DE69617730T2 - Amrc-test - Google Patents

Amrc-test

Info

Publication number
DE69617730T2
DE69617730T2 DE69617730T DE69617730T DE69617730T2 DE 69617730 T2 DE69617730 T2 DE 69617730T2 DE 69617730 T DE69617730 T DE 69617730T DE 69617730 T DE69617730 T DE 69617730T DE 69617730 T2 DE69617730 T2 DE 69617730T2
Authority
DE
Germany
Prior art keywords
amrc
test
amrc test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69617730T
Other languages
English (en)
Other versions
DE69617730D1 (en
Inventor
J Orlando
L Pappas
A Lopez
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Northrop Grumman Corp
Original Assignee
Northrop Grumman Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Northrop Grumman Corp filed Critical Northrop Grumman Corp
Application granted granted Critical
Publication of DE69617730D1 publication Critical patent/DE69617730D1/de
Publication of DE69617730T2 publication Critical patent/DE69617730T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • H04N17/002—Diagnosis, testing or measuring for television systems or their details for television cameras
DE69617730T 1995-10-27 1996-09-23 Amrc-test Expired - Fee Related DE69617730T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US08/549,587 US5748230A (en) 1995-10-27 1995-10-27 Automated minimum resolvable contrast (AMRC) test
PCT/US1996/015119 WO1997016032A1 (en) 1995-10-27 1996-09-23 Automated minimum resolvable contrast (amrc) test

Publications (2)

Publication Number Publication Date
DE69617730D1 DE69617730D1 (en) 2002-01-17
DE69617730T2 true DE69617730T2 (de) 2002-07-18

Family

ID=24193611

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69617730T Expired - Fee Related DE69617730T2 (de) 1995-10-27 1996-09-23 Amrc-test

Country Status (8)

Country Link
US (1) US5748230A (de)
EP (1) EP0864231B1 (de)
JP (1) JP2000503820A (de)
DE (1) DE69617730T2 (de)
ES (1) ES2166000T3 (de)
IL (1) IL123684A (de)
TW (1) TW305095B (de)
WO (1) WO1997016032A1 (de)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6366312B1 (en) * 1998-06-09 2002-04-02 Intel Corporation Testing components in digital imaging devices
US7898571B1 (en) * 1999-02-27 2011-03-01 Raytheon Company Versatile video data acquisition and analysis system
US6900884B2 (en) * 2001-10-04 2005-05-31 Lockheed Martin Corporation Automatic measurement of the modulation transfer function of an optical system
US7068302B2 (en) * 2002-08-15 2006-06-27 Ford Global Technologies, Llc Method for camera calibration and quality testing
JP4328224B2 (ja) * 2004-01-26 2009-09-09 オリンパス株式会社 結像光学系の結像性能評価方法及び装置
US7518712B2 (en) * 2004-05-12 2009-04-14 Edmund Optics, Inc. Tilted edge for optical-transfer-function measurement
EP1628494A1 (de) * 2004-08-17 2006-02-22 Dialog Semiconductor GmbH Intelligente Lichtquelle mit Synchronisation mit einer Digitalkamera
EP1648181A1 (de) * 2004-10-12 2006-04-19 Dialog Semiconductor GmbH Einzelbildabspeichervorrichtung
DE102005006755A1 (de) * 2005-02-15 2006-08-17 Robert Bosch Gmbh Verfahren zur optischen Justage einer Kamera
US8094195B2 (en) * 2006-12-28 2012-01-10 Flextronics International Usa, Inc. Digital camera calibration method
CN102342089A (zh) * 2009-03-02 2012-02-01 弗莱克斯电子有限责任公司 相机模块的校准技术
US8310548B2 (en) * 2009-10-23 2012-11-13 Contec Llc System and method for video quality parametric tests
CN102279092B (zh) * 2011-04-08 2013-08-14 长春理工大学 一种基于led显示的光学靶标***
JP5839990B2 (ja) * 2011-12-28 2016-01-06 三菱重工業株式会社 コントラスト光源装置及びコントラスト光源の形成方法
CN107111013B (zh) * 2014-12-08 2020-11-06 Trw汽车美国有限责任公司 紧凑调制传递函数评估***
CN108510480B (zh) * 2018-03-20 2021-02-09 北京理工大学 基于辐射对比度的卫星探测性能评估方法、装置及存储器
DE102018133289A1 (de) 2018-12-21 2020-06-25 Hensoldt Optronics Gmbh Messvorrichtung und Verfahren zur Bestimmung des minimal auflösbaren Kontrasts

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3912396A (en) * 1973-05-23 1975-10-14 Bell & Howell Co Electronic lens tester
US4299451A (en) * 1980-04-15 1981-11-10 The United States Of America As Represented By The Secretary Of The Air Force Minimum resolvable contrast measurement device
US4568975A (en) * 1984-08-02 1986-02-04 Visual Information Institute, Inc. Method for measuring the gray scale characteristics of a CRT display
US5033015A (en) * 1988-08-12 1991-07-16 Hughes Aircraft Company Automated system for testing an imaging sensor
JPH07117571B2 (ja) * 1988-09-22 1995-12-18 松下電子工業株式会社 固体撮像素子の検査方法
DE3836280C1 (de) * 1988-10-25 1989-08-10 Rohde & Schwarz Gmbh & Co Kg, 8000 Muenchen, De
US5155558A (en) * 1990-09-19 1992-10-13 E. I. Du Pont De Nemours And Company Method and apparatus for analyzing the appearance features of a surface
US5285286A (en) * 1992-01-24 1994-02-08 Eastman Kodak Company Apparatus for testing image sensors that simultaneously output multiple image blocks
US5572444A (en) * 1992-08-19 1996-11-05 Mtl Systems, Inc. Method and apparatus for automatic performance evaluation of electronic display devices
US5351201A (en) * 1992-08-19 1994-09-27 Mtl Systems, Inc. Method and apparatus for automatic performance evaluation of electronic display devices

Also Published As

Publication number Publication date
ES2166000T3 (es) 2002-04-01
IL123684A (en) 2001-03-19
EP0864231A4 (de) 1998-11-18
EP0864231B1 (de) 2001-12-05
EP0864231A1 (de) 1998-09-16
TW305095B (de) 1997-05-11
JP2000503820A (ja) 2000-03-28
IL123684A0 (en) 1998-10-30
DE69617730D1 (en) 2002-01-17
US5748230A (en) 1998-05-05
WO1997016032A1 (en) 1997-05-01

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee