DE69433974D1 - Elektro-optisches instrument - Google Patents
Elektro-optisches instrumentInfo
- Publication number
- DE69433974D1 DE69433974D1 DE69433974T DE69433974T DE69433974D1 DE 69433974 D1 DE69433974 D1 DE 69433974D1 DE 69433974 T DE69433974 T DE 69433974T DE 69433974 T DE69433974 T DE 69433974T DE 69433974 D1 DE69433974 D1 DE 69433974D1
- Authority
- DE
- Germany
- Prior art keywords
- electro
- optical instrument
- instrument
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q60/00—Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
- G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
- G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/07—Non contact-making probes
- G01R1/071—Non contact-making probes containing electro-optic elements
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
- Y10S977/868—Scanning probe structure with optical means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Tests Of Electronic Circuits (AREA)
- Measurement Of Current Or Voltage (AREA)
- Measuring Leads Or Probes (AREA)
Applications Claiming Priority (11)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8643993 | 1993-04-13 | ||
JP8643993 | 1993-04-13 | ||
JP17932093 | 1993-07-20 | ||
JP17932693A JP3192833B2 (ja) | 1993-07-20 | 1993-07-20 | 原子間力顕微鏡 |
JP17932093A JP3192832B2 (ja) | 1993-07-20 | 1993-07-20 | 電気計測装置のプローブ |
JP17930793 | 1993-07-20 | ||
JP17932693 | 1993-07-20 | ||
JP17930793A JP3192831B2 (ja) | 1993-07-20 | 1993-07-20 | 電気計測装置 |
JP18168793 | 1993-07-22 | ||
JP5181687A JPH0735827A (ja) | 1993-07-22 | 1993-07-22 | 電気光学計測装置 |
PCT/JP1994/000611 WO1994024575A1 (en) | 1993-04-13 | 1994-04-12 | Electrooptic instrument |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69433974D1 true DE69433974D1 (de) | 2004-10-07 |
DE69433974T2 DE69433974T2 (de) | 2005-09-01 |
Family
ID=27525226
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69433974T Expired - Fee Related DE69433974T2 (de) | 1993-04-13 | 1994-04-12 | Elektro-optisches instrument |
DE69434641T Expired - Fee Related DE69434641T2 (de) | 1993-04-13 | 1994-04-12 | Elektrooptisches Messinstrument |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69434641T Expired - Fee Related DE69434641T2 (de) | 1993-04-13 | 1994-04-12 | Elektrooptisches Messinstrument |
Country Status (4)
Country | Link |
---|---|
US (1) | US5583446A (de) |
EP (2) | EP0650067B1 (de) |
DE (2) | DE69433974T2 (de) |
WO (1) | WO1994024575A1 (de) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000329677A (ja) * | 1999-03-17 | 2000-11-30 | Seiko Instruments Inc | 光マイクロカンチレバーとその製造方法および光マイクロカンチレバーホルダ |
ATE519119T1 (de) * | 2002-01-07 | 2011-08-15 | Capres As | Elektrisches rückkopplungs-detektionssystem für mehrpunktsonden |
GB2387489A (en) * | 2002-04-08 | 2003-10-15 | Denselight Semiconductors Pte | Probe for testing an optoelectronic device |
DE10355296B3 (de) * | 2003-11-27 | 2005-06-09 | Infineon Technologies Ag | Testeinrichtung zum Wafertest von digitalen Halbleiterschaltungen |
US7272242B2 (en) * | 2004-04-26 | 2007-09-18 | United States Of America As Represented By The Secretary Of The Navy | Object detection in electro-optic sensor images |
FR2885446B1 (fr) * | 2005-05-09 | 2007-07-20 | St Microelectronics Sa | Sonde coaxiale, son procede de fabrication et dispositif de mesure en champ proche electromagnetique sur des systemes a distance submicrometrique |
DE102013211342A1 (de) * | 2013-06-18 | 2014-12-18 | Siemens Aktiengesellschaft | Fotobasiertes 3D-Oberflächen-Inspektionssystem |
