray-embossed on the surface during the manufacture of the entrance window.
  • the diffraction-optical element consists of an elliptical grating structure 4, in which the local grating constant, the distance between the individual grooves, becomes smaller with increasing radius, which gives the diffraction-optical grating structure the focusing effect.
  • the lattice structure 4 can also consist of a circular or rectilinear lattice structure, the lattice constant of which in turn becomes smaller as the distance from the center of the lattice structure increases. The latter rectilinear lattice structure has the effect of a cylindrical focusing element.
  • the grating structure is also designed such that it performs the function of focusing the light from the light source, but does not impair the detection of the infrared radiation from the room to be monitored.
  • a light source is used, the wavelength of which is different from that of infrared radiation.
  • a light source is suitable for this in the visible or near infrared.
  • the grating structure is determined for the wavelength of light from this light source and has an insignificant influence on the radiation in the infrared range.
  • Figures 2a), 2b), 2c) and 2d) schematically show examples of a profile of the diffraction-optical grating structure. Since this is a phase-modulating grating structure, the depth t of the grooves in the grating structure 4 is dimensioned such that the optical phase difference caused by the grating structure is 2 ⁇ or an integer multiple of 2 ⁇ . For this purpose, for example in the case of the arrangement of the light source and the detector within the entrance window and the use of the grating structure in reflection, it is taken into account that the diffraction occurs in the material of the entrance window and therefore the refractive index of the window material is included in the determination of the depth t.
  • the depth t results from this for normal angles of incidence equal to ⁇ / 2n, where ⁇ is the wavelength of the light and n is the refractive index of the window material. If, for example, a light-emitting diode is used as the light source, which emits light at a wavelength of 800 nm and n is 1.5, the depth t is 266 nm. With larger angles of incidence, the depth is somewhat smaller. The beam path of the infrared radiation from the room to be monitored is not affected by a grating of such a depth, since its shortest wavelength is 6 ⁇ m and for this wavelength the depth of 266 nm corresponds to a phase difference of much less than 2 ⁇ .
  • the profile of the lattice structure 4 is here either that of a sine function as shown in FIG. 2a), a rectangular function as shown in FIG. 2b) or a triangular sawtooth function as shown in FIG. 2c).
  • a grid with a profile with a so-called "blaze” as in FIG. 2c) is also known as a blazed grid.
  • Lattice structures with these profiles differ in that they have different diffraction efficiencies and are produced in different ways.
  • 2d) shows the profile of a grating with a non-linear blaze. It is similar to the profile of 2c), but has a slight surface curvature.
  • the local grating constant should be significantly smaller than the shortest wavelength of the infrared radiation, which is detected by the intrusion detector.
  • a small local grating constant relative to the wavelength of the infrared radiation means that the grating structure does not interfere with the beam path of the infrared radiation from the room to be monitored on the infrared sensors and does not impair their detection, but the radiation of the light source for monitoring the entrance window does Detector is focused.
  • the local grating constant the producibility of these dimensions and the associated achievable diffraction efficiency must also be taken into account.
  • the smallest local lattice constant is 5 ⁇ m. This is greater than the recommended grating constant, but the structure can be produced to a shape accuracy that results in a high diffraction efficiency.
  • the vertical cross section of the passive infrared intrusion detector 1 in FIG. 3 shows focusing optics 5 arranged in the interior of the intrusion detector in the form of a concave mirror, which focuses the body radiation falling into the space to be monitored onto the infrared sensors 6. These are sensitive to radiation in the wavelength range from 6 to 15 ⁇ m. If they detect body radiation from this area, they emit a signal to the evaluation and alarm output circuit on the printed circuit board 7.
  • a light source 8 and a detector 9 belonging to it are arranged on the circuit board 7.
  • the light source 8 is preferably a light-emitting diode which emits light in the near infrared wavelength range.
  • the detector 9 belonging to the light source 8 has a sensitivity in the wavelength range of the light source 8. This is preferably a photodetector such as a silicon photodiode.
  • the beam path of the light emitted by the light source 8 for monitoring the entry window 3 is identified by broken lines.
  • the light falls on the entrance window 3 and is focused on the detector 9 by the grating structure 4. This is the first or a higher diffraction order in reflection. If the entrance window 3 and the lattice structure 4 are covered by adhesive spray, the lattice structure is defaced and the light is no longer focused but diffusely scattered. As a result, the light intensity received by the detector 9 drops. If the signal it emits falls below a given threshold, a sabotage alarm is issued.
  • the diffraction efficiency of a diffraction-optical grating structure is less than 100% even for a blazed grating, and only part of the radiation incident on the grating structure 4 is focused on the detector 9 as a monitoring signal of the entrance window. Another part of the radiation exits through the entry window 3 into the free space and does nothing to monitor the entry window. A last part of the radiation is scattered at the entrance window 3. The scattered radiation is absorbed by the housing 2 or, after multiple reflections in the interior of the housing 2 and at the focusing optics 5, reaches the detector 9. The radiation that reaches the detector 9 through scattering and multiple reflections forms an underground signal to the monitoring signal of the entrance window, which is not changed in the event of sabotage by spray.
  • the focusing optics 5 can be designed in such a way that radiation in the near infrared is absorbed by it, but body radiation is reflected by it.
  • the layer of indium tin oxide reflects radiation in the area of body radiation, but allows visible and near infrared radiation to pass through, so that it falls on the black material and is absorbed by it.
  • the light source 8 is arranged on the circuit board 7 next to the detector 9 and in the plane parallel to that of the entrance window.
  • the assembly on the circuit board 7 is somewhat easier in this arrangement.
  • FIG. 1 Another embodiment of the infrared intrusion detector is shown in FIG.
  • the light source 8 and the associated detector 9 are arranged inside the entry window 3 and next to one another in an opening 10 in the focusing optics 5 opposite the entry window 3.
  • This arrangement opposite the entrance window 3 and the grating structure 4 allows a smaller angle of incidence of the light of the light source 8 onto the grating structure 4 compared to the arrangement in FIG. 2.
  • the smaller angle of incidence enables a higher diffraction efficiency.
  • an integrated element which contains the light source 8, the detector 9, the control circuit for the light source 8 and the amplifier circuit for the detector 9 in one element. Although in this arrangement this element does not come to rest on the printed circuit board 7, the use of an integrated element of this type offers advantages in assembly.
  • FIG. 5 shows a further embodiment of the invention, in which the light source 8 is arranged outside the entry window 3 with a lattice structure 4 and on the side of the housing 2, and the detector 9 is arranged inside the intrusion detector 1.
  • Light that falls from the light source 8 onto the grating structure 4 of the entrance window 3 is focused in transmission in the first or a higher diffraction order on the detector 9. If the entrance window 3 is sprayed, the lattice structure 4 is destroyed, and only a small portion of the radiation from the light source that normally falls on the detector 9 is received, and the monitoring signal is significantly reduced.
  • the above-mentioned lattice structure is produced by an injection embossing process, in which the entry window is first injected and the lattice structure 4 is then embossed into the window at an elevated temperature of the material.
  • a master stamp containing the lattice structure is used for embossing.
  • Such a master stamp is made of metal, for example.
  • the structure is produced in a first step in a photoresist, for example using a holographic method, a laser writing process or electron beam lithography.
  • the holographic method is used in particular when the grating profile is to have a sinus function.
  • the laser writing process on the other hand, is suitable for the production of lattice profiles with a rectangular or sawtooth function. Consists the desired structure in the photoresist, a negative copy in metal such as nickel is produced in a galvanic process, which serves as a master stamp for embossing the entrance window.

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  • Engineering & Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Burglar Alarm Systems (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
EP19960116924 1995-11-03 1996-10-22 Détecteur passif d'intrusion et utilisation du détecteur Expired - Lifetime EP0772171B1 (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
EP19960116924 EP0772171B1 (fr) 1995-11-03 1996-10-22 Détecteur passif d'intrusion et utilisation du détecteur

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP95117323 1995-11-03
EP95117323 1995-11-03
EP19960116924 EP0772171B1 (fr) 1995-11-03 1996-10-22 Détecteur passif d'intrusion et utilisation du détecteur

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EP0772171A1 true EP0772171A1 (fr) 1997-05-07
EP0772171B1 EP0772171B1 (fr) 2003-01-08

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Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2339614A (en) * 1998-07-14 2000-02-02 Infrared Integrated Syst Ltd Detector array sensor with mask warning
WO2000062267A1 (fr) * 1999-04-09 2000-10-19 Texecom Limited Lentille de focalisation a elements de diffraction pour capteur infrarouge
EP1061489A1 (fr) * 1999-06-07 2000-12-20 Siemens Building Technologies AG Détecteur d'intrusion avec dispositif de surveillance contre un sabotage
EP1079351A1 (fr) * 1999-08-27 2001-02-28 Siemens Building Technologies AG Dispositif de surveillance d'un espace
EP1174839A2 (fr) * 2000-07-19 2002-01-23 Vimar SpA Dispositif anti-sabotage et méthode pour la détection de sabotage dans un composant
DE19737166C2 (de) * 1997-08-26 2002-04-25 Esser Security Systems Gmbh PIR-Melder
WO2007147322A1 (fr) * 2006-06-16 2007-12-27 Hong Kong Applied Science And Technology Research Institute Co. Ltd (Astri) Dispositifs de contrôle et dispositifs de surveillance
US7807970B2 (en) 2006-02-20 2010-10-05 Robert Bosch Gmbh Obstruction detection device
EP2498232A1 (fr) * 2011-03-10 2012-09-12 Siemens Aktiengesellschaft Détecteur

