DE69601763T2 - Einrichtung zur Antriebsregelung - Google Patents

Einrichtung zur Antriebsregelung

Info

Publication number
DE69601763T2
DE69601763T2 DE69601763T DE69601763T DE69601763T2 DE 69601763 T2 DE69601763 T2 DE 69601763T2 DE 69601763 T DE69601763 T DE 69601763T DE 69601763 T DE69601763 T DE 69601763T DE 69601763 T2 DE69601763 T2 DE 69601763T2
Authority
DE
Germany
Prior art keywords
control device
drive control
drive
control
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69601763T
Other languages
English (en)
Other versions
DE69601763D1 (de
Inventor
Mikio Sato
Hiroaki Takeishi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP24826695A external-priority patent/JP3320276B2/ja
Priority claimed from JP32787295A external-priority patent/JP3387715B2/ja
Application filed by Canon Inc filed Critical Canon Inc
Publication of DE69601763D1 publication Critical patent/DE69601763D1/de
Application granted granted Critical
Publication of DE69601763T2 publication Critical patent/DE69601763T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70358Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/18Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
    • G05B19/19Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by positioning or contouring control systems, e.g. to control position from one programmed point to another or to control movement along a programmed continuous path
    • G05B19/21Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by positioning or contouring control systems, e.g. to control position from one programmed point to another or to control movement along a programmed continuous path using an incremental digital measuring device
    • G05B19/23Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by positioning or contouring control systems, e.g. to control position from one programmed point to another or to control movement along a programmed continuous path using an incremental digital measuring device for point-to-point control
    • G05B19/231Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by positioning or contouring control systems, e.g. to control position from one programmed point to another or to control movement along a programmed continuous path using an incremental digital measuring device for point-to-point control the positional error is used to control continuously the servomotor according to its magnitude
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/37Measurements
    • G05B2219/37275Laser, interferometer
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/41Servomotor, servo controller till figures
    • G05B2219/41026Change gain as function of speed
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/41Servomotor, servo controller till figures
    • G05B2219/41028Select gain with memory, rom table
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/41Servomotor, servo controller till figures
    • G05B2219/41029Adjust gain as function of position error and position
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/41Servomotor, servo controller till figures
    • G05B2219/41172Adapt coefficients of compensator to bring system into phase margin
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/41Servomotor, servo controller till figures
    • G05B2219/41203Lead-phase compensation, lag-phase compensation servo
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/41Servomotor, servo controller till figures
    • G05B2219/41216Two lookup tables, for forward and reverse movement
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/42Servomotor, servo controller kind till VSS
    • G05B2219/42033Kind of servo controller

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Human Computer Interaction (AREA)
  • Automation & Control Theory (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Control Of Position Or Direction (AREA)
DE69601763T 1995-09-04 1996-09-03 Einrichtung zur Antriebsregelung Expired - Lifetime DE69601763T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP24826695A JP3320276B2 (ja) 1995-09-04 1995-09-04 精密制御装置
JP32787295A JP3387715B2 (ja) 1995-11-24 1995-11-24 多相リニアモータ制御装置

Publications (2)

Publication Number Publication Date
DE69601763D1 DE69601763D1 (de) 1999-04-22
DE69601763T2 true DE69601763T2 (de) 1999-09-09

Family

ID=26538682

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69601763T Expired - Lifetime DE69601763T2 (de) 1995-09-04 1996-09-03 Einrichtung zur Antriebsregelung

Country Status (4)

Country Link
US (1) US5757149A (de)
EP (1) EP0762255B1 (de)
KR (1) KR100226599B1 (de)
DE (1) DE69601763T2 (de)

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US7365513B1 (en) 1994-04-01 2008-04-29 Nikon Corporation Positioning device having dynamically isolated frame, and lithographic device provided with such a positioning device
US6989647B1 (en) * 1994-04-01 2006-01-24 Nikon Corporation Positioning device having dynamically isolated frame, and lithographic device provided with such a positioning device
US5874820A (en) 1995-04-04 1999-02-23 Nikon Corporation Window frame-guided stage mechanism
TW318255B (de) 1995-05-30 1997-10-21 Philips Electronics Nv
JP3501559B2 (ja) * 1995-06-27 2004-03-02 キヤノン株式会社 リニア・モータ装置
JP4039728B2 (ja) * 1998-03-13 2008-01-30 オリエンタルモーター株式会社 ステッピングモータの制御装置
US6260282B1 (en) * 1998-03-27 2001-07-17 Nikon Corporation Stage control with reduced synchronization error and settling time
US6037737A (en) * 1998-04-30 2000-03-14 Trw Inc. Simple friction-compensating control algorithm for high precision mechanisms
JPH11354417A (ja) 1998-06-11 1999-12-24 Canon Inc 走査型露光装置およびこれを用いたデバイス製造方法ならびにステージ制御装置
US6144118A (en) * 1998-09-18 2000-11-07 General Scanning, Inc. High-speed precision positioning apparatus
JP3595708B2 (ja) * 1998-10-30 2004-12-02 キヤノン株式会社 露光装置、デバイス製造方法および制御方法
US6487458B1 (en) 1999-08-31 2002-11-26 Delphi Technologies, Inc. Adaptive closed-loop servo control
US6573976B2 (en) 2000-10-04 2003-06-03 Canon Kabushiki Kaisha Exposure apparatus, exposure method, and semiconductor device manufacturing method
EP1267213B1 (de) * 2001-06-13 2006-09-20 ASML Netherlands B.V. Lithographischer Projektionsapparat
JP3870058B2 (ja) * 2001-10-05 2007-01-17 キヤノン株式会社 スキャン露光装置及び方法並びにデバイスの製造方法
JP3963426B2 (ja) * 2001-11-28 2007-08-22 キヤノン株式会社 ステージ装置および露光装置
US6922025B2 (en) * 2002-02-21 2005-07-26 Anorad Corporation Zero ripple linear motor system
JP2004030500A (ja) * 2002-06-28 2004-01-29 Fanuc Ltd モータ制御装置
JP3907566B2 (ja) * 2002-09-27 2007-04-18 キヤノン株式会社 位置決め装置における測定手段を初期化する方法
US6949896B2 (en) * 2002-12-03 2005-09-27 Ricoh Company, Limited Apparatus for and method of driving motor to move object at a constant velocity
US7119511B2 (en) * 2003-04-11 2006-10-10 International Business Machines Corporation Servo system for a two-dimensional micro-electromechanical system (MEMS)-based scanner and method therefor
JP4315420B2 (ja) * 2003-04-18 2009-08-19 キヤノン株式会社 露光装置及び露光方法
NL1027851C2 (nl) * 2004-12-22 2006-06-27 Assembleon Nv Werkwijze voor het regelen van een dynamisch systeem alsmede een dergelijke inrichting.
US7265813B2 (en) * 2004-12-28 2007-09-04 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US20060170382A1 (en) * 2005-01-28 2006-08-03 Nikon Corporation Linear motor force ripple identification and compensation with iterative learning control
US7253580B2 (en) * 2005-05-06 2007-08-07 Marvell International Technology Ltd. Method and apparatus for adaptive motor speed control
US20070206456A1 (en) * 2005-09-30 2007-09-06 Sullivan Jeffrey S Trajectory mapping for improved motion-system jitter while minimizing tracking error
US7468589B2 (en) * 2006-01-13 2008-12-23 Asml Netherlands B.V. Lithographic apparatus having a controlled motor, and motor control system and method
WO2007097947A1 (en) * 2006-02-16 2007-08-30 Kadant Inc. Linear traversing carriage incorporating an air gap inductive motivator
US7453228B2 (en) * 2006-04-07 2008-11-18 Asml Netherlands B.V. Method for controlling a positioning device, positioning device, and lithographic apparatus provided with a positioning device
US7818073B2 (en) * 2006-04-20 2010-10-19 Asml Netherlands B.V. Method for obtaining improved feedforward data, a lithographic apparatus for carrying out the method and a device manufacturing method
CN100593767C (zh) * 2006-06-30 2010-03-10 深圳市大族激光科技股份有限公司 电容传感器的控制方法
US8267388B2 (en) * 2007-09-12 2012-09-18 Xradia, Inc. Alignment assembly
US8452424B2 (en) * 2008-03-05 2013-05-28 National Univeristy Corporation Nagoya Institute of Technology Moving object feed-forward control method
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US8649885B2 (en) * 2008-11-25 2014-02-11 Nikon Corporation Frequency selective iterative learning control system and method for controlling errors in stage movement
JP5308249B2 (ja) * 2009-06-22 2013-10-09 三菱重工業株式会社 サーボ制御装置
NL2006981A (en) 2010-07-26 2012-01-30 Asml Netherlands Bv Position control system, lithographic apparatus, and method to control a position of a movable object.
TWI488016B (zh) * 2012-11-16 2015-06-11 唐明中 可攜式遠端互動系統
US9871340B2 (en) * 2015-10-16 2018-01-16 Thorlabs, Inc. Linear motor or voice coil for fast tuning of a laser cavity
JP2022129161A (ja) * 2021-02-24 2022-09-05 キヤノン株式会社 制御装置、位置決め装置、リソグラフィー装置および物品製造方法

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Also Published As

Publication number Publication date
DE69601763D1 (de) 1999-04-22
KR970018132A (ko) 1997-04-30
EP0762255A1 (de) 1997-03-12
US5757149A (en) 1998-05-26
KR100226599B1 (ko) 1999-10-15
EP0762255B1 (de) 1999-03-17

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