DE69531597D1 - Testmethode und flipflop mit mutter- und tochtereinheit umfassender elektronischer schaltkreis - Google Patents

Testmethode und flipflop mit mutter- und tochtereinheit umfassender elektronischer schaltkreis

Info

Publication number
DE69531597D1
DE69531597D1 DE69531597T DE69531597T DE69531597D1 DE 69531597 D1 DE69531597 D1 DE 69531597D1 DE 69531597 T DE69531597 T DE 69531597T DE 69531597 T DE69531597 T DE 69531597T DE 69531597 D1 DE69531597 D1 DE 69531597D1
Authority
DE
Germany
Prior art keywords
flipflop
electronic circuit
test method
comprehensive electronic
iddq
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69531597T
Other languages
English (en)
Other versions
DE69531597T2 (de
Inventor
Manoj Sachdev
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from EP94201929A external-priority patent/EP0633530B1/de
Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Application granted granted Critical
Publication of DE69531597D1 publication Critical patent/DE69531597D1/de
Publication of DE69531597T2 publication Critical patent/DE69531597T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/2236—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test CPU or processors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318577—AC testing, e.g. current testing, burn-in

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Power Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Logic Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
DE69531597T 1994-07-05 1995-06-29 Testmethode und flipflop mit mutter- und tochtereinheit umfassender elektronischer schaltkreis Expired - Fee Related DE69531597T2 (de)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
EP94201929 1994-07-05
EP94201929A EP0633530B1 (de) 1993-07-09 1994-07-05 Prüfung, sequenziellogischer Schaltung auf grund einer kombinatorischen Logikschaltungsveränderung
EP95200212 1995-01-30
EP95200212 1995-01-30
PCT/IB1995/000527 WO1996001434A1 (en) 1994-07-05 1995-06-29 A method of testing and an electronic circuit comprising a flipflop with a master and a slave

Publications (2)

Publication Number Publication Date
DE69531597D1 true DE69531597D1 (de) 2003-10-02
DE69531597T2 DE69531597T2 (de) 2004-06-24

Family

ID=27235995

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69531597T Expired - Fee Related DE69531597T2 (de) 1994-07-05 1995-06-29 Testmethode und flipflop mit mutter- und tochtereinheit umfassender elektronischer schaltkreis

Country Status (8)

Country Link
US (1) US6445235B1 (de)
EP (1) EP0717851B1 (de)
JP (1) JP3626757B2 (de)
KR (1) KR100495456B1 (de)
CN (1) CN1076479C (de)
DE (1) DE69531597T2 (de)
TW (1) TW281726B (de)
WO (1) WO1996001434A1 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5907080A (en) * 1995-11-30 1999-05-25 Nexia Biotechnologies, Inc. Method for development of transgenic dwarf goats
JP3614125B2 (ja) * 2000-10-23 2005-01-26 三星電子株式会社 Ｃｐフリップフロップ
US6919875B2 (en) * 2001-10-02 2005-07-19 Rohm Co., Ltd. Flip-flop circuit, shift register and scan driving circuit for display device
TW200535857A (en) * 2004-04-20 2005-11-01 Innolux Display Corp Dynamic shift register
US20060013352A1 (en) * 2004-07-13 2006-01-19 Ching-Wei Lin Shift register and flat panel display apparatus using the same
US7262648B2 (en) * 2004-08-03 2007-08-28 Marvell International Ltd. Two-latch clocked-LSSD flip-flop
JP2006217540A (ja) * 2005-02-07 2006-08-17 Fujitsu Ltd 半導体集積回路および半導体集積回路の制御方法
WO2007148156A1 (en) * 2006-06-20 2007-12-27 Freescale Semiconductor, Inc. Device and method for hadling metastable signals
US7764086B2 (en) * 2006-12-22 2010-07-27 Industrial Technology Research Institute Buffer circuit
KR101136936B1 (ko) * 2009-10-26 2012-04-20 에스케이하이닉스 주식회사 반도체 장치 및 그 동작방법
CN101706554B (zh) * 2009-11-02 2012-03-14 中国科学院计算技术研究所 用于部分增强型扫描时延测试的触发器选择方法及***
US8514000B1 (en) * 2012-07-31 2013-08-20 Taiwan Semiconductor Manufacturing Co., Ltd. Meta-hardened flip-flop
CN105092930B (zh) * 2014-05-06 2020-10-30 恩智浦美国有限公司 片上电流测试电路

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
USRE30173E (en) * 1977-02-14 1979-12-18 Rca Corporation Current mirror amplifier
DE3443788C2 (de) * 1984-11-30 1987-01-08 Siemens AG, 1000 Berlin und 8000 München Taktgesteuerte Master-Slave-Kippschaltung
JPS6295016A (ja) * 1985-10-21 1987-05-01 Mitsubishi Electric Corp ラツチ回路
JPH0654860B2 (ja) * 1987-09-30 1994-07-20 ローム株式会社 フリップフロップ回路
NL8900050A (nl) * 1989-01-10 1990-08-01 Philips Nv Inrichting voor het meten van een ruststroom van een geintegreerde monolitische digitale schakeling, geintegreerde monolitische digitale schakeling voorzien van een dergelijke inrichting en testapparaat voorzien van een dergelijke inrichting.
JP2621993B2 (ja) * 1989-09-05 1997-06-18 株式会社東芝 フリップフロップ回路
JPH03201717A (ja) * 1989-12-28 1991-09-03 Mitsubishi Electric Corp フリップフロップ回路
JPH04167612A (ja) * 1990-10-26 1992-06-15 Seiko Epson Corp フリップフロップ回路
JPH04246908A (ja) * 1991-02-01 1992-09-02 Nec Corp フリップフロップ回路
JPH04263510A (ja) * 1991-02-18 1992-09-18 Nec Corp フリップフロップ回路
TW222725B (en) * 1993-07-09 1994-04-21 Philips Electronics Nv Testing sequential logic circuit upon changing into combinatorial logic circuit

Also Published As

Publication number Publication date
DE69531597T2 (de) 2004-06-24
EP0717851A1 (de) 1996-06-26
JPH09502808A (ja) 1997-03-18
CN1076479C (zh) 2001-12-19
JP3626757B2 (ja) 2005-03-09
CN1131985A (zh) 1996-09-25
EP0717851B1 (de) 2003-08-27
WO1996001434A1 (en) 1996-01-18
KR960705220A (ko) 1996-10-09
US6445235B1 (en) 2002-09-03
TW281726B (de) 1996-07-21
KR100495456B1 (ko) 2005-09-02

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8328 Change in the person/name/address of the agent

Representative=s name: EISENFUEHR, SPEISER & PARTNER, 10178 BERLIN

8327 Change in the person/name/address of the patent owner

Owner name: NXP B.V., EINDHOVEN, NL

8339 Ceased/non-payment of the annual fee