DK2325662T3 - Multi-indlæsnings- og multi-udlæsningsanalysator - Google Patents

Multi-indlæsnings- og multi-udlæsningsanalysator Download PDF

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Publication number
DK2325662T3
DK2325662T3 DK09811143.8T DK09811143T DK2325662T3 DK 2325662 T3 DK2325662 T3 DK 2325662T3 DK 09811143 T DK09811143 T DK 09811143T DK 2325662 T3 DK2325662 T3 DK 2325662T3
Authority
DK
Denmark
Prior art keywords
reading
analyzer
reading analyzer
Prior art date
Application number
DK09811143.8T
Other languages
English (en)
Inventor
VALDéS JUAN FRANCISCO VALENZUELA
GONZáLEZ ANTONIO MANUEL MARTíNEZ
Cabrera Juan Monzó
HERNáNDEZ DAVID AGAPITO SáNCHEZ
Original Assignee
Emite Ingenieria S L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=41727486&utm_source=***_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DK2325662(T3) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Emite Ingenieria S L filed Critical Emite Ingenieria S L
Application granted granted Critical
Publication of DK2325662T3 publication Critical patent/DK2325662T3/da

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
    • G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08—Measuring electromagnetic field characteristics
    • G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B6/00—Heating by electric, magnetic or electromagnetic fields
    • H05B6/64—Heating using microwaves
    • H05B6/70—Feed lines
    • H05B6/705—Feed lines using microwave tuning
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B6/00—Heating by electric, magnetic or electromagnetic fields
    • H05B6/64—Heating using microwaves
    • H05B6/72—Radiators or antennas
DK09811143.8T 2008-09-03 2009-09-03 Multi-indlæsnings- og multi-udlæsningsanalysator DK2325662T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
ES200802584A ES2342958B2 (es) 2008-09-03 2008-09-03 Analizador de multiples entradas y multiples salidas.
PCT/ES2009/070364 WO2010026274A1 (es) 2008-09-03 2009-09-03 Analizador de múltiples entradas y múltiples salidas

Publications (1)

Publication Number Publication Date
DK2325662T3 true DK2325662T3 (da) 2019-08-19

Family

ID=41727486

Family Applications (1)

Application Number Title Priority Date Filing Date
DK09811143.8T DK2325662T3 (da) 2008-09-03 2009-09-03 Multi-indlæsnings- og multi-udlæsningsanalysator

Country Status (9)

Country Link
US (1) US8872080B2 (da)
EP (1) EP2325662B1 (da)
JP (1) JP5335921B2 (da)
KR (1) KR20110058867A (da)
DK (1) DK2325662T3 (da)
ES (2) ES2342958B2 (da)
HU (1) HUE045057T2 (da)
PL (1) PL2325662T3 (da)
WO (1) WO2010026274A1 (da)

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US11289946B2 (en) * 2019-04-08 2022-03-29 Purdue Research Foundation Method and system of uniform wireless power distribution within a chamber

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Also Published As

Publication number Publication date
US20110155725A1 (en) 2011-06-30
JP2012502535A (ja) 2012-01-26
EP2325662A4 (en) 2017-07-05
EP2325662A1 (en) 2011-05-25
ES2342958B2 (es) 2011-07-04
HUE045057T2 (hu) 2019-12-30
ES2605233R1 (es) 2017-05-09
JP5335921B2 (ja) 2013-11-06
ES2605233A2 (es) 2017-03-13
ES2342958A1 (es) 2010-07-19
US8872080B2 (en) 2014-10-28
KR20110058867A (ko) 2011-06-01
EP2325662B1 (en) 2019-07-03
PL2325662T3 (pl) 2019-11-29
WO2010026274A8 (es) 2011-03-24
ES2605233B1 (es) 2018-02-20
WO2010026274A1 (es) 2010-03-11

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