DK0594478T3 - Application-specific integrated circuit with microprocessor and test means - Google Patents

Application-specific integrated circuit with microprocessor and test means

Info

Publication number
DK0594478T3
DK0594478T3 DK93402518T DK93402518T DK0594478T3 DK 0594478 T3 DK0594478 T3 DK 0594478T3 DK 93402518 T DK93402518 T DK 93402518T DK 93402518 T DK93402518 T DK 93402518T DK 0594478 T3 DK0594478 T3 DK 0594478T3
Authority
DK
Denmark
Prior art keywords
microprocessor
asic
output
functional
application
Prior art date
Application number
DK93402518T
Other languages
Danish (da)
Inventor
Patrick Darnault
Original Assignee
Sagem
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sagem filed Critical Sagem
Application granted granted Critical
Publication of DK0594478T3 publication Critical patent/DK0594478T3/en

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Microcomputers (AREA)
  • Communication Control (AREA)
  • Storage Device Security (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

Application-specific integrated circuit (ASIC), comprising a microprocessor (1), at least one functional input (16) of which is connected to a functional output (15) of an electronic circuit of the ASIC, and at least one functional output (11) of which is connected to a functional input of an electronic circuit of the said ASIC, the ASIC including means (9, 30) for porting at least one functional input (16) of the microprocessor to the output (9) of the ASIC and means (21, 24) for porting at least one functional output (11) of the microprocessor to the input/output (8) of the ASIC, in which the ASIC furthermore includes means (24, 41, 42, 45, 50) for disabling the electronic circuits (2, 3, 4, 5) and the microprocessor (1), and which are arranged so as to disable the said functional output (11) of the microprocessor, and at least one electronic gate (21), wired in series between the said output (11) of the microprocessor and the input/output (8) of the ASIC to which it is ported and providing for the flow of signals in one direction, and arranged so that its direction of flow reverses under the control of the said disabling means (24). - Application to computers. <IMAGE>
DK93402518T 1992-10-22 1993-10-13 Application-specific integrated circuit with microprocessor and test means DK0594478T3 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9212647A FR2697356B1 (en) 1992-10-22 1992-10-22 Integrated circuit on request with microprocessor.

Publications (1)

Publication Number Publication Date
DK0594478T3 true DK0594478T3 (en) 1998-09-23

Family

ID=9434781

Family Applications (1)

Application Number Title Priority Date Filing Date
DK93402518T DK0594478T3 (en) 1992-10-22 1993-10-13 Application-specific integrated circuit with microprocessor and test means

Country Status (9)

Country Link
EP (1) EP0594478B1 (en)
JP (1) JPH06208478A (en)
AT (1) ATE163100T1 (en)
CA (1) CA2108824A1 (en)
DE (1) DE69316823T2 (en)
DK (1) DK0594478T3 (en)
ES (1) ES2115036T3 (en)
FR (1) FR2697356B1 (en)
GR (1) GR3026763T3 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5724502A (en) * 1995-08-07 1998-03-03 International Business Machines Corporation Test mode matrix circuit for an embedded microprocessor core

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1990013043A1 (en) * 1989-04-18 1990-11-01 Vlsi Technology, Inc. Method for automatic isolation of functional blocks within integrated circuits
DE9000825U1 (en) * 1990-01-25 1990-03-29 Siemens AG, 1000 Berlin und 8000 München Integrated circuit
JP2619112B2 (en) * 1990-05-16 1997-06-11 株式会社東芝 Test facilitation circuit for information processing equipment

Also Published As

Publication number Publication date
JPH06208478A (en) 1994-07-26
DE69316823T2 (en) 1998-09-10
FR2697356A1 (en) 1994-04-29
ATE163100T1 (en) 1998-02-15
GR3026763T3 (en) 1998-07-31
ES2115036T3 (en) 1998-06-16
FR2697356B1 (en) 1994-12-09
CA2108824A1 (en) 1994-04-23
EP0594478A1 (en) 1994-04-27
EP0594478B1 (en) 1998-02-04
DE69316823D1 (en) 1998-03-12

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