DE69831918D1 - Speicherschaltung mit DMA Prüfung und sein Prüfverfahren - Google Patents
Speicherschaltung mit DMA Prüfung und sein PrüfverfahrenInfo
- Publication number
- DE69831918D1 DE69831918D1 DE69831918T DE69831918T DE69831918D1 DE 69831918 D1 DE69831918 D1 DE 69831918D1 DE 69831918 T DE69831918 T DE 69831918T DE 69831918 T DE69831918 T DE 69831918T DE 69831918 D1 DE69831918 D1 DE 69831918D1
- Authority
- DE
- Germany
- Prior art keywords
- pipe line
- data
- output
- test
- blocks
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/30—Accessing single arrays
- G11C29/32—Serial access; Scan testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/48—Arrangements in static stores specially adapted for testing by means external to the store, e.g. using direct memory access [DMA] or using auxiliary access paths
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Dram (AREA)
- Tests Of Electronic Circuits (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR9765539 | 1997-12-03 | ||
KR1019970065539A KR100238256B1 (ko) | 1997-12-03 | 1997-12-03 | 직접 억세스 모드 테스트를 사용하는 메모리 장치 및 테스트방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69831918D1 true DE69831918D1 (de) | 2005-11-24 |
DE69831918T2 DE69831918T2 (de) | 2006-07-20 |
Family
ID=36643425
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69831918T Expired - Lifetime DE69831918T2 (de) | 1997-12-03 | 1998-05-12 | Speicherschaltung mit DMA Prüfung und sein Prüfverfahren |
Country Status (6)
Country | Link |
---|---|
US (1) | US6046947A (de) |
EP (1) | EP0921528B1 (de) |
JP (1) | JP3822367B2 (de) |
KR (1) | KR100238256B1 (de) |
DE (1) | DE69831918T2 (de) |
TW (1) | TW396344B (de) |
Families Citing this family (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7643354B2 (en) * | 1999-07-30 | 2010-01-05 | University Of Kentucky Research Foundation | Neural network model for instruments that store and retrieve sequential information |
JP2001043700A (ja) * | 1999-08-02 | 2001-02-16 | Fujitsu Ltd | 半導体記憶装置 |
DE10064478B4 (de) * | 2000-12-22 | 2005-02-24 | Atmel Germany Gmbh | Verfahren zur Prüfung einer integrierten Schaltung und Schaltungsanordnung |
DE10136703C1 (de) * | 2001-07-27 | 2003-04-17 | Infineon Technologies Ag | Logikvorrichtung zum Testen einer integrierten Schaltung |
KR100406543B1 (ko) | 2001-12-24 | 2003-11-20 | 주식회사 하이닉스반도체 | 동기식 메모리의 파이프 래치 제어회로 |
US20030182609A1 (en) * | 2002-01-31 | 2003-09-25 | Shirish Agrawal | Pass gate multiplexer |
US7010733B2 (en) * | 2002-10-09 | 2006-03-07 | International Business Machines Corporation | Parametric testing for high pin count ASIC |
US7372752B2 (en) * | 2005-09-29 | 2008-05-13 | Hynix Semiconductor Inc. | Test mode controller |
CN101226777B (zh) * | 2007-01-15 | 2011-10-26 | 华邦电子股份有限公司 | 存储装置和减少测试针脚装置及其测试方法 |
JP2008311164A (ja) * | 2007-06-18 | 2008-12-25 | Panasonic Corp | 非水電解質二次電池および非水電解質二次電池用電極の製造方法 |
JP2010003388A (ja) * | 2008-06-23 | 2010-01-07 | Elpida Memory Inc | 半導体記憶装置およびそのテスト方法 |
KR102076858B1 (ko) * | 2013-12-24 | 2020-02-12 | 에스케이하이닉스 주식회사 | 반도체장치 및 이를 포함하는 반도체시스템 |
US10643735B1 (en) * | 2017-10-27 | 2020-05-05 | Pdf Solutions, Inc. | Passive array test structure for cross-point memory characterization |
CN114460447B (zh) * | 2021-01-19 | 2023-03-28 | 沐曦集成电路(上海)有限公司 | 锁存器的自测试电路及其自测试方法 |
US11526453B1 (en) * | 2021-08-13 | 2022-12-13 | Micron Technology, Inc. | Apparatus including parallel pipelines and methods of manufacturing the same |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5254940A (en) * | 1990-12-13 | 1993-10-19 | Lsi Logic Corporation | Testable embedded microprocessor and method of testing same |
GR920100088A (el) * | 1992-03-05 | 1993-11-30 | Consulting R & D Corp Koloni S | Διαφανής έλεγχος ολοκληρωμένων κυκλωμάτων. |
JP2845713B2 (ja) * | 1993-03-12 | 1999-01-13 | 株式会社東芝 | 並列ビットテストモード内蔵半導体メモリ |
JP3076185B2 (ja) * | 1993-12-07 | 2000-08-14 | 日本電気株式会社 | 半導体メモリ装置及びその検査方法 |
US5506499A (en) * | 1995-06-05 | 1996-04-09 | Neomagic Corp. | Multiple probing of an auxilary test pad which allows for reliable bonding to a primary bonding pad |
US5574692A (en) * | 1995-06-07 | 1996-11-12 | Lsi Logic Corporation | Memory testing apparatus for microelectronic integrated circuit |
JP2833563B2 (ja) * | 1996-01-23 | 1998-12-09 | 日本電気株式会社 | 半導体記憶装置 |
JPH09213072A (ja) * | 1996-02-09 | 1997-08-15 | Nec Corp | Dramリフレッシュ制御方式 |
US5668815A (en) * | 1996-08-14 | 1997-09-16 | Advanced Micro Devices, Inc. | Method for testing integrated memory using an integrated DMA controller |
US5877987A (en) * | 1997-02-14 | 1999-03-02 | Micron Technology, Inc. | Method and circuit for self-latching data read lines in the data output path of a semiconductor memory device |
-
1997
- 1997-12-03 KR KR1019970065539A patent/KR100238256B1/ko not_active IP Right Cessation
-
1998
- 1998-05-12 EP EP98303712A patent/EP0921528B1/de not_active Expired - Lifetime
- 1998-05-12 DE DE69831918T patent/DE69831918T2/de not_active Expired - Lifetime
- 1998-05-26 TW TW087108154A patent/TW396344B/zh not_active IP Right Cessation
- 1998-08-26 JP JP24061298A patent/JP3822367B2/ja not_active Expired - Fee Related
- 1998-11-24 US US09/198,702 patent/US6046947A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE69831918T2 (de) | 2006-07-20 |
KR19990047220A (ko) | 1999-07-05 |
JPH11176199A (ja) | 1999-07-02 |
JP3822367B2 (ja) | 2006-09-20 |
KR100238256B1 (ko) | 2000-01-15 |
EP0921528A1 (de) | 1999-06-09 |
EP0921528B1 (de) | 2005-10-19 |
TW396344B (en) | 2000-07-01 |
US6046947A (en) | 2000-04-04 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition |