EP0688879A1 - Appareil à vide élevée - Google Patents
Appareil à vide élevée Download PDFInfo
- Publication number
- EP0688879A1 EP0688879A1 EP95107446A EP95107446A EP0688879A1 EP 0688879 A1 EP0688879 A1 EP 0688879A1 EP 95107446 A EP95107446 A EP 95107446A EP 95107446 A EP95107446 A EP 95107446A EP 0688879 A1 EP0688879 A1 EP 0688879A1
- Authority
- EP
- European Patent Office
- Prior art keywords
- ppm
- vacuum
- vacuum apparatus
- oxygen
- purity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C9/00—Alloys based on copper
Definitions
- the invention relates to a material or to members to be used for the manufacture of high-vacuum appartuses such as power transmitter tubes, external anodes which also serve as vacuum containers for microwave tubes, vacuum deposition and sputtering apparatuses, klystrons, waveguides, acceleration cavity containers for accelerators, etc., from which hydrogen is easily removed by baking, as well as to a vacuum apparatus comprising such material or members.
- high-vacuum appartuses such as power transmitter tubes, external anodes which also serve as vacuum containers for microwave tubes, vacuum deposition and sputtering apparatuses, klystrons, waveguides, acceleration cavity containers for accelerators, etc., from which hydrogen is easily removed by baking, as well as to a vacuum apparatus comprising such material or members.
- materials or members for the manufacture of high-vacuum apparatuses have generally been made of high-purity oxygen-free copper which satisfies required excellent electrical conductivity and thermal conductivity and includes low residual gas for preventing reduction in the degreee of vacuum in a vacuum apparatus due to residual gas in the material from which the apparatus is made.
- Such low-residual-gas including high-purity oxygen-free copper is manufactured by degassing of normal oxygen-free copper in a reducing or vacuum atmosphere, or by addition of phophorus for deoxygenation.
- High-purity oxygen-free copper produced in this manner contains 3 ppm or less of oxygen and 0.2 to 0.5 ppm of hydrogen, and vacuum apparatuses made of such high-purity oxygen-fee copper are subjected to dehydrogenatoina by vacuum annealing, called "baking", before use to guard against reduction in the degree of vacuum in a vacuum apparatus due to an out-gas from the material of the apparatus in a high vacuum.
- the object of the present invention is to provide a high-purity copper alloy material suitable for high vacuum apparatuses which has after baking a reduced residual hydrogen content.
- the inventors have conducted research aimed at producing a material suitable as vacuum apparatus member made of a copper alloy from which hydrogen is easily removed by baking, conventionally high-purity oxygen-free copper, which does not lead to a reduced degree of vacuum due to out-gassing hydrogen when used in a high vacuum, as well as a vacuum apparatus comprising such a vacuum apparatus member, and have found that a copper alloy prepared by adding 1 to 15 ppm of zirconium (Zr) to normal high-purity oxygen-free copper allows easy removal of hydrogen by baking and has a very low level of out-gassing of residual hydrogen from the material in a high vacuum, thus preventing reduction in the degree of vacuum.
- Zr zirconium
- the present invention has been accomplished on the basis of this finding, and is characterized by being a material having a composition of high-purity oxygen-free copper with a purity of 99.99 wt% or greater, which contains 1 to 15 ppm of Zr and 3 ppm or less of oxygen; and vacuum apparatuses constructed with the aforementioned material having a composition of high-purity copper with a purity of 99.99 wt% or greater, which contains 1 to 15 ppm of Zr and 3 ppm or less of oxygen.
- the material of the present invention allows easy removal of hydrogen by baking when it contains 1 to 15 ppm of Zr because, since Zr is an element with a very strong affinity for oxygen, residual trace oxygen in the copper alloy combines preferentially with Zr and is not dissociated therefrom even by heating during baking. Therefor, the residual trace oxygen in the high-purity copper alloy does not trap hydrogen, and thus the hydrogen is easily removed during baking.
- a Zr content of less than 1 ppm is not preferred since this is insufficient for combining with the residual oxygen in the copper alloy, and conversely a Zr content of more than 15 ppm is not preferred since this reduces the hydrogen-removing effect during baking.
- the range of the Zr content is therefore established to be 1 to 15 ppm.
- a more preferred range of the Zr content is 3 to 10 ppm.
- the oxygen content of the vacuum apparatus member of the present invention is preferably up to 3 ppm.
- electrolytic copper with a purity of 99.99 wt% or greater is melted in a melting furnace under constant protection with CO + N2 gas, and the resulting molten metal is poured into a ladle while Zr is added to the flow of the molten metal for adjustement of the components to a prescribed composition.
- the apparatus shown in the drawings comprises a melting furnace 1, a spout 2, a tundish 3, an addition apparatus 4, a nozzle 5, a mold 6, a covering 7 of graphite particles and a sealing gas source 8 in order to produce an ingot 9.
- electrolytic copper with a purity of 99.99 wt% or greater was prepared and melted in the melting furnace 1 in a CO + N2 atmosphere.
- the resulting molten metal was passed through the spout 2 sealed with CO + N2 gas and transported to the tundish 3, and Zr was added from the addition apparatus 4 to the flowing molten metal before it reached the tundish 3.
- the surface of the molten metal in the tundish 3 was covered with a layer of graphite particles 7 to prevent its oxidation.
- the molten metal was then fed from the tundish 3 via the nozzle 5 to the mold 6 which was also sealed with CO + N2 gas, and an ingot 9 was obtained.
- Table 1 below shows the composition of the ingot obtained in this manner as detrmined by measurement of the Zr and oxygen contents. Specimens of 25 mm length, 25 mm width and 8 mm thickness were cut out from the ingot, and further lathed to prepare vacuum apparatus members of the present invention (1 to 10 of Table 1), vacuum apparatus members for comparison (1 to 3 of Table 1) and vacuum apparatus members of the conventional art (1 to 3 of Table 1), each having a diameter of 20 mm and a thickness of 4 mm.
- the vacuum apparatus material or members of the present invention 1 to 10, vacuum apparatus members for comparison 1 to 3 and vacuum apparatus members of the conventional art 1 to 3 were subjected to baking for one hour at a temperature of 500 °C in a vacuum atmosphere of 266 x 10 ⁇ 5 Pa (2 x 10 ⁇ 5 Torr) and these baked vacuum apparatus members of the present invention, vacuum apparatus members for comparison and vacuum apparatus members of the conventional art were further charged into an out-gas measuring apparatus to measure the out-gassing rate of hydrogen gas in a high-vacuum atmosphere of 133 x 10 ⁇ 10 Pa (1 x 10 ⁇ 10 Torr) while at a temperature of 500 °C.
- Table 1 The results are given in Table 1.
- a material for vacuum apparatus members according to the present invention offers easier removal of hydrogen during baking than vacuum apparatus members of the ceonventional art, and therefore it produces the excellent industrial effect of allowing the production of vacuum apparatuses with superior performance.
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Manufacture And Refinement Of Metals (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP160596/94 | 1994-06-20 | ||
JP16059694A JPH083664A (ja) | 1994-06-20 | 1994-06-20 | 真空装置用部材および真空装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
EP0688879A1 true EP0688879A1 (fr) | 1995-12-27 |
EP0688879B1 EP0688879B1 (fr) | 1998-02-04 |
Family
ID=15718373
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EP19950107446 Expired - Lifetime EP0688879B1 (fr) | 1994-06-20 | 1995-05-17 | Appareil à vide élevée |
Country Status (3)
Country | Link |
---|---|
EP (1) | EP0688879B1 (fr) |
JP (1) | JPH083664A (fr) |
DE (1) | DE69501569T2 (fr) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102007040822B4 (de) * | 2006-08-30 | 2013-08-14 | Mitsubishi Electric Corp. | Kupferlegierung und Verfahren zu deren Herstellung |
US10494712B2 (en) | 2015-05-21 | 2019-12-03 | Jx Nippon Mining & Metals Corporation | Copper alloy sputtering target and method for manufacturing same |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP7131376B2 (ja) * | 2018-12-27 | 2022-09-06 | 三菱マテリアル株式会社 | スパッタリングターゲット用銅素材 |
CN113290217B (zh) * | 2021-05-28 | 2022-09-23 | 金川集团股份有限公司 | 高纯无氧铜杆的真空连铸工艺 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62207834A (ja) * | 1986-03-10 | 1987-09-12 | Nippon Mining Co Ltd | 高真空雰囲気中で使用する銅材 |
JPS62243727A (ja) * | 1986-04-16 | 1987-10-24 | Hitachi Cable Ltd | プリント基板用圧延銅箔 |
US4717436A (en) * | 1985-03-27 | 1988-01-05 | Mitsubishi Kinzoku Kabushiki Kaisha | Wire for bonding a semiconductor device |
JPS63312934A (ja) * | 1987-06-16 | 1988-12-21 | Hitachi Cable Ltd | 半導体用リ−ドフレ−ム材 |
EP0296596A1 (fr) * | 1987-06-25 | 1988-12-28 | The Furukawa Electric Co., Ltd. | Fil de cuivre fin à utiliser dans les instruments eléctroniques et son procédé de fabrication |
US5077005A (en) * | 1989-03-06 | 1991-12-31 | Nippon Mining Co., Ltd. | High-conductivity copper alloys with excellent workability and heat resistance |
-
1994
- 1994-06-20 JP JP16059694A patent/JPH083664A/ja not_active Withdrawn
-
1995
- 1995-05-17 EP EP19950107446 patent/EP0688879B1/fr not_active Expired - Lifetime
- 1995-05-17 DE DE1995601569 patent/DE69501569T2/de not_active Expired - Fee Related
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4717436A (en) * | 1985-03-27 | 1988-01-05 | Mitsubishi Kinzoku Kabushiki Kaisha | Wire for bonding a semiconductor device |
JPS62207834A (ja) * | 1986-03-10 | 1987-09-12 | Nippon Mining Co Ltd | 高真空雰囲気中で使用する銅材 |
JPS62243727A (ja) * | 1986-04-16 | 1987-10-24 | Hitachi Cable Ltd | プリント基板用圧延銅箔 |
JPS63312934A (ja) * | 1987-06-16 | 1988-12-21 | Hitachi Cable Ltd | 半導体用リ−ドフレ−ム材 |
EP0296596A1 (fr) * | 1987-06-25 | 1988-12-28 | The Furukawa Electric Co., Ltd. | Fil de cuivre fin à utiliser dans les instruments eléctroniques et son procédé de fabrication |
US5077005A (en) * | 1989-03-06 | 1991-12-31 | Nippon Mining Co., Ltd. | High-conductivity copper alloys with excellent workability and heat resistance |
Non-Patent Citations (5)
Title |
---|
HELENIUS,A.,KOLEHMAINEN,M., RAJAINMAKI,H.: "Current and Future Uses of Oxygen-Free Copper", METALL, vol. 44, no. 11, pages 1067 - 1070 * |
PATENT ABSTRACTS OF JAPAN vol. 12, no. 122 (C - 488) 15 April 1988 (1988-04-15) * |
PATENT ABSTRACTS OF JAPAN vol. 12, no. 70 (C - 479) 4 March 1988 (1988-03-04) * |
PATENT ABSTRACTS OF JAPAN vol. 13, no. 156 (C - 585) 14 April 1989 (1989-04-14) * |
RAJAINMAKI,H., KOLEHMAINEN,M.,HELENIUS,A.: "The Production and Application of Oxygen-Free Copper", JOURNAL OF METALS, vol. 45, no. 3, pages 68 - 70 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102007040822B4 (de) * | 2006-08-30 | 2013-08-14 | Mitsubishi Electric Corp. | Kupferlegierung und Verfahren zu deren Herstellung |
US10494712B2 (en) | 2015-05-21 | 2019-12-03 | Jx Nippon Mining & Metals Corporation | Copper alloy sputtering target and method for manufacturing same |
Also Published As
Publication number | Publication date |
---|---|
DE69501569T2 (de) | 1998-06-10 |
DE69501569D1 (de) | 1998-03-12 |
EP0688879B1 (fr) | 1998-02-04 |
JPH083664A (ja) | 1996-01-09 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP2494084B1 (fr) | Alliage amorphe à base de zirconium (zn) et procédé de fabrication associé | |
EP0345045A1 (fr) | Procédé de fabrication de cibles de pulvérisation en tungstène-titane | |
JPS62280335A (ja) | 薄膜形成用高純度チタン材、それを用いて形成されてなるターゲットおよび薄膜、および薄膜形成用高純度チタン材の製造方法 | |
IT9020673A1 (it) | Metodo per formare prodotti sinterizzati | |
EP1146979B1 (fr) | Procede de fabrication d'une cible de pulverisation en silicium/aluminium | |
US3548915A (en) | New procedure for chill casting beryllium composite | |
KR950703668A (ko) | 고융점 금속 실리사이드 타겟, 그의 제조방법, 고융점 금속 실리사이드 박막 및 반도체장치(high melting point metallic silicide target and method for producing the same, high melting point metallic silicide film and semicomductor device) | |
US5116589A (en) | High density hexagonal boron nitride prepared by hot isostatic pressing in refractory metal containers | |
EP0688879A1 (fr) | Appareil à vide élevée | |
CN112725658B (zh) | 一种钛铝合金靶材的制备方法 | |
JP2016128605A (ja) | 合金の溶融方法 | |
CN110777263A (zh) | 一种低氧纯银熔体材料熔铸制备方法 | |
JPH0554208B2 (fr) | ||
CN115216637A (zh) | 精密可伐合金箔材用合金锭的制备方法 | |
EP3279366A1 (fr) | CIBLE DE PULVÉRISATION CATHODIQUE EN ALLIAGE Cu-Ga ET PROCÉDÉ POUR LA PRODUIRE | |
CN1450184A (zh) | 铜基合金电真空触头材料及其制备方法 | |
JPH0647579A (ja) | 活性Agろう材 | |
EP0401595B1 (fr) | Matériel fritté pour contact d'interrupteur à vide et procédé de sa fabrication | |
JPH0729446A (ja) | 真空インタラプタ用電極の製造方法 | |
US3676114A (en) | Improvement in the process relating to alloys containing platinum group metals | |
JPS6345339A (ja) | 軟化温度の低い高導電用銅合金 | |
JP3251779B2 (ja) | 真空バルブ用接点材料の製造方法 | |
EP0261670B1 (fr) | Alliage amorphe à haute résistance à la corrosion | |
US2974033A (en) | Melting titanium metal | |
KR100274094B1 (ko) | 음극 스퍼터용 타겟과 동 타겟의 제조방법 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PUAI | Public reference made under article 153(3) epc to a published international application that has entered the european phase |
Free format text: ORIGINAL CODE: 0009012 |
|
AK | Designated contracting states |
Kind code of ref document: A1 Designated state(s): DE FR GB |
|
17P | Request for examination filed |
Effective date: 19960529 |
|
17Q | First examination report despatched |
Effective date: 19961120 |
|
GRAG | Despatch of communication of intention to grant |
Free format text: ORIGINAL CODE: EPIDOS AGRA |
|
GRAG | Despatch of communication of intention to grant |
Free format text: ORIGINAL CODE: EPIDOS AGRA |
|
GRAH | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOS IGRA |
|
RAP1 | Party data changed (applicant data changed or rights of an application transferred) |
Owner name: MITSUBISHI MATERIALS CORPORATION |
|
GRAH | Despatch of communication of intention to grant a patent |
Free format text: ORIGINAL CODE: EPIDOS IGRA |
|
GRAA | (expected) grant |
Free format text: ORIGINAL CODE: 0009210 |
|
AK | Designated contracting states |
Kind code of ref document: B1 Designated state(s): DE FR GB |
|
REF | Corresponds to: |
Ref document number: 69501569 Country of ref document: DE Date of ref document: 19980312 |
|
ET | Fr: translation filed | ||
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: FR Payment date: 19980525 Year of fee payment: 4 |
|
PGFP | Annual fee paid to national office [announced via postgrant information from national office to epo] |
Ref country code: DE Payment date: 19980713 Year of fee payment: 4 |
|
PLBE | No opposition filed within time limit |
Free format text: ORIGINAL CODE: 0009261 |
|
STAA | Information on the status of an ep patent application or granted ep patent |
Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT |
|
26N | No opposition filed | ||
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: GB Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 19990517 |
|
GBPC | Gb: european patent ceased through non-payment of renewal fee |
Effective date: 19990517 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: FR Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20000131 |
|
PG25 | Lapsed in a contracting state [announced via postgrant information from national office to epo] |
Ref country code: DE Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES Effective date: 20000301 |
|
REG | Reference to a national code |
Ref country code: FR Ref legal event code: ST |