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1983000558A1 (fr) * 1981-08-03 1983-02-17 Detector Electronics Dispositif de detection de radiations
FR2520123A1 (fr) * 1982-01-15 1983-07-22 Thomson Csf Dispositif d'autotest pour equiper un systeme optronique
EP0189536A1 (fr) 1985-01-08 1986-08-06 Cerberus Ag Détecteur infrarouge d'intrusion
EP0358929A2 (fr) * 1988-09-10 1990-03-21 Aisens Co. Ltd. Capteur photoélectrique
EP0481934A1 (fr) * 1990-10-19 1992-04-22 ELKRON S.p.A. Dispositif d'antimasquage pour systèmes de sécurité
EP0499177A1 (fr) 1991-02-11 1992-08-19 BITRON VIDEO S.r.l. Dispositif de détection d'intrusion
EP0507025A2 (fr) * 1991-04-04 1992-10-07 Guardall Limited Arrangements et procédés pour la détection d'intrusion
EP0660284A1 (fr) * 1993-12-21 1995-06-28 Optex Co. Ltd. Système à infrarouge de détection d'intrus
WO1996006865A1 (fr) * 1994-08-28 1996-03-07 Visonic Sicherheitstechnik Gmbh Detecteur d'intrus infrarouge pourvu d'un dispositif de detection d'occultation

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1983000558A1 (fr) * 1981-08-03 1983-02-17 Detector Electronics Dispositif de detection de radiations
FR2520123A1 (fr) * 1982-01-15 1983-07-22 Thomson Csf Dispositif d'autotest pour equiper un systeme optronique
EP0189536A1 (fr) 1985-01-08 1986-08-06 Cerberus Ag Détecteur infrarouge d'intrusion
EP0358929A2 (fr) * 1988-09-10 1990-03-21 Aisens Co. Ltd. Capteur photoélectrique
EP0481934A1 (fr) * 1990-10-19 1992-04-22 ELKRON S.p.A. Dispositif d'antimasquage pour systèmes de sécurité
EP0499177A1 (fr) 1991-02-11 1992-08-19 BITRON VIDEO S.r.l. Dispositif de détection d'intrusion
EP0507025A2 (fr) * 1991-04-04 1992-10-07 Guardall Limited Arrangements et procédés pour la détection d'intrusion
EP0660284A1 (fr) * 1993-12-21 1995-06-28 Optex Co. Ltd. Système à infrarouge de détection d'intrus
WO1996006865A1 (fr) * 1994-08-28 1996-03-07 Visonic Sicherheitstechnik Gmbh Detecteur d'intrus infrarouge pourvu d'un dispositif de detection d'occultation

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19737166C2 (de) * 1997-08-26 2002-04-25 Esser Security Systems Gmbh PIR-Melder
GB2339614A (en) * 1998-07-14 2000-02-02 Infrared Integrated Syst Ltd Detector array sensor with mask warning
GB2339614B (en) * 1998-07-14 2000-06-21 Infrared Integrated Syst Ltd Detector-array sensor with mask warning
WO2000062267A1 (fr) * 1999-04-09 2000-10-19 Texecom Limited Lentille de focalisation a elements de diffraction pour capteur infrarouge
US6377174B1 (en) 1999-06-07 2002-04-23 Siemens Technologies Ag, Cerberus Division Intrusion detector having a sabotage surveillance device
EP1061489A1 (fr) * 1999-06-07 2000-12-20 Siemens Building Technologies AG Détecteur d'intrusion avec dispositif de surveillance contre un sabotage
EP1079351A1 (fr) * 1999-08-27 2001-02-28 Siemens Building Technologies AG Dispositif de surveillance d'un espace
EP1174839A2 (fr) * 2000-07-19 2002-01-23 Vimar SpA Dispositif anti-sabotage et méthode pour la détection de sabotage dans un composant
EP1174839A3 (fr) * 2000-07-19 2003-05-02 Vimar SpA Dispositif anti-sabotage et méthode pour la détection de sabotage dans un composant
US7807970B2 (en) 2006-02-20 2010-10-05 Robert Bosch Gmbh Obstruction detection device
WO2007147322A1 (fr) * 2006-06-16 2007-12-27 Hong Kong Applied Science And Technology Research Institute Co. Ltd (Astri) Dispositifs de contrôle et dispositifs de surveillance
US7414236B2 (en) 2006-06-16 2008-08-19 Hong Kong Applied Science And Technology Research Institute Co., Ltd. Monitoring devices and intrusion surveillance devices
EP2498232A1 (fr) * 2011-03-10 2012-09-12 Siemens Aktiengesellschaft Détecteur
US8772702B2 (en) 2011-03-10 2014-07-08 Siemens Ab Detector

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