EP0480096B1 - X-ray diagnostic apparatus comprising an X-ray image intensifier and a detector for its output screen image brightness - Google Patents

X-ray diagnostic apparatus comprising an X-ray image intensifier and a detector for its output screen image brightness Download PDF

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Publication number
EP0480096B1
EP0480096B1 EP90119637A EP90119637A EP0480096B1 EP 0480096 B1 EP0480096 B1 EP 0480096B1 EP 90119637 A EP90119637 A EP 90119637A EP 90119637 A EP90119637 A EP 90119637A EP 0480096 B1 EP0480096 B1 EP 0480096B1
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EP
European Patent Office
Prior art keywords
detector
diagnostic apparatus
ray diagnostic
detector elements
elements
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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EP90119637A
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German (de)
French (fr)
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EP0480096A1 (en
Inventor
Horst Dipl.-Phys. Dr. Rer. Nat. Aichinger
Udo Dipl.-Ing. Heinze (Fh)
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Siemens AG
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Siemens AG
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Priority to DE59006446T priority Critical patent/DE59006446D1/en
Priority to EP90119637A priority patent/EP0480096B1/en
Priority to US07/754,073 priority patent/US5164583A/en
Priority to JP29074691A priority patent/JP3188293B2/en
Publication of EP0480096A1 publication Critical patent/EP0480096A1/en
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    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • H05G1/38—Exposure time
    • H05G1/42—Exposure time using arrangements for switching when a predetermined dose of radiation has been applied, e.g. in which the switching instant is determined by measuring the electrical energy supplied to the tube
    • H05G1/44—Exposure time using arrangements for switching when a predetermined dose of radiation has been applied, e.g. in which the switching instant is determined by measuring the electrical energy supplied to the tube in which the switching instant is determined by measuring the amount of radiation directly
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/64—Circuit arrangements for X-ray apparatus incorporating image intensifiers

Definitions

  • the invention relates to an X-ray diagnostic system with an X-ray image intensifier and a detector for image brightness on its output screen with a matrix of detector elements.
  • An X-ray diagnostic system of this type is described in EP-A-0 362 427.
  • the detector elements of the detector are all of the same size and shape. It has been shown that not all measuring fields desirable in practice can be realized in this way.
  • EP-A-0 429 977 which is part of the prior art compared to the present application but is not prepublished, describes a computer tomograph with a detector which consists of a matrix of detector elements which have different shapes and sizes. An X-ray image intensifier whose output screen is assigned to such a detector is not shown in this document. Furthermore, it is not possible to select desired combinations of detector elements from the detector by means of a control device.
  • the invention has for its object to provide an X-ray diagnostic system of the type mentioned in such a way that the selectable measuring fields of the detector can be adapted in an organ-specific manner to the requirements even more optimally than in the prior art.
  • An expedient development of the invention consists in that the detector elements grouped around the center are triangular in such a way that a polygonal central measuring field can be selected. This measuring field can be approximated to a round measuring field, which is desirable for some applications.
  • Another embodiment of the invention is that the detector is seated on a connection plate which carries integrated circuits for the detector elements on its rear side. Both the detector itself and the associated circuits, in particular switches for selecting the detector elements and amplifiers, are mounted on a single connection plate.
  • This connection plate can be arranged adjustable in a housing, so that an adjustment is possible. In this case, a cable for connection to the outside can be led out of the housing.
  • FIG. 1 shows an X-ray tube 1, which is fed by an X-ray generator 2.
  • a patient 3 is penetrated by the X-rays.
  • the X-ray radiation that is spatially modulated thereby falls on the input of the X-ray image intensifier 4, which converts the intensity distribution of the X-ray radiation into a visible image of high luminance on the output screen.
  • This image is recorded by a television camera and displayed on a display unit 7 via a television center 6.
  • a semiconductor detector 8 is provided as an actual value transmitter, which feeds a corresponding signal to the actual value input of a comparator 9 via a measuring transducer 10.
  • the comparator 9 has a setpoint input 11, at which there is a signal corresponding to the setpoint of the average image brightness in the measuring field of the output screen of the X-ray image intensifier 4.
  • the x-ray generator 2 is influenced by a brightness control device 13 in the sense of an adjustment of the actual value to the target value.
  • a setpoint generator 12 is provided for setting the setpoint.
  • the semiconductor detector 8 has a surface on which the entire output image of the X-ray image intensifier 4 or a part thereof can be reproduced (by varying the focal length of the optics), with the aid of a partially transparent mirror 14 in the beam path between the output fluorescent screen of the X-ray image intensifier 4 and the television camera 5
  • a control device 15 electronically selects one or more areas of the semiconductor detector 8 in accordance with the desired measuring field.
  • the semiconductor detector 8 allows the selection of a large number of measuring fields, both with regard to their position and their shape and size.
  • FIG. 2 shows an example of a semiconductor detector 8 in an enlarged view.
  • This semiconductor detector 8 consists of a matrix of photodiode elements 8a, 8b etc., which are connected to terminals 17 via wires 16. 2, the photodiode elements 8a etc. have different shapes and sizes. For example, the photodiode elements 8a and 8e, 8b and 8d, 8g and 8i each have the same shape and area.
  • the photodiode elements 8a, 8e are larger than the photodiode elements 8b, 8c and 8d.
  • the photodiode elements 8g, 8i etc. are triangular.
  • the photodiode elements 8a etc. can be selected individually to form the desired measuring field.
  • 3 shows an example for the selection of photodiode elements.
  • the dark areas represent the selected measuring field, which is suitable for a colon overview image.
  • the selected measuring field must also be oriented. Accordingly, it can also be in accordance with FIGS. 4 to 6.
  • 3 to 6 show that the darkly drawn measuring field can be rotated electronically by appropriately selecting the photodiode elements 8a, etc., in the example in 90 ° steps.
  • FIG. 7 shows darkly a central measuring field which is approximated to a round measuring field and which is formed with the aid of the triangular-shaped photodiode elements 8g etc.
  • This measuring field is e.g. suitable for heart and skull images.
  • Additional measuring fields of different shapes and sizes can be selected by appropriately selecting the photodiode elements 8a, etc.
  • FIG. 8 shows the semiconductor detector 8 with the connections 17 on a substrate 18.
  • the substrate 18 is arranged on a connection plate 19, which is provided with a flexible printed circuit board 20.
  • Integrated circuits 21 are arranged on the rear side of the connecting plate 19 and are electrically connected to one another, to the connections 17 and to the flexible printed circuit board 20 by means of wires 22.
  • the integrated circuits 21 contain the switches for selecting the photodiode elements 8a etc. and the amplifiers.
  • Fig. 8 shows that a compact structure with the help of the connecting plate 19 is possible.
  • the different sizes of the photodiode elements 8a etc. are achieved.
  • the different shapes are created by dividing the photodiode elements, e.g. achieved to form the triangular photodiode elements 8g, 8i, etc.
  • These triangular-shaped photodiode elements 8g, 8i etc. enable the selection of a polygonal central measuring field.
  • the semiconductor detector 8 can also be used instead of an ionization chamber for direct recording. In this case, it causes the X-ray tube 1 to be switched off automatically after a predetermined dose has been reached. In this case too, an optimal choice of the measuring field determining the dose is possible.
  • FIG. 2 shows that light-emitting diodes 23 are provided at the crossing points of the photodiode elements 8a etc. Only two such light-emitting diodes 23 are shown in FIG. 2. Such light-emitting diodes can be provided at all crossing points. These light emitting diodes are controlled by the control device 15 and optically mark the respectively selected measuring field. The light emitted by the light-emitting diodes 23 is recorded via the television camera 5, so that the respectively selected measuring field is optically represented in the x-ray image on the display device 7.
  • the signals of each of the photodiode elements 8a etc. can be evaluated simultaneously.
  • the arithmetic mean or the peak value of these signals can be selected be formed.
  • These signals can also be weighted as a function of the organ recorded in each case.
  • the light-insensitive areas between the photodiode elements 8a etc., e.g. 2 in the form of dividing lines can be provided with a metallization which, when illuminated, makes the boundaries of the photodiode elements 8a etc. visible and thus the actual position of the built-in detector on the display device 7.

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  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • X-Ray Techniques (AREA)
  • Apparatus For Radiation Diagnosis (AREA)

Description

Die Erfindung betrifft eine Röntgendiagnostikanlage mit einem Röntgenbildverstärker und einem Detektor für die Bildhelligkeit auf dessen Ausgangsschirm mit einer Matrix aus Detektorelementen. Eine Röntgendiagnostikanlage dieser Art ist in der EP-A-0 362 427 beschrieben.The invention relates to an X-ray diagnostic system with an X-ray image intensifier and a detector for image brightness on its output screen with a matrix of detector elements. An X-ray diagnostic system of this type is described in EP-A-0 362 427.

