DE69532380D1 - Rundheitsmessen - Google Patents

Rundheitsmessen

Info

Publication number
DE69532380D1
DE69532380D1 DE69532380T DE69532380T DE69532380D1 DE 69532380 D1 DE69532380 D1 DE 69532380D1 DE 69532380 T DE69532380 T DE 69532380T DE 69532380 T DE69532380 T DE 69532380T DE 69532380 D1 DE69532380 D1 DE 69532380D1
Authority
DE
Germany
Prior art keywords
fairs
roundness
roundness fairs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69532380T
Other languages
English (en)
Other versions
DE69532380T2 (de
Inventor
James Scott
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Taylor Hobson Ltd
Original Assignee
Taylor Hobson Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Taylor Hobson Ltd filed Critical Taylor Hobson Ltd
Publication of DE69532380D1 publication Critical patent/DE69532380D1/de
Application granted granted Critical
Publication of DE69532380T2 publication Critical patent/DE69532380T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
DE69532380T 1994-10-18 1995-10-18 Rundheitsmessen Expired - Fee Related DE69532380T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB9421013A GB2294327A (en) 1994-10-18 1994-10-18 Roundness measuring
GB9421013 1994-10-18
PCT/GB1995/002460 WO1996012162A1 (en) 1994-10-18 1995-10-18 Roundness measuring

Publications (2)

Publication Number Publication Date
DE69532380D1 true DE69532380D1 (de) 2004-02-05
DE69532380T2 DE69532380T2 (de) 2004-06-09

Family

ID=10763042

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69532380T Expired - Fee Related DE69532380T2 (de) 1994-10-18 1995-10-18 Rundheitsmessen

Country Status (6)

Country Link
US (1) US5926781A (de)
EP (1) EP0787280B1 (de)
JP (1) JPH10507268A (de)
DE (1) DE69532380T2 (de)
GB (1) GB2294327A (de)
WO (1) WO1996012162A1 (de)

Families Citing this family (48)