JP2017524936A (ja) | 2014-07-24 | 2017-08-31 | ヌクレウス サイエンティフィック, インク.Nucleus Scientific, Inc. | 電荷貯蔵デバイスを試験するための機器搭載パケット(instrumented packet) |
KR20170035938A (ko) * | 2014-07-24 | 2017-03-31 | 누클레우스 사이언티픽, 인크. | 전하 저장 장치를 테스트하기 위한 측정 기기 |
CN107290590A (zh) * | 2017-05-15 | 2017-10-24 | 武汉科技大学 | 一种非接触模式突变结法测量单分子电学性能的方法 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6073366A (ja) * | 1983-09-30 | 1985-04-25 | Fujitsu Ltd | 配線電圧の給電及び測定装置 |
US4603293A (en) * | 1984-03-27 | 1986-07-29 | University Of Rochester | Measurement of electrical signals with subpicosecond resolution |
JPH0695108B2 (ja) * | 1986-11-25 | 1994-11-24 | 浜松ホトニクス株式会社 | 回路電圧検出装置 |
JPH0627787B2 (ja) * | 1987-03-19 | 1994-04-13 | ソニー・テクトロニクス株式会社 | 光プローブ |
EP0296262B1 (de) * | 1987-06-22 | 1991-08-28 | International Business Machines Corporation | Verfahren zur Oberflächenuntersuchung mit Nanometer- und Pikosekundenauflösung sowie Laserabgetastetes Rastertunnelmikroskop zur Durchführung des Verfahrens |
US4851767A (en) * | 1988-01-15 | 1989-07-25 | International Business Machines Corporation | Detachable high-speed opto-electronic sampling probe |
JPH02172250A (ja) * | 1988-12-24 | 1990-07-03 | Dainippon Printing Co Ltd | 半導体集積回路 |
US4916002A (en) * | 1989-01-13 | 1990-04-10 | The Board Of Trustees Of The Leland Jr. University | Microcasting of microminiature tips |
US4992659A (en) * | 1989-07-27 | 1991-02-12 | International Business Machines Corporation | Near-field lorentz force microscopy |
US5185572A (en) * | 1989-09-28 | 1993-02-09 | Olympus Optical Co., Ltd. | Scanning tunneling potentio-spectroscopic microscope and a data detecting method |
EP0449221B1 (de) * | 1990-03-27 | 1997-01-02 | Olympus Optical Co., Ltd. | Rastertunnelmikroskop |
US5177437A (en) * | 1990-08-08 | 1993-01-05 | Photon Dynamics, Inc. | High-density optically-addressable circuit board probe panel and method for use |
JP3000491B2 (ja) * | 1991-04-10 | 2000-01-17 | キヤノン株式会社 | カンチレバーユニット及びこれを用いた情報処理装置、原子間力顕微鏡、磁力顕微鏡 |
US5331275A (en) * | 1991-12-09 | 1994-07-19 | Fujitsu Limited | Probing device and system for testing an integrated circuit |
US5198667A (en) * | 1991-12-20 | 1993-03-30 | The United States Of America As Represented By The Secretary Of The Navy | Method and apparatus for performing scanning tunneling optical absorption spectroscopy |
-
1994
- 1994-04-12 EP EP94912091A patent/EP0650067B1/de not_active Expired - Lifetime
- 1994-04-12 DE DE69433974T patent/DE69433974T2/de not_active Expired - Fee Related
- 1994-04-12 US US08/351,396 patent/US5583446A/en not_active Expired - Lifetime
- 1994-04-12 DE DE69434641T patent/DE69434641T2/de not_active Expired - Fee Related
- 1994-04-12 WO PCT/JP1994/000611 patent/WO1994024575A1/ja active IP Right Grant
- 1994-04-12 EP EP04008313A patent/EP1443337B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1443337B1 (de) | 2006-03-01 |
US5583446A (en) | 1996-12-10 |
EP1443337A3 (de) | 2004-08-11 |
EP0650067A4 (de) | 1995-12-13 |
EP0650067A1 (de) | 1995-04-26 |
EP0650067B1 (de) | 2004-09-01 |
DE69434641D1 (de) | 2006-04-27 |
DE69434641T2 (de) | 2006-12-14 |
EP1443337A2 (de) | 2004-08-04 |
WO1994024575A1 (en) | 1994-10-27 |
DE69433974T2 (de) | 2005-09-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8327 | Change in the person/name/address of the patent owner |
Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US |
|
8339 | Ceased/non-payment of the annual fee |