Bei einer Röntgendiagnostikanlage dieser Art ist es möglich, die Detektorelemente des Detektors in der Matrix so anzuwählen, daß das jeweils gewünschte Meßfeld für die Erfassung des Istwertes der Dosisleistung gebildet wird. Gegenüber der Verwendung eines Photomultipliers als Detektor ergibt sich eine wesentlich größere Anzahl von Meßfeldern, die angewählt werden können.In the case of an X-ray diagnostic system of this type, it is possible to select the detector elements of the detector in the matrix in such a way that the desired measuring field for the detection of the actual value of the dose rate is formed. Compared to the use of a photomultiplier as a detector, there is a much larger number of measuring fields that can be selected.

Bei der bekannten Röntgendiagnostikanlage sind die Detektorelemente des Detektors alle gleich groß und gleich geformt. Es hat sich gezeigt, daß damit nicht alle in der Praxis wünschenswerten Meßfelder realisiert werden können.In the known X-ray diagnostic system, the detector elements of the detector are all of the same size and shape. It has been shown that not all measuring fields desirable in practice can be realized in this way.

In der EP-A-0 429 977, die gegenüber der vorliegenden Anmeldung zum Stand der Technik gehört, jedoch nicht vorveröffentlicht ist, ist ein Computertomograph mit einem Detektor beschrieben, der aus einer Matrix von Detektorelementen besteht, die unterschiedliche Formen und Größen haben. Ein Röntgenbildverstärker, dessen Ausgangsschirm ein solcher Detektor zugeordnet ist, geht aus diesem Dokument nicht hervor. Ferner ist es nicht möglich, gewünschte Kombinationen von Detektorelementen aus dem Detektor durch eine Steuervorrichtung auszuwählen.EP-A-0 429 977, which is part of the prior art compared to the present application but is not prepublished, describes a computer tomograph with a detector which consists of a matrix of detector elements which have different shapes and sizes. An X-ray image intensifier whose output screen is assigned to such a detector is not shown in this document. Furthermore, it is not possible to select desired combinations of detector elements from the detector by means of a control device.

Der Erfindung liegt die Aufgabe zugrunde, eine Röntgendiagnostikanlage der eingangs genannten Art so auszubilden, daß die wählbaren Meßfelder des Detektors organspezifisch in ihrer Form den Erfordernissen noch optimaler angepaßt werden können als beim Stand der Technik.The invention has for its object to provide an X-ray diagnostic system of the type mentioned in such a way that the selectable measuring fields of the detector can be adapted in an organ-specific manner to the requirements even more optimally than in the prior art.

Diese Aufgabe ist erfindungsgemäß gelöst durch die Merkmale des Patentanspruches 1. Dadurch ist es möglich, je nach Bedarf quadratische, rechteckige oder auch vieleckige Meßfelder zu realisieren.This object is achieved according to the invention by the features of claim 1. This makes it possible to implement square, rectangular or even polygonal measuring fields as required.

Eine zweckmäßige Weiterbildung der Erfindung besteht darin, daß die um das Zentrum gruppierten Detektorelemente dreieckförmig ausgebildet sind, derart, daß ein vieleckiges mittleres Meßfeld anwählbar ist. Dieses Meßfeld kann einem runden Meßfeld, das für manche Anwendungszwecke wünschenswert ist, gut angenähert werden. Eine weitere Ausgestaltung der Erfindung besteht darin, daß der Detektor auf einer Anschlußplatte sitzt, welche auf ihrer Rückseite integrierte Schaltkreise für die Detektorelemente trägt. Sowohl der Detektor selbst als auch die zugeordneten Schaltkreise, insbesondere Schalter zum Anwählen der Detektorelemente sowie Verstärker, sind dabei auf einer einzigen Anschlußplatte angebracht. Diese Anschlußplatte kann in einem Gehäuse einstellbar angeordnet werden, so daß eine Justierung möglich ist. Aus dem Gehäuse kann in diesem Fall ein Kabel zum Anschluß nach außen geführt sein.An expedient development of the invention consists in that the detector elements grouped around the center are triangular in such a way that a polygonal central measuring field can be selected. This measuring field can be approximated to a round measuring field, which is desirable for some applications. Another embodiment of the invention is that the detector is seated on a connection plate which carries integrated circuits for the detector elements on its rear side. Both the detector itself and the associated circuits, in particular switches for selecting the detector elements and amplifiers, are mounted on a single connection plate. This connection plate can be arranged adjustable in a housing, so that an adjustment is possible. In this case, a cable for connection to the outside can be led out of the housing.

