DE69925547D1 - Herstellung der Endflächen von Laserdioden durch Epitaxie auf Basis von III-V Materialien - Google Patents
Herstellung der Endflächen von Laserdioden durch Epitaxie auf Basis von III-V MaterialienInfo
- Publication number
- DE69925547D1 DE69925547D1 DE69925547T DE69925547T DE69925547D1 DE 69925547 D1 DE69925547 D1 DE 69925547D1 DE 69925547 T DE69925547 T DE 69925547T DE 69925547 T DE69925547 T DE 69925547T DE 69925547 D1 DE69925547 D1 DE 69925547D1
- Authority
- DE
- Germany
- Prior art keywords
- iii
- materials
- production
- end faces
- laser diodes
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/323—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/32308—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm
- H01S5/32341—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser emitting light at a wavelength less than 900 nm blue laser based on GaN or GaP
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S2304/00—Special growth methods for semiconductor lasers
- H01S2304/12—Pendeo epitaxial lateral overgrowth [ELOG], e.g. for growing GaN based blue laser diodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
- H01S5/0206—Substrates, e.g. growth, shape, material, removal or bonding
- H01S5/0213—Sapphire, quartz or diamond based substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
- H01S5/223—Buried stripe structure
- H01S5/2232—Buried stripe structure with inner confining structure between the active layer and the lower electrode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/3201—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures incorporating bulkstrain effects, e.g. strain compensation, strain related to polarisation
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Semiconductor Lasers (AREA)
- Led Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/140,976 US6240115B1 (en) | 1998-08-27 | 1998-08-27 | Epitaxial facet formation for laser diodes based on III-V material systems |
US140976 | 1998-08-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69925547D1 true DE69925547D1 (de) | 2005-07-07 |
DE69925547T2 DE69925547T2 (de) | 2006-02-02 |
Family
ID=22493618
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69925547T Expired - Fee Related DE69925547T2 (de) | 1998-08-27 | 1999-07-02 | Herstellung der Endflächen von Laserdioden durch Epitaxie auf Basis von III-V Materialien |
Country Status (4)
Country | Link |
---|---|
US (1) | US6240115B1 (de) |
EP (1) | EP0982819B1 (de) |
JP (1) | JP2000077770A (de) |
DE (1) | DE69925547T2 (de) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6395618B2 (en) * | 1998-07-10 | 2002-05-28 | Stmicroelectronics S.R.L. | Method for manufacturing integrated structures including removing a sacrificial region |
JP3470623B2 (ja) | 1998-11-26 | 2003-11-25 | ソニー株式会社 | 窒化物系iii−v族化合物半導体の成長方法、半導体装置の製造方法および半導体装置 |
TW504754B (en) * | 2000-03-24 | 2002-10-01 | Sumitomo Chemical Co | Group III-V compound semiconductor and method of producing the same |
US6627974B2 (en) * | 2000-06-19 | 2003-09-30 | Nichia Corporation | Nitride semiconductor substrate and method for manufacturing the same, and nitride semiconductor device using nitride semiconductor substrate |
US20060284163A1 (en) * | 2005-06-15 | 2006-12-21 | Bour David P | Single ELOG growth transverse p-n junction nitride semiconductor laser |
US20090085055A1 (en) * | 2007-09-27 | 2009-04-02 | Hui Peng | Method for Growing an Epitaxial Layer |
US8986835B2 (en) * | 2010-04-05 | 2015-03-24 | Purdue Research Foundation | Growth process for gallium nitride porous nanorods |
WO2017082126A1 (ja) * | 2015-11-12 | 2017-05-18 | 株式会社Sumco | Iii族窒化物半導体基板の製造方法及びiii族窒化物半導体基板 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3352712B2 (ja) | 1991-12-18 | 2002-12-03 | 浩 天野 | 窒化ガリウム系半導体素子及びその製造方法 |
KR19980079320A (ko) | 1997-03-24 | 1998-11-25 | 기다오까다까시 | 고품질 쥐에이엔계층의 선택성장방법, 고품질 쥐에이엔계층 성장기판 및 고품질 쥐에이엔계층 성장기판상에 제작하는 반도체디바이스 |
EP0874405A3 (de) | 1997-03-25 | 2004-09-15 | Mitsubishi Cable Industries, Ltd. | Element auf Basis von GaN mit niedriger Versetzungsdichte, seine Verwendung und Herstellungsverfahren |
-
1998
- 1998-08-27 US US09/140,976 patent/US6240115B1/en not_active Expired - Lifetime
-
1999
- 1999-07-02 DE DE69925547T patent/DE69925547T2/de not_active Expired - Fee Related
- 1999-07-02 EP EP99112852A patent/EP0982819B1/de not_active Expired - Lifetime
- 1999-07-30 JP JP21691799A patent/JP2000077770A/ja not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
EP0982819B1 (de) | 2005-06-01 |
US6240115B1 (en) | 2001-05-29 |
EP0982819A1 (de) | 2000-03-01 |
DE69925547T2 (de) | 2006-02-02 |
JP2000077770A (ja) | 2000-03-14 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: AVAGO TECHNOLOGIES GENERAL IP ( SINGAPORE) PTE. LT |
|
8339 | Ceased/non-payment of the annual fee |