DK0528915T3 - Fremgangsmåde og apparat til bestemmelse af billedklarheden af en overflade - Google Patents

Fremgangsmåde og apparat til bestemmelse af billedklarheden af en overflade

Info

Publication number
DK0528915T3
DK0528915T3 DK91909449.0T DK91909449T DK0528915T3 DK 0528915 T3 DK0528915 T3 DK 0528915T3 DK 91909449 T DK91909449 T DK 91909449T DK 0528915 T3 DK0528915 T3 DK 0528915T3
Authority
DK
Denmark
Prior art keywords
image
pct
virtual image
determining
detected virtual
Prior art date
Application number
DK91909449.0T
Other languages
English (en)
Inventor
Christiaan Theodorus W Lahaije
Wilhelmus Jacobus Van Der Meer
Original Assignee
Hoogovens Groep Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoogovens Groep Bv filed Critical Hoogovens Groep Bv
Application granted granted Critical
Publication of DK0528915T3 publication Critical patent/DK0528915T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G01B11/303—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/57—Measuring gloss
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0635—Structured illumination, e.g. with grating

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Processing (AREA)
DK91909449.0T 1990-05-18 1991-05-17 Fremgangsmåde og apparat til bestemmelse af billedklarheden af en overflade DK0528915T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NL9001164A NL9001164A (nl) 1990-05-18 1990-05-18 Werkwijze en inrichting ter bepaling van de beeldhelderheid van een oppervlak.

Publications (1)

Publication Number Publication Date
DK0528915T3 true DK0528915T3 (da) 1994-05-09

Family

ID=19857117

Family Applications (1)

Application Number Title Priority Date Filing Date
DK91909449.0T DK0528915T3 (da) 1990-05-18 1991-05-17 Fremgangsmåde og apparat til bestemmelse af billedklarheden af en overflade

Country Status (9)

Country Link
US (1) US5359668A (da)
EP (1) EP0528915B1 (da)
JP (1) JPH05505677A (da)
AT (1) ATE99802T1 (da)
CA (1) CA2083037C (da)
DE (1) DE69100947T2 (da)
DK (1) DK0528915T3 (da)
NL (1) NL9001164A (da)
WO (1) WO1991018278A1 (da)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2737294B1 (fr) * 1995-07-26 1997-09-05 Satimage Procede et dispositif de detection de l'etat de surface de pieces a surface reflechissante, applicables au controle de rugosite de pieces polies
DE19709992C1 (de) * 1997-03-11 1998-10-01 Betr Forsch Inst Angew Forsch Verfahren zum Messen der Oberflächengeometrie von Warmband
WO2003028377A1 (en) * 2001-09-14 2003-04-03 Vislog Technology Pte Ltd. Apparatus and method for selecting key frames of clear faces through a sequence of images
EP2031348B1 (de) * 2007-07-09 2014-09-10 VDEh-Betriebsforschungsinstitut GmbH Oberflächeninspektionsverfahren zum Detektieren von Oberflächendefekten und/oder Vermessen der Oberflächentopographie
CN104251687B (zh) * 2014-10-11 2017-05-03 盐城工学院 一种基于镜面图像处理的零件表面平整度检测方法
JP7272124B2 (ja) * 2019-06-11 2023-05-12 コニカミノルタ株式会社 評価装置および評価方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5271289A (en) * 1975-12-11 1977-06-14 Mitsubishi Electric Corp Surface inspection device
JPS56122906A (en) * 1980-03-01 1981-09-26 Hitachi Maxell Ltd Measuring method for surface flatness of magnetic recording medium
US4863268A (en) * 1984-02-14 1989-09-05 Diffracto Ltd. Diffractosight improvements
US4629319A (en) * 1984-02-14 1986-12-16 Diffracto Ltd. Panel surface flaw inspection
JPS6175236A (ja) * 1984-09-20 1986-04-17 Nippon Soken Inc 塗装面測定装置
JPS6260075A (ja) * 1985-09-10 1987-03-16 Hitachi Ltd 形状認識装置
DE3919893A1 (de) * 1988-06-22 1989-12-28 Innovat Ges Fuer Sondermaschin Verfahren und vorrichtung zur beruehrungslosen messung von gestaltsabweichungen an oberflaechen
FR2634551B1 (fr) * 1988-07-20 1990-11-02 Siderurgie Fse Inst Rech Procede et dispositif d'identification du fini d'une surface metallique
US4975972A (en) * 1988-10-18 1990-12-04 At&T Bell Laboratories Method and apparatus for surface inspection
KR930004970B1 (ko) * 1988-11-28 1993-06-11 마쯔시다덴기산교 가부시기가이샤 테이프주름의 검사방법 및 그 장치
IT1224030B (it) * 1988-12-23 1990-09-26 Fiat Ricerche Metodo e dispositivo per il rilievo e la classivicazione della raggrinzatura di trattamenti superficiali
US5142648A (en) * 1990-08-02 1992-08-25 General Motors Corporation Method and apparatus for paint inspection
USH999H (en) * 1990-09-13 1991-12-03 The United States Of America As Represented By The Secretary Of The Air Force Transparency distortion measurement process
US5155558A (en) * 1990-09-19 1992-10-13 E. I. Du Pont De Nemours And Company Method and apparatus for analyzing the appearance features of a surface
US5208766A (en) * 1990-11-13 1993-05-04 Hughes Aircraft Company Automated evaluation of painted surface quality

Also Published As

Publication number Publication date
CA2083037C (en) 1995-05-30
ATE99802T1 (de) 1994-01-15
WO1991018278A1 (en) 1991-11-28
DE69100947D1 (de) 1994-02-17
JPH05505677A (ja) 1993-08-19
EP0528915A1 (en) 1993-03-03
DE69100947T2 (de) 1994-05-05
US5359668A (en) 1994-10-25
NL9001164A (nl) 1991-12-16
CA2083037A1 (en) 1991-11-19
EP0528915B1 (en) 1994-01-05

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