Die Erfindung ist nachfolgend anhand eines in der Zeichnung dargestellten Ausführungsbeispieles näher erläutert. Es zeigen:

Fig. 1
eine Röntgendiagnostikanlage zur Erläuterung des Erfindungsgedankens,
Fig. 2
eine Draufsicht auf einen Detektor nach der Erfindung,
Fig. 3 bis 7
verschiedene Meßfeldformen bei dem Detektor gemäß Fig. 2, und
Fig. 8
den Detektor gemäß Fig. 2 in Verbindung mit den zugeordneten Schaltkreisen.
The invention is explained below with reference to an embodiment shown in the drawing. Show it:
Fig. 1
an X-ray diagnostic system to explain the inventive concept,
Fig. 2
a plan view of a detector according to the invention,
3 to 7
different measuring field shapes in the detector according to FIG. 2, and
Fig. 8
2 in connection with the associated circuits.

In der Fig. 1 ist eine Röntgenröhre 1 dargestellt, die von einem Röntgengenerator 2 gespeist wird. Ein Patient 3 wird von der Röntgenstrahlung durchdrungen. Die dadurch räumlich modulierte Röntgenstrahlung fällt auf den Eingang des Röntgenbildverstärkers 4, der die Intensitätsverteilung der Röntgenstrahlung in ein sichtbares Bild hoher Leuchtdichte am Ausgangsschirm umwandelt. Dieses Bild wird von einer Fernsehkamera aufgenommen und über eine Fernsehzentrale 6 auf einem Sichtgerät 7 wiedergegeben.1 shows an X-ray tube 1, which is fed by an X-ray generator 2. A patient 3 is penetrated by the X-rays. The X-ray radiation that is spatially modulated thereby falls on the input of the X-ray image intensifier 4, which converts the intensity distribution of the X-ray radiation into a visible image of high luminance on the output screen. This image is recorded by a television camera and displayed on a display unit 7 via a television center 6.

Zur Konstanthaltung der mittleren Bildhelligkeit oder des Spitzenwertes einzelner Segmente des Bildes in variablen Bereichen des Ausgangsschirmes des Röntgenbildverstärkers 4 ist ein Halbleiterdetektor 8 als Istwertgeber vorgesehen, der ein entsprechendes Signal dem Istwerteingang eines Vergleichers 9 über einen Meßwandler 10 zuführt. Der Vergleicher 9 weist einen Sollwerteingang 11 auf, an dem ein dem Sollwert der mittleren Bildhelligkeit im Meßfeld des Ausgangsschirmes des Röntgenbildverstärkers 4 entsprechendes Signal liegt. In Abhängigkeit von der Differenz zwischen Ist- und Sollwert wird der Röntgengenerator 2 von einer Helligkeitsregeleinrichtung 13 im Sinne eines Angleiches des Istwertes an den Sollwert beeinflußt. Für die Einstellung des Sollwertes ist ein Sollwertgeber 12 vorgesehen.To keep the mean image brightness or the peak value of individual segments of the image constant in variable areas of the output screen of the X-ray image intensifier 4, a semiconductor detector 8 is provided as an actual value transmitter, which feeds a corresponding signal to the actual value input of a comparator 9 via a measuring transducer 10. The comparator 9 has a setpoint input 11, at which there is a signal corresponding to the setpoint of the average image brightness in the measuring field of the output screen of the X-ray image intensifier 4. Depending on the difference between the actual value and the target value, the x-ray generator 2 is influenced by a brightness control device 13 in the sense of an adjustment of the actual value to the target value. A setpoint generator 12 is provided for setting the setpoint.

Der Halbleiterdetektor 8 hat eine Fläche, auf der das ganze Ausgangsbild des Röntgenbildverstärkers 4 oder ein Teil davon (durch Variation der Brennweite der Optik) abbildbar ist, und zwar mit Hilfe eines teildurchlässigen Spiegels 14 im Strahlengang zwischen dem Ausgangsleuchtschirm des Röntgenbildverstärkers 4 und der Fernsehkamera 5. Eine Steuervorrichtung 15 wählt dabei einen Bereich oder mehrere Bereiche des Halbleiterdetektors 8 entsprechend dem gewünschten Meßfeld elektronisch aus. Der Halbleiterdetektor 8 erlaubt dabei die Wahl einer Vielzahl von Meßfeldern, und zwar sowohl hinsichtlich ihrer Lage als auch ihrer Form und Größe.The semiconductor detector 8 has a surface on which the entire output image of the X-ray image intensifier 4 or a part thereof can be reproduced (by varying the focal length of the optics), with the aid of a partially transparent mirror 14 in the beam path between the output fluorescent screen of the X-ray image intensifier 4 and the television camera 5 A control device 15 electronically selects one or more areas of the semiconductor detector 8 in accordance with the desired measuring field. The semiconductor detector 8 allows the selection of a large number of measuring fields, both with regard to their position and their shape and size.

Die Fig. 2 zeigt ein Beispiel eines Halbleiterdetektors 8 in vergrößerter Darstellung. Dieser Halbleiterdetektor 8 besteht aus einer Matrix von Photodiodenelementen 8a, 8b usw., welche über Drähte 16 mit Anschlüssen 17 verbunden sind. Die Photodiodenelemente 8a usw. weisen gemäß Fig. 2 unterschiedliche Formen und Größen auf. So haben z.B. die Photodiodenelemente 8a und 8e, 8b und 8d, 8g und 8i jeweils dieselbe Form und Fläche. Die Photodiodenelemente 8a, 8e sind größer als die Photodiodenelemente 8b, 8c und 8d. Die Photodiodenelemente 8g, 8i usw. sind dreieckförmig ausgebildet.2 shows an example of a semiconductor detector 8 in an enlarged view. This semiconductor detector 8 consists of a matrix of photodiode elements 8a, 8b etc., which are connected to terminals 17 via wires 16. 2, the photodiode elements 8a etc. have different shapes and sizes. For example, the photodiode elements 8a and 8e, 8b and 8d, 8g and 8i each have the same shape and area. The photodiode elements 8a, 8e are larger than the photodiode elements 8b, 8c and 8d. The photodiode elements 8g, 8i etc. are triangular.

Die Photodiodenelemente 8a usw. sind zur Bildung des jeweils gewünschten Meßfeldes einzeln anwählbar. Die Fig. 3 zeigt dunkel gezeichnet ein Beispiel für die Anwahl von Photodiodenelementen. Die dunklen Bereiche stellen dabei das gewählte Meßfeld dar, das für eine Colon-Übersichtsaufnahme geeignet ist. Je nach Orientierung des Röntgenbildes in bezug auf den Halbleiterdetektor 8 muß dabei auch das gewählte Meßfeld orientiert sein. Demgemäß kann es auch entsprechend den Fig. 4 bis 6 liegen. Die Fig. 3 bis 6 zeigen, daß das dunkel gezeichnete Meßfeld durch entsprechende Anwahl der Photodiodenelemente 8a usw. elektronisch gedreht werden kann, und zwar bei dem Beispiel in 90°-Schritten.The photodiode elements 8a etc. can be selected individually to form the desired measuring field. 3 shows an example for the selection of photodiode elements. The dark areas represent the selected measuring field, which is suitable for a colon overview image. Depending on the orientation of the x-ray image with respect to the semiconductor detector 8, the selected measuring field must also be oriented. Accordingly, it can also be in accordance with FIGS. 4 to 6. 3 to 6 show that the darkly drawn measuring field can be rotated electronically by appropriately selecting the photodiode elements 8a, etc., in the example in 90 ° steps.

Die Fig. 7 zeigt dunkel ein zentrales Meßfeld, das einem runden Meßfeld angenähert ist und mit Hilfe der dreiecksförmigen Photodiodenelemente 8g usw. gebildet ist. Dieses Meßfeld ist z.B. für Herz- und Schädelaufnahmen geeignet.7 shows darkly a central measuring field which is approximated to a round measuring field and which is formed with the aid of the triangular-shaped photodiode elements 8g etc. This measuring field is e.g. suitable for heart and skull images.

Weitere Meßfelder unterschiedlicher Form und Größe sind durch entsprechende Anwahl der Photodiodenelemente 8a usw. wählbar.Additional measuring fields of different shapes and sizes can be selected by appropriately selecting the photodiode elements 8a, etc.

Die Fig. 8 zeigt den Halbleiterdetektor 8 mit den Anschlüssen 17 auf einem Substrat 18. Das Substrat 18 ist auf einer Anschlußplatte 19 angeordnet, die mit einer flexiblen Leiterplatte 20 versehen ist. Auf der Rückseite der Anschlußplatte 19 sind integrierte Schaltkreise 21 angeordnet, die mit Hilfe von Drähten 22 miteinander, mit den Anschlüssen 17 und der flexiblen Leiterplatte 20 elektrisch verbunden sind. Die integrierten Schaltkreise 21 enthalten die Schalter zur Anwahl der Photodiodenelemente 8a usw. sowie die Verstärker.FIG. 8 shows the semiconductor detector 8 with the connections 17 on a substrate 18. The substrate 18 is arranged on a connection plate 19, which is provided with a flexible printed circuit board 20. Integrated circuits 21 are arranged on the rear side of the connecting plate 19 and are electrically connected to one another, to the connections 17 and to the flexible printed circuit board 20 by means of wires 22. The integrated circuits 21 contain the switches for selecting the photodiode elements 8a etc. and the amplifiers.

Die Fig. 8 zeigt, daß ein kompakter Aufbau mit Hilfe der Anschlußplatte 19 möglich ist.Fig. 8 shows that a compact structure with the help of the connecting plate 19 is possible.

Hinsichtlich der Fig. 2 wird festgehalten, daß aufgrund unterschiedlicher Breiten der Spalten und Zeilen der Matrix des Halbleiterdetektors 8 die unterschiedlichen Größen der Photodiodenelemente 8a usw. erzielt sind. Die unterschiedlichen Formen werden durch Unterteilung der Photodiodenelemente, z.B. zur Bildung der dreieckförmigen Photodiodenelemente 8g, 8i usw. erzielt. Diese dreieckförmigen Photodiodenelemente 8g, 8i usw. ermöglichen die Anwahl eines vieleckigen mittleren Meßfeldes.With regard to FIG. 2, it is noted that due to different widths of the columns and rows of the matrix of the semiconductor detector 8, the different sizes of the photodiode elements 8a etc. are achieved. The different shapes are created by dividing the photodiode elements, e.g. achieved to form the triangular photodiode elements 8g, 8i, etc. These triangular-shaped photodiode elements 8g, 8i etc. enable the selection of a polygonal central measuring field.

Es ist auch möglich, die Signale der jeweils angewählten Photodiodenelemente 8a usw. einzeln auszuwerten und die Einzelmeßwerte (unter Berücksichtigung der unterschiedlichen Größenverhältnisse der Photodiodenelemente 8a usw.) untereinander zu vergleichen, um z.B. Photodiodenelemente des angewählten Meßfeldes automatisch abzuwählen bzw. unberücksichtigt zu lassen, die Direktstrahlung erhalten und somit die Messung verfälschen würden. Weiter kann durch Einzelauswertung der Signale aller Photodiodenelemente 8a usw. (also auch der nicht angewählten) Direktstrahlung detektiert werden und durch entsprechende Ansteuerung der Primärstrahlenblende 24 verringert bzw. vollständig eliminiert werden.It is also possible to individually evaluate the signals of the respectively selected photodiode elements 8a etc. and to compare the individual measured values (taking into account the different size ratios of the photodiode elements 8a etc.) with one another, e.g. Automatically deselect or disregard photodiode elements of the selected measuring field, which would receive direct radiation and thus falsify the measurement. Furthermore, direct radiation can be detected by individual evaluation of the signals of all photodiode elements 8a etc. (also including the unselected) and can be reduced or completely eliminated by appropriate activation of the primary beam diaphragm 24.

Der Halbleiterdetektor 8 kann auch anstelle einer Ionisationskammer für die Direktaufnahme verwendet werden. Er bewirkt in diesem Falle die automatische Abschaltung der Röntgenröhre 1 nach dem Erreichen einer vorbestimmten Dosis. Auch in diesem Falle ist eine optimale Wahl des die Dosis bestimmenden Meßfeldes möglich.The semiconductor detector 8 can also be used instead of an ionization chamber for direct recording. In this case, it causes the X-ray tube 1 to be switched off automatically after a predetermined dose has been reached. In this case too, an optimal choice of the measuring field determining the dose is possible.

Die Fig. 2 zeigt, daß an den Kreuzungspunkten der Photodiodenelemente 8a usw. Leuchtdioden 23 vorgesehen sind. In der Fig. 2 sind nur zwei solcher Leuchtdioden 23 gezeichnet. Es können an allen Kreuzungspunkten solche Leuchtdioden vorgesehen sein. Diese Leuchtdioden werden von der Steuervorrichtung 15 angesteuert und markieren das jeweils gewählte Meßfeld optisch. Über die Fernsehkamera 5 wird das von den Leuchtdioden 23 ausgehende Licht aufgenommen, so daß das jeweils gewählte Meßfeld im Röntgenbild auf dem Sichtgerät 7 optisch dargestellt wird.FIG. 2 shows that light-emitting diodes 23 are provided at the crossing points of the photodiode elements 8a etc. Only two such light-emitting diodes 23 are shown in FIG. 2. Such light-emitting diodes can be provided at all crossing points. These light emitting diodes are controlled by the control device 15 and optically mark the respectively selected measuring field. The light emitted by the light-emitting diodes 23 is recorded via the television camera 5, so that the respectively selected measuring field is optically represented in the x-ray image on the display device 7.

Die Signale jedes der Photodiodenelemente 8a usw. können gleichzeitig ausgewertet werden. Dabei kann wahlweise der arithmetische Mittelwert oder der Spitzenwert dieser Signale gebildet werden. Es kann auch eine Gewichtung dieser Signale in Abhängigkeit von dem jeweils aufgenommenen Organ erfolgen.The signals of each of the photodiode elements 8a etc. can be evaluated simultaneously. The arithmetic mean or the peak value of these signals can be selected be formed. These signals can also be weighted as a function of the organ recorded in each case.

Die lichtunempfindlichen Bereiche zwischen den Photodiodenelementen 8a usw., die z.B. in der Fig. 2 in Form von Trennungslinien dargestellt sind, können mit einer Metallisierung versehen werden, die bei Beleuchtung die Grenzen der Photodiodenelemente 8a usw. und somit die tatsächliche Lage des eingebauten Detektors auf dem Sichtgerät 7 sichtbar macht.The light-insensitive areas between the photodiode elements 8a etc., e.g. 2 in the form of dividing lines can be provided with a metallization which, when illuminated, makes the boundaries of the photodiode elements 8a etc. visible and thus the actual position of the built-in detector on the display device 7.

Trotz unterschiedlicher Größe und Form der Photodiodenelemente 8a usw. kann durch punktsymmetrische Anordnung dieser Photodiodenelemente 8a usw. zum Zentrum eine beliebig gewählte Meßfeldform in 90°-Schritten gedreht werden. Dadurch wird man unabhängig von der Einbaulage des Detektors und von der Patientenpositionierung.In spite of different sizes and shapes of the photodiode elements 8a etc., an arbitrarily chosen measuring field shape can be rotated in 90 ° steps by means of the point-symmetrical arrangement of these photodiode elements 8a etc. This makes you independent of the installation position of the detector and of the patient positioning.

Claims (11)

  1. X-ray diagnostic apparatus having an Xray image intensifier (4) and a detector (8) for the image brightness on its output screen in a selectable measuring field with a matrix of detector elements (8a etc.) and having a control device (15) for selecting the detector elements (8a etc.) in desired combinations, with the detector elements (8a etc.) having different forms and/or sizes.
  2. X-ray diagnostic apparatus according to claim 1, where, in the detector (8) detector elements (8g, 8i etc.) grouped about the centre are constructed in a triangular manner in such a way that a polygonal middle measuring field can be selected.
  3. X-ray diagnostic apparatus according to claim 1 or 2, where, in the detector (8) the width of the columns and lines forming the matrix is different.
  4. X-ray diagnostic apparatus according to one of claims 1 to 3, where the detector (8) is disposed on a terminal board (18) which carries integrated switching circuits (21) for the detector elements (8a etc.) on its rear side.
  5. X-ray diagnostic apparatus according to one of claims 1 to 4, where, in the detector (8) light diodes (23) are provided at the crossing points of the detector elements (8a etc.), which light diodes are controlled in such a way that the respectively selected measuring field is mixed into the X-ray image.
  6. X-ray diagnostic apparatus according to one of claims 1 to 4, where the detector (8) at the same time enables an evaluation of the signals of each of the photodiode elements (8a etc.).
  7. X-ray diagnostic apparatus according to claim 6, where the detector (8) influences the position of the primary radiation aperture (24) to reduce direct radiation.
  8. X-ray diagnostic apparatus according to claim 6, where the detector (8) selectively forms the arithmetic mean value of the signals of the selected detector elements (8a etc.) or the peak value of the signals of the individual detector elements (8a etc.) or a group of detector elements (8a etc.).
  9. X-ray diagnostic generator according to claims 6 and 8, where the detector (8) enables a weighting of the signals of the individual detector elements (8a etc.) dependent on the respective part.
  10. X-ray diagnostic apparatus according to one of claims 1 to 4, where, with the detector (8) the light-insensitive regions between the detector elements (8a etc.) are provided with a metal-coating which, upon illumination, makes visible the boundaries of the detector elements (8a etc.) and thus the actual position of the installed detector (8) on a display unit (7).
  11. X-ray diagnostic apparatus according to one of claims 1 to 10, where, with the detector (8), despite the different size and form of the detector elements (8a etc.), by means of point-symmetrical arrangement with respect to the centre of these detector elements (8a etc.) an arbitrarily selected measuring-field form can be rotated in steps of 90°.
EP90119637A 1990-10-12 1990-10-12 X-ray diagnostic apparatus comprising an X-ray image intensifier and a detector for its output screen image brightness Expired - Lifetime EP0480096B1 (en)

Priority Applications (4)

Application Number Priority Date Filing Date Title
DE59006446T DE59006446D1 (en) 1990-10-12 1990-10-12 X-ray diagnostic system with an X-ray image intensifier and a detector for the image brightness on its output screen.
EP90119637A EP0480096B1 (en) 1990-10-12 1990-10-12 X-ray diagnostic apparatus comprising an X-ray image intensifier and a detector for its output screen image brightness
US07/754,073 US5164583A (en) 1990-10-12 1991-09-03 Matrix of image brightness detector's elements formed by different groups of different shape or size
JP29074691A JP3188293B2 (en) 1990-10-12 1991-10-09 X-ray inspection equipment

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EP90119637A EP0480096B1 (en) 1990-10-12 1990-10-12 X-ray diagnostic apparatus comprising an X-ray image intensifier and a detector for its output screen image brightness

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Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06153077A (en) * 1992-11-10 1994-05-31 Hitachi Medical Corp X-ray television camera device
DE4300829C2 (en) * 1993-01-14 1996-08-29 Siemens Ag X-ray diagnostic device
US5461658A (en) * 1993-05-21 1995-10-24 U.S. Philips Corporation X-ray examination apparatus
US5528656A (en) * 1994-09-19 1996-06-18 Annis; Martin Method and apparatus for sampling an object
WO1997014277A1 (en) * 1995-10-10 1997-04-17 Philips Electronics N.V. X-ray examination apparatus comprising an exposure-control system
US5872602A (en) * 1995-12-13 1999-02-16 Johnson; Robert E. Fluoroscopic imaging system with image enhancement apparatus and method
US5867554A (en) * 1996-06-20 1999-02-02 Siemens Aktiengesellschaft Spiral scan computed tomography apparatus having a modular surface detector for radiation
DE19702739A1 (en) * 1997-01-27 1998-07-30 Philips Patentverwaltung X-ray device with a primary aperture arrangement
FR2760528B1 (en) * 1997-03-05 1999-05-21 Framatome Sa METHOD AND DEVICE FOR PHOTOTHERMAL EXAMINATION OF A MATERIAL
WO2000068710A2 (en) 1999-05-10 2000-11-16 Lippens Francois Energy-selective x-ray radiation detection system
US6795526B2 (en) 2002-03-04 2004-09-21 Ge Medical Systems Global Technology Co., Llc Automatic exposure control for a digital image acquisition system
EP1388740B1 (en) * 2002-08-09 2014-11-05 Canon Kabushiki Kaisha Radiation imaging method and apparatus
US7148487B2 (en) 2002-08-27 2006-12-12 Canon Kabushiki Kaisha Image sensing apparatus and method using radiation
JP4964771B2 (en) 2004-07-20 2012-07-04 メドトロニック，インコーポレイテッド Cerebrospinal fluid drainage device
US20090180590A1 (en) * 2006-06-22 2009-07-16 Koninklijke Philips Electronics N.V. X-ray image apparatus and method of imaging an object under examination
KR101911314B1 (en) * 2012-03-30 2018-10-24 삼성전자주식회사 X-ray detector
CN111989761A (en) * 2018-04-20 2020-11-24 Asml荷兰有限公司 Pixel shape and partition shape selection for high speed detectors for large active areas

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0429977A2 (en) * 1989-11-24 1991-06-05 Shimadzu Corporation Radiation imaging apparatus

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4414682A (en) * 1980-11-17 1983-11-08 American Science And Engineering, Inc. Penetrating radiant energy imaging system with multiple resolution
DE3225061A1 (en) * 1982-07-05 1984-01-05 Siemens AG, 1000 Berlin und 8000 München X-RAY DIAGNOSTIC DEVICE
DE3402888A1 (en) * 1984-01-27 1985-08-01 Siemens AG, 1000 Berlin und 8000 München X-RAY DIAGNOSTIC SYSTEM
NL8502569A (en) * 1985-09-20 1987-04-16 Philips Nv ROENTGEN RESEARCH DEVICE WITH A LOCALLY DIVIDED AID DETECTOR.
JP2606207B2 (en) * 1987-03-25 1997-04-30 株式会社島津製作所 Imaging equipment
DE8714009U1 (en) * 1987-10-19 1989-02-16 Siemens Ag, 1000 Berlin Und 8000 Muenchen, De
DE3825703A1 (en) * 1988-07-28 1990-02-01 Siemens Ag Diagnostic X-ray device with rectangular detector arrangement
DE3877960D1 (en) * 1988-10-05 1993-03-11 Siemens Ag X-RAY DIAGNOSTIC SYSTEM WITH A DETECTOR FOR THE MEDIUM IMAGE BRIGHTNESS.

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0429977A2 (en) * 1989-11-24 1991-06-05 Shimadzu Corporation Radiation imaging apparatus

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DE59006446D1 (en) 1994-08-18
US5164583A (en) 1992-11-17
EP0480096A1 (en) 1992-04-15
JPH04263837A (en) 1992-09-18
JP3188293B2 (en) 2001-07-16

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