* Cited by examiner, † Cited by third party
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GB2306654A (en) 1995-10-31 1997-05-07 Rank Taylor Hobson Ltd Surface measuring apparatus
GB9612383D0 (en) 1995-12-07 1996-08-14 Rank Taylor Hobson Ltd Surface form measurement
JPH11179656A (ja) * 1997-10-17 1999-07-06 Tokyo Seimitsu Co Ltd 粗さ・真円度測定機能を有する自動定寸装置
US6286227B1 (en) * 1998-08-03 2001-09-11 General Electric Company Micrometer system and process of use therefor
DE19851954A1 (de) * 1998-11-11 2000-05-18 Mahle Gmbh Messverfahren und -system für Rotationsteile, insbesondere für Kolben von Kolbenmaschinen
US6237242B1 (en) * 1999-05-20 2001-05-29 Rockwell Collins, Inc. Microradian adjustment assembly
US6526364B2 (en) * 2000-01-19 2003-02-25 Mitutoyo Corporation Method and apparatus for measuring roundness
US6519861B1 (en) * 2000-05-04 2003-02-18 Raytheon Company Mechanical centering apparatus and method
JP3687896B2 (ja) * 2000-09-27 2005-08-24 富士重工業株式会社 無段変速機用プーリの計測装置
KR100509344B1 (ko) * 2001-12-29 2005-08-22 학교법인 한마학원 진원도 측정용 치구
US20040173015A1 (en) * 2003-02-11 2004-09-09 Teper Boris R. Apparatus for measuring radial displacement of a wheel
KR100530188B1 (ko) * 2003-04-30 2005-11-23 벤다선광공업 주식회사 엔진구동용링기어의 진원도 자동조정장치
FI115001B (fi) * 2003-07-11 2005-02-15 Metso Paper Inc Menetelmä ja sovitelma rullan päätylapun sijainnin mittaamiseksi
KR100527670B1 (ko) * 2003-10-27 2005-11-29 삼성전자주식회사 구멍의 조도 산출 방법
US7036238B2 (en) * 2003-12-22 2006-05-02 Mitutoyo Corporation Width-measuring method and surface texture measuring instrument
US7173691B2 (en) * 2003-12-22 2007-02-06 Qed Technologies International, Inc. Method for calibrating the geometry of a multi-axis metrology system
JP4582446B2 (ja) * 2004-11-18 2010-11-17 株式会社東京精密 測定装置
FI117651B (fi) * 2005-01-04 2006-12-29 Metso Paper Inc Menetelmä ja sovitelma ympyrämäisen objektin sijainnin mittaamiseksi
US7434328B2 (en) * 2005-01-21 2008-10-14 Sikorsky Aircraft Corporation Rotor blade cuff measuring tool
KR101370171B1 (ko) * 2005-04-05 2014-03-04 퀘드 테크놀러지즈 인터내셔날, 인크. 비구면을 정밀 고해상도로 측정하는 방법
JP4663385B2 (ja) * 2005-04-18 2011-04-06 株式会社ブリヂストン 回転体表面の凹凸データ補正方法
US20090259435A1 (en) * 2005-12-05 2009-10-15 Masato Enomoto Roundness Measuring Instrument and Method of Determining Quality of Tip Head
DE102006015627B4 (de) * 2006-03-31 2008-03-27 Innovent E.V. Verfahren und Vorrichtung zur Bestimmung und Vermessung von Formabweichungen und Welligkeiten an rotationssymmetrischen Teilen
JP4276270B2 (ja) * 2007-02-20 2009-06-10 ファナック株式会社 接触検知によるワークの基準位置設定機能を有する工作機械
JP2008286535A (ja) * 2007-05-15 2008-11-27 Mitsutoyo Corp 真円度測定装置、真円度測定方法、及び真円度測定プログラム
JP2008292199A (ja) * 2007-05-22 2008-12-04 Mitsutoyo Corp 真円度測定装置、真円度測定方法、及び真円度測定プログラム
DE102008001487A1 (de) * 2008-04-30 2009-11-05 Robert Bosch Gmbh System sowie Ausrichtverfahren
KR101164046B1 (ko) * 2008-06-30 2012-07-20 미츠비시 쥬고교 가부시키가이샤 회전체의 심 어긋남 산출 방법 및 심 어긋남 산출 시스템
GB2464509C (en) * 2008-10-17 2014-05-21 Taylor Hobson Ltd Surface measurement instrument and method
JP5301412B2 (ja) * 2009-10-21 2013-09-25 株式会社ミツトヨ 測定力制御装置
GB2474893A (en) * 2009-10-30 2011-05-04 Taylor Hobson Ltd Surface measurement instrument and method
US8356417B2 (en) * 2010-01-20 2013-01-22 Mitutoyo Corporation Spherical-form measuring apparatus
CN101769730B (zh) * 2010-01-22 2012-07-25 西安工业大学 一种工件调平、调心装置
GB2478303B (en) 2010-03-02 2018-03-07 Taylor Hobson Ltd Surface measurement instrument and calibration thereof
US8456637B2 (en) 2010-08-26 2013-06-04 Mitutoyo Corporation Multiple measuring point configuration for a chromatic point sensor
US8194251B2 (en) 2010-08-26 2012-06-05 Mitutoyo Corporation Method for operating a dual beam chromatic point sensor system for simultaneously measuring two surface regions
GB2493786B (en) 2011-08-19 2017-09-27 Taylor Hobson Ltd Metrological apparatus
GB2499660B (en) 2012-02-27 2018-10-03 Taylor Hobson Ltd Surface measurement apparatus and method
GB2504121A (en) * 2012-07-19 2014-01-22 Taylor Hobson Ltd Metrological apparatus and a method of determining a surface characteristic or characteristics
WO2014122437A1 (en) 2013-02-05 2014-08-14 Renishaw Plc Method and apparatus for measuring a part
JP6337647B2 (ja) * 2014-06-26 2018-06-06 日本精工株式会社 転動部材の周面測定装置
US10190860B2 (en) * 2015-08-25 2019-01-29 Adcole Corporation Camshaft sidewall measuring devices and methods thereof
WO2017033581A1 (ja) * 2015-08-27 2017-03-02 株式会社東京精密 表面形状測定方法、心ずれ量算出方法、及び表面形状測定装置
CN105758285B (zh) * 2016-03-04 2018-05-01 合肥工业大学 基于并行误差分离法的大型圆柱廓形在线测量重构方法
DE102016107135A1 (de) 2016-04-18 2017-10-19 Jenoptik Industrial Metrology Germany Gmbh Messanordnung
DE102019208946A1 (de) * 2019-06-19 2020-12-24 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren und Vorrichtung zur Bestimmung einer Lage einer Drehachse eines Drehtisches sowie Drehtisch und Koordinatenmessgerät
JP7360591B2 (ja) * 2020-02-18 2023-10-13 株式会社東京精密 ワークの径測定方法及び真円度測定機
CN114434266A (zh) * 2022-04-11 2022-05-06 天津仁爱学院 一种发动机低压涡轮机匣涂层磨削修整装置及其方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1436721A (en) * 1973-05-23 1976-05-26 Rank Organisation Ltd Surface measurement
GB1477508A (en) * 1974-08-21 1977-06-22 Rank Organisation Ltd Measuring apparatus
GB2039050B (en) * 1979-01-04 1982-12-15 Rank Organisation Ltd Measuring centre of curvature
DE3123489A1 (de) * 1981-06-13 1982-12-30 Dr. Johannes Heidenhain Gmbh, 8225 Traunreut Verfahren zur messung der rundheitsabweichungen von rotationskoerpern und einrichtungen zur durchfuehrung des verfahrens
GB8605324D0 (en) * 1986-03-04 1986-04-09 Rank Taylor Hobson Ltd Metrological apparatus
DE3769350D1 (de) * 1986-03-04 1991-05-23 Rank Taylor Hobson Ltd Positionskontrolle eines zu bearbeitenden werkstuecks.
JPH07104146B2 (ja) * 1989-08-29 1995-11-13 株式会社ミツトヨ 座標測定用プローブの回転テーブル倣い制御方法
US5151870A (en) * 1989-11-17 1992-09-29 Illinois Tool Works Inc. Apparatus and method for determining a center and measuring with reference thereto
JPH0820228B2 (ja) * 1990-01-31 1996-03-04 住友ゴム工業株式会社 タイヤ外周面のプロファイル測定方法及びその装置
JP2809295B2 (ja) * 1992-03-26 1998-10-08 株式会社東京精密 座標測定機及びその測定方法

Also Published As

Publication number Publication date
GB2294327A (en) 1996-04-24
JPH10507268A (ja) 1998-07-14
WO1996012162A1 (en) 1996-04-25
EP0787280B1 (de) 2004-01-02
US5926781A (en) 1999-07-20
DE69532380T2 (de) 2004-06-09
GB9421013D0 (en) 1994-12-07
EP0787280A1 (de) 1997-08-06

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee